IEEE IEC 62528 2007

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IEC 62528 Ed. 1 (IEEE Std 1500(TM)-2005): Standard Testability Method for Embedded Core-based Integrated Circuits

Published By	Publication Date	Number of Pages
IEEE	2007	130

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Description

New IEEE Standard – Active. Replaced IEEE Std 1500-2005. This standard defines a mechanism for the test of core designs within a system on chip(SoC). This mechanism constitutes a hardware architecture and leverages the core test language(CTL) to facilitate communication between core designers and core integrators.

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PDF Pages	PDF Title
4	CONTENTS
6	FOREWORD
8	Title page
9	IEEE Introduction Objective of the IEEE 1500 effort
10	Achievements Notice to users Errata Interpretations Patents
11	1. Overview
12	1.1 Scope 1.2 Purpose 2. Normative references
13	3. Definitions, acronyms, and abbreviations 3.1 Definitions
18	3.2 Acronyms and abbreviations
19	4. Structure of this standard 4.1 Specifications
20	4.2 Descriptions 5. Introduction and motivations of two compliance levels
21	6. Overview of the IEEE 1500 scalable hardware architecture 6.1 Wrapper serial port (WSP) 6.2 Wrapper parallel port (WPP)
22	6.3 Wrapper instruction register (WIR) 6.4 Wrapper bypass register (WBY) 6.5 Wrapper boundary register (WBR)
23	7. WIR instructions 7.1 Introduction 7.2 Response of the wrapper circuitry to instructions 7.2.1 Specifications
24	7.2.2 Description
25	7.3 Wrapper instruction rules and naming convention 7.3.1 Specifications
26	7.3.2 Description 7.4 WS_BYPASS Instruction 7.4.1 Specifications 7.4.2 Description
27	7.5 WS_EXTEST instruction 7.5.1 Specifications
28	7.5.2 Description
29	7.6 WP_EXTEST instruction 7.6.1 Specifications
30	7.6.2 Description
31	7.7 Wx_EXTEST instruction 7.7.1 Specifications
32	7.7.2 Description 7.8 WS_SAFE instruction 7.8.1 Specifications
33	7.8.2 Description
34	7.9 WS_PRELOAD instruction 7.9.1 Specifications 7.9.2 Description 7.10 WP_PRELOAD instruction
35	7.10.1 Specifications 7.10.2 Description
36	7.11 WS_CLAMP instruction 7.11.1 Specifications
37	7.11.2 Description
38	7.12 WS_INTEST_RING instruction 7.12.1 Specifications
39	7.12.2 Description 7.13 WS_INTEST_SCAN instruction
40	7.13.1 Specifications 7.13.2 Description
42	7.14 Wx_INTEST instruction 7.14.1 Specifications 7.14.2 Description
43	8. Wrapper serial port (WSP)
44	8.1 WSP terminals 8.1.1 Specifications 8.1.2 Description
45	9. Wrapper parallel port (WPP) 9.1 WPP terminals 9.1.1 Specifications 9.1.2 Description 10. Wrapper instruction register (WIR) 10.1 WIR configuration and DR selection
46	10.1.1 Specifications 10.1.2 Description 10.2 WIR design
48	10.2.1 Specifications 10.2.2 Description
49	10.3 WIR operation
50	10.3.1 Specifications
51	10.3.2 Description
52	11. Wrapper bypass register (WBY) 11.1 WBY register configuration and selection 11.1.1 Specifications 11.1.2 Description 11.2 WBY design
53	11.2.1 Specifications 11.2.2 Description 11.3 WBY operation 11.3.1 Specifications
54	11.3.2 Description 12. Wrapper boundary register (WBR)
56	12.1 WBR structure and operation 12.1.1 Specifications
57	12.1.2 Description 12.2 WBR cell structure and operation 12.2.1 Specifications 12.2.2 Description
58	12.3 WBR operation events 12.3.1 Specifications
61	12.3.2 Description 12.4 WBR operation modes 12.4.1 Normal mode 12.4.2 Inward facing (IF) mode
62	12.4.3 Outward facing (OF) mode 12.4.4 Nonhazardous mode 12.5 Parallel access to the WBR
63	12.5.1 Parallel configuration of the WBR
64	12.5.2 Harnessing of the WBR
65	12.6 WBR cell naming 12.6.1 Specifications 12.6.2 Description
66	12.7 WBR cell examples
70	12.8 IEEE 1500 WBR example
73	13. Wrapper states 13.1 Wrapper Disabled and Wrapper Enabled states 13.1.1 Specifications
74	13.1.2 Description 14. WSP timing diagram 14.1 Specifications
75	14.2 Description
77	14.2.1 Timing parameters for event and functional input/output (I/O)
79	14.3 Synchronous reset timing
80	15. WSP configurations for IEEE 1500 system chips 15.1 Connecting multiple WSPs
82	15.1.1 Specifications
83	15.1.2 Description 16. Plug-and-play (PnP) 16.1 Background and definition
84	16.2 PnP aspects of standard instructions 16.2.1 Specifications
85	16.2.2 Description 16.3 PnP limitations on protocols 16.3.1 Specifications 16.3.2 Description 16.4 Non-PnP in IEEE Std 1500 17. Compliance definitions common to wrapped and unwrapped cores 17.1 General rules
86	17.1.1 Specifications 17.1.2 Description
87	17.2 Per-terminal rules 17.2.1 Specifications
88	17.2.2 Description 17.3 Test pattern information rules 17.3.1 Specifications
89	17.3.2 Description
91	18. Compliance definitions specific to unwrapped cores 18.1 General rules 18.1.1 Specifications 18.1.2 Description
92	18.2 Per-terminal rules 18.2.1 Specifications 18.2.2 Description 18.3 Additional test information rules 18.3.1 Specifications
93	18.3.2 Description 19. Compliance definitions specific to wrapped cores 19.1 General rules 19.1.1 Specifications 19.1.2 Description
94	19.2 Per-terminal rules 19.2.1 Specifications 19.2.2 Description 19.3 Wrapper protocol information rules 19.3.1 Specifications 19.3.2 Description
95	20. IEEE 1500 application 20.1 CTL (IEEE P1450.6) overview
96	20.2 IEEE 1500 examples
98	20.2.1 WS_INTEST_SCAN
103	20.2.2 WE_BYPASS
107	20.2.3 WS_EXTEST
110	20.2.4 WP_EXTEST and WP_INTEST
112	Annex A (normative) Bubble diagram definition
114	Annex B (informative) WBR cell examples
123	Annex C (informative) Relationship of IEEE Std 1500 to IEEE Std 1149.1 C.1 Sample IEEE 1149.1 TAP controller interface
126	Annec D (informative) List of participants

Additional information

Standard Title	IEC 62528 Ed. 1 (IEEE Std 1500(TM)-2005): Standard Testability Method for Embedded Core-based Integrated Circuits
Published Code	IEEE
Publication Date	2007
Pages Count	130

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