IEEE N42.45-2011
$50.92
American National Standard for Evaluating the Image Quality of X-ray Computed Tomography (CT)Security-Screening Systems
| Published By | Publication Date | Number of Pages |
| IEEE | 2011 |
– Active. Test methods and test articles for the evaluation of the image quality of CT security screening systems are provided. The quality of data for automated analysis is the primary concern. This standard does not address the system’s ability to use its image data to automatically detect explosives or other threat materials, which is typically verified by an appropriate regulatory body.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 1 | ANSI N42.45-2011 Front Cover |
| 3 | Title page |
| 7 | Introduction Notice to users Laws and regulations Copyrights Updating of IEEE documents |
| 8 | Errata Patents |
| 9 | Participants |
| 11 | Contents |
| 12 | Important Notice 1. Overview 1.1 Scope 1.2 Purpose |
| 13 | 2. Normative references |
| 14 | 3. Definitions 4. General test-performance requirements |
| 15 | 5. Description of the test articles |
| 17 | 6. Test procedures for image quality 6.1 General |
| 18 | 6.2 Manually recorded data 6.2.1 Purpose 6.2.2 System data |
| 20 | 6.2.3 Evaluation environment data 6.2.4 Comments 6.2.5 Deviations from specified methods 6.2.6 Presentation of results |
| 21 | 6.3 Object length accuracy 6.3.1 Purpose |
| 22 | 6.3.2 Test object description 6.3.3 Test method |
| 24 | 6.3.4 Presentation of results |
| 25 | 6.4 Path length CT value and Zeff 6.4.1 Purpose 6.4.2 Test object description |
| 26 | 6.4.3 Test method 6.4.4 Presentation of results |
| 27 | 6.5 Noise equivalent quanta (NEQ) 6.5.1 Purpose 6.5.2 Test object description |
| 28 | 6.5.3 Test method |
| 29 | 6.5.4 Presentation of results 6.6 CT value consistency 6.6.1 Purpose 6.6.2 Test object description |
| 30 | 6.6.3 Test method 6.6.4 Presentation of results 6.7 Zeff and CT value uniformity 6.7.1 Purpose 6.7.2 Test object description |
| 31 | 6.7.3 Test method |
| 32 | 6.7.4 Presentation of results |
| 33 | 6.8 Streak artifacts 6.8.1 Purpose 6.8.2 Test object description 6.8.3 Test method |
| 35 | 6.8.4 Presentation of results 6.9 Slice sensitivity profile (SSP) 6.9.1 Purpose 6.9.2 Test object description |
| 36 | 6.9.3 Test method |
| 37 | 6.9.4 Presentation of results 6.10 Image registration 6.10.1 Purpose 6.10.2 Test object description |
| 38 | 6.10.3 Test method |
| 41 | 6.10.4 Presentation of results |
| 42 | Annex A (informative)Bibliography |
| 43 | Annex B (normative)Detailed test article drawings B.1 General B.2 Commercial parts B.3 Outer case modifications |
| 45 | B.4 Detailed drawings of custom components |
| 55 | Annex C (informative)Sample report C.1 General |
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