IEEE P1450.4:2018 Edition

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IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Test Flow Specification

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IEEE	2018

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Description

New IEEE Standard – Active – Draft. This standard extends IEEE Std 1450-1999 (STIL) to 39 provide an interface between test generation tools and test equipment with regard to the specification of the flow of execution of test program components. It defines structures such that test flows, sub-flows, and binning may be described in a manner that facilitates automated generation, modification, and/or manual maintenance, and although not yet a complete run-time test language, execution on automated test equipment (ATE). It defines an interface between tester configurations (described by IEEE Std 1450-1999 and IEEE 1450.2-2002) and test program components. It defines a hierarchy of flows, sub-flows, and test components. It defines structures for defining flow related variables and processing expressions involving those variables. It provides structures that support automatic test program generation (ATPRG) and translation, and running it natively as an ATE programming language. As an adjunct, IEEE Std 1450.3-2007, may be used by ATPRG for tester rules checking.

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PDF Pages	PDF Title
1	IEEE Std 1450.4™-2017 Front Cover
2	Blank Page
3	Title page
5	Important Notices and Disclaimers Concerning IEEE Standards Documents
8	Participants
9	Introduction
10	Contents
13	List of Figures
15	List of Tables
16	Blank Page
17	1. Overview 1.1 General
19	1.2 Scope 1.3 Purpose 2. Normative references
20	3. Definitions, abbreviations, and acronyms 3.1 Definitions
22	3.2 Acronyms and abbreviations
23	4. Preface 4.1 General 4.2 Word usage 4.3 Conventions
24	4.4 Semantics 5. Tutorial 5.1 General 5.2 Flow test program example
27	5.3 FlowExtended test program example
29	6. Extensions to STIL.0 Clause 6 (STIL syntax description) 6.1 General 6.2 Additional reserved words
31	6.3 Additions to STIL.0 Table 3 (SI units) 6.4 Extensions to STIL.0 6.6 (token length)
32	6.5 Extensions to STIL.0 6.8 (user-defined name characteristics) 6.6 Extensions to STIL.0 6.12 (number characteristics) 6.7 Extensions to STIL.0 6.16 (STIL name spaces and name resolution)
33	6.8 Expressions
38	6.9 Functions
40	6.10 Enum
41	6.11 Parameter, MethodParameter, and FlowVariable types
42	7. Extensions to STIL.0 Clause 8 (STIL statement) 7.1 General
44	7.2 STIL syntax 7.3 STIL example 8. Extensions to STIL.0 Clause 14 (Signals block) (FlowExtended) 8.1 General 8.2 Signals block syntax and examples
55	9. Extensions to STIL.0 Clause 15 (SignalGroups block) (FlowExtended)
56	10. Extensions to STIL.0 Clause 16 (PatternExec block) (FlowExtended) 10.1 General 10.2 PatternExec block syntax 11. Extensions to STIL.0 Clause 17 (PatternBurst block) (FlowExtended) 11.1 General 11.2 Extensions to STIL.0 17.1 (PatternBurst block syntax)
57	12. Extensions to STIL.0 Clause 18 (Timing and WaveformTable block) (FlowExtended)
58	12.2 Timing and WaveformTable syntax 13. Extensions to STIL.0 Clause 19 (Spec and Selector blocks)
59	13.2 Spec block syntax
60	14. Extensions to STIL.2 Clause 10 (DCLevels block) (FlowExtended) 14.1 General 14.2 DCLevels block syntax
61	15. Extensions to STIL.2 Clause 12 (DCSequence) (FlowExtended) 15.2 DCSequence block syntax
62	15.3 DCSequence block example
63	16. Include enhancements 16.1 IncludeOnce 16.2 DomainInclude
65	17. FlowVariables 17.1 General 17.2 FlowVariables syntax
67	17.3 FlowVariables examples
69	17.4 FlowVariable access
70	17.5 FlowVariable types
76	17.6 FlowVariable attributes
79	17.7 FlowVariable operators and member functions
81	17.8 FlowVariable array operations
82	18. Device to tester interface
83	19. SignalMap 19.1 General
84	19.2 SignalMap syntax
86	19.3 SignalMap examples
91	20. Device (FlowExtended) 20.1 General
98	20.2 STIL.2: DC levels 20.3 Chip
99	20.4 Package
100	20.5 Channel map
102	20.6 Multi-site/MPW testing 20.7 Device block examples
110	21. Binning 21.1 General 21.2 Binning element reference
111	22. SoftBinDefs 22.1 SoftBinDefs syntax
112	22.2 SoftBinDefs examples
113	22.3 Bins
115	22.4 Bin None (FlowExtended)
116	22.5 Bin axes 22.6 countSince functions (FlowExtended)
117	23. HardBinDefs 23.1 HardBinDefs syntax
118	23.2 HardBinDefs examples 23.3 Bins
119	24. BinMap 24.1 General 24.2 BinMap syntax
120	24.3 BinMap example 25. Flow conceptual model
123	26. Flow conceptual model (FlowExtended) 26.1 General
126	26.2 Flow-related types 26.3 Inheritance
128	26.4 Instantiation and execution 27. TestBase definition (FlowExtended) 27.1 TestBase syntax
132	27.2 TestBase example
133	27.3 Parameter initialization and assignment
134	27.4 Parameter types
139	27.5 Parameter attributes 27.6 Parameter operators and member functions
140	27.7 Parameter array operations 27.8 Spec variable access
142	28. TestType definition (FlowExtended) 28.1 General 28.2 TestType syntax
144	28.3 TestType example
145	29. Test 29.1 General 29.2 Test syntax
147	29.3 Test example
149	30. FlowNode 30.1 General
150	30.2 FlowNode syntax
152	30.3 FlowNode examples
153	31. FlowType definition (FlowExtended) 31.1 FlowType syntax 32. Flow 32.1 General
154	32.2 Flow syntax
155	32.3 Flow examples
156	33. Actions and flow control
158	34. TestProgram 34.1 General
159	34.2 TestProgram syntax
160	34.3 TestProgram examples
161	34.4 Entry points 34.5 Bin map
162	35. Standard definitions 35.1 Standard enumerated types
164	35.2 Standard global variables (FlowExtended)
165	35.3 Flow control defaults (FlowExtended)
170	35.4 Standard No-op and None (FlowExtended) 35.5 Standard PatternExec test (FlowExtended)
171	35.6 Standard functional test (FlowExtended)
172	35.7 Standard flow (FlowExtended)
174	Annex A (informative) Event sequence A.1 General A.2 Parsing and loading A.3 Execution
175	Annex B (informative) Top-level block sequence (FlowExtended) B.1 General B.2 Skeleton and dependencies
177	Annex C (informative) Usage examples (FlowExtended) C.1 Coding examples
188	Annex D (informative) Switching from Flow to FlowExtended
189	Blank Page
190	Back Cover

Additional information

Standard Title	IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Test Flow Specification
Published Code	IEEE
Publication Date	2018

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