IEEE P2818
$31.42
IEEE Draft Standard for Reliability Component Stress Analysis and Derating Specification
| Published By | Publication Date | Number of Pages |
| IEEE | N/A |
New IEEE Standard – Active – Draft. This document describes an open standard for parts stress analysis and derating. It establishes uniform methods to increase a component’s reliability margin by decreasing the amount of applied stress (i.e., voltage, current, temperature, power, etc.) to an electronic, electrical, or electromechanical part. Reducing the stress levels improves device reliability/durability by reducing failure rates, thereby improving the reliability and availability of the product.
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