ISO 22489:2006

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Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy

Published By	Publication Date	Number of Pages
ISO	2006-12	22

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Categories: 71.040.99 - Other standards related to analytical chemistry, ISO

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Description

ISO 22489:2006 specifies requirements for the quantification of elements in a micrometre-sized volume of a specimen identified through analysis of the X-rays generated by an electron beam using wavelength-dispersive spectrometers fitted either to an electron probe microanalyser or to a scanning electron microscope.

It describes the principle of the quantitative analysis, the general coverage of this technique in terms of elements, mass fractions and reference specimens, the general requirements for the instrument, and the fundamental procedures involved, such as specimen preparation, selection of experimental conditions, the measurements, the analysis of these and the report.

It is intended for the quantitative analysis of a flat and homogeneous bulk specimen using a normal incidence beam. It does not specify detailed requirements for either the instruments or the data reduction software. Operators should obtain information such as installation conditions, detailed procedures for operation and specification of the instrument from the makers of any products used.

Additional information

Published Code	ISO
Published By	International Organization for Standardization
Publication Date	2006-12
Pages Count	22
Language	English
Edition	1
File Size	215.0 KB
ICS Codes	71.040.99 - Other standards related to analytical chemistry

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ISO 22489:2006

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