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JIS C 60068-2-82:2009

JIS C 60068-2-82:2009

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Environmental testing – Part 2-82: Tests-Test XW1: Whisker test methods for electronic and electric components

Published By Publication Date Number of Pages
JIS 2009-12-21 34
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This Standard specifies whisker tests for electric or electronic components representing the finished stage, with tin or tin-alloy finish.

However, the Standard does not specify tests for whiskers that may grow as a result of external mechanical stress.

This test method is employed by a relevant specification (international component or application specification) with transfer of the test severities to be applied and with defined acceptance criteria.

Where tests described in this Standard are considered for other components, e.g. mechanical parts as used in electrical or electronic equipment, it should be ensured that the material system and whisker growth mechanisms are comparable.

NOTE: The International Standard corresponding to this Standard is as follows.

IEC 60068-2-82: 2007 Environmental testing—Part 2-82: Tests—Test Tx: Whisker test methods for electronic and electric components (IDT)

In addition, symbols which denote the degree of correspondence in the contents between the relevant International Standard and JIS are IDT (identical), MOD (modified), and NEQ (not equivalent) according to ISO/IEC Guide 21-1.

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JIS C 60068-2-82:2009
$56.55