JIS R 1637:1998
$11.70
Test Method for Resistivity of Conductive Fine Ceramic Thin Films with a Four-Point Probe Array
| Published By | Publication Date | Number of Pages |
| JIS | 1998-01-20 | 7 |
| Published Code | JIS |
|---|---|
| Published By | Japanese Industrial Standards |
| Publication Date | 1998-01-20 |
| Pages Count | 7 |
| Language | English |
| File Size | 286.7 KB |
| ICS Codes | 81.060.01 - Ceramics in general |
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