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JIS Z 4334:2005

$17.55

Reference sources for the calibration of surface contamination monitors – Beta-emitters (maximum beta energy greater than 0.15 MeV) and alpha-emitters

Published By Publication Date Number of Pages
JIS 2005-03-20 15
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Published Code

JIS

Published By

Japanese Industrial Standards

Publication Date

2005-03-20

Pages Count

15

Language

English

File Size

624.6 KB

ICS Codes 17.240 - Radiation measurements
JIS Z 4334:2005
$17.55