SAE J 3083:2017

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Reliability Prediction for Automotive Electronics Based on Field Return Data

Published By	Publication Date	Number of Pages
SAE	2017-03-17	22

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Categories: 03.100.40 - Research and development, 31.080 - Semiconductor devices, SAE

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Description

This document should be used as guidance for non-handbook based reliability predictions conducted on automotive electronics products. It presents a method that utilizes warranty and field repair data to calculate the failure rates of individual electronic components and predict the reliability of the entire electronic system. It assumes that the user has access to a database containing field return data with classification of components, times to failure, and a total number of components operating in the field.

Additional information

Published Code	SAE
Published By	SAE International, formerly Society of Automotive Engineers
Publication Date	2017-03-17
Pages Count	22
Language	English
Descriptors	Failure modes and effects analysis; Product development; Electronic control systems; Supply chain management; Light trucks; Semiconductor devices; Cost analysis; Research and development; Electric vehicles
File Size	378.9 KB
ICS Codes	03.100.40 - Research and development 31.080 - Semiconductor devices

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SAE J 3083:2017

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