29.045 - Semiconducting materials
Showing all 13 results
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JIS H 0610:1966 (R1983)
Method of Measurement of Etch Pit Density of Germanium Crystal Published By Publication Date Number…
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JIS H 0607:1978 (R1983)
Determination of Conductivity Type in Germanium by Thermoelectromotive Method Published By Publication Date Number of…
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JIS H 0604:1995
Measurement of Minority-Carrier Lifetime in Silicon Single Crystal by Photoconductive Decay Method Published By Publication…
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JIS H 0603:1978 (R1983)
Measurement of Minority Carrier Life Time in Germanium by Photoconductive Decay Method Published By Publication…
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JIS H 0601:1962 (R1983)
Testing Methods of Resistivity for Germanium Published By Publication Date Number of Pages JIS 1962-06-01…
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IEC TR 60146-1-2:2019
Semiconductor converters – General requirements and line commutated converters – Part 1-2: Application guidelines Published…
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IEC TR 60146-1-2:2011
Semiconductor converters – General requirements and line commutated converters – Part 1-2: Application guide Published…
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IEC 62899-503-3:2021
Printed electronics – Part 503-3: Quality assessment – Measuring method of contact resistance for the…
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IEC 62899-503-1:2020
Printed electronics – Part 503-1: Quality assessment – Test method of displacement current measurement for…
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IEC 62899-203:2018
Printed electronics – Part 203: Materials – Semiconductor ink Published By Publication Date Number of…
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IEC 60146-1-3:1991
Semiconductor convertors – General requirements and line commutated convertors – Part 1-3: Transformers and reactors…
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IEC 60146-1-1:2009
Convertisseurs à semiconducteurs – Exigences générales et convertisseurs commutés par le réseau – Partie 1-1…
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IEC 60119:1960
Recommandations pour les cellules, éléments redresseurs et groupes redresseurs à semiconducteurs polycristallins Published By Publication…