31.080.30 - Transistors
Showing 81–90 of 90 results
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BS 6493-1.8:1985
Semiconductor devices. Discrete devices – Recommendations for field-effect transistors Published By Publication Date Number of…
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ASTM-F617:2000 Edition
F617-00 Standard Test Method for Measuring MOSFET Linear Threshold Voltage (Withdrawn 2006) Published By Publication…
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ASTM-F528 2005
F528-99(2005) Standard Test Method of Measurement of Common-Emitter D-C Current Gain of Junction Transistors (Withdrawn…
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ASTM-F996 2018
F996-11(2018) Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components…
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ASTM-F676 1997
F676-97 Standard Test Method for Measuring Unsaturated TTL Sink Current Published By Publication Date Number…
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ASTM-F528 1999
F528-99 Standard Test Method of Measurement of Common-Emitter D-C Current Gain of Junction Transistors Published…
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ASTM-F996 2003
F996-98(2003) Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components…
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ASTM-F996 2011(Redline)
F996-11 Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components…
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ASTM-F996 2011
F996-11 Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components…
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ASTM-F996 2010
F996-10 Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components…