31.080 - Semiconductor devices
Showing 913–928 of 1120 results
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BSI DD IEC/PAS 62483:2006 2007
Test method for measuring whisker growth on tin and tin alloy surface finishes Published By…
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BS EN 62047-4:2010
Semiconductor devices. Micro-electromechanical devices – Generic specification for MEMS Published By Publication Date Number of…
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BS IEC 60747-16-2:2001:2008 Edition
Semiconductor devices – Microwave integrated circuits. Frequency prescalers Published By Publication Date Number of Pages…
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BS EN 62258-6:2006
Semiconductor die products – Requirements for information concerning thermal simulation Published By Publication Date Number…
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BS EN 62258-5:2006
Semiconductor die products – Requirements for information concerning electrical simulation Published By Publication Date Number…
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BS IEC 60747-14-4:2011
Semiconductor devices. Discrete devices – Semiconductor accelerometers Published By Publication Date Number of Pages BSI…
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BS EN 60749-37:2008
Semiconductor devices. Mechanical and climatic test methods – Board level drop test method using an…
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BS EN 60749-35:2006
Semiconductor devices. Mechanical and climatic test methods – Acoustic microscopy for plastic encapsulated electronic components…
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BS IEC 60191-1:2007
Mechanical standardization of semiconductor devices – General rules for the preparation of outline drawings of…
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BSI PD IEC/TR 62258-4:2007
Semiconductor die products – Questionnaire for die users and suppliers Published By Publication Date Number…
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BS EN 60749-39:2006
Semiconductor devices. Mechanical and climatic test methods – Measurement of moisture diffusivity and water solubility…
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BS EN 60749-38:2008
Semiconductor devices. Mechanical and climatic test methods – Soft error test method for semiconductor devices…
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BSI DD IEC/PAS 62050:2004 2006
Board level drop test method of components for handheld electronicproduc ts Published By Publication Date…
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BS IEC 60747-8-4:2004
Discrete semiconductor devices – Metal-oxide semiconductor field-effect transistors (MOSFETs) for power switching applications Published By…
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BS EN 60749-20-1:2009
Semiconductor devices. Mechanical and climatic test methods – Handling, packing, labelling and shipping of surface-mount…
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BS EN 60749-17:2003:2004 Edition
Semiconductor devices. Mechanical and climatic test methods – Neutron irradiation Published By Publication Date Number…