{"id":110982,"date":"2024-10-18T16:04:06","date_gmt":"2024-10-18T16:04:06","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-1057-1994\/"},"modified":"2024-10-24T21:59:51","modified_gmt":"2024-10-24T21:59:51","slug":"ieee-1057-1994","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-1057-1994\/","title":{"rendered":"IEEE 1057 1994"},"content":{"rendered":"

Revision Standard – Inactive – Superseded. Superseded by IEEE Std 1057-2007. Terminology and test methods for describing the performance of waveform recorders are provided.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
1<\/td>\nTitle page <\/td>\n<\/tr>\n
3<\/td>\nIntroduction
Participants <\/td>\n<\/tr>\n
5<\/td>\nCONTENTS <\/td>\n<\/tr>\n
6<\/td>\n1. Overview
1.1 Scope
1.2 Purpose
1.3 Guidance to the user <\/td>\n<\/tr>\n
8<\/td>\n1.4 Manufacturer supplied information <\/td>\n<\/tr>\n
9<\/td>\n2. References
3. Definitions and symbols
3.1 Definitions <\/td>\n<\/tr>\n
13<\/td>\n3.2 Symbols <\/td>\n<\/tr>\n
17<\/td>\n4. Test methods
4.1 General methods <\/td>\n<\/tr>\n
36<\/td>\n4.2 Input impedance <\/td>\n<\/tr>\n
37<\/td>\n4.3 Gain and offset <\/td>\n<\/tr>\n
38<\/td>\n4.4 Linearity, harmonic distortion, and spurious response <\/td>\n<\/tr>\n
43<\/td>\n4.5 Noise <\/td>\n<\/tr>\n
46<\/td>\n4.6 Analog bandwidth <\/td>\n<\/tr>\n
47<\/td>\n4.7 Frequency response <\/td>\n<\/tr>\n
48<\/td>\n4.8 Step response parameters <\/td>\n<\/tr>\n
51<\/td>\n4.9 Time base errors <\/td>\n<\/tr>\n
54<\/td>\n4.10 Triggering <\/td>\n<\/tr>\n
57<\/td>\n4.11 Crosstalk
4.12 Monotonicity <\/td>\n<\/tr>\n
58<\/td>\n4.13 Hysteresis
4.14 Overvoltage recovery <\/td>\n<\/tr>\n
59<\/td>\n4.15 Word error rate <\/td>\n<\/tr>\n
60<\/td>\n4.16 Cycle time
4.17 Differential input specifications <\/td>\n<\/tr>\n
63<\/td>\nAnnex A\u2014Derivation of the three parameter (known frequency) sine wave curvefit algorithm <\/td>\n<\/tr>\n
67<\/td>\nAnnex B\u2014Derivation of the four parameter (general case) sine wave curvefit algorithm <\/td>\n<\/tr>\n
74<\/td>\nAnnex C\u2014Comments on errors associated with word-error-rate measure ment <\/td>\n<\/tr>\n
76<\/td>\nAnnex D\u2014Measurement of random noise below the quantization level <\/td>\n<\/tr>\n
78<\/td>\nAnnex E\u2014Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

IEEE Standard for Digitizing Waveform Recorders<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
IEEE<\/b><\/a><\/td>\n1994<\/td>\n79<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":110983,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2644],"product_tag":[],"class_list":{"0":"post-110982","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-ieee","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/110982","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/110983"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=110982"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=110982"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=110982"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}