{"id":111749,"date":"2024-10-18T16:15:57","date_gmt":"2024-10-18T16:15:57","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-iso-iec-14515-1-2000\/"},"modified":"2024-10-24T22:02:34","modified_gmt":"2024-10-24T22:02:34","slug":"ieee-iso-iec-14515-1-2000","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-iso-iec-14515-1-2000\/","title":{"rendered":"IEEE ISO IEC 14515 1 2000"},"content":{"rendered":"

New IEEE Standard – Active. This standard defines the test method specifications for IEEE Std 1003.b-1993 (based on the document corresponding to the merger of IEEE Std 1003.1-1990 and IEEE Std 1003.1b- 1993). The test method specifications consist of assertions to be tested and related test procedures. As an amendment to IEEE Std 1003.1-1990, this standard is structured to amend those portions of IEEE Std 2003.1-1992 (the test method specification for IEEE Std 1003.1-1990) that correspond to the amended parts of IEEE Std 1003.1-1990. This standard is aimed primarily at providers of test methods for IEEE Std 1003.1b-1993 and at implementors of IEEE Std 1003.1b-1993.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
1<\/td>\nTitle page <\/td>\n<\/tr>\n
5<\/td>\nIntroduction <\/td>\n<\/tr>\n
6<\/td>\nParticipants <\/td>\n<\/tr>\n
9<\/td>\nCONTENTS <\/td>\n<\/tr>\n
11<\/td>\n1. General <\/td>\n<\/tr>\n
26<\/td>\n2. Definitions and General Requirements <\/td>\n<\/tr>\n
41<\/td>\n3. Process Primitives <\/td>\n<\/tr>\n
83<\/td>\n4. Process Environment <\/td>\n<\/tr>\n
103<\/td>\n5. Files and Directories <\/td>\n<\/tr>\n
175<\/td>\n6. Input and Output Primitives <\/td>\n<\/tr>\n
194<\/td>\n7. Device- and Class-Specific Functions <\/td>\n<\/tr>\n
227<\/td>\n8. Language-Specific for the C Programming Language <\/td>\n<\/tr>\n
303<\/td>\n9. System Databases <\/td>\n<\/tr>\n
308<\/td>\n10. Data Interchange Format <\/td>\n<\/tr>\n
317<\/td>\nAnnex A Bibliography <\/td>\n<\/tr>\n
318<\/td>\nAnnex B Rationale and Notes <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

ISO\/IEC 14515-1:2000, Information Technology — Portable Operating System Interface (POSIX(R)) — Test methods for measuring conformance to POSIX — Part 1: System interfaces<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
IEEE<\/b><\/a><\/td>\n2000<\/td>\n327<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":111750,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2644],"product_tag":[],"class_list":{"0":"post-111749","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-ieee","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/111749","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/111750"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=111749"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=111749"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=111749"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}