{"id":111862,"date":"2024-10-18T16:17:37","date_gmt":"2024-10-18T16:17:37","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-1641-1-2013\/"},"modified":"2024-10-24T22:02:53","modified_gmt":"2024-10-24T22:02:53","slug":"ieee-1641-1-2013","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-1641-1-2013\/","title":{"rendered":"IEEE 1641.1 2013"},"content":{"rendered":"

Revision Standard – Active. Guidance in the use of the signal and test definition (STD) standard, IEEE Std 1641-2010, is provided. IEEE Std 1641 provides the means to define and describe signals used in testing. This guide describes how to form complex signals usable across all test platforms.<\/p>\n

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PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
1<\/td>\nIEEE Std 1641.1-2013 Front cover <\/td>\n<\/tr>\n
3<\/td>\nTitle page
\n <\/td>\n<\/tr>\n
6<\/td>\nNotice to users
Laws and regulations
Copyrights
Updating of IEEE documents
Errata
Patents <\/td>\n<\/tr>\n
8<\/td>\nParticipants <\/td>\n<\/tr>\n
10<\/td>\nIntroduction <\/td>\n<\/tr>\n
11<\/td>\nContents <\/td>\n<\/tr>\n
15<\/td>\nImportant notice
\n
1. Overview
1.1 Scope
1.2 Purpose <\/td>\n<\/tr>\n
16<\/td>\n2. Normative references
3. Definitions, acronyms, and abbreviations
3.1 Definitions <\/td>\n<\/tr>\n
18<\/td>\n3.2 Acronyms and abbreviations <\/td>\n<\/tr>\n
19<\/td>\n4. Introduction to IEEE Std 1641
4.1 Requirements for signal and test definition standard <\/td>\n<\/tr>\n
20<\/td>\n4.2 Features of the standard
4.3 Hierarchy of signal definitions <\/td>\n<\/tr>\n
22<\/td>\n4.4 Improvements to the standard
4.5 Signals and streams <\/td>\n<\/tr>\n
25<\/td>\n4.6 Inclusion of support for Automatic Test Markup Language
5. Describing signals using IEEE Std 1641
5.1 Overview <\/td>\n<\/tr>\n
27<\/td>\n5.2 Physical types <\/td>\n<\/tr>\n
29<\/td>\n5.3 Signals <\/td>\n<\/tr>\n
33<\/td>\n5.4 Using signal graphs to create a signal <\/td>\n<\/tr>\n
37<\/td>\n5.5 Documenting signal descriptions <\/td>\n<\/tr>\n
42<\/td>\n5.6 Using signal definitions
6. Signal models
6.1 General <\/td>\n<\/tr>\n
43<\/td>\n6.2 TSF model as signal template <\/td>\n<\/tr>\n
45<\/td>\n6.3 Typical signal model (TSF) <\/td>\n<\/tr>\n
47<\/td>\n6.4 Using TSFs in a test requirement or program <\/td>\n<\/tr>\n
48<\/td>\n6.5 Measurement models (signal measurement)
7. Defining measurements with STD
7.1 General <\/td>\n<\/tr>\n
49<\/td>\n7.2 Sensors <\/td>\n<\/tr>\n
54<\/td>\n7.3 Measurement maps
7.4 Intrinsic measurements <\/td>\n<\/tr>\n
63<\/td>\n7.5 Generic measurement <\/td>\n<\/tr>\n
67<\/td>\n7.6 Reference signals description
7.7 Different valid measurement methods <\/td>\n<\/tr>\n
70<\/td>\n8. Describing tests and test requirements
8.1 Structure\u2014sequence and signals <\/td>\n<\/tr>\n
71<\/td>\n8.2 Using tools such as graphical environments <\/td>\n<\/tr>\n
72<\/td>\n8.3 Portable test requirements <\/td>\n<\/tr>\n
81<\/td>\n8.4 ATML Test Description
8.5 Examples of test requirements using TPL, ATLAS, and native languages <\/td>\n<\/tr>\n
105<\/td>\n9. Basic signal components
9.1 Introduction of new BSCs
9.2 BSC interfaces <\/td>\n<\/tr>\n
106<\/td>\n9.3 Diagrammatic representation of BSCs <\/td>\n<\/tr>\n
107<\/td>\n9.4 SignalFunctions and events <\/td>\n<\/tr>\n
120<\/td>\n10. Test signal framework
10.1 Introduction to test signal framework (TSF)
10.2 Building TSF signal models using BSCs
10.3 Examples of source signal models <\/td>\n<\/tr>\n
128<\/td>\n10.4 Dual or multiple use TSF models <\/td>\n<\/tr>\n
131<\/td>\n10.5 Signal models with preset internal attributes <\/td>\n<\/tr>\n
135<\/td>\n10.6 Examples of signal models that process input signal <\/td>\n<\/tr>\n
140<\/td>\n10.7 Example of signal models that include connection BSCs <\/td>\n<\/tr>\n
143<\/td>\n10.8 SignalDelay TSF model for SWEEP <\/td>\n<\/tr>\n
144<\/td>\n10.9 TSF model for linear sweep using frequency modulation BSC <\/td>\n<\/tr>\n
145<\/td>\n10.10 TSF model for logarithmic sweep using FM BSC <\/td>\n<\/tr>\n
146<\/td>\n10.11 TSF attributes mappings and formulae <\/td>\n<\/tr>\n
148<\/td>\n10.12 Synchronization of signal model <\/td>\n<\/tr>\n
156<\/td>\n10.13 Gating a signal model <\/td>\n<\/tr>\n
159<\/td>\n10.14 Use of XML to specify TSF signal model information <\/td>\n<\/tr>\n
168<\/td>\n10.15 Use of IDL to specify TSF signal model information <\/td>\n<\/tr>\n
172<\/td>\n11. Digital signals
11.1 Possible states for digital stream <\/td>\n<\/tr>\n
173<\/td>\n11.2 Generating a digital stream <\/td>\n<\/tr>\n
174<\/td>\n11.3 Converting digital data into a physical digital signal <\/td>\n<\/tr>\n
179<\/td>\n11.4 Using the SelectCase BSC <\/td>\n<\/tr>\n
182<\/td>\n11.5 Extracting digital data from a physical digital signal
12. More about events and their interaction
12.1 Interaction between streams <\/td>\n<\/tr>\n
187<\/td>\n12.2 Recovering event information from digital streams <\/td>\n<\/tr>\n
188<\/td>\n13. Test Procedure Language
13.1 Introduction to TPL <\/td>\n<\/tr>\n
189<\/td>\n13.2 Simple test requirement in TPL <\/td>\n<\/tr>\n
197<\/td>\n13.3 Further test requirement in TPL <\/td>\n<\/tr>\n
205<\/td>\n13.4 Examples of test statements in TPL <\/td>\n<\/tr>\n
214<\/td>\n13.5 Quantities, units, and unit symbols <\/td>\n<\/tr>\n
215<\/td>\n14. Signal Modeling Language
14.1 Introduction to SML <\/td>\n<\/tr>\n
216<\/td>\n14.2 Using SML to define a BSC <\/td>\n<\/tr>\n
222<\/td>\nAnnex A (informative) Glossary <\/td>\n<\/tr>\n
224<\/td>\nAnnex B (informative) Intrinsic measurement
B.1 Introduction
B.2 Essential aspects and parts of a measurement <\/td>\n<\/tr>\n
228<\/td>\nB.3 Interpreting measurement information <\/td>\n<\/tr>\n
229<\/td>\nB.4 Examples showing breakdown of derivation of attributes <\/td>\n<\/tr>\n
236<\/td>\nB.5 Creating IEEE 1641 measurements for legacy ATLAS systems <\/td>\n<\/tr>\n
240<\/td>\nAnnex C (informative) Generic measurement
C.1 Introduction
C.2 Information required to complete a measurement <\/td>\n<\/tr>\n
241<\/td>\nC.3 Interpreting measurement information <\/td>\n<\/tr>\n
242<\/td>\nC.4 Examples showing breakdown of derivation of attributes <\/td>\n<\/tr>\n
248<\/td>\nC.5 Creating IEEE 1641 measurements for legacy ATLAS systems <\/td>\n<\/tr>\n
250<\/td>\nC.6 Dependence upon reference signal <\/td>\n<\/tr>\n
254<\/td>\nC.7 Measurements on a complex signal (square wave) <\/td>\n<\/tr>\n
256<\/td>\nAnnex D (informative) Role of Resource Adapter Information (RAI) in IEEE Std 1641
D.1 Introduction
D.2 Maximizing the platform independence of test requirements <\/td>\n<\/tr>\n
257<\/td>\nD.3 Interpreting the principles and rules <\/td>\n<\/tr>\n
258<\/td>\nD.4 Test requirement presentation <\/td>\n<\/tr>\n
259<\/td>\nAnnex E (informative) Understanding IEEE 1641 capabilities
E.1 How to define and connect loads <\/td>\n<\/tr>\n
269<\/td>\nE.2 Implementing short circuits in IEEE 1641 <\/td>\n<\/tr>\n
270<\/td>\nE.3 Signals and triggering <\/td>\n<\/tr>\n
275<\/td>\nAnnex F (informative) Implementation of IEEE 1641 application techniques
F.1 Implementing IEEE 1641\u2014RF stimulus and measurement <\/td>\n<\/tr>\n
284<\/td>\nF.2 Implementing IEEE 1641\u2014Amplifier characterization using IEEE 1641 <\/td>\n<\/tr>\n
296<\/td>\nF.3 Implementing IEEE 1641\u2014Envelope testing of waveforms <\/td>\n<\/tr>\n
306<\/td>\nF.4 Implementing IEEE 1641\u2014Resource drivers and COTS languages <\/td>\n<\/tr>\n
315<\/td>\nF.5 Implementing IEEE 1641\u2014Compilation techniques <\/td>\n<\/tr>\n
323<\/td>\nAnnex G (informative) Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

IEEE Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test Definition<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
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