{"id":129402,"date":"2024-10-19T06:33:00","date_gmt":"2024-10-19T06:33:00","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-1687-2014\/"},"modified":"2024-10-24T23:35:27","modified_gmt":"2024-10-24T23:35:27","slug":"ieee-1687-2014","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-1687-2014\/","title":{"rendered":"IEEE 1687 2014"},"content":{"rendered":"

New IEEE Standard – Active. A methodology for accessing instrumentation embedded within a semiconductor device, without defining the instruments or their features themselves, via the IEEE 1149.1(TM) test access port (TAP) and\/or other signals, is described in this standard. The elements of the methodology include a hardware architecture for the on-chip network connecting the instruments to the chip pins, a hardware description language to describe this network, and a software language and protocol for communicating with the instruments via this network.<\/p>\n

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PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
1<\/td>\nIEEE Std 1687-2014 Front cover <\/td>\n<\/tr>\n
5<\/td>\nImportant Notices and Disclaimers Concerning IEEE Standards Documents <\/td>\n<\/tr>\n
8<\/td>\nParticipants <\/td>\n<\/tr>\n
11<\/td>\nIntroduction <\/td>\n<\/tr>\n
12<\/td>\nContents <\/td>\n<\/tr>\n
15<\/td>\nIMPORTANT NOTICE
1. Overview
1.1 Scope
1.2 Purpose <\/td>\n<\/tr>\n
16<\/td>\n1.3 Background
1.4 Organization <\/td>\n<\/tr>\n
17<\/td>\n1.5 Context <\/td>\n<\/tr>\n
18<\/td>\n2. Normative references
3. Definitions, acronyms, and abbreviations
3.1 Definitions <\/td>\n<\/tr>\n
24<\/td>\n3.2 Acronyms and abbreviations <\/td>\n<\/tr>\n
25<\/td>\n4. Technology
4.1 Introduction
4.2 Serial access networks <\/td>\n<\/tr>\n
32<\/td>\n4.3 On-chip instruments <\/td>\n<\/tr>\n
33<\/td>\n5. Hardware architecture
5.1 Introduction to the IEEE 1687 network
5.2 Hierarchical IEEE 1687 networks <\/td>\n<\/tr>\n
36<\/td>\n5.3 Controller
5.4 Instrument interface <\/td>\n<\/tr>\n
37<\/td>\n5.5 Access network <\/td>\n<\/tr>\n
44<\/td>\n5.6 Test data register <\/td>\n<\/tr>\n
48<\/td>\n5.7 Local reset <\/td>\n<\/tr>\n
52<\/td>\n5.8 Delivery and integration of instruments <\/td>\n<\/tr>\n
53<\/td>\n5.9 Embedded TAP controller <\/td>\n<\/tr>\n
58<\/td>\n5.10 Definitions of the structure of IEEE 1687 hardware architecture <\/td>\n<\/tr>\n
59<\/td>\n5.11 Port functions of a module <\/td>\n<\/tr>\n
61<\/td>\n5.12 Signals between and within IEEE 1687 modules <\/td>\n<\/tr>\n
62<\/td>\n5.13 Components comprising a module <\/td>\n<\/tr>\n
64<\/td>\n5.14 TAP finite state machine embedded in an IEEE 1687 module <\/td>\n<\/tr>\n
67<\/td>\n5.15 Access network behavior
5.16 Plug-and-play interfaces <\/td>\n<\/tr>\n
70<\/td>\n6. Instrument Connectivity Language (ICL)
6.1 ICL introduction <\/td>\n<\/tr>\n
71<\/td>\n6.2 ICL overview <\/td>\n<\/tr>\n
73<\/td>\n6.3 ICL lexical conventions and definitions <\/td>\n<\/tr>\n
87<\/td>\n6.4 ICL primitive element keywords and statements <\/td>\n<\/tr>\n
149<\/td>\n6.5 ICL informational statements <\/td>\n<\/tr>\n
155<\/td>\n6.6 ICL connectivity
6.7 Inferring information in implicit ICL <\/td>\n<\/tr>\n
156<\/td>\n6.8 Active values for control signals <\/td>\n<\/tr>\n
157<\/td>\n7. Procedural Description Language (PDL): level-0
7.1 Purpose
7.2 PDL levels <\/td>\n<\/tr>\n
158<\/td>\n7.3 Basic PDL concepts <\/td>\n<\/tr>\n
161<\/td>\n7.4 Retargeting of PDL <\/td>\n<\/tr>\n
163<\/td>\n7.5 PDL level-0 overview <\/td>\n<\/tr>\n
166<\/td>\n7.6 PDL general rules <\/td>\n<\/tr>\n
168<\/td>\n7.7 Generic PDL tokens <\/td>\n<\/tr>\n
169<\/td>\n7.8 PDL numbers <\/td>\n<\/tr>\n
171<\/td>\n7.9 PDL level-0 commands <\/td>\n<\/tr>\n
196<\/td>\n8. Procedural Description Language: level-1 (Tcl)
8.1 Purpose
8.2 Tcl command extensions <\/td>\n<\/tr>\n
197<\/td>\n8.3 PDL level-1 overview
8.4 PDL level-1 commands <\/td>\n<\/tr>\n
203<\/td>\n8.5 PDL level-1 example <\/td>\n<\/tr>\n
204<\/td>\nAnnex A (informative) ICL grammar
A.1 Conventions
A.2 ICL language definition <\/td>\n<\/tr>\n
213<\/td>\nAnnex B (informative) PDL level-0 grammar
B.1 Conventions
B.2 Grammar <\/td>\n<\/tr>\n
217<\/td>\nAnnex C (informative) PDL level-1 grammar <\/td>\n<\/tr>\n
218<\/td>\nAnnex D (informative) PDL differences between IEEE Std 1687-2014 and IEEE Std 1149.1-2013
D.1 Introduction
D.2 PDL level-0 command differences <\/td>\n<\/tr>\n
220<\/td>\nD.3 PDL level-1 commands <\/td>\n<\/tr>\n
221<\/td>\nD.4 General operation differences <\/td>\n<\/tr>\n
222<\/td>\nD.5 Creating interoperable PDL <\/td>\n<\/tr>\n
226<\/td>\nAnnex E (informative) Examples
E.1 Example context <\/td>\n<\/tr>\n
228<\/td>\nE.2 Instrument example <\/td>\n<\/tr>\n
229<\/td>\nE.3 Scan register example <\/td>\n<\/tr>\n
231<\/td>\nE.4 Wrapped instrument example <\/td>\n<\/tr>\n
232<\/td>\nE.5 Daisy-chain example <\/td>\n<\/tr>\n
233<\/td>\nE.6 SIB_mux_pre component example <\/td>\n<\/tr>\n
234<\/td>\nE.7 Single SIB example <\/td>\n<\/tr>\n
235<\/td>\nE.8 Multiple SIB example <\/td>\n<\/tr>\n
236<\/td>\nE.9 Scan muxes with local control example <\/td>\n<\/tr>\n
238<\/td>\nE.10 Scan muxes with remote control example <\/td>\n<\/tr>\n
239<\/td>\nE.11 Nested SIB example: mux_pre <\/td>\n<\/tr>\n
241<\/td>\nE.12 BAD Nested SIB example: mux_post <\/td>\n<\/tr>\n
242<\/td>\nE.13 Exclusive access example: implicit ICL <\/td>\n<\/tr>\n
243<\/td>\nE.14 Exclusive access example: explicit ICL <\/td>\n<\/tr>\n
244<\/td>\nE.15 Exclusive access with broadcast example <\/td>\n<\/tr>\n
246<\/td>\nE.16 Broadcast or daisy-chain example <\/td>\n<\/tr>\n
247<\/td>\nE.17 Branched scan chain example <\/td>\n<\/tr>\n
248<\/td>\nE.18 Branched-then-merged scan chain example <\/td>\n<\/tr>\n
250<\/td>\nE.19 IEEE 1500 wrapper serial port <\/td>\n<\/tr>\n
251<\/td>\nE.20 IEEE 1500 WSP with SWIR bit included <\/td>\n<\/tr>\n
253<\/td>\nE.21 Single embedded TAP controller (eTAPC) example <\/td>\n<\/tr>\n
254<\/td>\nE.22 Basic PDL for a simple instrument <\/td>\n<\/tr>\n
256<\/td>\nE.23 MBIST engine example <\/td>\n<\/tr>\n
257<\/td>\nE.24 MBIST and associated memory example <\/td>\n<\/tr>\n
258<\/td>\nE.25 Combined MBIST and memory example <\/td>\n<\/tr>\n
260<\/td>\nE.26 Addressable instruments <\/td>\n<\/tr>\n
261<\/td>\nE.27 Black-box module <\/td>\n<\/tr>\n
262<\/td>\nE.28 Wide scan interface example <\/td>\n<\/tr>\n
263<\/td>\nE.29 Simple IEEE 1149.1 AccessLink example <\/td>\n<\/tr>\n
264<\/td>\nE.30 Complex IEEE 1149.1 AccessLink example <\/td>\n<\/tr>\n
267<\/td>\nE.31 Generic AccessLink example <\/td>\n<\/tr>\n
269<\/td>\nAnnex F (informative) Design guidance
F.1 Introduction
F.2 Scan register implementations <\/td>\n<\/tr>\n
275<\/td>\nF.3 Scan multiplexers <\/td>\n<\/tr>\n
281<\/td>\nAnnex G (informative) Bibliography <\/td>\n<\/tr>\n
283<\/td>\nBack cover <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
IEEE<\/b><\/a><\/td>\n2014<\/td>\n283<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":129403,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2644],"product_tag":[],"class_list":{"0":"post-129402","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-ieee","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/129402","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/129403"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=129402"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=129402"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=129402"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}