{"id":154557,"date":"2024-10-19T09:11:55","date_gmt":"2024-10-19T09:11:55","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-1149-6-2016\/"},"modified":"2024-10-25T01:27:27","modified_gmt":"2024-10-25T01:27:27","slug":"ieee-1149-6-2016","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-1149-6-2016\/","title":{"rendered":"IEEE 1149.6 2016"},"content":{"rendered":"

Revision Standard – Active. This standard augments IEEE Std 1149.1 to improve the ability for testing differential and\/or ac-coupled interconnections between integrated circuits on circuit boards and systems.<\/p>\n

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PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
1<\/td>\nIEEE Std 1149.6\u2122-2015 Front Cover <\/td>\n<\/tr>\n
3<\/td>\nTitle page <\/td>\n<\/tr>\n
5<\/td>\nImportant Notices and Disclaimers Concerning IEEE Standards Documents <\/td>\n<\/tr>\n
8<\/td>\nParticipants <\/td>\n<\/tr>\n
9<\/td>\nIntroduction <\/td>\n<\/tr>\n
12<\/td>\nContents <\/td>\n<\/tr>\n
15<\/td>\nImportant Notice
1. Overview
1.1 Scope
1.2 Purpose <\/td>\n<\/tr>\n
16<\/td>\n1.3 Organization of the standard <\/td>\n<\/tr>\n
17<\/td>\n1.4 Context
1.5 Objectives <\/td>\n<\/tr>\n
18<\/td>\n2. Normative references
3. Definitions and acronyms
3.1 Definitions <\/td>\n<\/tr>\n
24<\/td>\n3.2 Acronyms <\/td>\n<\/tr>\n
25<\/td>\n4. Technology <\/td>\n<\/tr>\n
26<\/td>\n4.1 Signal pin types
4.2 Signal coupling and coupling combinations <\/td>\n<\/tr>\n
32<\/td>\n4.3 The effects of defects <\/td>\n<\/tr>\n
34<\/td>\n4.4 Defects targeted by the standard <\/td>\n<\/tr>\n
35<\/td>\n4.5 Differential termination and testability <\/td>\n<\/tr>\n
38<\/td>\n4.6 Test signal implementation <\/td>\n<\/tr>\n
42<\/td>\n4.7 Test receiver support for ac testing instructions <\/td>\n<\/tr>\n
46<\/td>\n4.8 Test receiver support for the (DC) EXTEST instruction <\/td>\n<\/tr>\n
48<\/td>\n4.9 A general test receiver for dc and ac testing instructions <\/td>\n<\/tr>\n
50<\/td>\n4.10 Boundary-scan capture data versus configuration <\/td>\n<\/tr>\n
52<\/td>\n4.11 Noise sources and sensitivities <\/td>\n<\/tr>\n
56<\/td>\n5. Instructions
5.1 IEEE Std 1149.1 instructions
5.2 AC testing instructions <\/td>\n<\/tr>\n
59<\/td>\n5.3 The EXTEST_PULSE instruction <\/td>\n<\/tr>\n
61<\/td>\n5.4 The EXTEST_TRAIN instruction <\/td>\n<\/tr>\n
64<\/td>\n5.5 ac test signal generation
6. Pin implementation specifications
6.1 Pin identification <\/td>\n<\/tr>\n
65<\/td>\n6.2 Input test receivers <\/td>\n<\/tr>\n
97<\/td>\n6.3 Output drivers <\/td>\n<\/tr>\n
100<\/td>\n6.4 Bidirectional pins <\/td>\n<\/tr>\n
104<\/td>\n6.5 AC\/DC selection cells <\/td>\n<\/tr>\n
106<\/td>\n7. Conformance and documentation requirements
7.1 Conformance <\/td>\n<\/tr>\n
107<\/td>\n7.2 Documentation <\/td>\n<\/tr>\n
109<\/td>\n7.3 BSDL package for Advanced I\/O description (STD_1149_6_2015) <\/td>\n<\/tr>\n
112<\/td>\n7.4 BSDL extension structure <\/td>\n<\/tr>\n
115<\/td>\n7.5 BSDL attribute definitions <\/td>\n<\/tr>\n
137<\/td>\n7.6 Example BSDL <\/td>\n<\/tr>\n
156<\/td>\n7.7 PDL procedures for programmable ac pins <\/td>\n<\/tr>\n
161<\/td>\n7.8 Example PDL procedures for programmable ac pins <\/td>\n<\/tr>\n
187<\/td>\nAnnex A (informative) Applications and tools
A.1 Chip compliance checking and BSDL and PDL verification <\/td>\n<\/tr>\n
193<\/td>\nA.2 Functional verification
A.3 Board interconnection testing <\/td>\n<\/tr>\n
203<\/td>\nAnnex B (informative) Noise rejection in edge-detecting mode
B.1 Noise rejection by bandwidth limitation <\/td>\n<\/tr>\n
205<\/td>\nB.2 Noise rejection by slew rate limitation <\/td>\n<\/tr>\n
206<\/td>\nAnnex C (informative) Advanced I\/O boundary-scan register cells
C.1 AC\/DC selection cell AC_SelX
C.2 AC\/DC selection cell AC_SelU <\/td>\n<\/tr>\n
207<\/td>\nC.3 Output data cell AC_1 (supports INTEST) <\/td>\n<\/tr>\n
208<\/td>\nC.4 Output data cell AC_2
C.5 Bidirectional output cell AC_7 (supports INTEST) <\/td>\n<\/tr>\n
209<\/td>\nC.6 Bidirectional output cell AC_8 <\/td>\n<\/tr>\n
210<\/td>\nC.7 Self-monitoring output cell AC_9 (supports INTEST) <\/td>\n<\/tr>\n
211<\/td>\nC.8 Self-monitoring output cell AC_10
C.9 AC_40 and AC_41 cells <\/td>\n<\/tr>\n
212<\/td>\nC.10 AC cell mode controls <\/td>\n<\/tr>\n
213<\/td>\nAnnex D (informative) Test receiver design examples
D.1 LVDS with normal board coupling <\/td>\n<\/tr>\n
219<\/td>\nD.2 LVDS with alternative board coupling <\/td>\n<\/tr>\n
220<\/td>\nD.3 LVDS with on-chip coupling <\/td>\n<\/tr>\n
222<\/td>\nD.4 LVPECL (low-voltage pseudo emitter-coupled logic) <\/td>\n<\/tr>\n
224<\/td>\nD.5 LVPECL with guaranteed on-board ac coupling <\/td>\n<\/tr>\n
225<\/td>\nD.6 LVPECL with on-chip coupling <\/td>\n<\/tr>\n
227<\/td>\nAnnex E (informative) A proposed \u201cINITIALIZE\u201d instruction <\/td>\n<\/tr>\n
228<\/td>\nAnnex F (informative) Bibliography <\/td>\n<\/tr>\n
230<\/td>\nBack Cover <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

IEEE Approved Draft Standard for Boundary-Scan Testing of Advanced Digital Networks<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
IEEE<\/b><\/a><\/td>\n2016<\/td>\n230<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":154560,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2644],"product_tag":[],"class_list":{"0":"post-154557","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-ieee","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/154557","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/154560"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=154557"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=154557"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=154557"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}