{"id":237331,"date":"2024-10-19T15:30:00","date_gmt":"2024-10-19T15:30:00","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-607582016-tc\/"},"modified":"2024-10-25T10:08:49","modified_gmt":"2024-10-25T10:08:49","slug":"bs-en-607582016-tc","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-607582016-tc\/","title":{"rendered":"BS EN 60758:2016 – TC"},"content":{"rendered":"

IEC 60758:2016 applies to synthetic quartz single crystals intended for manufacturing piezoelectric elements for frequency control, selection and optical applications. This edition includes the following significant technical changes with respect to the previous edition: – order rearrangement and review of terms and definitions; – abolition as a standard of the infrared absorbance coefficient ? 3410<\/sub>; – addition of the value measurement explanation by FT-IR equipment in annex; – addition of the synthetic quartz crystal standards for optical applications.<\/p>\n

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PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
1<\/td>\ncompares BS EN 60758:2016 <\/td>\n<\/tr>\n
2<\/td>\nTRACKED CHANGES
Text example 1 \u2014 indicates added text (in green) <\/td>\n<\/tr>\n
86<\/td>\nCONTENTS <\/td>\n<\/tr>\n
90<\/td>\nFOREWORD <\/td>\n<\/tr>\n
92<\/td>\nINTRODUCTION <\/td>\n<\/tr>\n
93<\/td>\n1 Scope
2 Normative references
3 Terms and definitions <\/td>\n<\/tr>\n
97<\/td>\n4 Specification for synthetic quartz crystal
4.1 Standard values
4.1.1 Shape of synthetic quartz for optical applications
4.1.2 Orientation of the seed
4.1.3 Inclusion density <\/td>\n<\/tr>\n
98<\/td>\n4.1.4 Striae in synthetic quartz for optical applications
4.1.5 Infrared quality indications of \u03b13 500 and \u03b13 585 for piezoelectric applications
Tables
Table 1 \u2013 Inclusion density grades for piezoelectric applications
Table 2 \u2013 Inclusion density grades for optical applications
Table 3 \u2013 Infrared absorbance coefficient grades for piezoelectric applications <\/td>\n<\/tr>\n
99<\/td>\n4.1.6 Grade classification by \u03b1 value and Schlieren method for optical applications
4.1.7 Frequency-temperature characteristics of synthetic quartz for piezoelectric applications
4.1.8 Etch channel density \u03c1
Table 4 \u2013 Infrared absorbance coefficient gradesand Schlieren method for optical applications <\/td>\n<\/tr>\n
100<\/td>\n4.1.9 Internal transmittance for optical applications
Table 5 \u2013 Etch channel density grades for piezoelectric applications <\/td>\n<\/tr>\n
101<\/td>\n4.2 Requirements and measuring methods
4.2.1 Orientation
Figures
Figure 1 \u2013 Quartz crystal axis and cut direction <\/td>\n<\/tr>\n
102<\/td>\n4.2.2 Handedness
4.2.3 Synthetic quartz crystal dimensions <\/td>\n<\/tr>\n
103<\/td>\n4.2.4 Seed dimensions
4.2.5 Imperfections
Figure 2 \u2013 Idealized sections of a synthetic quartz crystal grown on a Z-cut seed <\/td>\n<\/tr>\n
105<\/td>\nFigure 3 \u2013 Typical example of cutting wafers of AT-cut plate, minor rhombohedral-cut plate, X-cut plate, Y-cut plate and Z-cut plate <\/td>\n<\/tr>\n
106<\/td>\n4.2.6 Evaluation of infrared quality by \u03b1 measurement <\/td>\n<\/tr>\n
108<\/td>\n4.2.7 Frequency versus temperature characteristics for piezoelectric applications <\/td>\n<\/tr>\n
109<\/td>\n4.2.8 Striae in synthetic quartz for optical applications
4.2.9 Growth band in synthetic quartz for optical applications
Figure 4 \u2013 Frequency-temperature characteristics deviation rate of the test specimen
Figure 5 \u2013 Typical schlieren system setup <\/td>\n<\/tr>\n
110<\/td>\n4.2.10 Etch channel density <\/td>\n<\/tr>\n
111<\/td>\n4.2.11 Internal transmittance for optical applications
4.3 Marking
4.3.1 General <\/td>\n<\/tr>\n
112<\/td>\n4.3.2 Shipping requirements
5 Specification for lumbered synthetic quartz crystal
5.1 Standard values
5.1.1 Tolerance of dimensions <\/td>\n<\/tr>\n
113<\/td>\n5.1.2 Reference surface flatness
5.1.3 Angular tolerance of reference surface
Figure 6 \u2013 Lumbered synthetic quartz crystal outline and dimensions along X-, Y- and Z-axes <\/td>\n<\/tr>\n
114<\/td>\n5.1.4 Centrality of the seed
Figure 7 \u2013 Angular deviation for reference surface <\/td>\n<\/tr>\n
115<\/td>\n5.2 Requirements and measuring methods
5.2.1 As-grown quartz bars used for lumbered quartz bars
5.2.2 Dimensions of lumbered synthetic quartz crystal
5.2.3 Identification on reference surface
5.2.4 Measurement of reference surface flatness
5.2.5 Measurement of reference surface angle tolerance
5.2.6 Centrality of the seed
Figure 8 \u2013 Centrality of the seed with respect to the dimensionalong the Z- or Z’-axis <\/td>\n<\/tr>\n
116<\/td>\n5.3 Delivery conditions
5.3.1 General
5.3.2 Marking
5.3.3 Packing
5.3.4 Making batch
6 Inspection rule for synthetic quartz crystal and lumbered synthetic quartz crystal
6.1 Inspection rule for as-grown synthetic quartz crystal
6.1.1 Inspection
6.1.2 Lot-by-lot test <\/td>\n<\/tr>\n
117<\/td>\n6.2 Inspection rule for lumbered synthetic quartz crystal
6.2.1 General
Table 6 \u2013 Test conditions and requirements for the lot-by-Iot test for group A
Table 7 \u2013 Test conditions and requirements for the lot-by-lot test for group B <\/td>\n<\/tr>\n
118<\/td>\n6.2.2 Lot-by-lot test
7 Guidelines for the use of synthetic quartz crystal for piezoelectric applications
7.1 General
7.1.1 Overview
7.1.2 Synthetic quartz crystal
Table 8 \u2013 Test conditions and requirements for the lot-by-lot test <\/td>\n<\/tr>\n
119<\/td>\n7.2 Shape and size of synthetic quartz crystal
7.2.1 Crystal axis and face designation <\/td>\n<\/tr>\n
120<\/td>\n7.2.2 Seed
7.2.3 Shapes and dimensions
Figure 9 \u2013 Quartz crystal axis and face designation <\/td>\n<\/tr>\n
121<\/td>\n7.2.4 Growth zones
7.3 Standard method for evaluating the quality of synthetic quartz crystal
Figure 10 \u2013 Synthetic quartz crystal grown on a Z-cut seed of small X-dimensions <\/td>\n<\/tr>\n
122<\/td>\n7.4 Other methods for checking the quality of synthetic quartz crystal
7.4.1 General
7.4.2 Visual inspection
7.4.3 Infrared radiation absorption method <\/td>\n<\/tr>\n
123<\/td>\n7.4.4 Miscellaneous
Figure 11 \u2013 Example of a relation between the \u03b1 value and the Q value at wave number 3 500 cm-1 <\/td>\n<\/tr>\n
124<\/td>\n7.5 \u03b1 grade for piezoelectric quartz
7.6 Optional grading (only as ordered), in inclusions, etch channels, Al content
7.6.1 Inclusions
7.6.2 Etch channels
7.6.3 Al content <\/td>\n<\/tr>\n
125<\/td>\n7.6.4 Swept quartz <\/td>\n<\/tr>\n
126<\/td>\n7.7 Ordering <\/td>\n<\/tr>\n
127<\/td>\nAnnexes
Annex A (informative) Frequently used sampling procedures
A.1 Complete volume counting
A.2 Commodity Y-bar sampling \u2013 Method 1
A.3 Commodity Y-bar sampling \u2013 Method 2 <\/td>\n<\/tr>\n
128<\/td>\nA.4 Use of comparative standards for 100\u00a0% crystal inspection <\/td>\n<\/tr>\n
129<\/td>\nAnnex B (informative) Numerical example
Table B.1 \u2013 Commodity bar sampling, method 1
Table B.2 \u2013 Commodity bar sampling <\/td>\n<\/tr>\n
130<\/td>\nAnnex C (informative) Example of reference sample selection <\/td>\n<\/tr>\n
131<\/td>\nAnnex D (informative) Explanations of point callipers
Figure D.1 \u2013 Point callipers
Figure D.2 \u2013 Digital point callipers <\/td>\n<\/tr>\n
132<\/td>\nAnnex E (informative) Infrared absorbance \u03b1 value compensation
E.1 General
E.2 Sample preparation, equipment set-up and measuring procedure
E.2.1 General
E.2.2 Sample preparation
E.2.3 Equipment set-up <\/td>\n<\/tr>\n
133<\/td>\nE.2.4 Measurement procedure
E.3 Procedure to establish correction terms
Figure E.1 \u2013 Schematic of measurement set-up <\/td>\n<\/tr>\n
134<\/td>\nFigure E.2 \u2013 Graph relationship between averaged \u03b1 and measured \u03b1 at two wave numbers of \u03b13 500 and \u03b13 585
Table E.1 \u2013 Example of calibration data at \u03b13 585
Table E.2 \u2013 Example of calibration data at \u03b13 500 <\/td>\n<\/tr>\n
135<\/td>\nE.4 Calculation of compensated (corrected) absorbance values <\/td>\n<\/tr>\n
136<\/td>\nAnnex F (informative) Differences of the orthogonal axial system for quartz between IEC standard and IEEE standard <\/td>\n<\/tr>\n
137<\/td>\nFigure F.1 \u2013 Left- and right-handed quartz crystals <\/td>\n<\/tr>\n
138<\/td>\nAnnex\u00a0G (informative) \u03b1 value measurement consistency between dispersive infrared spectrometer and fourier transform infrared spectrometer
G.1 General
G.2 Experiment <\/td>\n<\/tr>\n
139<\/td>\nG.3 Experimental result <\/td>\n<\/tr>\n
141<\/td>\nFigure G.1 \u2013 Relationship of \u03b1 between measuring value and reference value <\/td>\n<\/tr>\n
142<\/td>\nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Tracked Changes. Synthetic quartz crystal. Specifications and guidelines for use<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2020<\/td>\n146<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":237335,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2641],"product_tag":[],"class_list":{"0":"post-237331","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-bsi","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/237331","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/237335"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=237331"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=237331"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=237331"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}