{"id":239098,"date":"2024-10-19T15:38:03","date_gmt":"2024-10-19T15:38:03","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iec-62396-22012\/"},"modified":"2024-10-25T10:19:50","modified_gmt":"2024-10-25T10:19:50","slug":"bs-iec-62396-22012","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iec-62396-22012\/","title":{"rendered":"BS IEC 62396-2:2012"},"content":{"rendered":"

This part of IEC 62396<\/span> <\/span> aims to provide guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to atmospheric neutrons at aircraft altitudes.<\/p>\n

Although developed for the avionics industry, this process may be applied by other industrial sectors.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
4<\/td>\nCONTENTS <\/td>\n<\/tr>\n
6<\/td>\nFOREWORD <\/td>\n<\/tr>\n
8<\/td>\nINTRODUCTION <\/td>\n<\/tr>\n
9<\/td>\n1 Scope
2 Normative references
3 Terms and definitions
4 Abbreviations used in the document <\/td>\n<\/tr>\n
11<\/td>\n5 Obtaining SEE data
5.1 Types of SEE data
5.2 Use of existing SEE data
5.2.1 General
5.2.2 Heavy ion data <\/td>\n<\/tr>\n
12<\/td>\n5.2.3 Neutron and proton data
5.2.4 Thermal neutron data
5.3 Deciding to perform dedicated SEE tests <\/td>\n<\/tr>\n
13<\/td>\n6 Availability of existing SEE data for avionics applications
6.1 Variability of SEE data
6.2 Types of existing SEE data that may be used
6.2.1 General <\/td>\n<\/tr>\n
14<\/td>\n6.2.2 Sources of data, proprietary versus published data <\/td>\n<\/tr>\n
15<\/td>\n6.2.3 Data based on the use of different sources <\/td>\n<\/tr>\n
17<\/td>\nFigures
Figure 1 \u2013 Comparison of Los Alamos, TRIUMF and ANITA neutron spectra with terrestrial \/ avionics neutron spectra (JESD-89A and IEC 62396-1) <\/td>\n<\/tr>\n
19<\/td>\nFigure 2 \u2013 Variation of high energy neutron SEU cross-section per bitas a function of device feature size for SRAM and SRAM arrays in FPGAand microprocessors <\/td>\n<\/tr>\n
20<\/td>\nFigure 3 \u2013 Percentage fraction of SEU rate from atmospheric neutrons contributed by neutrons with E < 10 MeV <\/td>\n<\/tr>\n
21<\/td>\n6.2.4 Ground level versus avionics applications <\/td>\n<\/tr>\n
22<\/td>\n6.3 Sources of existing data
Tables
Table 1 \u2013 Sources of existing data (published after 2000) <\/td>\n<\/tr>\n
23<\/td>\n7 Considerations for SEE testing
7.1 General <\/td>\n<\/tr>\n
24<\/td>\n7.2 Selection of hardware to be tested
7.3 Selection of test method <\/td>\n<\/tr>\n
25<\/td>\n7.4 Selection of facility providing energetic particles
7.4.1 Radiation sources
7.4.2 Spallation neutron source <\/td>\n<\/tr>\n
26<\/td>\n7.4.3 Monoenergetic and quasi-monoenergetic beam sources <\/td>\n<\/tr>\n
27<\/td>\n7.4.4 Thermal neutron sources
7.4.5 Whole system and equipment testing <\/td>\n<\/tr>\n
28<\/td>\n8 Converting test results to avionics SEE rates
8.1 General <\/td>\n<\/tr>\n
29<\/td>\n8.2 Use of spallation neutron source
8.3 Use of SEU cross-section curve over energy <\/td>\n<\/tr>\n
31<\/td>\nFigure 4 \u2013 Comparison of mono-energetic SEU cross-sections with Weibull and piece-wise linear fits <\/td>\n<\/tr>\n
32<\/td>\n8.4 Measured SEU rates for different accelerator based neutron sources
8.5 Influence of upper neutron energy on the accuracy of calculated SEE rates; verification and compensation
Table 2 \u2013 Spectral distribution of neutron energies <\/td>\n<\/tr>\n
34<\/td>\nAnnex A (informative) Sources of SEE data published before 2000
Table A.1 \u2013 Sources of existing SEE data published before 2000 <\/td>\n<\/tr>\n
35<\/td>\nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Process management for avionics. Atmospheric radiation effects – Guidelines for single event effects testing for avionics systems<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2014<\/td>\n42<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":239101,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[89,2641],"product_tag":[],"class_list":{"0":"post-239098","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-03-100-50","7":"product_cat-bsi","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/239098","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/239101"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=239098"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=239098"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=239098"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}