IEC 61788-16:2013 involves describing the standard measurement method of power-dependent surface resistance of superconductors at microwave frequencies by the sapphire resonator method. The measuring item is the power dependence of Rs at the resonant frequency. This method is the applicable for a frequency in the range of 10 GHz, for an input microwave power lower than 37 dBm (5 W). The aim is to report the surface resistance data at the measured frequency and that scaled to 10 GHz. Keyword: superconductivity<\/p>\n
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| 6<\/td>\n | English CONTENTS <\/td>\n<\/tr>\n | ||||||
| 8<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n | ||||||
| 9<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions <\/td>\n<\/tr>\n | ||||||
| 10<\/td>\n | 4 Requirements 5 Apparatus 5.1 Measurement system 5.1.1 Measurement system for the tan \u03b4 of the sapphire rod <\/td>\n<\/tr>\n | ||||||
| 11<\/td>\n | 5.1.2 Measurement system for the power dependence of the surface resistance of superconductors at microwave frequencies Figure\u00a01 \u2013 Measurement system for tan \u03b4 of the sapphire rod Figure 2 \u2013 Measurement system for the microwave power dependence of the surface resistance <\/td>\n<\/tr>\n | ||||||
| 12<\/td>\n | 5.2 Measurement apparatus 5.2.1 Sapphire resonator 5.2.2 Sapphire rod Figure\u00a03 \u2013 Sapphire resonator (open type) to measurethe surface resistance of superconductor films <\/td>\n<\/tr>\n | ||||||
| 13<\/td>\n | 5.2.3 Superconductor films 6 Measurement procedure 6.1 Set-up 6.2 Measurement of the tan \u03b4 of the sapphire rod 6.2.1 General 6.2.2 Measurement of the frequency response of the TE021 mode Table\u00a01 \u2013 Typical dimensions of the sapphire rod <\/td>\n<\/tr>\n | ||||||
| 15<\/td>\n | 6.2.3 Measurement of the frequency response of the TE012 mode 6.2.4 Determination of tan \u03b4 of the sapphire rod Figure\u00a04 \u2013 Reflection scattering parameters (|S11| and |S22|) <\/td>\n<\/tr>\n | ||||||
| 16<\/td>\n | 6.3 Power dependence measurement 6.3.1 General <\/td>\n<\/tr>\n | ||||||
| 17<\/td>\n | 6.3.2 Calibration of the incident microwave power to the resonator 6.3.3 Measurement of the reference level 6.3.4 Surface resistance measurement as a function of the incident microwave power 6.3.5 Determination of the maximum surface magnetic flux density <\/td>\n<\/tr>\n | ||||||
| 18<\/td>\n | 7 Uncertainty of the test method 7.1 Surface resistance Table\u00a02 \u2013 Specifications of the vector network analyzer <\/td>\n<\/tr>\n | ||||||
| 19<\/td>\n | 7.2 Temperature Figure\u00a05 \u2013 Term definitions in Table\u00a03 Table\u00a03 \u2013 Specifications of the sapphire rods <\/td>\n<\/tr>\n | ||||||
| 20<\/td>\n | 7.3 Specimen and holder support structure 7.4 Specimen protection 8 Test report 8.1 Identification of the test specimen 8.2 Report of power dependence of Rs values 8.3 Report of test conditions <\/td>\n<\/tr>\n | ||||||
| 21<\/td>\n | Annex A (informative) Additional information relating to Clauses 1 to 7 Figure\u00a0A.1 \u2013 Three types of sapphire rod resonators <\/td>\n<\/tr>\n | ||||||
| 22<\/td>\n | Figure\u00a0A.2 \u2013 Mode chart for a sapphire resonator (see IEC\u00a061788-15) <\/td>\n<\/tr>\n | ||||||
| 23<\/td>\n | Figure\u00a0A.3 \u2013 Loaded quality factor QL measurements usingthe conventional 3\u00a0dB method and the circle fit method <\/td>\n<\/tr>\n | ||||||
| 24<\/td>\n | Figure\u00a0A.4 \u2013 Temperature dependence of tan \u03b4 of a sapphire rod measured using the two-resonance mode dielectric resonator method [3] <\/td>\n<\/tr>\n | ||||||
| 25<\/td>\n | Figure A.5 \u2013 Dependence of the surface resistance Rson the maximum surface magnetic flux density Bs max <\/td>\n<\/tr>\n | ||||||
| 26<\/td>\n | Annex B (informative) Uncertainty considerations <\/td>\n<\/tr>\n | ||||||
| 27<\/td>\n | Table\u00a0B.1 \u2013 Output signals from two nominally identical extensometers Table\u00a0B.2 \u2013 Mean values of two output signals Table\u00a0B.3 \u2013 Experimental standard deviations of two output signals <\/td>\n<\/tr>\n | ||||||
| 28<\/td>\n | Table\u00a0B.4 \u2013 Standard uncertainties of two output signals Table\u00a0B.5 \u2013 Coefficient of Variations of two output signals <\/td>\n<\/tr>\n | ||||||
| 31<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Superconductivity – Electronic characteristic measurements. Power-dependent surface resistance of superconductors at microwave frequencies<\/b><\/p>\n |