{"id":250018,"date":"2024-10-19T16:29:18","date_gmt":"2024-10-19T16:29:18","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-61788-152011\/"},"modified":"2024-10-25T11:42:12","modified_gmt":"2024-10-25T11:42:12","slug":"bs-en-61788-152011","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-61788-152011\/","title":{"rendered":"BS EN 61788-15:2011"},"content":{"rendered":"<p>This part of IEC 61788 describes measurements of the intrinsic surface impedance (Z<sub>S<\/sub>) of HTS films at microwave frequencies by a modified two-resonance mode dielectric resonatormethod [13, 14]<sup>2<\/sup>. The object of measurement is to obtain the temperature dependence of the intrinsic Z<sub>S<\/sub> at the resonant frequenc y <i>f<\/i><sub>0<\/sub>.<\/p>\n<p>The frequency and thickness range and the measurement resolution for the intrinsic Z<sub>S<\/sub> of HTS films are as follows:<\/p>\n<ul>\n<li>\n<p>f requency: up to 40 GHz;<\/p>\n<\/li>\n<li>\n<p>f ilm thickness: greater than 50 nm ;<\/p>\n<\/li>\n<li>\n<p>m easurement resolution: 0 ,01 m\u03a9 at 10 GHz.<\/p>\n<\/li>\n<\/ul>\n<p>The intrinsic Z<sub>S<\/sub> data at the measured frequency, and that scaled to 10 GHz, assuming the <i>f<\/i><sup>2<\/sup> rule for the intrinsic surface resistance R<sub>S<\/sub> (<i>f<\/i> &lt; 40 GHz) and the <i>f<\/i> rule for the intrinsic surface reactance X<sub>S<\/sub> for comparison, shall be reported.<\/p>\n<h4>PDF Catalog<\/h4>\n<table border=\"1px\" class=\"des-table\">\n<tr>\n<th>PDF Pages<\/th>\n<th>PDF Title<\/th>\n<\/tr>\n<tr>\n<td><b>6<b><\/td>\n<td>English <br \/> CONTENTS  <\/td>\n<\/tr>\n<tr>\n<td><b>8<b><\/td>\n<td>FOREWORD  <\/td>\n<\/tr>\n<tr>\n<td><b>10<b><\/td>\n<td>INTRODUCTION  <\/td>\n<\/tr>\n<tr>\n<td><b>11<b><\/td>\n<td>1 Scope <br \/> 2 Normative references <br \/> 3 Terms, definitions and general concepts  <\/td>\n<\/tr>\n<tr>\n<td><b>12<b><\/td>\n<td>4 Requirements   <\/td>\n<\/tr>\n<tr>\n<td><b>13<b><\/td>\n<td>5 Apparatus  <br \/> 5.1 Measurement equipment  <br \/> 5.2 Measurement apparatus  <\/td>\n<\/tr>\n<tr>\n<td><b>14<b><\/td>\n<td>Figures <br \/> Figure 1 \u2013 Schematic diagram for the measurement equipment for the intrinsic ZSof HTS films at cryogenic temperatures <br \/> Figure 2 \u2013 Schematic diagram of a dielectric resonator with a switch for thermal connection  <\/td>\n<\/tr>\n<tr>\n<td><b>15<b><\/td>\n<td>Figure 3 \u2013 Typical dielectric resonator with a movable top plate  <\/td>\n<\/tr>\n<tr>\n<td><b>16<b><\/td>\n<td>Figure 4 \u2013 Switch block for thermal connection  <\/td>\n<\/tr>\n<tr>\n<td><b>17<b><\/td>\n<td>5.3 Dielectric rods  <br \/> Figure 5 \u2013 Dielectric resonator assembled with a switch block for thermal connection  <\/td>\n<\/tr>\n<tr>\n<td><b>18<b><\/td>\n<td>5.4 Superconductor films and copper cavity  <br \/> 6 Measurement procedure <br \/> 6.1 Set-up\u00a0  <br \/> 6.2 Measurement of the reference level <br \/> 6.3 Measurement of the RS of oxygen-free high purity copper  <br \/> Tables <br \/> Table 1 \u2013 Typical dimensions of a sapphire rod <br \/> Table 2 \u2013 Typical dimensions of OFHC cavities and HTS films  <\/td>\n<\/tr>\n<tr>\n<td><b>20<b><\/td>\n<td>Figure 6 \u2013 A typical resonance peak. Insertion attenuation IA,resonant frequency f0 and half power bandwidth \u2206f3dB are defined  <\/td>\n<\/tr>\n<tr>\n<td><b>21<b><\/td>\n<td>6.4 Determination of the effective RS of superconductor films and tan\u03b4 of standard dielectric rods <br \/> Table 3 \u2013 Geometrical factors and filling factors calculatedfor the standard sapphire resonator  <\/td>\n<\/tr>\n<tr>\n<td><b>22<b><\/td>\n<td>6.5 Determination of the penetration depth <br \/> Figure 7 \u2013 Reflection scattering parameters S11 and S22  <\/td>\n<\/tr>\n<tr>\n<td><b>24<b><\/td>\n<td>6.6 Determination of the intrinsic surface impedance  <\/td>\n<\/tr>\n<tr>\n<td><b>25<b><\/td>\n<td>7 Uncertainty of the test method  <br \/> 7.1 Measurement of unloaded quality factor <br \/> 7.2 Measurement of loss tangent <br \/> Table 4 \u2013 Specifications of vector network analyzer <br \/> Table 5 \u2013 Type B uncertainty for the specifications on the sapphire rod  <\/td>\n<\/tr>\n<tr>\n<td><b>26<b><\/td>\n<td>7.3 Temperature  <br \/> 7.4 Specimen and holder support structure  <br \/> 8 Test Report  <br \/> 8.1 Identification of test specimen  <br \/> 8.2 Report of the intrinsic ZS values  <br \/> 8.3 Report of the test conditions  <br \/> Figure 8 \u2013 Definitions for terms in Table 5  <\/td>\n<\/tr>\n<tr>\n<td><b>28<b><\/td>\n<td>Annex\u00a0A (informative) Additional information relating to Clauses 1 to 8 <br \/> Figure A.1 \u2013 Schematic diagram for the measurement system  <\/td>\n<\/tr>\n<tr>\n<td><b>29<b><\/td>\n<td>Figure A.2 \u2013 A motion stage using step motors  <\/td>\n<\/tr>\n<tr>\n<td><b>30<b><\/td>\n<td>Figure A.3 \u2013 Cross-sectional view of a dielectric resonator  <\/td>\n<\/tr>\n<tr>\n<td><b>34<b><\/td>\n<td>Figure A.4 \u2013 A diagram for simplified cross-sectional view of a dielectric resonator   <\/td>\n<\/tr>\n<tr>\n<td><b>35<b><\/td>\n<td>Table A.1 \u2013 Geometrical factors and filling factors calculatedfor the standard sapphire resonator  <\/td>\n<\/tr>\n<tr>\n<td><b>37<b><\/td>\n<td>Figure A.5 \u2013 Mode chart for a sapphire resonator  <\/td>\n<\/tr>\n<tr>\n<td><b>38<b><\/td>\n<td>Figure A.6 \u2013 Frequency response of the sapphire resonator  <\/td>\n<\/tr>\n<tr>\n<td><b>39<b><\/td>\n<td>Figure A.7 \u2013 QU versus temperature for the TE021 and the TE012 modes of the sapphire resonator with 360\u00a0nm-thick YBCO films <br \/> Figure A.8 \u2013 The resonant frequency f0 versus temperature for the TE021 and TE012 modes of the sapphire resonator with 360\u00a0nm-thick YBCO films  <\/td>\n<\/tr>\n<tr>\n<td><b>40<b><\/td>\n<td>Figure A.9 \u2013 The temperature dependence of the RSe of YBCO films with the thicknesses of 70\u00a0nm to 360\u00a0nm measured at ~40\u00a0GHz <br \/> Figure A.10 \u2013 The temperature dependence of \u2206\u03bbe for the YBCO films with the thicknesses of 70\u00a0nm and 360\u00a0nm measured at ~40\u00a0GHz   <\/td>\n<\/tr>\n<tr>\n<td><b>41<b><\/td>\n<td>Figure A.11 \u2013 The penetration depths \u03bb of the 360 nm-thick YBCO film measured at 10\u00a0kHz by using the mutual inductance method and at ~40\u00a0GHz by using sapphire resonator <br \/> Figure A.12 \u2013 The temperature dependence of the intrinsic surface resistance RS of YBCO films with the thicknesses of 70\u00a0nm to 360\u00a0nm measured at ~40\u00a0GHz  <\/td>\n<\/tr>\n<tr>\n<td><b>42<b><\/td>\n<td>Figure A.13 \u2013 Comparison of the temperature-dependent value of each term in Equation (A.35) for the TE021 mode of the standard sapphire resonator <br \/> Figure A.14 \u2013 Comparison of the temperature-dependent value of each term in Equation (A.35) for the TE012 mode of the standard sapphire resonator  <\/td>\n<\/tr>\n<tr>\n<td><b>43<b><\/td>\n<td>Figure A.15 \u2013 Temperature dependence of uncertainty in the measured intrinsic RS of YBCO films  <\/td>\n<\/tr>\n<tr>\n<td><b>45<b><\/td>\n<td>Annex B (informative) Uncertainty considerations  <\/td>\n<\/tr>\n<tr>\n<td><b>46<b><\/td>\n<td>Table B.1 \u2013 Output signals from two nominally identical extensometers <br \/> Table B.2 \u2013 Mean values of two output signals <br \/> Table B.3 \u2013 Experimental standard deviations of two output signals <br \/> Table B.4 \u2013 Standard uncertainties of two output signals  <\/td>\n<\/tr>\n<tr>\n<td><b>47<b><\/td>\n<td>Table B.5 \u2013 Coefficient of variations of two output signals  <\/td>\n<\/tr>\n<tr>\n<td><b>49<b><\/td>\n<td>Bibliography  <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"<p><b>Superconductivity &#8211; Electronic characteristic measurements. Intrinsic surface impedance of superconductor films at microwave frequencies<\/b><\/p>\n<table class=\"shortdes-table\" style=\"width: 100%\" border=\"0\" cellspacing=\"0\" cellpadding=\"0\">\n<tbody>\n<tr>\n<td>Published By<\/td>\n<td>Publication Date<\/td>\n<td>Number of Pages<\/td>\n<\/tr>\n<tr>\n<td><a href=\"https:\/\/pdfstandards.shop\/product-category\/publishers\/bsi\/\"><b>BSI<\/b><\/a><\/td>\n<td>2012<\/td>\n<td>52<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":250020,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2641],"product_tag":[],"class_list":{"0":"post-250018","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-bsi","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/250018","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/250020"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=250018"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=250018"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=250018"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}