{"id":261014,"date":"2024-10-19T17:17:31","date_gmt":"2024-10-19T17:17:31","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iso-11452-32016\/"},"modified":"2024-10-25T13:01:27","modified_gmt":"2024-10-25T13:01:27","slug":"bs-iso-11452-32016","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iso-11452-32016\/","title":{"rendered":"BS ISO 11452-3:2016"},"content":{"rendered":"
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
6<\/td>\n | Foreword <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | Introduction <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions 4 Test conditions <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 5 Test apparatus 5.1 TEM cell <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 5.2 Instrumentation 5.3 Test set-up 5.3.1 General <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 5.3.2 Exposure of device under test and wiring harness (for major field coupling to the harness) <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 5.3.3 Exposure of device under test alone (for major field coupling to that device) <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 6 Test procedure 6.1 Test plan 6.2 Test method 6.2.1 General 6.2.2 Test level setting <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 6.2.3 DUT test 6.3 Test report <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | Annex\u00a0A (informative) TEM cell dimensions <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | Annex\u00a0B (informative) Calculations and measurements of TEM-cell frequency range <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | Annex\u00a0C (informative) Installation of external components and low pass filter design <\/td>\n<\/tr>\n | ||||||
25<\/td>\n | Annex\u00a0D (informative) Test setup without low pass filters <\/td>\n<\/tr>\n | ||||||
28<\/td>\n | Annex\u00a0E (informative) Function performance status classification (FPSC) and test severity levels <\/td>\n<\/tr>\n | ||||||
29<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Road vehicles. Component test methods for electrical disturbances from narrowband radiated electromagnetic energy – Transverse electromagnetic (TEM) cell<\/b><\/p>\n |