{"id":290420,"date":"2024-10-19T19:42:30","date_gmt":"2024-10-19T19:42:30","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iso-279112011\/"},"modified":"2024-10-25T16:42:38","modified_gmt":"2024-10-25T16:42:38","slug":"bs-iso-279112011","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iso-279112011\/","title":{"rendered":"BS ISO 27911:2011"},"content":{"rendered":"
This International Standard describes a method for determining the spatial (lateral) resolution of an apertured near-field scanning optical microscope (NSOM) by imaging an object with a size much smaller than the expected resolution. It is applicable to aperture-type NSOMs operated in the transmission, reflection, collection or illumination\/collection mode.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
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9<\/td>\n | Scope Normative references Terms and definitions Symbols and abbreviated terms <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | General information Background information Types of NSOM operation General Classification <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | Control of gap between probe and specimen surface Methods of measuring the lateral resolution of an NSOM Parameters that affect the lateral resolution General <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | Aperture size of NSOM probe Condition of outer metal coating Vertical size of the specimen Lateral size of the specimen <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | Polarization of illumination light Gap between the probe and the specimen surface Collection optics Photodetector Contrast mode Measurement of lateral resolution by imaging a very small ob Background information <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | Selection of the specimen and specimen requirements <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | Setting the parameters before operation of the instrument Data collection and analysis <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | Recording of data <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope<\/b><\/p>\n |