{"id":290636,"date":"2024-10-19T19:43:30","date_gmt":"2024-10-19T19:43:30","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iso-134242013\/"},"modified":"2024-10-25T16:43:54","modified_gmt":"2024-10-25T16:43:54","slug":"bs-iso-134242013","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iso-134242013\/","title":{"rendered":"BS ISO 13424:2013"},"content":{"rendered":"

This International Standard specifies the minimum amount of information required in reports of analyses of thin films on a substrate by XPS. These analyses involve measurement of the chemical composition and thickness of homogeneous thin films, and measurement of the chemical composition as a function of depth of inhomogeneous thin films by angle-resolved XPS, XPS sputter-depth profiling, peak-shape analysis, and variable photon energy XPS.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
6<\/td>\nForeword <\/td>\n<\/tr>\n
7<\/td>\nIntroduction <\/td>\n<\/tr>\n
9<\/td>\nSection sec_1
Section sec_2
Section sec_3
Section sec_4
Section sec_5
Section sec_5.1
1\tScope
2\tNormative references
3\tTerms and definitions
4\tAbbreviated terms
5\tOverview of thin-film analysis by XPS
5.1\tIntroduction <\/td>\n<\/tr>\n
10<\/td>\nTable tab_1 <\/td>\n<\/tr>\n
11<\/td>\nSection sec_5.2
Section sec_5.3
Section sec_5.4
Section sec_5.5
Section sec_5.6
5.2\tGeneral XPS
5.3\tAngle-resolved XPS
5.4\tPeak-shape analysis
5.5\tVariable photon energy XPS
5.6\tXPS with sputter-depth profiling <\/td>\n<\/tr>\n
12<\/td>\nSection sec_6
Section sec_7
Section sec_7.1
Section sec_7.2
Section sec_7.2.1
Section sec_7.2.2
Section sec_7.2.3
Section sec_7.2.4
6\tSpecimen handling
7\tInstrument and operating conditions
7.1\tInstrument calibration
7.2\tOperating conditions <\/td>\n<\/tr>\n
13<\/td>\nSection sec_8
Section sec_8.1
Section sec_8.2
Section sec_8.2.1
Section sec_8.2.2
Section sec_8.2.3
Section sec_8.2.4
8\tReporting XPS method, experimental conditions, analysis parameters, and analytical results
8.1\tXPS method for thin-film analysis
8.2\tExperimental conditions <\/td>\n<\/tr>\n
14<\/td>\nSection sec_8.2.5
Section sec_8.2.6
Section sec_8.2.7
Section sec_8.3
Section sec_8.3.1
Section sec_8.3.2
8.3\tAnalysis parameters <\/td>\n<\/tr>\n
15<\/td>\nSection sec_8.3.3
Section sec_8.3.4
Section sec_8.3.5
Section sec_8.3.6
Section sec_8.4
Table tab_2
8.4\tExamples of summary tables <\/td>\n<\/tr>\n
17<\/td>\nTable tab_3
Section sec_8.5
8.5\tAnalytical Results <\/td>\n<\/tr>\n
18<\/td>\nAnnex sec_A
Annex sec_A.1
Annex sec_A.2
Annex\u00a0A
\n(informative)<\/p>\n

General XPS <\/td>\n<\/tr>\n

20<\/td>\nAnnex sec_A.3 <\/td>\n<\/tr>\n
22<\/td>\nAnnex sec_A.4
Annex sec_A.5 <\/td>\n<\/tr>\n
23<\/td>\nAnnex sec_A.5.1 <\/td>\n<\/tr>\n
24<\/td>\nFigure fig_A.1
Table tab_A.1 <\/td>\n<\/tr>\n
25<\/td>\nFigure fig_A.2 <\/td>\n<\/tr>\n
26<\/td>\nAnnex sec_B
Annex sec_B.1
Annex sec_B.2
Annex\u00a0B
\n(informative)<\/p>\n

Angle-resolved XPS <\/td>\n<\/tr>\n

27<\/td>\nAnnex sec_B.3 <\/td>\n<\/tr>\n
29<\/td>\nAnnex sec_B.3.1 <\/td>\n<\/tr>\n
30<\/td>\nAnnex sec_B.3.2
Annex sec_B.3.3
Annex sec_B.3.4
Annex sec_B.4 <\/td>\n<\/tr>\n
31<\/td>\nFigure fig_B.1 <\/td>\n<\/tr>\n
32<\/td>\nAnnex sec_C
Annex sec_C.1
Annex sec_C.2
Annex\u00a0C
\n(informative)<\/p>\n

Peak-shape analysis <\/td>\n<\/tr>\n

33<\/td>\nFigure fig_C.1
Annex sec_C.3 <\/td>\n<\/tr>\n
34<\/td>\nFigure fig_C.2
Annex sec_C.3.1 <\/td>\n<\/tr>\n
35<\/td>\nAnnex sec_C.3.2
Figure fig_C.3 <\/td>\n<\/tr>\n
36<\/td>\nTable tab_C.1
Annex sec_C.3.3
Table tab_C.2 <\/td>\n<\/tr>\n
38<\/td>\nFigure fig_C.4
Annex sec_C.3.4 <\/td>\n<\/tr>\n
41<\/td>\nTable tab_C.3 <\/td>\n<\/tr>\n
42<\/td>\nFigure fig_C.5
Table tab_C.4 <\/td>\n<\/tr>\n
44<\/td>\nFigure fig_C.6 <\/td>\n<\/tr>\n
45<\/td>\nAnnex sec_D
Annex sec_D.1
Annex sec_D.2
Annex sec_D.3
Annex\u00a0D
\n(informative)<\/p>\n

XPS with sputter-depth profiling <\/td>\n<\/tr>\n

46<\/td>\nFigure fig_D.1 <\/td>\n<\/tr>\n
47<\/td>\nFigure fig_D.2 <\/td>\n<\/tr>\n
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Bibliography <\/td>\n<\/tr>\n
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Reference ref_118 <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2013<\/td>\n58<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":290644,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[1000,2641],"product_tag":[],"class_list":{"0":"post-290636","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-71-040-40","7":"product_cat-bsi","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/290636","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/290644"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=290636"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=290636"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=290636"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}