{"id":335500,"date":"2024-10-19T23:25:19","date_gmt":"2024-10-19T23:25:19","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-16603-20-082014\/"},"modified":"2024-10-25T22:23:01","modified_gmt":"2024-10-25T22:23:01","slug":"bs-en-16603-20-082014","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-16603-20-082014\/","title":{"rendered":"BS EN 16603-20-08:2014"},"content":{"rendered":"

This Standard specifies the general requirements for the qualification, procurement, storage and delivery of photovoltaic assemblies, solar cell assemblies, bare solar cells, coverglasses and protection diodes suitable for space applications.<\/p>\n

This standard does not cover the particular qualification requirements for a specific mission.<\/p>\n

This Standard primarily applies to qualification approval for photovoltaic assemblies, solar cell assemblies, bare solar cells, coverglasses and protection diodes, and to the procurement of these items.<\/p>\n

This standard is limited to crystaline Silicon and single and multi-junction GaAs solar cells with a thickness of more than 50 \u03bcm and does not include thin film solar cell technologies and poly-crystaline solar cells.<\/p>\n

This Standard does not cover the concentration technology, and especially the requirements related to the optical components of a concentrator (e.g. reflector and lens) and their verification (e.g. collimated light source).<\/p>\n

This Standard does not apply to qualification of the solar array subsystem, solar panels, structure and solar array mechanisms.<\/p>\n

This standard may be tailored for the specific characteristic and constrains of a space project in conformance with ECSS-S-ST-00.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
31<\/td>\n5.3.2.1 Outgassing
5.3.2.2 Toxicity <\/td>\n<\/tr>\n
32<\/td>\n5.3.2.3 Flammability
5.3.2.4 Corrosion
5.3.2.5 Magnetism
5.3.2.6 Erosion
5.3.2.7 Atomic oxygen (ATOX)
5.3.3.1 Cell integration <\/td>\n<\/tr>\n
33<\/td>\n5.3.3.2 Stringing
5.3.3.3 Cell interspacing
5.3.3.4 Sectioning
5.3.3.5 Reverse bias protection
5.3.3.6 Insulation <\/td>\n<\/tr>\n
34<\/td>\n5.3.3.7 Derating
5.3.3.8 Redundancy
5.3.3.9 Fault tolerance
5.3.3.10 Fatigue resistance <\/td>\n<\/tr>\n
35<\/td>\n5.3.3.11 Adherence to substrate
5.3.3.12 Adhesive uniformity
5.3.3.13 Electrostatic discharge (ESD)
5.3.3.14 Electromagnetic compatibility (EMC)
5.3.3.15 Repairability <\/td>\n<\/tr>\n
36<\/td>\n5.4.3.1 Overview
5.4.3.2 Mass measurement
5.4.3.3 Wet insulation test <\/td>\n<\/tr>\n
37<\/td>\n5.4.3.4 Adherence to substrate
5.4.3.5 Visual inspection
5.4.3.6 Continuity check <\/td>\n<\/tr>\n
38<\/td>\n5.5.1.1 Purpose
5.5.1.2 Process <\/td>\n<\/tr>\n
39<\/td>\n5.5.1.3 Fatigue thermal cycling test <\/td>\n<\/tr>\n
42<\/td>\n5.5.1.4 Humidity <\/td>\n<\/tr>\n
43<\/td>\n5.5.1.5 Electrostatic discharge (ESD) test
5.5.1.6 Erosion of materials
5.5.1.7 EMC
5.5.2.1 Purpose
5.5.2.2 Applicability <\/td>\n<\/tr>\n
44<\/td>\n5.5.2.3 Deliverables
5.5.2.4 Process
5.5.3.1 Add-on mass measurement
5.5.3.2 Full visual inspection <\/td>\n<\/tr>\n
50<\/td>\n5.5.3.3 Electrical health check <\/td>\n<\/tr>\n
51<\/td>\n5.5.3.4 Electrical performance measurement <\/td>\n<\/tr>\n
52<\/td>\n5.5.3.5 Capacitance test
5.5.3.6 Bake-out <\/td>\n<\/tr>\n
53<\/td>\n5.5.3.7 Thermal cycling acceptance test
5.5.3.8 Reflectance <\/td>\n<\/tr>\n
54<\/td>\n5.5.3.9 X-Ray
5.5.3.10 Substrate integrity
5.5.3.11 Vacuum thermal cycling <\/td>\n<\/tr>\n
59<\/td>\n6.3.3.1 Purpose
6.3.3.2 Process
6.3.3.3 Pass-fail criteria <\/td>\n<\/tr>\n
61<\/td>\n6.4.2.1 Production and test schedule
6.4.2.2 Qualification test samples
6.4.2.3 Qualification testing <\/td>\n<\/tr>\n
62<\/td>\n6.4.3.1 Visual inspection (VI) <\/td>\n<\/tr>\n
64<\/td>\n6.4.3.2 Dimensions and weight (DW) <\/td>\n<\/tr>\n
65<\/td>\n6.4.3.3 Electrical performance (EP) <\/td>\n<\/tr>\n
66<\/td>\n6.4.3.4 Temperature coefficients (TC)
6.4.3.5 Spectral response (SR) <\/td>\n<\/tr>\n
67<\/td>\n6.4.3.6 Thermo-optical data (TO) <\/td>\n<\/tr>\n
68<\/td>\n6.4.3.7 Thermal cycling (CY)
6.4.3.8 Humidity and temperature (HT)
6.4.3.9 Coating adherence (CA) <\/td>\n<\/tr>\n
69<\/td>\n6.4.3.10 Interconnector adherence (IA)
6.4.3.11 Electron irradiation (EI) <\/td>\n<\/tr>\n
70<\/td>\n6.4.3.12 Photon irradiation and temperature annealing (PH) <\/td>\n<\/tr>\n
71<\/td>\n6.4.3.13 Surface conductivity (SC)
6.4.3.14 Solar Cell Reverse Bias Test (RB)
6.4.3.15 Ultraviolet exposure test (UV) <\/td>\n<\/tr>\n
72<\/td>\n6.4.3.16 Capacitance test (CT) <\/td>\n<\/tr>\n
73<\/td>\n6.4.3.17 Flatness test (FT)
6.4.3.18 Life test (LT) <\/td>\n<\/tr>\n
75<\/td>\n7.1.1.1 Tests for qualification and procurement
7.1.1.2 Conditions and methods of tests <\/td>\n<\/tr>\n
76<\/td>\n7.1.1.3 Responsibility of supplier for the performance of tests and inspections
7.1.1.4 Preliminary characterization <\/td>\n<\/tr>\n
78<\/td>\n7.3.2.1 Test other than electrical performance
7.3.2.2 Electrical performance <\/td>\n<\/tr>\n
81<\/td>\n7.4.2.1 Production and test schedule
7.4.2.2 Qualification test samples
7.4.2.3 Qualification testing <\/td>\n<\/tr>\n
82<\/td>\n7.5.1.1 Applicability
7.5.1.2 Test process
7.5.1.3 Deviations
7.5.1.4 Solar cell defects <\/td>\n<\/tr>\n
83<\/td>\n7.5.1.5 Solar cell contact area defects <\/td>\n<\/tr>\n
84<\/td>\n7.5.3.1 Purpose
7.5.3.2 Process <\/td>\n<\/tr>\n
86<\/td>\n7.5.5.1 Purpose
7.5.5.2 Process
7.5.6.1 Overview <\/td>\n<\/tr>\n
87<\/td>\n7.5.6.2 Hemispherical reflectance (HR)
7.5.6.3 Coverglass gain-loss (GL)
7.5.6.4 Solar absorptance (as)
7.5.7.1 HT1 for qualification testing (subgroup O) <\/td>\n<\/tr>\n
88<\/td>\n7.5.7.2 HT2 for qualification (subgroup A) and acceptance testing
7.5.8.1 Purpose
7.5.8.2 Process <\/td>\n<\/tr>\n
89<\/td>\n7.5.9.1 Purpose
7.5.9.2 Process
7.5.9.3 Pass fail criteria
7.5.10.1 Purpose
7.5.10.2 Process
7.5.10.3 Pass fail criteria
7.5.11.1 Purpose
7.5.11.2 Process <\/td>\n<\/tr>\n
90<\/td>\n7.5.11.3 Pass fail criteria
7.5.12.1 Purpose
7.5.12.2 Process
7.5.13.1 Purpose
7.5.13.2 Process <\/td>\n<\/tr>\n
91<\/td>\n7.5.14.1 Purpose
7.5.14.2 Process <\/td>\n<\/tr>\n
92<\/td>\n7.5.15.1 Purpose
7.5.15.2 Process
7.5.16.1 Purpose
7.5.16.2 Process <\/td>\n<\/tr>\n
93<\/td>\n7.5.16.3 Pass-fail criteria
7.5.17.1 Purpose
7.5.17.2 Process
7.5.18.1 Purpose
7.5.18.2 Process
7.5.19.1 Purpose
7.5.19.2 Process
7.5.19.3 Pass\/fail criteria. <\/td>\n<\/tr>\n
97<\/td>\n8.3.1.1 Tests for qualification and procurement
8.3.1.2 Conditions and methods of tests
8.3.1.3 Responsibility of supplier for the performance of tests and inspections <\/td>\n<\/tr>\n
100<\/td>\n8.6.2.1 Production and test schedule
8.6.2.2 Qualification test samples
8.6.2.3 Qualification testing <\/td>\n<\/tr>\n
102<\/td>\n8.7.1.1 General
8.7.1.2 Deviations
8.7.1.3 Defects <\/td>\n<\/tr>\n
104<\/td>\n8.7.3.1 Bulk and surface resistivity
8.7.3.2 Refractive index
8.7.4.1 Dimension and weight <\/td>\n<\/tr>\n
105<\/td>\n8.7.4.2 Density
8.7.4.3 Thickness
8.7.4.4 Edge parallelism
8.7.4.5 Perpendicularity of sides
8.7.5.1 Reflectance <\/td>\n<\/tr>\n
106<\/td>\n8.7.5.2 Reflectance cut-on
8.7.5.3 Reflectance cut-off
8.7.5.4 Reflectance bandwidth <\/td>\n<\/tr>\n
108<\/td>\n8.7.11.1 HT1 for qualification testing (subgroup O) <\/td>\n<\/tr>\n
109<\/td>\n8.7.11.2 HT2 for acceptance testing
8.7.12.1 Purpose
8.7.12.2 Process <\/td>\n<\/tr>\n
110<\/td>\n8.7.13.1 Purpose
8.7.13.2 Process
8.7.14.1 Purpose
8.7.14.2 Process <\/td>\n<\/tr>\n
113<\/td>\n9.2.1.1 Tests for qualification and procurement <\/td>\n<\/tr>\n
114<\/td>\n9.2.1.2 Conditions and methods of tests
9.2.1.3 Responsibility of supplier for the performance of tests and inspections <\/td>\n<\/tr>\n
115<\/td>\n9.2.2.1 Integral protection diodes
9.2.2.2 External protection diodes <\/td>\n<\/tr>\n
117<\/td>\n9.4.5.1 Production and test schedule
9.4.5.2 Diode characterization for acceptance (DCA) <\/td>\n<\/tr>\n
120<\/td>\n9.5.4.1 Production and test schedule <\/td>\n<\/tr>\n
121<\/td>\n9.5.4.2 Qualification test samples
9.5.4.3 Qualification testing
9.6.2.1 Applicability <\/td>\n<\/tr>\n
122<\/td>\n9.6.2.2 Test process
9.6.2.3 Deviations
9.6.2.4 Protection diode defects
9.6.2.5 External protection diode contact area defects <\/td>\n<\/tr>\n
123<\/td>\n9.6.4.1 Purpose
9.6.4.2 Process
9.6.5.1 Purpose
9.6.5.2 Process <\/td>\n<\/tr>\n
124<\/td>\n9.6.6.1 Purpose
9.6.6.2 Process
9.6.7.1 Purpose
9.6.7.2 Process
9.6.7.3 Pass Fail Criteria <\/td>\n<\/tr>\n
125<\/td>\n9.6.8.1 Purpose
9.6.8.2 Process
9.6.8.3 Pass Fail Criteria
9.6.9.1 Purpose
9.6.9.2 Process
9.6.9.3 Pass Fail Criteria
9.6.10.1 Purpose <\/td>\n<\/tr>\n
126<\/td>\n9.6.10.2 Process
9.6.11.1 Purpose
9.6.11.2 Process
9.6.12.1 Purpose
9.6.12.2 Process <\/td>\n<\/tr>\n
127<\/td>\n9.6.13.1 Purpose
9.6.13.2 Process
9.6.14.1 Purpose <\/td>\n<\/tr>\n
128<\/td>\n9.6.14.2 Process
9.6.15.1 Purpose
9.6.15.2 Process <\/td>\n<\/tr>\n
129<\/td>\n9.6.15.3 Pass-fail criteria
9.6.16.1 Purpose
9.6.16.2 Process
9.6.16.3 Pass-fail criteria <\/td>\n<\/tr>\n
130<\/td>\n9.6.17.1 Purpose
9.6.17.2 Process <\/td>\n<\/tr>\n
132<\/td>\n9.6.17.3 Pass-fail criteria
9.6.18.1 Purpose
9.6.18.2 Process <\/td>\n<\/tr>\n
134<\/td>\n9.6.18.3 Pass-fail criteria <\/td>\n<\/tr>\n
136<\/td>\n10.1.1.1 AM0 spectrum
10.1.1.2 Total Irradiance of the Sun simulator
10.1.1.3 Spectral distribution of the Sun simulator <\/td>\n<\/tr>\n
146<\/td>\n10.2.2.1 Selection of secondary working standards
10.2.2.2 Irradiated secondary working standards
10.2.2.3 Secondary working standards performance requirements <\/td>\n<\/tr>\n
148<\/td>\n10.2.6.1 Sun simulator calibration
10.2.6.2 Sun simulator maintenance <\/td>\n<\/tr>\n
149<\/td>\n11.1.1.1 Introduction
11.1.1.2 Description <\/td>\n<\/tr>\n
150<\/td>\n11.1.3.1 Preparation of the measurement equipment <\/td>\n<\/tr>\n
151<\/td>\n11.1.3.2 Process for calibration of the test equipment <\/td>\n<\/tr>\n
153<\/td>\n11.1.3.3 Measurement of the cell with the network analyser <\/td>\n<\/tr>\n
154<\/td>\n11.1.4.1 Correction of the measurement with respect to the actual impedance of the shunt (impedance values from the B\/A measurements)
11.1.4.2 Modelling <\/td>\n<\/tr>\n
157<\/td>\n11.2.1.1 Introduction <\/td>\n<\/tr>\n
158<\/td>\n11.2.1.2 Description
11.2.2.1 Measurement equipment set-up <\/td>\n<\/tr>\n
159<\/td>\n11.2.2.2 Calibration of the measurement equipment
11.2.2.3 Performance measurement
11.2.2.4 Data processing <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Space engineering – Photovoltaic assemblies and components<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2014<\/td>\n198<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":335505,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2641],"product_tag":[],"class_list":{"0":"post-335500","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-bsi","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/335500","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/335505"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=335500"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=335500"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=335500"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}