IEC 60747-17:2020(E) specifies the terminology, essential ratings, characteristics, safety test and the measuring methods of magnetic coupler and capacitive coupler. It specifies the principles and requirements of insulation and isolation characteristics for magnetic and capacitive couplers for basic insulation and reinforced insulation. This first edition cancels and replaces IEC PAS 60747-17:2011. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to IEC PAS 60747-17:2011: a) introduced lifetime safety factors for improved life time consideration, to comply with widely recognized aging mechanisms of silicone dioxide (TDDB) and thin film polymer isolation layers; b) significantly improved “end of life testing” paragraph and statistical life time consideration by adding detailed description on process, safety factors, methods of generating data points and respective lifetime interpolations as well as being specific on minimum amount of samples required; c) introduced concept of certification by similarity, including Annex A, giving guidance on qualification considerations and required certification process; d) alternative pulse shape allowed for surge pulse testing, to avoid issues due to surge tester availability; e) various improvements throughout the standard: definitions, for example type of coupler have been improved, introduction of surge impulse VIMP rating, usage of glass transition temperature, pre-conditioning have been redefined for improved usability and better compatibility with today\u2019s design and functionality of couplers, available mold compounds, etc.<\/p>\n
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| 2<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
| 5<\/td>\n | Annex ZA(normative)Normative references to international publicationswith their corresponding European publications <\/td>\n<\/tr>\n | ||||||
| 7<\/td>\n | English CONTENTS <\/td>\n<\/tr>\n | ||||||
| 10<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
| 12<\/td>\n | 1 Scope 2 Normative references <\/td>\n<\/tr>\n | ||||||
| 13<\/td>\n | 3 Terms and definitions <\/td>\n<\/tr>\n | ||||||
| 20<\/td>\n | Figures Figure 1 \u2013 Time intervals for methods a and b of the test voltage <\/td>\n<\/tr>\n | ||||||
| 24<\/td>\n | 4 Electrical characteristics \u2013 Coupler logic and timing definitions Tables Table 1 \u2013 Overview on characteristics and symbols <\/td>\n<\/tr>\n | ||||||
| 25<\/td>\n | 5 Coupler for protection against electrical shock 5.1 General 5.2 Type 5.3 Ratings 5.3.1 General 5.3.2 Safety limiting values 5.3.3 Functional ratings 5.3.4 Rated isolation voltages 5.4 Electrical safety requirements <\/td>\n<\/tr>\n | ||||||
| 26<\/td>\n | 5.5 Electrical, environmental and\/or endurance test information 5.5.1 General Table 2 \u2013 Datasheet characteristics <\/td>\n<\/tr>\n | ||||||
| 27<\/td>\n | Table 3 \u2013 Tests and test sequence for coupler providing basic insulationand reinforced insulation for protection against electrical shock <\/td>\n<\/tr>\n | ||||||
| 28<\/td>\n | 5.5.2 Routine test 5.5.3 Sample test 5.5.4 Maximum surge isolation voltage Table 4 \u2013 Test conditions <\/td>\n<\/tr>\n | ||||||
| 29<\/td>\n | 5.5.5 Type test Figure 2 \u20131,2\/50 \u03bcs surge pulse according 61000-4-5:2014 allowed as equivalent impulse for isolation testing <\/td>\n<\/tr>\n | ||||||
| 36<\/td>\n | Figure 3 \u2013 Determination of time to failure (referring to method in 5.5.5.8) <\/td>\n<\/tr>\n | ||||||
| 37<\/td>\n | Figure 4 \u2013 Determination of working voltage (referringto method in 5.5.5.8 for exponential model) <\/td>\n<\/tr>\n | ||||||
| 38<\/td>\n | Figure 5 \u2013 Determination of working voltage (referringto method in 5.5.5.8 for non-linear model) <\/td>\n<\/tr>\n | ||||||
| 40<\/td>\n | 6 Measuring methods for couplers 6.1 General 6.2 Isolation capacitance (ClO) 6.2.1 Purpose 6.2.2 Circuit diagram <\/td>\n<\/tr>\n | ||||||
| 41<\/td>\n | 6.2.3 Measurement procedure 6.2.4 Precautions to be observed 6.2.5 Special conditions 6.3 Isolation resistance between input and output, RlO 6.3.1 Purpose 6.3.2 Circuit diagram Figure 6 \u2013 Isolation capacitance measurement circuit <\/td>\n<\/tr>\n | ||||||
| 42<\/td>\n | 6.3.3 Precautions to be observed 6.3.4 Measurement procedure 6.3.5 Special conditions 6.4 Isolation test 6.4.1 Purpose 6.4.2 Circuit diagram Figure 7 \u2013 Isolation resistance measurement circuit <\/td>\n<\/tr>\n | ||||||
| 43<\/td>\n | 6.4.3 Test procedure 6.4.4 Requirements Figure 8 \u2013 Isolation voltage measurement circuit <\/td>\n<\/tr>\n | ||||||
| 44<\/td>\n | 6.5 Partial discharges of coupler 6.5.1 Purpose 6.5.2 Circuit diagram 6.5.3 Description of Figure 9 test circuit and requirements Figure 9 \u2013 Partial discharge test circuit <\/td>\n<\/tr>\n | ||||||
| 45<\/td>\n | 6.5.4 Test procedure 6.5.5 Description of calibration circuit (see Figure 10) Figure 10 \u2013 Connections for the calibration of the complete test arrangement <\/td>\n<\/tr>\n | ||||||
| 46<\/td>\n | 6.5.6 Test methods 6.5.7 Specified conditions Table 5 \u2013 Safety factor F <\/td>\n<\/tr>\n | ||||||
| 47<\/td>\n | 6.5.8 Test voltage conditions 6.6 Switching times of couplers 6.6.1 Purpose 6.6.2 Circuit diagram Table 6 \u2013 Specified conditions for method a and method b <\/td>\n<\/tr>\n | ||||||
| 48<\/td>\n | 6.6.3 Measurement procedure Figure 11 \u2013 Switching time test circuit Figure 12 \u2013 Transition time waveform measurement <\/td>\n<\/tr>\n | ||||||
| 49<\/td>\n | 6.6.4 Specified conditions 6.7 Measuring methods of common-mode transient immunity (CMTI) for magnetic and capacitive couplers 6.7.1 Purpose 6.7.2 Circuit diagram Figure 13 \u2013 Propagation delay time waveform measurement <\/td>\n<\/tr>\n | ||||||
| 50<\/td>\n | 6.7.3 Precautions to be observed Figure 14 \u2013 Static versus dynamic data source signal VI Figure 15 \u2013 Common-mode transient immunity (CMTI) test setup for both static and dynamic testing <\/td>\n<\/tr>\n | ||||||
| 51<\/td>\n | 6.7.4 Static CMTI measuring procedure <\/td>\n<\/tr>\n | ||||||
| 52<\/td>\n | 6.7.5 Specified conditions 6.7.6 Dynamic CMTI measuring procedure Figure 16 \u2013 Static common-mode transient immunity (CMTI)and VCM and low to high data transition waveform <\/td>\n<\/tr>\n | ||||||
| 53<\/td>\n | Annex A (informative)Qualification guidance <\/td>\n<\/tr>\n | ||||||
| 54<\/td>\n | Figure A.1 \u2013 Lifetime verification Table A.1 \u2013 Front end process changes within component <\/td>\n<\/tr>\n | ||||||
| 55<\/td>\n | Table A.2 \u2013 Front End Process Changes within SiO\/SiN\/imide-passivation Table A.3 \u2013 Layout changes Table A.4 \u2013 Backend changes <\/td>\n<\/tr>\n | ||||||
| 56<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Semiconductor devices – Magnetic and capacitive coupler for basic and reinforced insulation<\/b><\/p>\n |