{"id":363371,"date":"2024-10-20T01:45:16","date_gmt":"2024-10-20T01:45:16","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/asme-bpvc-v-2017\/"},"modified":"2024-10-26T02:45:01","modified_gmt":"2024-10-26T02:45:01","slug":"asme-bpvc-v-2017","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/asme\/asme-bpvc-v-2017\/","title":{"rendered":"ASME BPVC V 2017"},"content":{"rendered":"

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PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
5<\/td>\nTable of Contents <\/td>\n<\/tr>\n
26<\/td>\nList of Sections <\/td>\n<\/tr>\n
27<\/td>\nINTERPRETATIONS
CODE CASES <\/td>\n<\/tr>\n
28<\/td>\nForeword <\/td>\n<\/tr>\n
30<\/td>\nStatement of Policy on the Use of the Certification Mark and Code Authorization in Advertising
Statement of Policy on the Use of ASME Marking to Identify Manufactured Items <\/td>\n<\/tr>\n
31<\/td>\nSubmittal of Technical Inquiries to the Boiler and Pressure Vessel Standards Committees
1 Introduction
2 Inquiry Format <\/td>\n<\/tr>\n
32<\/td>\n3 Code Revisions or Additions
4 Code Cases
5 Code Interpretations <\/td>\n<\/tr>\n
33<\/td>\n6 Submittals <\/td>\n<\/tr>\n
34<\/td>\nPersonnel <\/td>\n<\/tr>\n
53<\/td>\nASTM Personnel <\/td>\n<\/tr>\n
54<\/td>\nSummary of Changes <\/td>\n<\/tr>\n
61<\/td>\nList of Changes in Record Number Order <\/td>\n<\/tr>\n
65<\/td>\nCross-Referencing and Stylistic Changes in the Boiler and Pressure Vessel Code
Subparagraph Breakdowns\/Nested Lists Hierarchy
Footnotes
Submittal of Technical Inquiries to the Boiler and Pressure Vessel Standards Committees
Cross-References <\/td>\n<\/tr>\n
67<\/td>\nSubsection A Nondestructive Methods of Examination
Article 1 General Requirements
T-110 Scope
T-120 General <\/td>\n<\/tr>\n
68<\/td>\nT-130 Equipment
T-150 Procedure <\/td>\n<\/tr>\n
69<\/td>\nT-160 Calibration
T-170 Examinations and Inspections
T-180 Evaluation
T-190 Records\/Documentation <\/td>\n<\/tr>\n
71<\/td>\nMandatory Appendix I Glossary of Terms for Nondestructive Examination
I-110 Scope
I-120 General Requirements
I-121 GENERAL TERMS <\/td>\n<\/tr>\n
89<\/td>\nI-130 UT \u2014 Ultrasonics <\/td>\n<\/tr>\n
90<\/td>\nMandatory Appendix II Supplemental Personnel Qualification Requirements for NDE Certification
II-110 Scope
II-120 General Requirements
II-121 LEVEL I AND LEVEL II TRAINING AND EXPERIENCE REQUIREMENTS
II-122 LEVEL I AND LEVEL II EXAMINATIONS
II-123 LEVEL III REQUIREMENTS
II-124 TRAINING OUTLINES <\/td>\n<\/tr>\n
91<\/td>\nII-121-1 Initial Training and Experience Requirements for CR and DR Techniques <\/td>\n<\/tr>\n
92<\/td>\nII-121-2 Additional Training and Experience Requirements for PAUT and TOFD Ultrasonic Techniques
II-122.1 Minimum CR and DR Examination Questions
II-122.2 Minimum Ultrasonic Technique Examination Questions <\/td>\n<\/tr>\n
93<\/td>\nNonmandatory Appendix A Imperfection vs Type of NDE Method
A-110 Scope
A-110 Imperfection vs. Type of NDE Method <\/td>\n<\/tr>\n
95<\/td>\nArticle 2 Radiographic Examination
T-210 Scope
T-220 General Requirements
T-221 Procedure Requirements
T-222 Surface Preparation
T-223 Backscatter Radiation
T-224 System of Identification
T-225 Monitoring Density Limitations of Radiographs
T-226 Extent of Examination
T-230 Equipment and Materials
T-231 Film <\/td>\n<\/tr>\n
96<\/td>\nT-232 Intensifying Screens
T-233 Image Quality Indicator (IQI) Design
T-233.1 Hole-Type IQI Designation, Thickness, and Hole Diameters
T-233.2 Wire IQI Designation, Wire Diameter, and Wire Identity <\/td>\n<\/tr>\n
97<\/td>\nT-234 Facilities for Viewing of Radiographs
T-260 Calibration
T-261 Source Size
T-262 Densitometer and Step Wedge Comparison Film
T-270 Examination
T-271 Radiographic Technique <\/td>\n<\/tr>\n
98<\/td>\nT-272 Radiation Energy
T-273 Direction of Radiation
T-274 Geometric Unsharpness
T-275 Location Markers <\/td>\n<\/tr>\n
99<\/td>\nT-275 Location Marker Sketches <\/td>\n<\/tr>\n
100<\/td>\nT-276 IQI Selection
T-277 Use of IQIs to Monitor Radiographic Examination <\/td>\n<\/tr>\n
101<\/td>\nT-276 IQI Selection <\/td>\n<\/tr>\n
102<\/td>\nT-280 Evaluation
T-281 Quality of Radiographs
T-282 Radiographic Density
T-283 IQI Sensitivity <\/td>\n<\/tr>\n
103<\/td>\nT-284 Excessive Backscatter
T-285 Evaluation by Manufacturer
T-290 Documentation
T-291 Radiographic Technique Documentation Details
T-292 Radiograph Review Form
T-283 Equivalent Hole-Type IQI Sensitivity <\/td>\n<\/tr>\n
104<\/td>\nMandatory Appendix I In-Motion Radiography
I-210 Scope
I-220 General Requirements
I-223 Backscatter Detection Symbol Location
I-260 Calibration
I-263 Beam Width
I-270 Examination
I-274 Geometric and In-Motion Unsharpness
I-275 Location Markers
I-277 Placement and Number of IQIs <\/td>\n<\/tr>\n
105<\/td>\nI-279 Repaired Area
I-263 Beam Width Determination <\/td>\n<\/tr>\n
106<\/td>\nMandatory Appendix II Real-Time Radioscopic Examination
II-210 Scope
II-220 General Requirements
II-221 Procedure Requirements
II-230 Equipment and Materials
II-231 Radioscopic Examination Record
II-235 Calibration Block
II-236 Calibrated Line Pair Test Pattern and Step Wedge
II-237 Equivalent Performance Level
II-260 Calibration
II-263 System Performance Measurement
II-264 Measurement With a Calibration Block <\/td>\n<\/tr>\n
107<\/td>\nII-270 Examination
II-278 System Configuration
II-280 Evaluation
II-286 Factors Affecting System Performance
II-290 Documentation
II-291 Radioscopic Technique Information
II-292 Evaluation by Manufacturer <\/td>\n<\/tr>\n
108<\/td>\nMandatory Appendix III Digital Image Acquisition, Display, and Storage for Radiography and Radioscopy
III-210 Scope
III-220 General Requirements
III-221 Procedure Requirements
III-222 Original Image Artifacts
III-230 Equipment and Materials
III-231 Digital Image Examination Record
III-234 Viewing Considerations
III-236 Calibrated Optical Line Pair Test Pattern and Optical Density Step Wedge
III-250 Image Acquisition and Storage
III-255 Area of Interest
III-258 System Configuration
III-260 Calibration
III-263 System Performance Measurement
III-280 Evaluation
III-286 Factors Affecting System Performance <\/td>\n<\/tr>\n
109<\/td>\nIII-287 System-Induced Artifacts
III-290 Documentation
III-291 Digital Imaging Technique Information
III-292 Evaluation by Manufacturer <\/td>\n<\/tr>\n
110<\/td>\nMandatory Appendix IV Interpretation, Evaluation, and Disposition of Radiographic and Radioscopic Examination Test Results Produced by the Digital Image Acquisition and Display Process
IV-210 Scope
IV-220 General Requirements
IV-221 Procedure Requirements
IV-222 Original Image Artifacts
IV-230 Equipment and Materials
IV-231 Digital Image Examination Record
IV-234 Viewing Considerations
IV-236 Calibrated Optical Line Pair Test Pattern and Optical Density Step Wedge <\/td>\n<\/tr>\n
111<\/td>\nIV-250 Image Acquisition, Storage, and Interpretation
IV-255 Area of Interest
IV-258 System Configuration
IV-260 Calibration
IV-263 System Performance Measurement
IV-280 Evaluation
IV-286 Factors Affecting System Performance
IV-287 System-Induced Artifacts
IV-290 Documentation
IV-291 Digital Imaging Technique Information
IV-292 Evaluation by Manufacturer <\/td>\n<\/tr>\n
112<\/td>\nMandatory Appendix V Glossary of Terms for Radiographic Examination <\/td>\n<\/tr>\n
113<\/td>\nMandatory Appendix VI Acquisition, Display, Interpretation, and Storage of Digital Images of Radiographic Film for Nuclear Applications
VI-210 Scope
VI-220 General Requirements
VI-221 Supplemental Requirements
VI-222 Written Procedure
VI-223 Personnel Requirements
VI-230 Equipment and Materials
VI-231 System Features
VI-232 System Spot Size <\/td>\n<\/tr>\n
114<\/td>\nVI-240 System Performance Requirements
VI-241 Spatial Resolution
VI-242 Contrast Sensitivity
VI-243 Dynamic Range
VI-244 Spatial Linearity
VI-250 Technique
VI-251 Spatial Resolution Evaluation
VI-252 Contrast Sensitivity Evaluation
VI-253 Dynamic Range Evaluation
VI-254 Spatial Linearity Evaluation
VI-260 Demonstration of System Performance
VI-261 Procedure Demonstration
VI-262 Processed Targets
VI-263 Changes in Essential Variables
VI-264 Frequency of Verification <\/td>\n<\/tr>\n
115<\/td>\nVI-265 Changes in System Performance
VI-270 Examination
VI-271 System Performance Requirements
VI-272 Artifacts
VI-273 Calibration
VI-280 Evaluation
VI-281 Process Evaluation
VI-282 Interpretation
VI-283 Baseline
VI-290 Documentation
VI-291 Reporting Requirements
VI-292 Archiving <\/td>\n<\/tr>\n
116<\/td>\nMandatory Appendix VI Supplement A
VI-A-210 Scope
VI-A-220 General
VI-A-221 Reference Film
VI-A-230 Equipment and Materials
VI-A-231 Reference Targets
VI-A-232 Spatial Resolution Targets
VI-A-233 Constrast Sensitivity Targets
VI-A-234 Dynamic Range Targets
VI-A-235 Spatial Linearity Targets
VI-A-240 Miscellaneous Requirements <\/td>\n<\/tr>\n
117<\/td>\nVI-A-1 Reference Film <\/td>\n<\/tr>\n
118<\/td>\nVI-A-241 Material
VI-A-242 Film Size
VI-A-243 Spatial Resolution
VI-A-244 Density
VI-A-245 Linearity <\/td>\n<\/tr>\n
119<\/td>\nMandatory Appendix VII Radiographic Examination of Metallic Castings
VII-210 Scope
VII-220 General Requirements
VII-224 System of Identification
VII-270 Examination
VII-271 Radiographic Technique
VII-276 IQI Selection
VII-280 Evaluation
VII-282 Radiographic Density
VII-290 Documentation
VII-293 Layout Details <\/td>\n<\/tr>\n
120<\/td>\nMandatory Appendix VIII Radiography Using Phosphor Imaging Plate
VIII-210 Scope
VIII-220 General Requirements
VIII-221 Procedure Requirements
VIII-225 Monitoring Density Limitations of Radiographs
VIII-230 Equipment and Materials
VIII-231 Phosphor Imaging Plate
VIII-234 Facilities for Viewing of Radiographs
VIII-260 Calibration
VIII-262 Densitometer and Step Wedge Comparison Film
VIII-270 Examination
VIII-277 Use of IQIs to Monitor Radiographic Examination <\/td>\n<\/tr>\n
121<\/td>\nVIII-280 Evaluation
VIII-281 System-Induced Artifacts
VIII-282 Image Brightness
VIII-283 IQI Sensitivity
VIII-284 Excessive Backscatter
VIII-287 Dimensional Measuring
VIII-288 Interpretation
VIII-290 Documentation
VIII-291 Digital Imaging Technique Documentation Details <\/td>\n<\/tr>\n
123<\/td>\nMandatory Appendix IX Radiography Using Digital Detector Systems
IX-210 Scope
IX-220 General Requirements
IX-221 Procedure Requirements
IX-225 Monitoring Density Limitations of Radiographs
IX-230 Equipment and Materials
IX-231 Film
IX-232 Intensifying Screens
IX-234 Facilities for Viewing of Radiographs
IX-260 Calibration
IX-262 Densitometer and Step Wedge Comparison Film <\/td>\n<\/tr>\n
124<\/td>\nIX-263 Beam Width
IX-270 Examination
IX-274 Geometric and In-Motion Unsharpness
IX-275 Location Markers
IX-263 Beam Width Determination <\/td>\n<\/tr>\n
125<\/td>\nIX-277 Use of IQIs to Monitor Radiographic Examination
IX-280 Evaluation
IX-281 Quality of Digital Images
IX-282 Image Brightness
IX-283 IQI Sensitivity
IX-284 Excessive Backscatter <\/td>\n<\/tr>\n
126<\/td>\nIX-287 Dimensional Measuring
IX-288 Interpretation
IX-290 Documentation
IX-291 Digital Imaging Technique Documentation Details <\/td>\n<\/tr>\n
127<\/td>\nNonmandatory Appendix A Recommended Radiographic Technique Sketches for Pipe or Tube Welds
A-210 Scope <\/td>\n<\/tr>\n
128<\/td>\nA-210-1 Single-Wall Radiographic Techniques <\/td>\n<\/tr>\n
129<\/td>\nA-210-2 Double-Wall Radiographic Techniques <\/td>\n<\/tr>\n
130<\/td>\nNonmandatory Appendix C Hole-Type IQI Placement Sketches for Welds
C-210 Scope <\/td>\n<\/tr>\n
131<\/td>\nC-210-1 Side and Top Views of Hole-Type IQI Placements <\/td>\n<\/tr>\n
132<\/td>\nC-210-2 Side and Top Views of Hole-Type IQI Placements <\/td>\n<\/tr>\n
133<\/td>\nC-210-3 Side and Top Views of Hole-Type IQI Placements <\/td>\n<\/tr>\n
134<\/td>\nC-210-4 Side and Top Views of Hole-Type IQI Placements <\/td>\n<\/tr>\n
135<\/td>\nNonmandatory Appendix D Number of IQIs (Special Cases)
D-210 Scope
D-210-1 Complete Circumference Cylindrical Component
D-210-2 Section of Circumference 240 deg or More Cylindrical Component (Example is Alternate Intervals)
D-210-3 Section(s) of Circumference Less Than 240 deg Cylindrical Component <\/td>\n<\/tr>\n
136<\/td>\nD-210-4 Section(s) of Circumference Equal to or More Than 120 deg and Less Than 240 deg Cylindrical Component Option
D-210-5 Complete Circumferential Welds Spherical Component
D-210-6 Welds in Segments of Spherical Component
D-210-7 Plan View A-A <\/td>\n<\/tr>\n
137<\/td>\nD-210-8 Array of Objects in a Circle <\/td>\n<\/tr>\n
138<\/td>\nArticle 4 Ultrasonic Examination Methods for Welds
T-410 Scope
T-420 General
T-421 Written Procedure Requirements
T-430 Equipment
T-431 Instrument Requirements
T-432 Search Units <\/td>\n<\/tr>\n
139<\/td>\nT-433 Couplant
T-421 Requirements of an Ultrasonic Examination Procedure <\/td>\n<\/tr>\n
140<\/td>\nT-434 Calibration Blocks <\/td>\n<\/tr>\n
141<\/td>\nT-434.1.7.2 Ratio Limits for Curved Surfaces <\/td>\n<\/tr>\n
142<\/td>\nT-434.2.1 Nonpiping Calibration Blocks <\/td>\n<\/tr>\n
143<\/td>\nT-434.3-1 Calibration Block for Piping <\/td>\n<\/tr>\n
144<\/td>\nT-434.3-2 Alternate Calibration Block for Piping <\/td>\n<\/tr>\n
145<\/td>\nT-434.4.1 Calibration Block for Technique One <\/td>\n<\/tr>\n
146<\/td>\nT-434.4.2.1 Alternate Calibration Block for Technique One <\/td>\n<\/tr>\n
147<\/td>\nT-434.4.2.2 Alternate Calibration Block for Technique One
T-434.4.3 Calibration Block for Technique Two <\/td>\n<\/tr>\n
148<\/td>\nT-434.5.1 Calibration Block for Straight Beam Examination of Nozzle Side Weld Fusion Zone and\/or Adjacent Nozzle Parent Metal <\/td>\n<\/tr>\n
149<\/td>\nT-440 Miscellaneous Requirements
T-441 Identification of Weld Examination Areas
T-450 Techniques
T-451 Coarse Grain Materials
T-452 Computerized Imaging Techniques
T-453 Scanning Techniques
T-460 Calibration
T-461 Instrument Linearity Checks <\/td>\n<\/tr>\n
150<\/td>\nT-462 General Calibration Requirements
T-463 Calibration for Nonpiping <\/td>\n<\/tr>\n
151<\/td>\nT-464 Calibration for Piping
T-465 Calibration for Weld Metal Overlay Cladding
T-466 Calibration for Nozzle Side Weld Fusion Zone and\/or Adjacent Nozzle Parent Metal <\/td>\n<\/tr>\n
152<\/td>\nT-467 Calibration Confirmation
T-470 Examination
T-471 General Examination Requirements <\/td>\n<\/tr>\n
153<\/td>\nT-472 Weld Joint Distance\u2013Amplitude Technique
T-473 Weld Metal Overlay Cladding Techniques
T-474 Nondistance\u2013Amplitude Techniques <\/td>\n<\/tr>\n
154<\/td>\nT-475 Nozzle Side Weld Fusion Zone and\/or Adjacent Nozzle Parent Metal
T-477 Post-Examination Cleaning
T-480 Evaluation
T-481 General
T-482 Evaluation Level
T-483 Evaluation of Laminar Reflectors
T-484 Alternative Evaluations
T-490 Documentation
T-491 Recording Indications
T-492 Examination Records <\/td>\n<\/tr>\n
155<\/td>\nT-493 Report
T-494 Storage Media <\/td>\n<\/tr>\n
156<\/td>\nMandatory Appendix I Screen Height Linearity
I-410 Scope
I-440 Miscellaneous Requirements
I-440 Linearity <\/td>\n<\/tr>\n
157<\/td>\nMandatory Appendix II Amplitude Control Linearity
II-410 Scope
II-440 Miscellaneous Requirements <\/td>\n<\/tr>\n
158<\/td>\nMandatory Appendix III Time of Flight Diffraction (TOFD) Technique
III-410 Scope
III-420 General
III-421 Written Procedure Requirements
III-430 Equipment
III-431 Instrument Requirements
III-432 Search Units
III-421 Requirements of a TOFD Examination Procedure <\/td>\n<\/tr>\n
159<\/td>\nIII-434 Calibration Blocks
III-435 Mechanics
III-434.2.1(a) TOFD Reference Block <\/td>\n<\/tr>\n
160<\/td>\nIII-460 Calibration
III-463 Calibration
III-464 Calibration for Piping
III-465 Calibration for Cladding
III-467 Encoder Confirmation
III-434.2.1(b) Two-Zone Reference Block Example <\/td>\n<\/tr>\n
161<\/td>\nIII-470 Examination
III-471 General Examination Requirements
III-463.5 Offset Scans <\/td>\n<\/tr>\n
162<\/td>\nIII-472 Weld Joint Distance\u2013Amplitude Technique
III-473 Cladding Technique
III-475 Data Sampling Spacing
III-480 Evaluation
III-485 Missing Data Lines
III-486 Flaw Sizing and Interpretation
III-490 Documentation
III-492 Examination Record
III-493 Report <\/td>\n<\/tr>\n
163<\/td>\nMandatory Appendix IV Phased Array Manual Raster Examination Techniques Using Linear Arrays
IV-410 Scope
IV-420 General
IV-421 Written Procedure Requirements
IV-460 Calibration
IV-461 Instrument Linearity Checks
IV-462 General Calibration Requirements
IV-421 Requirements of a Phased Manual Raster Scanning Examination Procedure Using Linear Arrays <\/td>\n<\/tr>\n
164<\/td>\nIV-490 Documentation
IV-492 Examination Record <\/td>\n<\/tr>\n
165<\/td>\nMandatory Appendix V Phased Array E-Scan and S-Scan Linear Scanning Examination Techniques
V-410 Scope
V-420 General
V-421 Written Procedure Requirements
V-422 Scan Plan
V-460 Calibration
V-461 Instrument Linearity Checks
V-462 General Calibration Requirements
V-421 Requirements of a Phased Array Linear Scanning Examination Procedure Using Linear Arrays <\/td>\n<\/tr>\n
166<\/td>\nV-467 Encoder Calibration
V-470 Examination
V-471 General Examination Requirements
V-490 Documentation
V-492 Examination Record <\/td>\n<\/tr>\n
167<\/td>\nMandatory Appendix VII Ultrasonic Examination Requirements for Workmanship-Based Acceptance Criteria
VII-410 Scope
VII-420 General
VII-421 Written Procedure Requirements
VII-423 Personnel Qualifications
VII-430 Equipment
VII-431 Instrument Requirements
VII-434 Calibration Blocks
VII-421 Requirements of an Ultrasonic Examination Procedure for Workmanship-Based Acceptance Criteria <\/td>\n<\/tr>\n
168<\/td>\nVII-440 Miscellaneous Requirements
VII-442 Scanning Data
VII-460 Calibration
VII-466 Calibration for Nozzle Side Weld Fusion Zone and\/or Adjacent Nozzle Parent Metal
VII-470 Examination
VII-471 General Examination Requirements
VII-480 Evaluation
VII-483 Evaluation of Laminar Reflectors
VII-485 Evaluation
VII-486 Supplemental Manual Techniques
VII-487 Evaluation by Manufacturer
VII-490 Documentation
VII-492 Examination Record <\/td>\n<\/tr>\n
169<\/td>\nMandatory Appendix VIII Ultrasonic Examination Requirements for Fracture-Mechanics-Based Acceptance Criteria
VIII-410 Scope
VIII-420 General
VIII-421 Written Procedure Requirements
VIII-423 Personnel Qualifications
VIII-430 Equipment
VIII-431 Instrument Requirements
VIII-432 Search Units
VIII-434 Calibration Blocks
VIII-421 Requirements of an Ultrasonic Examination Procedure for Fracture-Mechanics-Based Acceptance Criteria <\/td>\n<\/tr>\n
170<\/td>\nVIII-440 Miscellaneous Requirements
VIII-442 Scanning Data
VIII-460 Calibration
VIII-467 Calibration for Nozzle Side Weld Fusion Zone and\/or Adjacent Nozzle Parent Metal
VIII-470 Examination
VIII-471 General Examination Requirements
VIII-480 Evaluation
VIII-482 Evaluation Level
VIII-483 Evaluation of Laminar Reflectors
VIII-485 Evaluation Settings
VIII-486 Size and Category <\/td>\n<\/tr>\n
171<\/td>\nVIII-487 Supplemental Manual Techniques
VIII-488 Evaluation by Manufacturer
VIII-490 Documentation
VIII-492 Examination Records <\/td>\n<\/tr>\n
172<\/td>\nMandatory Appendix IX Procedure Qualification Requirements for Flaw Sizing and Categorization
IX-410 Scope
IX-420 General
IX-430 Equipment
IX-435 Demonstration Blocks
IX-440 Miscellaneous Requirements
IX-442 Qualification Data <\/td>\n<\/tr>\n
173<\/td>\nIX-480 Evaluation
IX-481 Size and Category
IX-482 Automated and Semiautomated Acceptable Performance Criteria
IX-483 Supplemental Manual Technique(s) Acceptable Performance
IX-490 Documentation
IX-492 Demonstration Block Record <\/td>\n<\/tr>\n
174<\/td>\nMandatory Appendix X Ultrasonic Examination of High Density Polyethylene
X-410 Scope
X-420 General
X-421 Written Procedure Requirements
X-422 Scan Plan
X-430 Equipment
X-431 Instrument Requirements
X-421 Requirements of an Ultrasonic Examination Procedure for HDPE Techniques <\/td>\n<\/tr>\n
175<\/td>\nX-432 Search Units
X-434 Calibration Blocks
X-460 Calibration
X-462 General Calibration Requirements
X-464 Calibration for Piping
X-467 Calibration Confirmation <\/td>\n<\/tr>\n
176<\/td>\nX-470 Examination
X-471 General Examination Requirements
X-490 Documentation
X-492 Examination Record
X-471.1 Fusion Pipe Joint Examination Volume <\/td>\n<\/tr>\n
177<\/td>\nNonmandatory Appendix A Layout of Vessel Reference Points
A-410 Scope
A-440 Miscellaneous Requirements
A-441 Circumferential (Girth) Welds
A-442 Longitudinal Welds
A-443 Nozzle-to-Vessel Welds <\/td>\n<\/tr>\n
178<\/td>\nNonmandatory Appendix B General Techniques for Angle Beam Calibrations
B-410 Scope
B-460 Calibration
B-461 Sweep Range Calibration
B-461.1 Sweep Range (Side-Drilled Holes) <\/td>\n<\/tr>\n
179<\/td>\nB-461.2 Sweep Range (IIW Block)
B-461.3 Sweep Range (Notches) <\/td>\n<\/tr>\n
180<\/td>\nB-462 Distance\u2013Amplitude Correction
B-462.1 Sensitivity and Distance\u2013Amplitude Correction (Side-Drilled Holes) <\/td>\n<\/tr>\n
181<\/td>\nB-463 Distance\u2013Amplitude Correction Inner 1\/4 Volume (See Nonmandatory Appendix J, Figure J-431 View A)
B-464 Position Calibration (See Figure B-464)
B-462.3 Sensitivity and Distance\u2013Amplitude Correction (Notches) <\/td>\n<\/tr>\n
182<\/td>\nB-465 Calibration Correction for Planar Reflectors Perpendicular to the Examination Surface at or Near the Opposite Surface (See Figure B-465)
B-466 Beam Spread (See Figure B-466)
B-464 Position Depth and Beam Path
B-465 Planar Reflections <\/td>\n<\/tr>\n
183<\/td>\nB-466 Beam Spread <\/td>\n<\/tr>\n
184<\/td>\nNonmandatory Appendix C General Techniques for Straight Beam Calibrations
C-410 Scope
C-460 Calibration
C-461 Sweep Range Calibration (See Figure C-461)
C-462 Distance\u2013Amplitude Correction (See Figure C-462)
C-461 Sweep Range <\/td>\n<\/tr>\n
185<\/td>\nC-462 Sensitivity and Distance\u2013Amplitude Correction <\/td>\n<\/tr>\n
186<\/td>\nNonmandatory Appendix D Examples of Recording Angle Beam Examination Data
D-410 Scope
D-420 General
D-470 Examination Requirements
D-471 Reflectors With Indication Amplitudes Greater Than 20% of DAC or Reference Level
D-472 Reflectors With Indication Amplitudes Greater Than the DAC Curve or Reference Level
D-473 Flaw Sizing Techniques to Be Qualified and Demonstrated
D-490 Documentation <\/td>\n<\/tr>\n
187<\/td>\nD-491 Reflectors With Indication Amplitudes Greater Than 20% of DAC or Reference Level
D-490 Search Unit Location, Position, and Beam Direction
D-490 Example Data Record <\/td>\n<\/tr>\n
188<\/td>\nD-492 Reflectors With Indication Amplitudes Greater Than the DAC Curve or Reference Level
D-493 Reflectors That Require Measurement Techniques to Be Qualified and Demonstrated <\/td>\n<\/tr>\n
189<\/td>\nNonmandatory Appendix E Computerized Imaging Techniques
E-410 Scope
E-420 General
E-460 Calibration
E-470 Examination
E-471 Synthetic Aperture Focusing Technique for Ultrasonic Testing (SAFT-UT) <\/td>\n<\/tr>\n
190<\/td>\nE-472 Line-Synthetic Aperture Focusing Technique (L-SAFT)
E-473 Broadband Holography Technique <\/td>\n<\/tr>\n
191<\/td>\nE-460.1 Lateral Resolution and Depth Discrimination Block for 45 deg and 60 deg Applications <\/td>\n<\/tr>\n
192<\/td>\nE-474 UT-Phased Array Technique <\/td>\n<\/tr>\n
193<\/td>\nE-460.2 Lateral and Depth Resolution Block for 0 deg Applications <\/td>\n<\/tr>\n
194<\/td>\nE-475 UT-Amplitude Time-of-Flight Locus-Curve Analysis Technique
E-476 Automated Data Acquisition and Imaging Technique <\/td>\n<\/tr>\n
195<\/td>\nNonmandatory Appendix G Alternate Calibration Block Configuration
G-410 Scope
G-460 Calibration
G-461 Determination of Gain Correction
G-461 Transducer Factor F1 for Various Ultrasonic Transducer Diameters and Frequencies <\/td>\n<\/tr>\n
196<\/td>\nG-461(a) Critical Radius, RC, for Transducer\/Couplant Combinations <\/td>\n<\/tr>\n
197<\/td>\nG-461(b) Correction Factor (Gain) for Various Ultrasonic Examination Parameters <\/td>\n<\/tr>\n
198<\/td>\nNonmandatory Appendix I Examination of Welds Using Angle Beam Search Units
I-410 Scope
I-470 Examination
I-471 General Scanning Requirements
I-472 Exceptions to General Scanning Requirements
I-473 Examination Coverage <\/td>\n<\/tr>\n
199<\/td>\nNonmandatory Appendix J Alternative Basic Calibration Block
J-410 Scope
J-430 Equipment
J-431 Basic Calibration Block
J-432 Basic Calibration Block Material
J-433 Calibration Reflectors <\/td>\n<\/tr>\n
200<\/td>\nJ-431 Basic Calibration Block <\/td>\n<\/tr>\n
202<\/td>\nNonmandatory Appendix K Recording Straight Beam Examination Data for Planar Reflectors
K-410 Scope
K-470 Examination
K-471 Overlap
K-490 Records\/Documentation <\/td>\n<\/tr>\n
203<\/td>\nNonmandatory Appendix L TOFD Sizing Demonstration\/Dual Probe \u2014 Computer Imaging Technique
L-410 Scope
L-420 General
L-430 Equipment
L-431 System
L-432 Demonstration Block
L-460 Calibration
L-461 System
L-462 System Checks
L-470 Examination
L-480 Evaluation
L-481 Sizing Determinations <\/td>\n<\/tr>\n
204<\/td>\nL-482 Sizing Accuracy Determinations
L-483 Classification\/Sizing System
L-432 Example of a Flat Demonstration Block Containing Three Notches <\/td>\n<\/tr>\n
205<\/td>\nL-490 Documentation
L-491 Demonstration Report <\/td>\n<\/tr>\n
206<\/td>\nNonmandatory Appendix M General Techniques for Angle Beam Longitudinal Wave Calibrations
M-410 Scope
M-460 Calibration
M-461 Sweep Range Calibration
M-461.1 Sweep Range (Side-Drilled Holes) <\/td>\n<\/tr>\n
207<\/td>\nM-461.2 Sweep Range (Cylindrical Surfaces)
M-461.3 Sweep Range (Straight Beam Search Unit) <\/td>\n<\/tr>\n
208<\/td>\nM-462 Distance\u2013Amplitude Correction (DAC) (See Figure M-462)
M-462 Sensitivity and Distance\u2013Amplitude Correction <\/td>\n<\/tr>\n
209<\/td>\nNonmandatory Appendix N Time of Flight Diffraction (TOFD) Interpretation
N-410 Scope
N-420 General
N-421 TOFD Images \u2014 Data Visualization
N-421(a) Schematic Showing Waveform Transformation Into Grayscale <\/td>\n<\/tr>\n
210<\/td>\nN-421(b) Schematic Showing Generation of Grayscale Image From Multiple A-Scans
N-421(c) Schematic Showing Standard TOFD Setup and Display With Waveform and Signal Phases <\/td>\n<\/tr>\n
211<\/td>\nN-450 Procedure
N-451 Measurement Tools
N-452 Flaw Position Errors
N-453 Measuring Flaw Length
N-454 Measuring Flaw Depth
N-421(d) TOFD Display With Flaws and Displayed A-Scan <\/td>\n<\/tr>\n
212<\/td>\nN-451 Measurement Tools for Flaw Heights
N-452(a) Schematic Showing the Detection of Off-Axis Flaws <\/td>\n<\/tr>\n
213<\/td>\nN-452(b) Measurement Errors From Flaw Position Uncertainty
N-453 TOFD Image Showing Hyperbolic \u201cTails\u201d From the Ends of a Flaw Image Used to Measure Flaw Length <\/td>\n<\/tr>\n
214<\/td>\nN-454(a) TOFD Image Showing Top and Bottom Diffracted Signals From Midwall Flaw and A-Scan Interpretation
N-454(b) TOFD Image Showing Top and Bottom Diffracted Signals From Centerline Crack and A-Scan Interpretation <\/td>\n<\/tr>\n
215<\/td>\nN-480 Evaluation
N-481 Single Flaw Images
N-481(a) Schematics of Image Generation, Scan Pattern, Waveform, and TOFD Display Showing the Image of the Point Flaw <\/td>\n<\/tr>\n
216<\/td>\nN-481(b) Schematics of Image Generation, Flaw Location, and TOFD Display Showing the Image of the Inside (ID) Surface-Breaking Flaw
N-481(c) Schematics of Image Generation, Flaw Location, and TOFD Display Showing the Image of the Outside (OD) Surface-Breaking Flaw <\/td>\n<\/tr>\n
217<\/td>\nN-481(d) Schematics of Flaw Location, Signals, and TOFD Display Showing the Image of the Midwall Flaw <\/td>\n<\/tr>\n
218<\/td>\nN-481(e) Flaw Location and TOFD Display Showing the Image of the Lack of Root Penetration
N-481(f) Flaw Location and TOFD Display Showing the Image of the Concave Root Flaw <\/td>\n<\/tr>\n
219<\/td>\nN-481(g) Flaw Location, TOFD Display Showing the Image of the Midwall Lack of Fusion Flaw, and the A-Scan
N-481(h) Flaw Location and TOFD Display Showing the Image of the Porosity <\/td>\n<\/tr>\n
220<\/td>\nN-481(i) Flaw Location and TOFD Display Showing the Image of the Transverse Crack
N-481(j) Schematics of Image Generation, Flaw Location, and TOFD Display Showing the Image of the Interpass Lack of Fusion <\/td>\n<\/tr>\n
221<\/td>\nN-482 Multiple Flaw Images
N-482(a) Schematic of Flaw Locations and TOFD Image Showing the Lateral Wave, Backwall, and Three of the Four Flaws <\/td>\n<\/tr>\n
222<\/td>\nN-483 Typical Problems With TOFD Interpretation
N-482(b) Schematic of Flaw Locations and TOFD Display Showing the Lateral Wave, Backwall, and Four Flaws <\/td>\n<\/tr>\n
223<\/td>\nN-483(a) Acceptable Noise Levels, Flaws, Lateral Wave, and Longitudinal Wave Backwall <\/td>\n<\/tr>\n
224<\/td>\nN-483(b) TOFD Image With Gain Too Low <\/td>\n<\/tr>\n
225<\/td>\nN-483(c) TOFD Image With Gain Set Too High
N-483(d)(1) TOFD Image With the Gate Set Too Early <\/td>\n<\/tr>\n
226<\/td>\nN-483(d)(2) TOFD Image With the Gate Set Too Late
N-483(d)(3) TOFD Image With the Gate Set Too Long <\/td>\n<\/tr>\n
227<\/td>\nN-483(e) TOFD Image With Transducers Set Too Far Apart
N-483(f) TOFD Image With Transducers Set Too Close Together <\/td>\n<\/tr>\n
228<\/td>\nN-483(g) TOFD Image With Transducers not Centered on the Weld Axis
N-483(h) TOFD Image Showing Electrical Noise Interference <\/td>\n<\/tr>\n
229<\/td>\nNonmandatory Appendix O Time of Flight Diffraction (TOFD) Technique \u2014 General Examination Configurations
O-410 Scope
O-430 Equipment
O-432 Search Units
O-470 Examination
O-432(a) Search Unit Parameters for Single Zone Examinations Up to 3 in. (75 mm)
O-432(b) Search Unit Parameters for Multiple Zone Examinations Up to 12 in. (300 mm) Thick
O-470 Recommended TOFD Zones for Butt Welds Up to 12 in. (300 mm) Thick <\/td>\n<\/tr>\n
230<\/td>\nO-470(a) Example of a Single Zone TOFD Setup
O-470(b) Example of a Two Zone TOFD Setup (Equal Zone Heights)
O-470(c) Example of a Three Zone TOFD Setup (Unequal Zone Heights With Zone 3 Addressed by Two Offset Scans) <\/td>\n<\/tr>\n
231<\/td>\nO-470(d) Example of a Four Zone TOFD Setup (Equal Zone Heights) <\/td>\n<\/tr>\n
232<\/td>\nNonmandatory Appendix P Phased Array (PAUT) Interpretation
P-410 Scope
P-420 General
P-421 PAUT Images \u2014 Data Visualization
P-450 Procedure
P-451 Measurement Tools
P-452 Flaw Sizing Techniques
P-480 Evaluation <\/td>\n<\/tr>\n
233<\/td>\nP-481 I.D. (Inside Diameter) Connected Crack
P-421-1 Black and White (B&W) Version of Color Palette <\/td>\n<\/tr>\n
234<\/td>\nP-421-2 Scan Pattern Format <\/td>\n<\/tr>\n
235<\/td>\nP-421-3 Example of an E-Scan Image Display <\/td>\n<\/tr>\n
236<\/td>\nP-421-4 Example of an S-Scan Image Display
P-452.1 Flaw Length Sizing Using Amplitude Drop Technique and the Vertical Cursors on the C-Scan Display <\/td>\n<\/tr>\n
237<\/td>\nP-452.2-1 Scan Showing Flaw Height Sizing Using Amplitude Drop Technique and the Horizontal Cursors on the B-Scan Display
P-452.2-2 Flaw Height Sizing Using Top Diffraction Technique and the Horizontal Cursors on the S-Scan Display <\/td>\n<\/tr>\n
238<\/td>\nP-481 S-Scan of I.D. Connected Crack
P-481.1 E-Scan of LOF in Midwall <\/td>\n<\/tr>\n
239<\/td>\nP-481.2 S-Scan of Porosity, Showing Multiple Reflectors
P-481.3 O.D. Toe Crack Detected Using S-Scan <\/td>\n<\/tr>\n
240<\/td>\nP-481.4 IP Signal on S-Scan, Positioned on Root
P-481.5 Slag Displayed as a Midwall Defect on S-Scan <\/td>\n<\/tr>\n
241<\/td>\nNonmandatory Appendix Q Example of a Split DAC Curve
Q-410 Scope
Q-420 General
Q-421 First DAC
Q-422 Second DAC
Q-423 Notch Reflectors
Q-410 Distance\u2013Amplitude Correction <\/td>\n<\/tr>\n
242<\/td>\nQ-421 First DAC Curve
Q-422 Second DAC Curve <\/td>\n<\/tr>\n
243<\/td>\nNonmandatory Appendix R Straight Beam Calibration Blocks for Restricted Access Weld Examinations
R-410 Scope
R-420 General
R-430 Equipment
R-434 Calibration Blocks <\/td>\n<\/tr>\n
244<\/td>\nR-434-1 Corner Weld Example <\/td>\n<\/tr>\n
245<\/td>\nR-434-2 Tee Weld Example <\/td>\n<\/tr>\n
246<\/td>\nArticle 5 Ultrasonic Examination Methods for Materials
T-510 Scope
T-520 General
T-521 Basic Requirements
T-522 Written Procedure Requirements
T-530 Equipment
T-531 Instrument
T-532 Search Units
T-533 Couplant
T-534 Calibration Block Requirements <\/td>\n<\/tr>\n
247<\/td>\nT-560 Calibration
T-561 Instrument Linearity Checks
T-562 General Calibration Requirements
T-522 Variables of an Ultrasonic Examination Procedure <\/td>\n<\/tr>\n
248<\/td>\nT-534.3 Straight Beam Calibration Blocks for Bolting <\/td>\n<\/tr>\n
249<\/td>\nT-563 Calibration Confirmation
T-564 Casting Calibration for Supplementary Angle Beam Examinations
T-570 Examination
T-571 Examination of Product Forms <\/td>\n<\/tr>\n
250<\/td>\nT-572 Examination of Pumps and Valves
T-573 Inservice Examination
T-574 Thickness Measurement
T-577 Post-Examination Cleaning
T-580 Evaluation
T-590 Documentation
T-591 Recording Indications
T-592 Examination Records <\/td>\n<\/tr>\n
251<\/td>\nT-593 Report
T-594 Storage Media <\/td>\n<\/tr>\n
252<\/td>\nMandatory Appendix I Ultrasonic Examination of Pumps and Valves
I-510 Scope
I-530 Equipment
I-531 Calibration Blocks
I-560 Calibration
I-561 System Calibration
I-570 Examination <\/td>\n<\/tr>\n
253<\/td>\nMandatory Appendix II Inservice Examination of Nozzle Inside Corner Radius and Inner Corner Regions
II-510 Scope
II-530 Equipment
II-531 Calibration Blocks
II-560 Calibration
II-561 System Calibration
II-570 Examination <\/td>\n<\/tr>\n
254<\/td>\nMandatory Appendix III Glossary of Terms for Ultrasonic Examination <\/td>\n<\/tr>\n
255<\/td>\nMandatory Appendix IV Inservice Examination of Bolts
IV-510 Scope
IV-530 Equipment
IV-531 Calibration Blocks
IV-560 Calibration
IV-561 DAC Calibration
IV-570 Examination
IV-571 General Examination Requirements <\/td>\n<\/tr>\n
256<\/td>\nArticle 6 Liquid Penetrant Examination
T-610 Scope
T-620 General
T-621 Written Procedure Requirements
T-630 Equipment
T-640 Miscellaneous Requirements
T-641 Control of Contaminants
T-642 Surface Preparation <\/td>\n<\/tr>\n
257<\/td>\nT-643 Drying After Preparation
T-650 Technique
T-651 Techniques
T-621.1 Requirements of a Liquid Penetrant Examination Procedure
T-621.3 Minimum and Maximum Time Limits for Steps in Penetrant Examination Procedures <\/td>\n<\/tr>\n
258<\/td>\nT-652 Techniques for Standard Temperatures
T-653 Techniques for Nonstandard Temperatures
T-654 Technique Restrictions
T-660 Calibration
T-670 Examination
T-671 Penetrant Application
T-672 Penetration (Dwell) Time
T-673 Excess Penetrant Removal <\/td>\n<\/tr>\n
259<\/td>\nT-674 Drying After Excess Penetrant Removal
T-675 Developing
T-672 Minimum Dwell Times <\/td>\n<\/tr>\n
260<\/td>\nT-676 Interpretation
T-677 Post-Examination Cleaning
T-680 Evaluation
T-690 Documentation
T-691 Recording of Indications
T-692 Examination Records <\/td>\n<\/tr>\n
261<\/td>\nMandatory Appendix I Glossary of Terms for Liquid Penetrant Examination <\/td>\n<\/tr>\n
262<\/td>\nMandatory Appendix II Control of Contaminants for Liquid Penetrant Examination
II-610 Scope
II-640 Requirements
II-641 Nickel Base Alloys
II-642 Austenitic or Duplex Stainless Steel and Titanium
II-643 Water
II-690 Documentation <\/td>\n<\/tr>\n
263<\/td>\nMandatory Appendix III Qualification Techniques for Examinations at Nonstandard Temperatures
III-610 Scope
III-630 Materials
III-640 Requirements
III-641 Comparator Application
III-630 Liquid Penetrant Comparator <\/td>\n<\/tr>\n
265<\/td>\nArticle 7 Magnetic Particle Examination
T-710 Scope
T-720 General
T-721 Written Procedure Requirements
T-730 Equipment
T-731 Examination Medium
T-740 Miscellaneous Requirements
T-741 Surface Conditioning <\/td>\n<\/tr>\n
266<\/td>\nT-750 Technique
T-751 Techniques
T-752 Prod Technique
T-721 Requirements of a Magnetic Particle Examination Procedure <\/td>\n<\/tr>\n
267<\/td>\nT-753 Longitudinal Magnetization Technique
T-754 Circular Magnetization Technique <\/td>\n<\/tr>\n
268<\/td>\nT-755 Yoke Technique
T-756 Multidirectional Magnetization Technique
T-754.2.1 Single-Pass and Two-Pass Central Conductor Technique
T-754.2.2 The Effective Region of Examination When Using an Offset Central Conductor <\/td>\n<\/tr>\n
269<\/td>\nT-760 Calibration
T-761 Frequency of Calibration
T-762 Lifting Power of Yokes
T-763 Gaussmeters
T-764 Magnetic Field Adequacy and Direction <\/td>\n<\/tr>\n
270<\/td>\nT-765 Wet Particle Concentration and Contamination
T-764.2(a) Pie-Shaped Magnetic Particle Field Indicator
T-764.2(b)(1) Artificial Flaw Shims <\/td>\n<\/tr>\n
271<\/td>\nT-764.2(b)(2) Artificial Flaw Shims <\/td>\n<\/tr>\n
272<\/td>\nT-766 System Performance of Horizontal Units
T-770 Examination
T-771 Preliminary Examination
T-772 Direction of Magnetization
T-773 Method of Examination
T-774 Examination Coverage <\/td>\n<\/tr>\n
273<\/td>\nT-766.1 Ketos (Betz) Test Ring <\/td>\n<\/tr>\n
274<\/td>\nT-775 Rectified Current
T-776 Excess Particle Removal
T-777 Interpretation
T-778 Demagnetization
T-779 Post-Examination Cleaning <\/td>\n<\/tr>\n
275<\/td>\nT-780 Evaluation
T-790 Documentation
T-791 Multidirectional Magnetization Technique Sketch
T-792 Recording of Indications
T-793 Examination Records <\/td>\n<\/tr>\n
276<\/td>\nMandatory Appendix I Magnetic Particle Examination Using the AC Yoke Technique on Ferromagnetic Materials Coated With Nonferromagnetic Coatings
I-710 Scope
I-720 General
I-721 Written Procedure Requirements
I-722 Personnel Qualification
I-721 Requirements of AC Yoke Technique on Coated Ferritic Component <\/td>\n<\/tr>\n
277<\/td>\nI-723 Procedure\/Technique Demonstration
I-730 Equipment
I-740 Miscellaneous Requirements
I-741 Coating Thickness Measurement
I-750 Technique
I-751 Technique Qualification
I-760 Calibration
I-761 Yoke Maximum Lifting Force <\/td>\n<\/tr>\n
278<\/td>\nI-762 Light Intensity Measurement
I-770 Examination
I-780 Evaluation
I-790 Documentation
I-791 Examination Record <\/td>\n<\/tr>\n
279<\/td>\nMandatory Appendix II Glossary of Terms for Magnetic Particle Examination <\/td>\n<\/tr>\n
280<\/td>\nMandatory Appendix III Magnetic Particle Examination Using the Yoke Technique With Fluorescent Particles in an Undarkened Area
III-710 Scope
III-720 General
III-721 Written Procedure Requirements
III-723 Procedure Demonstration
III-750 Technique
III-751 Qualification Standard
III-760 Calibration
III-761 Black Light Intensity Measurement
III-762 White Light Intensity Measurement
III-770 Examination
III-721 Requirements for an AC or HWDC Yoke Technique With Fluorescent Particles in an Undarkened Area <\/td>\n<\/tr>\n
281<\/td>\nIII-777 Interpretation
III-790 Documentation
III-791 Examination Record <\/td>\n<\/tr>\n
282<\/td>\nMandatory Appendix IV Qualification of Alternate Wavelength Light Sources for Excitation of Fluorescent Particles
IV-710 Scope
IV-720 General
IV-721 Written Procedure Requirements
IV-723 Procedure Demonstration
IV-750 Technique
IV-751 Qualification Standard
IV-752 Filter Glasses
IV-770 Qualification Examinations
IV-771 Black Light Intensity
IV-772 Examination Requirements
IV-721 Requirements for Qualifying Alternate Wavelength Light Sources for Excitation of Specific Fluorescent Particles <\/td>\n<\/tr>\n
283<\/td>\nIV-773 Qualification of Alternate Wavelength Light Source and Specific Particles
IV-790 Documentation
IV-791 Examination Record <\/td>\n<\/tr>\n
284<\/td>\nMandatory Appendix V Requirements for the Use of Magnetic Rubber Techniques
V-710 Scope
V-720 General Requirements
V-721 Written Procedure Requirements
V-730 Equipment
V-731 Magnetizing Apparatus
V-732 Magnetic Rubber Materials
V-733 Magnetic Field Strength
V-734 Magnification
V-740 Miscellaneous Requirements
V-741 Surface Preparation <\/td>\n<\/tr>\n
285<\/td>\nV-742 Taping and Damming
V-743 Release Treatment
V-750 Techniques
V-751 Techniques
V-752 Application of Magnetic Field
V-721 Requirements for the Magnetic Rubber Examination Procedure <\/td>\n<\/tr>\n
286<\/td>\nV-760 Calibration
V-764 Magnetic Field Adequacy and Direction
V-770 Examination
V-773 Application of Liquid Polymer-Magnetic Particle Material
V-774 Movement During Cure
V-776 Removal of Replicas
V-780 Evaluation
V-790 Documentation
V-793 Examination Records <\/td>\n<\/tr>\n
287<\/td>\nNonmandatory Appendix A Measurement of Tangential Field Strength With Gaussmeters
A-710 Scope
A-720 General Requirements
A-730 Equipment
A-750 Procedure
A-790 Documentation\/Records <\/td>\n<\/tr>\n
288<\/td>\nArticle 8 Eddy Current Examination
T-810 Scope <\/td>\n<\/tr>\n
289<\/td>\nMandatory Appendix I Glossary of Terms for Eddy Current Examination <\/td>\n<\/tr>\n
290<\/td>\nMandatory Appendix II Eddy Current Examination of Nonferromagnetic Heat Exchanger Tubing
II-810 Scope
II-820 General
II-821 Written Procedure Requirements
II-822 Personnel Requirements
II-830 Equipment <\/td>\n<\/tr>\n
291<\/td>\nII-821 Requirements for an Eddy Current Examination Procedure <\/td>\n<\/tr>\n
292<\/td>\nII-840 Requirements <\/td>\n<\/tr>\n
293<\/td>\nII-860 Calibration <\/td>\n<\/tr>\n
294<\/td>\nII-870 Examination
II-880 Evaluation
II-860.3.1 Differential Technique Response From Calibration Reference Standard
II-860.3.2 Absolute Technique Response From Calibration Reference Standard <\/td>\n<\/tr>\n
295<\/td>\nII-890 Documentation
II-880 Flaw Depth as a Function of Phase Angle at 400 kHz [Ni\u2013Cr\u2013Fe 0.050 in. (1.24 mm) Wall Tube] <\/td>\n<\/tr>\n
297<\/td>\nMandatory Appendix III Eddy Current Examination on Coated Ferromagnetic Materials
III-810 Scope
III-820 General
III-821 Personnel Qualification
III-822 Written Procedure Requirements
III-823 Procedure Demonstration
III-830 Equipment
III-850 Technique
III-860 Calibration <\/td>\n<\/tr>\n
298<\/td>\nIII-870 Examination
III-890 Documentation
III-891 Examination Report
III-893 Record Retention <\/td>\n<\/tr>\n
299<\/td>\nMandatory Appendix IV External Coil Eddy Current Examination of Tubular Products
IV-810 Scope
IV-820 General
IV-821 Performance
IV-822 Personnel Qualification
IV-823 Written Procedure Requirements
IV-830 Equipment
IV-831 Test Coils and Probes
IV-823 Requirements of an External Coil Eddy Current Examination Procedure <\/td>\n<\/tr>\n
300<\/td>\nIV-832 Scanners
IV-833 Reference Specimen
IV-850 Technique
IV-860 Calibration
IV-861 Performance Verification
IV-862 Calibration of Equipment
IV-870 Examination
IV-880 Evaluation
IV-890 Documentation
IV-891 Examination Reports
IV-893 Record Retention <\/td>\n<\/tr>\n
301<\/td>\nMandatory Appendix V Eddy Current Measurement of Nonconductive-Nonferromagnetic Coating Thickness on a Nonferromagnetic Metallic Material
V-810 Scope
V-820 General
V-821 Written Procedure Requirements
V-822 Personnel Qualification
V-823 Procedure\/Technique Demonstration
V-830 Equipment
V-831 Probes
V-821 Requirements of an Eddy Current Examination Procedure for the Measurement of Nonconductive-Nonferromagnetic Coating Thickness on a Metallic Material <\/td>\n<\/tr>\n
302<\/td>\nV-850 Technique
V-860 Calibration
V-870 Examination
V-880 Evaluation
V-860 Typical Lift-off Calibration Curve for Coating Thickness Showing Thickness Calibration Points Along the Curve <\/td>\n<\/tr>\n
303<\/td>\nV-890 Documentation
V-891 Examination Report
V-893 Record Retention <\/td>\n<\/tr>\n
304<\/td>\nMandatory Appendix VI Eddy Current Detection and Measurement of Depth of Surface Discontinuities in Nonferromagnetic Metals With Surface Probes
VI-810 Scope
VI-820 General
VI-821 Written Procedure Requirements
VI-822 Personnel Qualification
VI-823 Procedure\/Technique Demonstration
VI-821 Requirements of an Eddy Current Examination Procedure for the Detection and Measurement of Depth for Surface Discontinuities in Nonferromagnetic Metallic Materials <\/td>\n<\/tr>\n
305<\/td>\nVI-830 Equipment
VI-831 Probes
VI-832 Reference Specimen
VI-850 Technique
VI-860 Calibration
VI-870 Examination
VI-880 Evaluation <\/td>\n<\/tr>\n
306<\/td>\nVI-890 Documentation
VI-891 Examination Report
VI-893 Record Retention
VI-832 Reference Specimen
VI-850 Impedance Plane Representations of Indications From Figure VI-832 <\/td>\n<\/tr>\n
307<\/td>\nMandatory Appendix VII Eddy Current Examination of Ferromagnetic and Nonferromagnetic Conductive Metals to Determine If Flaws Are Surface Connected
VII-810 Scope
VII-820 General
VII-821 Performance
VII-822 Personnel Qualification
VII-823 Written Procedure Requirements
VII-830 Equipment
VII-830.1 System Description
VII-830.2 Surface Probes
VII-830.3 Cables
VII-830.4 Instrumentation
VII-823 Requirements of an Eddy Current Surface Examination Procedure <\/td>\n<\/tr>\n
308<\/td>\nVII-830.5 Reference Specimen
VII-850 Technique
VII-860 Calibration
VII-861 General
VII-830.5 Eddy Current Reference Specimen <\/td>\n<\/tr>\n
309<\/td>\nVII-862 Calibration Response
VII-870 Examination
VII-880 Evaluation
VII-890 Documentation
VII-891 Examination Report
VII-892 Record Retention <\/td>\n<\/tr>\n
310<\/td>\nVII-862 Impedance Plane Responses for Stainless Steel and Carbon Steel Reference Specimens <\/td>\n<\/tr>\n
311<\/td>\nMandatory Appendix VIII Eddy Current Examination of Nonferromagnetic Heat Exchanger Tubing
VIII-810 Scope
VIII-820 General
VIII-821 Written Procedure Requirements
VIII-830 Equipment
VIII-831 Data Acquisition System
VIII-832 Analog Data Acquisition System <\/td>\n<\/tr>\n
312<\/td>\nVIII-833 Digital Data Acquisition System
VIII-834 Bobbin Coils
VIII-821 Requirements for an Eddy Current Examination Procedure <\/td>\n<\/tr>\n
313<\/td>\nVIII-850 Technique
VIII-850.1 Probe Data Acquisition Speed
VIII-850.2 Recording
VIII-850.3 Automated Data Screening System
VIII-860 Calibration
VIII-861 Equipment Calibration
VIII-862 Calibration Reference Standards
VIII-863 Base Frequency <\/td>\n<\/tr>\n
314<\/td>\nVIII-864 Setup and Adjustment
VIII-864.1 Differential Technique Response From Calibration Reference
VIII-864.2 Absolute Technique From Calibration Reference Standard <\/td>\n<\/tr>\n
315<\/td>\nVIII-870 Examination
VIII-880 Evaluation
VIII-880.1 Data Evaluation
VIII-880.2 Means of Determining Indication Depth
VIII-880.3 Frequencies Used for Data Evaluation
VIII-890 Documentation
VIII-890.1 Reporting
VIII-890.2 Support Members
VIII-890.3 Records <\/td>\n<\/tr>\n
317<\/td>\nArticle 9 Visual Examination
T-910 Scope
T-920 General
T-921 Written Procedure Requirements
T-922 Personnel Requirements
T-923 Physical Requirements
T-921 Requirements of a Visual Examination Procedure <\/td>\n<\/tr>\n
318<\/td>\nT-930 Equipment
T-950 Technique
T-951 Applications
T-952 Direct Visual Examination
T-953 Remote Visual Examination
T-954 Translucent Visual Examination
T-980 Evaluation
T-990 Documentation
T-991 Report of Examination
T-993 Record Maintenance <\/td>\n<\/tr>\n
319<\/td>\nMandatory Appendix I Glossary of Terms for Visual Examination <\/td>\n<\/tr>\n
320<\/td>\nArticle 10 Leak Testing
T-1010 Scope
T-1020 General
T-1021 Written Procedure Requirements
T-1022 Referencing Code
T-1030 Equipment
T-1031 Gages <\/td>\n<\/tr>\n
321<\/td>\nT-1040 Miscellaneous Requirements
T-1041 Cleanliness
T-1042 Openings
T-1043 Temperature
T-1044 Pressure\/Vacuum (Pressure Limits)
T-1050 Procedure
T-1051 Preliminary Leak Test
T-1052 Test Sequence
T-1060 Calibration
T-1061 Pressure\/Vacuum Gages
T-1062 Temperature Measuring Devices
T-1063 Calibration Leak Standards
T-1070 Test <\/td>\n<\/tr>\n
322<\/td>\nT-1080 Evaluation
T-1081 Acceptance Standards
T-1090 Documentation
T-1091 Test Report
T-1092 Record Retention <\/td>\n<\/tr>\n
323<\/td>\nMandatory Appendix I Bubble Test \u2014 Direct Pressure Technique
I-1010 Scope
I-1020 General
I-1021 Written Procedure Requirements
I-1030 Equipment
I-1031 Gases
I-1032 Bubble Solution
I-1033 Immersion Bath
I-1070 Test
I-1071 Soak Time
I-1021 Requirements of a Direct Pressure Bubble Leak Testing Procedure <\/td>\n<\/tr>\n
324<\/td>\nI-1072 Surface Temperature
I-1073 Application of Solution
I-1074 Immersion in Bath
I-1075 Lighting and Visual Aids
I-1076 Indication of Leakage
I-1077 Posttest Cleaning
I-1080 Evaluation
I-1081 Leakage
I-1082 Repair\/Retest <\/td>\n<\/tr>\n
325<\/td>\nMandatory Appendix II Bubble Test \u2014 Vacuum Box Technique
II-1010 Scope
II-1020 General
II-1021 Written Procedure Requirements
II-1030 Equipment
II-1031 Bubble Solution
II-1032 Vacuum Box
II-1021 Requirements of a Vacuum Box Leak Testing Procedure <\/td>\n<\/tr>\n
326<\/td>\nII-1033 Vacuum Source
II-1070 Test
II-1071 Surface Temperature
II-1072 Application of Solution
II-1073 Vacuum Box Placement
II-1074 Pressure (Vacuum) Retention
II-1075 Vacuum Box Overlap
II-1076 Lighting and Visual Aids
II-1077 Indication of Leakage
II-1078 Posttest Cleaning
II-1080 Evaluation
II-1081 Leakage
II-1082 Repair\/Retest <\/td>\n<\/tr>\n
327<\/td>\nMandatory Appendix III Halogen Diode Detector Probe Test
III-1010 Introduction and Scope
III-1011 Alkali-Ion Diode (Heated Anode) Halogen Leak Detectors
III-1012 Electron Capture Halogen Leak Detectors
III-1020 General
III-1021 Written Procedure Requirements
III-1030 Equipment
III-1031 Tracer Gas
III-1032 Instrument
III-1033 Calibration Leak Standards
III-1060 Calibration
III-1061 Standard Leak Size <\/td>\n<\/tr>\n
328<\/td>\nIII-1062 Warm Up
III-1063 Scanning Rate
III-1064 Detection Time
III-1065 Frequency and Sensitivity
III-1070 Test
III-1071 Location of Test
III-1072 Concentration of Tracer Gas
III-1073 Soak Time
III-1021 Requirements of a Halogen Diode Detector Probe Testing Procedure
III-1031 Tracer Gases <\/td>\n<\/tr>\n
329<\/td>\nIII-1074 Scanning Distance
III-1075 Scanning Rate
III-1076 Scanning Direction
III-1077 Leakage Detection
III-1078 Application
III-1080 Evaluation
III-1081 Leakage
III-1082 Repair\/Retest <\/td>\n<\/tr>\n
330<\/td>\nMandatory Appendix IV Helium Mass Spectrometer Test \u2014 Detector Probe Technique
IV-1010 Scope
IV-1020 General
IV-1021 Written Procedure Requirements
IV-1030 Equipment
IV-1031 Instrument
IV-1032 Auxiliary Equipment
IV-1033 Calibration Leak Standards
IV-1060 Calibration
IV-1061 Instrument Calibration
IV-1062 System Calibration <\/td>\n<\/tr>\n
331<\/td>\nIV-1070 Test
IV-1071 Location of Test
IV-1072 Concentration of Tracer Gas
IV-1073 Soak Time
IV-1074 Scanning Distance
IV-1075 Scanning Rate
IV-1021 Requirements of a Helium Mass Spectrometer Detector Probe Testing Procedure <\/td>\n<\/tr>\n
332<\/td>\nIV-1076 Scanning Direction
IV-1077 Leakage Detection
IV-1078 Application
IV-1080 Evaluation
IV-1081 Leakage
IV-1082 Repair\/Retest <\/td>\n<\/tr>\n
333<\/td>\nMandatory Appendix V Helium Mass Spectrometer Test \u2014 Tracer Probe Technique
V-1010 Scope
V-1020 General
V-1021 Written Procedure Requirements
V-1030 Equipment
V-1031 Instrument
V-1032 Auxiliary Equipment
V-1033 System Calibration Leak Standard
V-1060 Calibration
V-1061 Instrument Calibration <\/td>\n<\/tr>\n
334<\/td>\nV-1062 System Calibration
V-1070 Test
V-1071 Scanning Rate
V-1072 Scanning Direction
V-1073 Scanning Distance
V-1074 Leakage Detection
V-1075 Flow Rate
V-1021 Requirements of a Helium Mass Spectrometer Tracer Probe Testing Procedure <\/td>\n<\/tr>\n
335<\/td>\nV-1080 Evaluation
V-1081 Leakage
V-1082 Repair\/Retest <\/td>\n<\/tr>\n
336<\/td>\nMandatory Appendix VI Pressure Change Test
VI-1010 Scope
VI-1020 General
VI-1021 Written Procedure Requirements
VI-1030 Equipment
VI-1031 Pressure Measuring Instruments
VI-1032 Temperature Measuring Instruments
VI-1021 Requirements of a Pressure Change Testing Procedure <\/td>\n<\/tr>\n
337<\/td>\nVI-1060 Calibration
VI-1061 Pressure Measuring Instruments
VI-1062 Temperature Measuring Instruments
VI-1070 Test
VI-1071 Pressure Application
VI-1072 Vacuum Application
VI-1073 Test Duration
VI-1074 Small Pressurized Systems
VI-1075 Large Pressurized Systems
VI-1076 Start of Test
VI-1077 Essential Variables
VI-1080 Evaluation
VI-1081 Acceptable Test
VI-1082 Rejectable Test <\/td>\n<\/tr>\n
338<\/td>\nMandatory Appendix VII Glossary of Terms for Leak Testing <\/td>\n<\/tr>\n
339<\/td>\nMandatory Appendix VIII Thermal Conductivity Detector Probe Test
VIII-1010 Introduction and Scope
VIII-1011 Thermal Conductivity Leak Detectors
VIII-1020 General
VIII-1021 Written Procedure Requirements
VIII-1030 Equipment
VIII-1031 Tracer Gas
VIII-1032 Instrument
VIII-1033 Calibration Leak Standard
VIII-1060 Calibration
VIII-1061 Standard Leak Size
VIII-1062 Warm Up
VIII-1063 Scanning Rate <\/td>\n<\/tr>\n
340<\/td>\nVIII-1064 Detection Time
VIII-1065 Frequency and Sensitivity
VIII-1070 Test
VIII-1071 Location of Test
VIII-1072 Concentration of Tracer Gas
VIII-1073 Soak Times
VIII-1074 Scanning Distance
VIII-1075 Scanning Rate
VIII-1021 Requirements of a Thermal Conductivity Detector Probe Testing Procedure
VIII-1031 Tracer Gases <\/td>\n<\/tr>\n
341<\/td>\nVIII-1076 Scanning Direction
VIII-1077 Leakage Detection
VIII-1078 Application
VIII-1080 Evaluation
VIII-1081 Leakage
VIII-1082 Repair\/Retest <\/td>\n<\/tr>\n
342<\/td>\nMandatory Appendix IX Helium Mass Spectrometer Test \u2014 Hood Technique
IX-1010 Scope
IX-1020 General
IX-1021 Written Procedure Requirements
IX-1030 Equipment
IX-1031 Instrument
IX-1032 Auxiliary Equipment
IX-1021 Requirements of a Helium Mass Spectrometer Hood Testing Procedure <\/td>\n<\/tr>\n
343<\/td>\nIX-1033 System Calibration Leak Standard
IX-1050 Technique
IX-1051 Permeation
IX-1052 Repetitive or Similar Tests
IX-1060 Calibration
IX-1061 Instrument Calibration
IX-1062 System Calibration
IX-1070 Test
IX-1071 Standard Technique <\/td>\n<\/tr>\n
344<\/td>\nIX-1072 Alternative Technique
IX-1080 Evaluation
IX-1081 Leakage
IX-1082 Repair\/Retest <\/td>\n<\/tr>\n
345<\/td>\nMandatory Appendix X Ultrasonic Leak Detector Test
X-1010 Introduction
X-1020 General
X-1021 Written Procedure Requirements
X-1030 Equipment
X-1031 Instrument
X-1032 Capillary Calibration Leak Standard
X-1021 Requirements of an Ultrasonic Leak Testing Procedure <\/td>\n<\/tr>\n
346<\/td>\nX-1060 Calibration
X-1061 Standard Leak Size
X-1062 Warm Up
X-1063 Scanning Rate
X-1064 Frequency and Sensitivity
X-1070 Test
X-1071 Location of Test
X-1072 Soak Time
X-1073 Scanning Distance
X-1074 Scanning Rate
X-1075 Leakage Detection
X-1080 Evaluation
X-1081 Leakage
X-1082 Repair\/Retest <\/td>\n<\/tr>\n
347<\/td>\nNonmandatory Appendix A Supplementary Leak Testing Equation Symbols
A-1010 Applicability of the Formulas <\/td>\n<\/tr>\n
348<\/td>\nArticle 11 Acoustic Emission Examination of Fiber-Reinforced Plastic Vessels
T-1110 Scope
T-1120 General
T-1121 Vessel Conditioning
T-1122 Vessel Loading
T-1121 Requirements for Reduced Operating Level Immediately Prior to Examination <\/td>\n<\/tr>\n
349<\/td>\nT-1123 Vessel Support
T-1124 Environmental Conditions
T-1125 Noise Elimination
T-1126 Instrumentation Settings
T-1127 Sensors
T-1128 Procedure Requirements
T-1130 Equipment <\/td>\n<\/tr>\n
350<\/td>\nT-1160 Calibration
T-1161 System Calibration
T-1162 Sensor Locations and Spacings
T-1163 Systems Performance Check
T-1170 Examination
T-1171 General Guidelines
T-1172 Background Noise <\/td>\n<\/tr>\n
351<\/td>\nT-1173 Loading
T-1174 AE Activity
T-1175 Test Termination
T-1180 Evaluation
T-1181 Evaluation Criteria
T-1182 Emissions During Load Hold, EH
T-1183 Felicity Ratio Determination
T-1184 High Amplitude Events Criterion
T-1185 Total Counts Criterion
T-1190 Documentation
T-1191 Report <\/td>\n<\/tr>\n
352<\/td>\nT-1192 Record <\/td>\n<\/tr>\n
353<\/td>\nT-1173(a)(1) Atmospheric Vessels Loading Sequence <\/td>\n<\/tr>\n
354<\/td>\nT-1173(a)(2) Vacuum Vessels Loading Sequence <\/td>\n<\/tr>\n
355<\/td>\nT-1173(a)(3) Test Algorithm \u2014 Flowchart for Atmospheric Vessels <\/td>\n<\/tr>\n
356<\/td>\nT-1173(b)(1) Pressure Vessel Loading Sequence <\/td>\n<\/tr>\n
357<\/td>\nT-1173(b)(2) Algorithm \u2014 Flowchart for Pressure Vessels <\/td>\n<\/tr>\n
358<\/td>\nT-1181 Evaluation Criteria <\/td>\n<\/tr>\n
359<\/td>\nMandatory Appendix I Instrumentation Performance Requirements
I-1110 AE Sensors
I-1111 High Frequency Sensors
I-1112 Low Frequency Sensors
I-1120 Signal Cable
I-1130 Couplant
I-1140 Preamplifier
I-1150 Filters
I-1160 Power-Signal Cable
I-1161 Power Supply <\/td>\n<\/tr>\n
360<\/td>\nI-1170 Main Amplifier
I-1180 Main Processor
I-1181 General
I-1182 Peak Amplitude Detection
I-1183 Signal Outputs and Recording <\/td>\n<\/tr>\n
361<\/td>\nI-1183 Sample of Schematic of AE Instrumentation for Vessel Examination <\/td>\n<\/tr>\n
362<\/td>\nMandatory Appendix II Instrument Calibration
II-1110 General
II-1120 Threshold
II-1130 Reference Amplitude Threshold
II-1140 Count Criterion Nc and AM Value <\/td>\n<\/tr>\n
363<\/td>\nII-1150 Measurement of M
II-1160 Field Performance <\/td>\n<\/tr>\n
364<\/td>\nMandatory Appendix III Glossary of Terms for Acoustic Emission Examination of Fiber-Reinforced Plastic Vessels <\/td>\n<\/tr>\n
365<\/td>\nNonmandatory Appendix A Sensor Placement Guidelines
A-1110 Case 1 \u2014 Atmospheric Vertical Vessel <\/td>\n<\/tr>\n
366<\/td>\nA-1120 Case 2 \u2014 Atmospheric Vertical Vessel <\/td>\n<\/tr>\n
367<\/td>\nA-1130 Case 3 \u2014 Atmospheric\/Pressure Vessel <\/td>\n<\/tr>\n
368<\/td>\nA-1140 Case 4 \u2014 Atmospheric\/Pressure Vertical Vessel <\/td>\n<\/tr>\n
369<\/td>\nA-1150 Case 5 \u2014 Atmospheric\/Vacuum Vertical Vessel <\/td>\n<\/tr>\n
370<\/td>\nA-1160 Case 6 \u2014 Atmospheric\/Pressure Horizontal Tank <\/td>\n<\/tr>\n
371<\/td>\nArticle 12 Acoustic Emission Examination of Metallic Vessels During Pressure Testing
T-1210 Scope
T-1220 General
T-1221 Vessel Stressing
T-1222 Noise Reduction
T-1223 Sensors
T-1224 Location of Acoustic Emission Sources <\/td>\n<\/tr>\n
372<\/td>\nT-1225 Procedure Requirements
T-1230 Equipment
T-1260 Calibration
T-1261 System Calibration
T-1262 On-Site System Calibration
T-1263 Attenuation Characterization
T-1264 Sensor Location
T-1265 Sensor Spacing <\/td>\n<\/tr>\n
373<\/td>\nT-1266 Systems Performance Check
T-1270 Examination
T-1271 General Guidelines
T-1272 Background Noise
T-1273 Vessel Pressurization <\/td>\n<\/tr>\n
374<\/td>\nT-1280 Evaluation
T-1281 Evaluation Criteria
T-1290 Documentation
T-1291 Written Report
T-1292 Record <\/td>\n<\/tr>\n
375<\/td>\nT-1273.2.1 An Example of Pressure Vessel Test Stressing Sequence <\/td>\n<\/tr>\n
376<\/td>\nT-1273.2.2 An Example of In-Service, Pressure Vessel, Test Loading Sequence <\/td>\n<\/tr>\n
377<\/td>\nT-1281 An Example of Evaluation Criteria for Zone Location <\/td>\n<\/tr>\n
378<\/td>\nMandatory Appendix I Instrumentation Performance Requirements
I-1210 Acoustic Emission Sensors
I-1220 Signal Cable
I-1230 Couplant
I-1240 Preamplifier
I-1250 Filter
I-1260 Power-Signal Cable
I-1270 Power Supply
I-1280 Main Amplifier
I-1290 Main Processor
I-1291 General <\/td>\n<\/tr>\n
379<\/td>\nI-1292 Peak Amplitude Detection <\/td>\n<\/tr>\n
380<\/td>\nMandatory Appendix II Instrument Calibration and Cross-Referencing
II-1210 Manufacturer\u2019s Calibration
II-1211 Annual Calibration
II-1220 Instrument Cross-Referencing
II-1221 Sensor Characterization <\/td>\n<\/tr>\n
381<\/td>\nMandatory Appendix III Glossary of Terms for Acoustic Emission Examination of Metal Pressure Vessels <\/td>\n<\/tr>\n
382<\/td>\nNonmandatory Appendix A Sensor Placement Guidelines
A-1210 Case 1 \u2014 Vertical Pressure Vessel Dished Heads, Lug or Leg Supported <\/td>\n<\/tr>\n
383<\/td>\nA-1220 Case 2 \u2014 Vertical Pressure Vessel Dished Heads, Agitated, Baffled Lug, or Leg Support <\/td>\n<\/tr>\n
384<\/td>\nA-1230 Case 3 \u2014 Horizontal Pressure Vessel Dished Heads, Saddle Supported <\/td>\n<\/tr>\n
385<\/td>\nA-1240 Case 4 \u2014 Vertical Pressure Vessel Packed or Trayed Column Dished Heads, Lug or Skirt Supported <\/td>\n<\/tr>\n
386<\/td>\nA-1250 Case 5 \u2014 Spherical Pressure Vessel, Leg Supported <\/td>\n<\/tr>\n
387<\/td>\nNonmandatory Appendix B Supplemental Information for Conducting Acoustic Emission Examinations
B-1210 Frequency Selection
B-1220 Combining More Than One Sensor in a Single Channel
B-1230 Attenuative Welds
B-1240 Production Line Testing of Identical Vessels <\/td>\n<\/tr>\n
388<\/td>\nArticle 13 Continuous Acoustic Emission Monitoring of Pressure Boundary Components
T-1310 Scope
T-1311 References
T-1320 General
T-1321 Relevant Indications
T-1322 Personnel Qualification
T-1323 Written Procedures <\/td>\n<\/tr>\n
389<\/td>\nT-1330 Equipment
T-1331 General
T-1332 AE Sensors
T-1331 Functional Flow Diagram \u2014 Continuous AE Monitoring System <\/td>\n<\/tr>\n
390<\/td>\nT-1333 Signal Cables
T-1334 Amplifiers
T-1335 AE Instrument and Monitor
T-1332.2 Response of a Waveguide AE Sensor Inductively Tuned to 500 kHz <\/td>\n<\/tr>\n
391<\/td>\nT-1340 Miscellaneous Requirements
T-1341 Equipment Verification
T-1342 Sensor Calibration <\/td>\n<\/tr>\n
392<\/td>\nT-1343 Signal Pattern Recognition
T-1344 Material Attenuation\/Characterization
T-1345 Background Noise
T-1346 Verification Records
T-1347 Sensor Installation
T-1348 Signal Lead Installation
T-1349 AE Monitor Installation <\/td>\n<\/tr>\n
393<\/td>\nT-1350 Technique\/Procedure Requirements
T-1351 AE System Operation
T-1352 Data Processing, Interpretation, and Evaluation
T-1353 Data Recording and Storage
T-1354 Component Loading
T-1355 Noise Interference <\/td>\n<\/tr>\n
394<\/td>\nT-1356 Coordination with Plant System Owner\/Operator
T-1357 Source Location and Sensor Mounting
T-1360 Calibration
T-1361 Sensors
T-1362 Complete AE Monitor System
T-1363 Verification Intervals
T-1364 Verification Records
T-1370 Examination
T-1371 Plant Startup and Shutdown
T-1373 Plant Steady-State Operation <\/td>\n<\/tr>\n
395<\/td>\nT-1374 Nuclear Metal Components
T-1375 Non-Nuclear Metal Components
T-1376 Nonmetallic Components
T-1377 Limited Zone Monitoring
T-1378 Hostile Environment Applications
T-1379 Leak Detection Applications
T-1380 Evaluation\/Results
T-1381 Data Processing, Interpretation, and Evaluation
T-1382 Data Requirements
T-1390 Reports\/Records
T-1391 Reports to Plant System Owner\/Operator <\/td>\n<\/tr>\n
396<\/td>\nT-1392 Records
T-1393 Record Retention Requirements <\/td>\n<\/tr>\n
397<\/td>\nMandatory Appendix I Nuclear Components
I-1310 Scope
I-1330 Equipment
I-1331 Preamplifiers
I-1332 AE Sensors
I-1333 Frequency Response
I-1334 Signal Processing
I-1340 Miscellaneous Requirements
I-1341 Equipment Qualification
I-1360 Calibration
I-1361 Calibration Block
I-1362 Calibration Interval
I-1380 Evaluation <\/td>\n<\/tr>\n
399<\/td>\nMandatory Appendix II Non-Nuclear Metal Components
II-1310 Scope
II-1330 Equipment
II-1331 Sensors
II-1333 Amplifiers
II-1334 Main Processor <\/td>\n<\/tr>\n
400<\/td>\nII-1360 Calibration
II-1361 System Performance Check
II-1362 System Performance Check Verification
II-1380 Evaluation
II-1381 Evaluation Criteria \u2014 Zone Location
II-1382 Evaluation Criteria \u2014 Multisource Location
II-1381 An Example of Evaluation Criteria for Zone Location
II-1382 An Example of Evaluation Criteria for Multisource Location <\/td>\n<\/tr>\n
401<\/td>\nMandatory Appendix III Nonmetallic Components
III-1310 Scope
III-1320 General
III-1321 Applications
III-1330 Equipment
III-1331 Sensors
III-1332 Source Location Accuracy
III-1360 Calibration
III-1361
III-1362
III-1363
III-1364 <\/td>\n<\/tr>\n
402<\/td>\nIII-1380 Evaluation
III-1381 Evaluation Criteria
III-1382 Source Mechanism <\/td>\n<\/tr>\n
403<\/td>\nMandatory Appendix IV Limited Zone Monitoring
IV-1310 Scope
IV-1320 General
IV-1321 Guard Sensor Technique
IV-1340 Miscellaneous Requirements
IV-1341 Redundant Sensors
IV-1350 Technique
IV-1351 Techniques
IV-1352 Procedure
IV-1353 Other Techniques
IV-1360 Calibration
IV-1380 Evaluation <\/td>\n<\/tr>\n
404<\/td>\nIV-1390 Documentation <\/td>\n<\/tr>\n
405<\/td>\nMandatory Appendix V Hostile Environment Applications
V-1310 Scope
V-1330 Equipment
V-1331 AE Sensors
V-1332 AE Sensor Types
V-1333 Waveguide
V-1334 AE Signal Transmission
V-1340 Miscellaneous Requirements
V-1341 Sensor Mounting <\/td>\n<\/tr>\n
406<\/td>\nV-1333 Metal Waveguide AE Sensor Construction <\/td>\n<\/tr>\n
407<\/td>\nV-1341 Mounting Fixture for Steel Waveguide AE Sensor <\/td>\n<\/tr>\n
408<\/td>\nMandatory Appendix VI Leak Detection Applications
VI-1310 Scope
VI-1320 General
VI-1330 Equipment
VI-1331 Sensor Type
VI-1332 Waveguide <\/td>\n<\/tr>\n
409<\/td>\nVI-1333 Electronic Filters
VI-1350 Technique
VI-1351 Procedure
VI-1360 Calibration
VI-1361 Calibration Checks
VI-1370 Examination
VI-1371 Implementation of System Requirements
VI-1372 Verification Procedure
VI-1373 Equipment Qualification and Calibration Data
VI-1380 Evaluation
VI-1381 Leak Indications
VI-1382 Leak Location <\/td>\n<\/tr>\n
410<\/td>\nMandatory Appendix VII Glossary of Terms for Acoustic Emission Examination <\/td>\n<\/tr>\n
411<\/td>\nArticle 14 Examination System Qualification
T-1410 Scope
T-1420 General Requirements
T-1421 The Qualification Process
T-1422 Technical Justification
T-1423 Performance Demonstration
T-1424 Levels of Rigor <\/td>\n<\/tr>\n
412<\/td>\nT-1425 Planning a Qualification Demonstration
T-1430 Equipment
T-1440 Application Requirements
T-1441 Technical Justification Report <\/td>\n<\/tr>\n
413<\/td>\nT-1442 Performance Demonstration <\/td>\n<\/tr>\n
414<\/td>\nT-1443 Examination System Requalification
T-1450 Conduct of Qualification Demonstration
T-1451 Protocol Document
T-1452 Individual Qualification <\/td>\n<\/tr>\n
415<\/td>\nT-1460 Calibration
T-1470 Examination
T-1471 Intermediate Rigor Detection Test
T-1472 High Rigor Detection Tests <\/td>\n<\/tr>\n
416<\/td>\nT-1472.1 Total Number of Samples for a Given Number of Misses at a Specified Confidence Level and POD
T-1472.2 Required Number of First Stage Examiners vs. Target Pass Rate <\/td>\n<\/tr>\n
417<\/td>\nT-1480 Evaluation
T-1490 Documentation and Records <\/td>\n<\/tr>\n
418<\/td>\nMandatory Appendix I Glossary of Terms for Examination System Qualification <\/td>\n<\/tr>\n
419<\/td>\nMandatory Appendix II UT Performance Demonstration Criteria
II-1410 Scope
II-1420 General
II-1430 Equipment
II-1434 Qualification Blocks
II-1440 Application Requirements <\/td>\n<\/tr>\n
420<\/td>\nII-1450 Conduct of Qualification Demonstration
II-1434 Flaw Characterization for Tables II-1434-1 and II-1434-2
II-1434-1 Flaw Acceptance Criteria for 4-in. to 12-in. Thick Weld
II-1434-2 Flaw Acceptance Criteria for Larger Than 12-in. Thick Weld <\/td>\n<\/tr>\n
421<\/td>\nII-1460 Calibration
II-1470 Examination
II-1480 Evaluation
II-1481 Low Level
II-1482 Intermediate Level
II-1483 High Level
II-1490 Documentation <\/td>\n<\/tr>\n
422<\/td>\nArticle 15 Alternating Current Field Measurement Technique (ACFMT)
T-1510 Scope
T-1520 General
T-1521 Supplemental Requirements
T-1522 Written Procedure Requirements
T-1530 Equipment
T-1531 Instrument
T-1532 Probes
T-1533 Calibration Blocks <\/td>\n<\/tr>\n
423<\/td>\nT-1540 Miscellaneous Requirements
T-1541 Surface Conditioning
T-1542 Demagnetization
T-1543 Identification of Weld Examination Areas
T-1560 Calibration
T-1561 General Requirements
T-1562 Calibration
T-1522 Requirements of an ACFMT Examination Procedure <\/td>\n<\/tr>\n
424<\/td>\nT-1563 Performance Confirmation
T-1533 ACFMT Calibration Block <\/td>\n<\/tr>\n
425<\/td>\nT-1570 Examination
T-1571 General Examination Requirements
T-1572 Examination Coverage
T-1573 Overlap
T-1574 Interpretation
T-1580 Evaluation
T-1590 Documentation
T-1591 Recording Indication
T-1592 Examination Record
T-1593 Report <\/td>\n<\/tr>\n
426<\/td>\nArticle 16 Magnetic Flux Leakage (MFL) Examination
T-1610 Scope
T-1620 General
T-1621 Personnel Qualification Requirements
T-1622 Equipment Qualification Requirements
T-1623 Written Procedure Requirements <\/td>\n<\/tr>\n
427<\/td>\nT-1630 Equipment
T-1640 Requirements
T-1650 Calibration
T-1660 Examination
T-1622.1.1 Reference Plate Dimensions <\/td>\n<\/tr>\n
428<\/td>\nT-1622.1.2 Reference Pipe or Tube Dimensions
T-1623 Requirements of an MFL Examination Procedure <\/td>\n<\/tr>\n
429<\/td>\nT-1670 Evaluation
T-1680 Documentation <\/td>\n<\/tr>\n
430<\/td>\nArticle 17 Remote Field Testing (RFT) Examination Method
T-1710 Scope
T-1720 General
T-1721 Written Procedure Requirements
T-1722 Personnel Requirements
T-1730 Equipment
T-1750 Technique
T-1721 Requirements of an RFT Examination Procedure <\/td>\n<\/tr>\n
431<\/td>\nT-1760 Calibration
T-1761 Instrument Calibration
T-1762 System Preparation
T-1763 System Setup and Calibration
T-1762 Pit Reference Tube (Typical) <\/td>\n<\/tr>\n
432<\/td>\nT-1763.1(a) Voltage Plane Display of Differential Channel Response for Through-Wall Hole (Through-Hole Signal) and 20% Groove Showing Preferred Angular Relationship
T-1763.1(b) Voltage Plane Display of Differential Channel Response for the Tube Support Plate (TSP), 20% Groove, and Through-Wall Hole (Through-Hole Signal) <\/td>\n<\/tr>\n
433<\/td>\nT-1764 Auxiliary Frequency(ies) Calibration Procedure
T-1765 Calibration Confirmation
T-1766 Correlation of Signals to Estimate Depth of Flaws
T-1770 Examination
T-1771 General
T-1772 Probe Speed
T-1780 Evaluation
T-1790 Documentation
T-1763.2 Reference Curve and the Absolute Channel Signal Response From Two Circumferential Grooves and a Tube Support Plate <\/td>\n<\/tr>\n
434<\/td>\nT-1793 Record Retention <\/td>\n<\/tr>\n
435<\/td>\nArticle 18 Acoustic Pulse Reflectometry (APR) Examination
T-1810 Scope
T-1820 General
T-1821 Written Procedure Requirements
T-1830 Equipment
T-1831 Instrumentation
T-1832 Reference Specimen
T-1821 Requirements of an Acoustic Pulse Reflectometry Examination Procedure <\/td>\n<\/tr>\n
436<\/td>\nT-1832 Reference Specimens <\/td>\n<\/tr>\n
437<\/td>\nT-1840 Miscellaneous Requirements
T-1841 Tube or Pipe Precleaning
T-1850 Prior to the Examination
T-1860 Calibration
T-1861 Instrument Calibration
T-1862 System Preparation
T-1863 System Setup
T-1864 Functional Test <\/td>\n<\/tr>\n
438<\/td>\nT-1865 Analysis of Signals to Determine Flaw Type and Estimate Flaw Size
T-1870 Examination
T-1880 Evaluation
T-1890 Documentation
T-1891 Recording Indications
T-1892 Examination Records
T-1893 Storage Media <\/td>\n<\/tr>\n
439<\/td>\nT-1865.1 Signal Analysis From Various Types of Discontinuities
T-1865.2 Reflection From a Through-Wall Hole <\/td>\n<\/tr>\n
440<\/td>\nArticle 19 Guided Wave Examination Method for Piping
T-1910 Scope
T-1920 General
T-1921 Written Procedure Requirements
T-1922 Personnel Qualification
T-1930 Equipment
T-1931 Instrumentation Requirements
T-1932 Sensors
T-1950 Wave Modes <\/td>\n<\/tr>\n
441<\/td>\nT-1951 Miscellaneous Requirements
T-1960 Calibration
T-1961 Instrument Calibration
T-1921.1 Requirements of a GWT Examination Procedure <\/td>\n<\/tr>\n
442<\/td>\nT-1962 System Calibration
T-1963 Distance\u2013Amplitude Correction (DAC) or Time-Corrected Gain (TCG)
T-1964 Detection Threshold
T-1965 Call Level
T-1970 Examination
T-1971 Examination Coverage
T-1980 Evaluation
T-1981 General
T-1982 Evaluation Level
T-1990 Documentation
T-1992 Examination Records <\/td>\n<\/tr>\n
444<\/td>\nNonmandatory Appendix A Operation of GWT Systems
A-1910 Scope
A-1920 General <\/td>\n<\/tr>\n
445<\/td>\nA-1921 Call Level
A-1922 Effect of Pipe Geometry on Examination Range
A-1920 Illustration of the Guided Wave Examination Procedure <\/td>\n<\/tr>\n
446<\/td>\nA-1923 Effect of Pipe Coating
A-1924 Effect of General Corrosion on Examination Range
A-1925 Special Applications of Guided Wave Testing <\/td>\n<\/tr>\n
447<\/td>\nSubsection B Documents Adopted by Section V <\/td>\n<\/tr>\n
448<\/td>\nArticle 22 Radiographic Standards <\/td>\n<\/tr>\n
449<\/td>\nSE-94 <\/td>\n<\/tr>\n
463<\/td>\nSE-747 <\/td>\n<\/tr>\n
479<\/td>\nSE-999 <\/td>\n<\/tr>\n
485<\/td>\nSE-1025 <\/td>\n<\/tr>\n
493<\/td>\nSE-1030 <\/td>\n<\/tr>\n
505<\/td>\nSE-1114 <\/td>\n<\/tr>\n
511<\/td>\nSE-1165 <\/td>\n<\/tr>\n
525<\/td>\nSE-1255 <\/td>\n<\/tr>\n
537<\/td>\nSE-1416 <\/td>\n<\/tr>\n
543<\/td>\nSE-1647 <\/td>\n<\/tr>\n
548<\/td>\nArticle 23 Ultrasonic Standards <\/td>\n<\/tr>\n
549<\/td>\nSA-388\/SA-388M <\/td>\n<\/tr>\n
559<\/td>\nSA-435\/SA-435M <\/td>\n<\/tr>\n
563<\/td>\nSA-577\/SA-577M <\/td>\n<\/tr>\n
567<\/td>\nSA-578\/SA-578M <\/td>\n<\/tr>\n
575<\/td>\nSA-609\/SA-609M <\/td>\n<\/tr>\n
585<\/td>\nSA-745\/SA-745M <\/td>\n<\/tr>\n
591<\/td>\nSB-548 <\/td>\n<\/tr>\n
597<\/td>\nSD-7091 <\/td>\n<\/tr>\n
605<\/td>\nSE-213 <\/td>\n<\/tr>\n
617<\/td>\nSE-273 <\/td>\n<\/tr>\n
623<\/td>\nSE-797\/SE-797M <\/td>\n<\/tr>\n
631<\/td>\nSE-2491 <\/td>\n<\/tr>\n
651<\/td>\nSE-2700 <\/td>\n<\/tr>\n
660<\/td>\nArticle 24 Liquid Penetrant Standards <\/td>\n<\/tr>\n
661<\/td>\nSD-129 <\/td>\n<\/tr>\n
667<\/td>\nSD-516 <\/td>\n<\/tr>\n
673<\/td>\nSD-808 <\/td>\n<\/tr>\n
679<\/td>\nSE-165\/SE-165M <\/td>\n<\/tr>\n
699<\/td>\nSE-2297 <\/td>\n<\/tr>\n
705<\/td>\nSE-3022 <\/td>\n<\/tr>\n
714<\/td>\nArticle 25 Magnetic Particle Standards <\/td>\n<\/tr>\n
715<\/td>\nSD-1186 <\/td>\n<\/tr>\n
721<\/td>\nSE-709 <\/td>\n<\/tr>\n
769<\/td>\nArticle 26 Eddy Current Standards <\/td>\n<\/tr>\n
771<\/td>\nSE-243 <\/td>\n<\/tr>\n
777<\/td>\nArticle 29 Acoustic Emission Standards <\/td>\n<\/tr>\n
779<\/td>\nSE-650\/SE-650M <\/td>\n<\/tr>\n
783<\/td>\nSE-750 <\/td>\n<\/tr>\n
795<\/td>\nSE-976 <\/td>\n<\/tr>\n
805<\/td>\nSE-1067\/SE-1067M <\/td>\n<\/tr>\n
821<\/td>\nSE-1118\/SE-1118M <\/td>\n<\/tr>\n
835<\/td>\nSE-1139 <\/td>\n<\/tr>\n
843<\/td>\nSE-1211\/SE-1211M <\/td>\n<\/tr>\n
849<\/td>\nSE-1419\/SE-1419M <\/td>\n<\/tr>\n
857<\/td>\nSE-2075\/SE-2075M <\/td>\n<\/tr>\n
862<\/td>\nArticle 30 Terminology for Nondestructive Examinations Standard <\/td>\n<\/tr>\n
863<\/td>\nSE-1316 <\/td>\n<\/tr>\n
864<\/td>\nArticle 31 Alternating Current Field Measurement Standard <\/td>\n<\/tr>\n
865<\/td>\nSE-2261\/SE-2261M <\/td>\n<\/tr>\n
880<\/td>\nArticle 32 Remote Field Testing Standard <\/td>\n<\/tr>\n
881<\/td>\nSE-2096\/SE-2096M <\/td>\n<\/tr>\n
891<\/td>\nArticle 33 Guided Wave Standards <\/td>\n<\/tr>\n
893<\/td>\nSE-2775 <\/td>\n<\/tr>\n
905<\/td>\nSE-2929 <\/td>\n<\/tr>\n
916<\/td>\nMandatory Appendices
Mandatory Appendix II Standard Units for Use in Equations
II-1 Standard Units for Use in Equations <\/td>\n<\/tr>\n
917<\/td>\nNonmandatory Appendices
Nonmandatory Appendix A Guidance for the Use of U.S. Customary and SI Units in the ASME Boiler and Pressure Vessel Code
A-1 Use of Units in Equations
A-2 Guidelines Used to Develop SI Equivalents <\/td>\n<\/tr>\n
919<\/td>\nA-3 Soft Conversion Factors <\/td>\n<\/tr>\n
921<\/td>\nEndnotes <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

ASME BPVC – V -2017 BPVC Section V, Nondestructive Examination<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
ASME<\/b><\/a><\/td>\n2017<\/td>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":363373,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2643],"product_tag":[],"class_list":{"0":"post-363371","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-asme","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/363371","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/363373"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=363371"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=363371"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=363371"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}