{"id":374265,"date":"2024-10-20T02:37:47","date_gmt":"2024-10-20T02:37:47","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/asme-bpvc-v-2021\/"},"modified":"2024-10-26T04:35:29","modified_gmt":"2024-10-26T04:35:29","slug":"asme-bpvc-v-2021","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/asme\/asme-bpvc-v-2021\/","title":{"rendered":"ASME BPVC V 2021"},"content":{"rendered":"

This Section contains requirements and methods for nondestructive examination which are referenced and required by other BPVC Sections. It also includes manufacturer’s examination responsibilities, duties of authorized inspectors and requirements for qualification of personnel, inspection and examination. Examination methods are intended to detect surface and internal discontinuities in materials, welds, and fabricated parts and components. A glossary of related terms is included. Careful application of this Section will help users to comply with applicable regulations within their jurisdictions, while achieving the operational, cost and safety benefits to be gained from the many industry best-practices detailed within these volumes. Intended for manufacturers, users, constructors, designers and others concerned with the design, fabrication, assembly, erection, examination, inspection and testing of pressure vessels, plus all potential governing entities.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
5<\/td>\nTable of Contents <\/td>\n<\/tr>\n
28<\/td>\nList of Sections <\/td>\n<\/tr>\n
29<\/td>\nINTERPRETATIONS
CODE CASES <\/td>\n<\/tr>\n
30<\/td>\nForeword <\/td>\n<\/tr>\n
32<\/td>\nStatement of Policy on the Use of the ASME Single Certification Mark and Code Authorization in Advertising
Statement of Policy on the Use of ASME Marking to Identify Manufactured Items <\/td>\n<\/tr>\n
33<\/td>\nSubmittal of Technical Inquiries to the Boiler and Pressure Vessel Standards Committees
1 Introduction
2 Inquiry Format <\/td>\n<\/tr>\n
34<\/td>\n3 Code Revisions or Additions
4 Code Cases
5 Code Interpretations <\/td>\n<\/tr>\n
35<\/td>\n6 Submittals <\/td>\n<\/tr>\n
36<\/td>\nPERSONNEL <\/td>\n<\/tr>\n
57<\/td>\nASTM Personnel <\/td>\n<\/tr>\n
58<\/td>\nSummary of Changes <\/td>\n<\/tr>\n
62<\/td>\nList of Changes in Record Number Order <\/td>\n<\/tr>\n
63<\/td>\nCross-Referencing and Stylistic Changes in the Boiler and Pressure Vessel Code
Subparagraph Breakdowns\/Nested Lists Hierarchy
Footnotes
Submittal of Technical Inquiries to the Boiler and Pressure Vessel Standards Committees
Cross-References <\/td>\n<\/tr>\n
65<\/td>\nSubsection A Nondestructive Methods of Examination
Article 1 General Requirements
T-110 Scope
T-120 General <\/td>\n<\/tr>\n
66<\/td>\nT-130 Equipment
T-150 Procedure <\/td>\n<\/tr>\n
67<\/td>\nT-160 Calibration
T-170 Examinations and Inspections
T-180 Evaluation <\/td>\n<\/tr>\n
68<\/td>\nT-190 Records\/Documentation <\/td>\n<\/tr>\n
69<\/td>\nMandatory Appendix I Glossary of Terms for Nondestructive Examination
I-110 Scope
I-120 General Requirements
I-121 General Terms <\/td>\n<\/tr>\n
90<\/td>\nI-130 UT \u2014 Ultrasonics <\/td>\n<\/tr>\n
91<\/td>\nMandatory Appendix II Supplemental Personnel Qualification Requirements for NDE Certification
II-110 Scope
II-120 General Requirements
II-121 Level I and Level II Training and Experience Requirements
II-122 Level I and Level II Examinations
II-123 Level III Requirements
II-124 Training Outlines <\/td>\n<\/tr>\n
92<\/td>\nII-121-1 Initial Training and Experience Requirements for CR and DR Techniques <\/td>\n<\/tr>\n
93<\/td>\nII-121-2 Additional Training and Experience Requirements for PAUT, TOFD, and FMC Ultrasonic Techniques
II-122.1 Minimum CR and DR Examination Questions
II-122.2 Minimum Ultrasonic Technique Examination Questions <\/td>\n<\/tr>\n
94<\/td>\nMandatory Appendix II Supplement A <\/td>\n<\/tr>\n
95<\/td>\nMandatory Appendix III Exceptions and Additional Requirements for Use of ASNT SNT-TC-1A 2016 Edition
III-110 Exceptions, Modifications, and Additions
III-111 Use of \u201cShould\u201d and \u201cShall\u201d
III-112 Adjustments to Specific Paragraphs <\/td>\n<\/tr>\n
101<\/td>\nMandatory Appendix IV Exceptions to ANSI\/ASNT CP-189 2020 Edition
IV-110 Introduction
IV-120 Exceptions to ANSI\/ASNT CP-189
IV-121 Use of \u201cNDT\u201d and \u201cNDE\u201d
IV-122 Adjustments to Specific Paragraphs <\/td>\n<\/tr>\n
103<\/td>\nNonmandatory Appendix A Imperfection vs Type of NDE Method
A-110 Scope
A-110 Imperfection vs. Type of NDE Method <\/td>\n<\/tr>\n
105<\/td>\nArticle 2 Radiographic Examination
T-210 Scope
T-220 General Requirements
T-221 Procedure Requirements
T-222 Surface Preparation
T-223 Backscatter Radiation
T-224 System of Identification
T-225 Monitoring Density Limitations of Radiographs
T-226 Extent of Examination <\/td>\n<\/tr>\n
106<\/td>\nT-230 Equipment and Materials
T-231 Film
T-232 Intensifying Screens
T-233 Image Quality Indicator (IQI) Design
T-233.1 Hole-Type IQI Designation, Thickness, and Hole Diameters
T-233.2 Wire IQI Designation, Wire Diameter, and Wire Identity <\/td>\n<\/tr>\n
107<\/td>\nT-234 Facilities for Viewing of Radiographs
T-260 Calibration
T-261 Source Size
T-262 Densitometer and Step Wedge Comparison Film
T-270 Examination
T-271 Radiographic Technique <\/td>\n<\/tr>\n
108<\/td>\nT-272 Radiation Energy
T-273 Direction of Radiation
T-274 Geometric Unsharpness
T-275 Location Markers <\/td>\n<\/tr>\n
109<\/td>\nT-275 Location Marker Sketches <\/td>\n<\/tr>\n
110<\/td>\nT-276 IQI Selection
T-277 Use of IQIs to Monitor Radiographic Examination <\/td>\n<\/tr>\n
111<\/td>\nT-276 IQI Selection <\/td>\n<\/tr>\n
112<\/td>\nT-280 Evaluation
T-281 Quality of Radiographs
T-282 Radiographic Density
T-283 IQI Sensitivity <\/td>\n<\/tr>\n
113<\/td>\nT-284 Excessive Backscatter
T-285 Evaluation by Manufacturer
T-290 Documentation
T-291 Radiographic Technique Documentation Details
T-292 Radiograph Review Form
T-283 Equivalent Hole-Type IQI Sensitivity <\/td>\n<\/tr>\n
114<\/td>\nMandatory Appendix I In-Motion Radiography
I-210 Scope
I-220 General Requirements
I-223 Backscatter Detection Symbol Location
I-260 Calibration
I-263 Beam Width
I-270 Examination
I-274 Geometric and In-Motion Unsharpness
I-275 Location Markers
I-277 Placement and Number of IQIs <\/td>\n<\/tr>\n
115<\/td>\nI-279 Repaired Area
I-263 Beam Width Determination <\/td>\n<\/tr>\n
116<\/td>\nMandatory Appendix II Real-Time Radioscopic Examination
II-210 Scope
II-220 General Requirements
II-221 Procedure Requirements
II-230 Equipment and Materials
II-231 Radioscopic Examination Record
II-235 Calibration Block
II-236 Calibrated Line Pair Test Pattern and Step Wedge
II-237 Equivalent Performance Level
II-260 Calibration
II-263 System Performance Measurement
II-264 Measurement With a Calibration Block <\/td>\n<\/tr>\n
117<\/td>\nII-270 Examination
II-278 System Configuration
II-280 Evaluation
II-286 Factors Affecting System Performance
II-290 Documentation
II-291 Radioscopic Technique Information
II-292 Evaluation by Manufacturer <\/td>\n<\/tr>\n
118<\/td>\nMandatory Appendix III Digital Image Acquisition, Display, and Storage for Radiography and Radioscopy
III-210 Scope
III-220 General Requirements
III-221 Procedure Requirements
III-222 Original Image Artifacts
III-230 Equipment and Materials
III-231 Digital Image Examination Record
III-234 Viewing Considerations
III-236 Calibrated Optical Line Pair Test Pattern and Optical Density Step Wedge
III-250 Image Acquisition and Storage
III-255 Area of Interest
III-258 System Configuration
III-260 Calibration
III-263 System Performance Measurement
III-280 Evaluation
III-286 Factors Affecting System Performance <\/td>\n<\/tr>\n
119<\/td>\nIII-287 System-Induced Artifacts
III-290 Documentation
III-291 Digital Imaging Technique Information
III-292 Evaluation by Manufacturer <\/td>\n<\/tr>\n
120<\/td>\nMandatory Appendix IV Interpretation, Evaluation, and Disposition of Radiographic and Radioscopic Examination Test Results Produced by the Digital Image Acquisition and Display Process
IV-210 Scope
IV-220 General Requirements
IV-221 Procedure Requirements
IV-222 Original Image Artifacts
IV-230 Equipment and Materials
IV-231 Digital Image Examination Record
IV-234 Viewing Considerations
IV-236 Calibrated Optical Line Pair Test Pattern and Optical Density Step Wedge <\/td>\n<\/tr>\n
121<\/td>\nIV-250 Image Acquisition, Storage, and Interpretation
IV-255 Area of Interest
IV-258 System Configuration
IV-260 Calibration
IV-263 System Performance Measurement
IV-280 Evaluation
IV-286 Factors Affecting System Performance
IV-287 System-Induced Artifacts
IV-290 Documentation
IV-291 Digital Imaging Technique Information
IV-292 Evaluation by Manufacturer <\/td>\n<\/tr>\n
122<\/td>\nMandatory Appendix VI Acquisition, Display, Interpretation, and Storage of Digital Images of Radiographic Film for Nuclear Applications
VI-210 Scope
VI-220 General Requirements
VI-221 Supplemental Requirements
VI-222 Written Procedure
VI-223 Personnel Requirements
VI-230 Equipment and Materials
VI-231 System Features
VI-232 System Spot Size <\/td>\n<\/tr>\n
123<\/td>\nVI-240 System Performance Requirements
VI-241 Spatial Resolution
VI-242 Contrast Sensitivity
VI-243 Dynamic Range
VI-244 Spatial Linearity
VI-250 Technique
VI-251 Spatial Resolution Evaluation
VI-252 Contrast Sensitivity Evaluation
VI-253 Dynamic Range Evaluation
VI-254 Spatial Linearity Evaluation
VI-260 Demonstration of System Performance
VI-261 Procedure Demonstration
VI-262 Processed Targets
VI-263 Changes in Essential Variables
VI-264 Frequency of Verification <\/td>\n<\/tr>\n
124<\/td>\nVI-265 Changes in System Performance
VI-270 Examination
VI-271 System Performance Requirements
VI-272 Artifacts
VI-273 Calibration
VI-280 Evaluation
VI-281 Process Evaluation
VI-282 Interpretation
VI-283 Baseline
VI-290 Documentation
VI-291 Reporting Requirements
VI-292 Archiving <\/td>\n<\/tr>\n
125<\/td>\nMandatory Appendix VI Supplement A
VI-A-210 Scope
VI-A-220 General
VI-A-221 Reference Film
VI-A-230 Equipment and Materials
VI-A-231 Reference Targets
VI-A-232 Spatial Resolution Targets
VI-A-233 Constrast Sensitivity Targets
VI-A-234 Dynamic Range Targets
VI-A-235 Spatial Linearity Targets
VI-A-240 Miscellaneous Requirements <\/td>\n<\/tr>\n
126<\/td>\nVI-A-1 Reference Film <\/td>\n<\/tr>\n
127<\/td>\nVI-A-241 Material
VI-A-242 Film Size
VI-A-243 Spatial Resolution
VI-A-244 Density
VI-A-245 Linearity <\/td>\n<\/tr>\n
128<\/td>\nMandatory Appendix VII Radiographic Examination of Metallic Castings
VII-210 Scope
VII-220 General Requirements
VII-224 System of Identification
VII-270 Examination
VII-271 Radiographic Technique
VII-276 IQI Selection
VII-280 Evaluation
VII-282 Radiographic Density
VII-290 Documentation
VII-293 Layout Details <\/td>\n<\/tr>\n
129<\/td>\nMandatory Appendix VIII Radiography Using Phosphor Imaging Plate
VIII-210 Scope
VIII-220 General Requirements
VIII-221 Procedure Requirements
VIII-225 Monitoring Density Limitations of Radiographs
VIII-230 Equipment and Materials
VIII-231 Phosphor Imaging Plate
VIII-234 Facilities for Viewing of Radiographs
VIII-260 Calibration
VIII-262 Densitometer and Step Wedge Comparison Film
VIII-270 Examination
VIII-277 Use of IQIs to Monitor Radiographic Examination <\/td>\n<\/tr>\n
130<\/td>\nVIII-280 Evaluation
VIII-281 System-Induced Artifacts
VIII-282 Image Brightness
VIII-283 IQI Sensitivity
VIII-284 Excessive Backscatter
VIII-287 Dimensional Measuring
VIII-288 Interpretation <\/td>\n<\/tr>\n
131<\/td>\nVIII-290 Documentation
VIII-291 Digital Imaging Technique Documentation Details
VIII-293 Embedded Data <\/td>\n<\/tr>\n
132<\/td>\nMandatory Appendix VIII Supplement A
VIII-A-210 Scope
VIII-A-220 General
VIII-A-221 Demonstration Block
VIII-A-230 Equipment and Materials
VIII-A-231 Scan Parameters
VIII-A-232 Gray Scale Values
VIII-A-233 Image Quality Indicators
VIII-A-240 Miscellaneous Requirements
VIII-A-241 Sensitivity
VIII-A-242 Records <\/td>\n<\/tr>\n
133<\/td>\nVIII-A-221-1 Procedure Demonstration Block <\/td>\n<\/tr>\n
134<\/td>\nMandatory Appendix IX Radiography Using Digital Detector Systems
IX-210 Scope
IX-220 General Requirements
IX-221 Procedure Requirements
IX-225 Monitoring Density Limitations of Radiographs
IX-230 Equipment and Materials
IX-231 Film
IX-232 Intensifying Screens
IX-234 Facilities for Viewing of Radiographs
IX-260 Detector Pixel Correction
IX-261 Bad Pixel Maps <\/td>\n<\/tr>\n
135<\/td>\nIX-262 Densitometer and Step Wedge Comparison Film
IX-263 Beam Width
IX-270 Examination
IX-274 Geometric and Motion Unsharpness
IX-275 Location Markers
IX-277 Use of IQIs to Monitor Radiographic Examination <\/td>\n<\/tr>\n
136<\/td>\nIX-280 Evaluation
IX-281 Quality of Digital Images
IX-282 Image Brightness
IX-283 IQI Sensitivity
IX-263 Beam Width Determination <\/td>\n<\/tr>\n
137<\/td>\nIX-284 Excessive Backscatter
IX-287 Dimensional Measuring
IX-288 Interpretation
IX-290 Documentation
IX-291 Digital Imaging Technique Documentation Details
IX-293 Embedded Data <\/td>\n<\/tr>\n
138<\/td>\nMandatory Appendix IX Supplement A
IX-A-210 Scope
IX-A-220 General
IX-A-221 Demonstration Block
IX-A-230 Equipment and Materials
IX-A-231 Acquisition Parameters
IX-A-232 Gray Scale Values
IX-A-233 Image Quality Indicators
IX-A-240 Miscellaneous Requirements
IX-A-241 Sensitivity
IX-A-242 Records <\/td>\n<\/tr>\n
139<\/td>\nNonmandatory Appendix A Recommended Radiographic Technique Sketches for Pipe or Tube Welds
A-210 Scope <\/td>\n<\/tr>\n
140<\/td>\nA-210-1 Single-Wall Radiographic Techniques <\/td>\n<\/tr>\n
141<\/td>\nA-210-2 Double-Wall Radiographic Techniques <\/td>\n<\/tr>\n
142<\/td>\nNonmandatory Appendix C Hole-Type IQI Placement Sketches for Welds
C-210 Scope <\/td>\n<\/tr>\n
143<\/td>\nC-210-1 Side and Top Views of Hole-Type IQI Placements <\/td>\n<\/tr>\n
144<\/td>\nC-210-2 Side and Top Views of Hole-Type IQI Placements <\/td>\n<\/tr>\n
145<\/td>\nC-210-3 Side and Top Views of Hole-Type IQI Placements <\/td>\n<\/tr>\n
146<\/td>\nC-210-4 Side and Top Views of Hole-Type IQI Placements <\/td>\n<\/tr>\n
147<\/td>\nNonmandatory Appendix D Number of IQIs (Special Cases)
D-210 Scope
D-210-1 Complete Circumference Cylindrical Component
D-210-2 Section of Circumference 240 deg or More Cylindrical Component (Example is Alternate Intervals)
D-210-3 Section(s) of Circumference Less Than 240 deg Cylindrical Component <\/td>\n<\/tr>\n
148<\/td>\nD-210-4 Section(s) of Circumference Equal to or More Than 120 deg and Less Than 240 deg Cylindrical Component Option
D-210-5 Complete Circumferential Welds Spherical Component
D-210-6 Welds in Segments of Spherical Component
D-210-7 Plan View A-A <\/td>\n<\/tr>\n
149<\/td>\nD-210-8 Array of Objects in a Circle <\/td>\n<\/tr>\n
150<\/td>\nArticle 4 Ultrasonic Examination Methods for Welds
T-410 Scope
T-420 General
T-421 Written Procedure Requirements
T-430 Equipment
T-431 Instrument Requirements
T-432 Search Units <\/td>\n<\/tr>\n
151<\/td>\nT-421 Requirements of an Ultrasonic Examination Procedure <\/td>\n<\/tr>\n
152<\/td>\nT-433 Couplant
T-434 Calibration Blocks <\/td>\n<\/tr>\n
154<\/td>\nT-434.1.7.2 Ratio Limits for Curved Surfaces <\/td>\n<\/tr>\n
155<\/td>\nT-434.2.1 Nonpiping Calibration Blocks <\/td>\n<\/tr>\n
156<\/td>\nT-434.3-1 Calibration Block for Piping <\/td>\n<\/tr>\n
157<\/td>\nT-434.3-2 Alternate Calibration Block for Piping <\/td>\n<\/tr>\n
158<\/td>\nT-434.4.1 Calibration Block for Technique One <\/td>\n<\/tr>\n
159<\/td>\nT-434.4.2.1 Alternate Calibration Block for Technique One <\/td>\n<\/tr>\n
160<\/td>\nT-434.4.2.2 Alternate Calibration Block for Technique One
T-434.4.3 Calibration Block for Technique Two <\/td>\n<\/tr>\n
161<\/td>\nT-434.5.1 Calibration Block for Straight Beam Examination of Nozzle Side Weld Fusion Zone and\/or Adjacent Nozzle Parent Metal <\/td>\n<\/tr>\n
162<\/td>\nT-440 Miscellaneous Requirements
T-441 Identification of Weld Examination Areas
T-450 Techniques
T-451 Coarse Grain Materials
T-452 Computerized Imaging Techniques
T-453 Scanning Techniques
T-460 Calibration
T-461 Instrument Linearity Checks <\/td>\n<\/tr>\n
163<\/td>\nT-462 General Calibration Requirements
T-463 Calibration for Nonpiping <\/td>\n<\/tr>\n
164<\/td>\nT-464 Calibration for Piping
T-465 Calibration for Weld Metal Overlay Cladding
T-466 Calibration for Nozzle Side Weld Fusion Zone and\/or Adjacent Nozzle Parent Metal <\/td>\n<\/tr>\n
165<\/td>\nT-467 Calibration Confirmation
T-470 Examination
T-471 General Examination Requirements <\/td>\n<\/tr>\n
166<\/td>\nT-472 Weld Joint Distance\u2013Amplitude Technique
T-473 Weld Metal Overlay Cladding Techniques
T-474 Nondistance\u2013Amplitude Techniques <\/td>\n<\/tr>\n
167<\/td>\nT-475 Nozzle Side Weld Fusion Zone and\/or Adjacent Nozzle Parent Metal
T-477 Post-Examination Cleaning
T-480 Evaluation
T-481 General
T-482 Evaluation Level
T-483 Evaluation of Laminar Reflectors
T-484 Alternative Evaluations
T-490 Documentation
T-491 Recording Indications
T-492 Examination Records <\/td>\n<\/tr>\n
168<\/td>\nT-493 Report
T-494 Storage Media <\/td>\n<\/tr>\n
169<\/td>\nMandatory Appendix I Screen Height Linearity
I-410 Scope
I-440 Miscellaneous Requirements
I-440 Linearity <\/td>\n<\/tr>\n
170<\/td>\nMandatory Appendix II Amplitude Control Linearity
II-410 Scope
II-440 Miscellaneous Requirements <\/td>\n<\/tr>\n
171<\/td>\nMandatory Appendix III Time of Flight Diffraction (TOFD) Technique
III-410 Scope
III-420 General
III-421 Written Procedure Requirements
III-430 Equipment
III-431 Instrument Requirements
III-432 Search Units
III-421 Requirements of a TOFD Examination Procedure <\/td>\n<\/tr>\n
172<\/td>\nIII-434 Calibration Blocks
III-435 Mechanics
III-434.2.1(a) TOFD Reference Block <\/td>\n<\/tr>\n
173<\/td>\nIII-460 Calibration
III-463 Calibration
III-464 Calibration for Piping
III-465 Calibration for Cladding
III-434.2.1(b) Two-Zone Reference Block Example <\/td>\n<\/tr>\n
174<\/td>\nIII-467 Encoder Confirmation
III-470 Examination
III-471 General Examination Requirements
III-463.5 Offset Scans <\/td>\n<\/tr>\n
175<\/td>\nIII-472 Weld Joint Distance\u2013Amplitude Technique
III-473 Cladding Technique
III-475 Data Sampling Spacing
III-480 Evaluation
III-485 Missing Data Lines
III-486 Flaw Sizing and Interpretation
III-490 Documentation
III-492 Examination Record
III-493 Report <\/td>\n<\/tr>\n
176<\/td>\nMandatory Appendix IV Phased Array Manual Raster Examination Techniques Using Linear Arrays
IV-410 Scope
IV-420 General
IV-421 Written Procedure Requirements
IV-422 Scan Plan
IV-460 Calibration
IV-461 Instrument Linearity Checks
IV-462 General Calibration Requirements
IV-490 Documentation
IV-492 Examination Record <\/td>\n<\/tr>\n
177<\/td>\nIV-421 Requirements of a Manual Linear Phased Array Raster Scanning Examination Procedure <\/td>\n<\/tr>\n
178<\/td>\nMandatory Appendix V Phased Array E-Scan and S-Scan Linear Scanning Examination Techniques
V-410 Scope
V-420 General
V-421 Written Procedure Requirements
V-422 Scan Plan
V-460 Calibration
V-461 Instrument Linearity Checks
V-462 General Calibration Requirements
V-467 Encoder Calibration
V-470 Examination
V-471 General Examination Requirements <\/td>\n<\/tr>\n
179<\/td>\nV-421 Requirements of Phased Array Linear Scanning Examination Procedures <\/td>\n<\/tr>\n
180<\/td>\nV-490 Documentation
V-492 Examination Record <\/td>\n<\/tr>\n
181<\/td>\nMandatory Appendix VII Ultrasonic Examination Requirements for Workmanship-Based Acceptance Criteria
VII-410 Scope
VII-420 General
VII-421 Written Procedure Requirements
VII-423 Personnel Qualifications
VII-430 Equipment
VII-431 Instrument Requirements
VII-434 Calibration Blocks
VII-440 Miscellaneous Requirements
VII-442 Scanning Data <\/td>\n<\/tr>\n
182<\/td>\nVII-460 Calibration
VII-466 Calibration for Nozzle Side Weld Fusion Zone and\/or Adjacent Nozzle Parent Metal
VII-470 Examination
VII-471 General Examination Requirements
VII-480 Evaluation
VII-483 Evaluation of Laminar Reflectors
VII-485 Evaluation
VII-486 Supplemental Manual Techniques
VII-487 Evaluation by Manufacturer
VII-490 Documentation
VII-492 Examination Record <\/td>\n<\/tr>\n
183<\/td>\nMandatory Appendix VIII Ultrasonic Examination Requirements for Fracture-Mechanics-Based Acceptance Criteria
VIII-410 Scope
VIII-420 General
VIII-421 Written Procedure Requirements
VIII-423 Personnel Qualifications
VIII-430 Equipment
VIII-431 Instrument Requirements
VIII-432 Search Units
VIII-434 Calibration Blocks <\/td>\n<\/tr>\n
184<\/td>\nVIII-440 Miscellaneous Requirements
VIII-442 Scanning Data
VIII-460 Calibration
VIII-467 Calibration for Nozzle Side Weld Fusion Zone and\/or Adjacent Nozzle Parent Metal
VIII-470 Examination
VIII-471 General Examination Requirements
VIII-480 Evaluation
VIII-482 Evaluation Level
VIII-483 Evaluation of Laminar Reflectors
VIII-485 Evaluation Settings
VIII-486 Size and Category
VIII-487 Supplemental Manual Techniques
VIII-488 Evaluation by Manufacturer <\/td>\n<\/tr>\n
185<\/td>\nVIII-490 Documentation
VIII-492 Examination Records <\/td>\n<\/tr>\n
186<\/td>\nMandatory Appendix IX Procedure Qualification Requirements for Flaw Sizing and Categorization
IX-410 Scope
IX-420 General
IX-430 Equipment
IX-435 Demonstration Blocks
IX-440 Miscellaneous Requirements
IX-442 Qualification Data <\/td>\n<\/tr>\n
187<\/td>\nIX-480 Evaluation
IX-481 Size and Category
IX-482 Automated and Semiautomated Acceptable Performance Criteria
IX-483 Supplemental Manual Technique(s) Acceptable Performance
IX-490 Documentation
IX-495 Demonstration Block Record <\/td>\n<\/tr>\n
188<\/td>\nMandatory Appendix X Ultrasonic Examination of High Density Polyethylene
X-410 Scope
X-420 General
X-421 Written Procedure Requirements
X-422 Scan Plan
X-430 Equipment
X-431 Instrument Requirements
X-421 Requirements of an Ultrasonic Examination Procedure for HDPE Techniques <\/td>\n<\/tr>\n
189<\/td>\nX-432 Search Units
X-434 Calibration Blocks
X-460 Calibration
X-462 General Calibration Requirements
X-464 Calibration for Piping
X-467 Calibration Confirmation <\/td>\n<\/tr>\n
190<\/td>\nX-470 Examination
X-471 General Examination Requirements
X-490 Documentation
X-492 Examination Record
X-471.1 Fusion Pipe Joint Examination Volume <\/td>\n<\/tr>\n
191<\/td>\nMandatory Appendix XI Full Matrix Capture
XI-410 Scope
XI-420 General
XI-421 Written Procedure Requirements
XI-422 Scan Plan
XI-423 Personnel Qualifications
XI-430 Equipment
XI-432 Search Unit(s)
XI-434 Calibration Blocks <\/td>\n<\/tr>\n
192<\/td>\nXI-435 Reference Standards
XI-450 Techniques
XI-451 Data Reconstruction Techniques
XI-421.1-1 Requirements of an FMC Examination Procedure <\/td>\n<\/tr>\n
193<\/td>\nXI-434.1-1 Calibration Block <\/td>\n<\/tr>\n
194<\/td>\nXI-460 Calibration
XI-461 Instrument Calibration
XI-462 General Calibration Requirements <\/td>\n<\/tr>\n
195<\/td>\nXI-464
XI-467 Encoder Calibration
XI-470 Examination
XI-471 General Examination Requirements
XI-474
XI-480 Evaluation
XI-481 General Evaluation Requirements <\/td>\n<\/tr>\n
196<\/td>\nXI-482 Evaluation Level
XI-483 Evaluation of Laminar Reflectors
XI-485 Evaluation Settings
XI-486 Size and Category
XI-488 Evaluation by Manufacturer
XI-490 Documentation
XI-492 Examination Records <\/td>\n<\/tr>\n
197<\/td>\nXI-494 Data Storage <\/td>\n<\/tr>\n
198<\/td>\nNonmandatory Appendix A Layout of Vessel Reference Points
A-410 Scope
A-440 Miscellaneous Requirements
A-441 Circumferential (Girth) Welds
A-442 Longitudinal Welds
A-443 Nozzle-to-Vessel Welds <\/td>\n<\/tr>\n
199<\/td>\nNonmandatory Appendix B General Techniques for Angle Beam Calibrations
B-410 Scope
B-460 Calibration
B-461 Sweep Range Calibration
B-461.1 Sweep Range (Side-Drilled Holes) <\/td>\n<\/tr>\n
200<\/td>\nB-461.2 Sweep Range (IIW Block)
B-461.3 Sweep Range (Notches) <\/td>\n<\/tr>\n
201<\/td>\nB-462 Distance\u2013Amplitude Correction
B-462.1 Sensitivity and Distance\u2013Amplitude Correction (Side-Drilled Holes) <\/td>\n<\/tr>\n
202<\/td>\nB-463 Distance\u2013Amplitude Correction Inner 1\/4 Volume (See Nonmandatory Appendix J, Figure J-431 View A)
B-464 Position Calibration (See Figure B-464)
B-462.3 Sensitivity and Distance\u2013Amplitude Correction (Notches) <\/td>\n<\/tr>\n
203<\/td>\nB-465 Calibration Correction for Planar Reflectors Perpendicular to the Examination Surface at or Near the Opposite Surface (See Figure B-465)
B-466 Beam Spread (See Figure B-466)
B-464 Position Depth and Beam Path
B-465 Planar Reflections <\/td>\n<\/tr>\n
204<\/td>\nB-466 Beam Spread <\/td>\n<\/tr>\n
205<\/td>\nNonmandatory Appendix C General Techniques for Straight Beam Calibrations
C-410 Scope
C-460 Calibration
C-461 Sweep Range Calibration (See Figure C-461)
C-462 Distance\u2013Amplitude Correction (See Figure C-462)
C-461 Sweep Range <\/td>\n<\/tr>\n
206<\/td>\nC-462 Sensitivity and Distance\u2013Amplitude Correction <\/td>\n<\/tr>\n
207<\/td>\nNonmandatory Appendix D Examples of Recording Angle Beam Examination Data
D-410 Scope
D-420 General
D-470 Examination Requirements
D-471 Reflectors With Indication Amplitudes Greater Than 20% of DAC or Reference Level
D-472 Reflectors With Indication Amplitudes Greater Than the DAC Curve or Reference Level
D-473 Flaw Sizing Techniques to Be Qualified and Demonstrated
D-490 Documentation <\/td>\n<\/tr>\n
208<\/td>\nD-491 Reflectors With Indication Amplitudes Greater Than 20% of DAC or Reference Level
D-490 Search Unit Location, Position, and Beam Direction
D-490 Example Data Record <\/td>\n<\/tr>\n
209<\/td>\nD-492 Reflectors With Indication Amplitudes Greater Than the DAC Curve or Reference Level
D-493 Reflectors That Require Measurement Techniques to Be Qualified and Demonstrated <\/td>\n<\/tr>\n
210<\/td>\nNonmandatory Appendix E Computerized Imaging Techniques
E-410 Scope
E-420 General
E-460 Calibration
E-470 Examination
E-471 Synthetic Aperture Focusing Technique for Ultrasonic Testing (SAFT-UT) <\/td>\n<\/tr>\n
211<\/td>\nE-472 Line-Synthetic Aperture Focusing Technique (L-SAFT)
E-473 Broadband Holography Technique <\/td>\n<\/tr>\n
212<\/td>\nE-460.1 Lateral Resolution and Depth Discrimination Block for 45 deg and 60 deg Applications <\/td>\n<\/tr>\n
213<\/td>\nE-474 UT-Phased Array Technique <\/td>\n<\/tr>\n
214<\/td>\nE-460.2 Lateral and Depth Resolution Block for 0 deg Applications <\/td>\n<\/tr>\n
215<\/td>\nE-475 UT-Amplitude Time-of-Flight Locus-Curve Analysis Technique
E-476 Automated Data Acquisition and Imaging Technique <\/td>\n<\/tr>\n
216<\/td>\nNonmandatory Appendix F Examination of Welds Using Full Matrix Capture
F-410 Scope
F-420 General
F-421 Post-Processing
F-430 Equipment
F-432 Search Unit Selection <\/td>\n<\/tr>\n
217<\/td>\nF-440 Miscellaneous
F-441 Full Matrix Capture
F-442 Total Focusing Method
F-450 Techniques
F-451 Conventional Phased-Array vs. FMC\/TFM
F-441-1 An Illustrated Elementary Transmit\/Receive Matrix <\/td>\n<\/tr>\n
218<\/td>\nF-460 Calibration
F-462 General Calibration Requirements
F-451.1-1 FMC\/TFM Generic Workflow <\/td>\n<\/tr>\n
219<\/td>\nF-451.1-2 Active Focusing Workflow
F-451.1-3 Active Focusing Workflow With FMC Data Acquisition <\/td>\n<\/tr>\n
220<\/td>\nF-470 Examination
F-471 Ultrasonic Paths\/Modes
F-472 Selection of the Path(s)\/Mode(s)
F-451.1-4 Example of an Iterative FMC\/TFM Workflow as an Adaptation of That Shown in Figure F-451.1-1 <\/td>\n<\/tr>\n
221<\/td>\nF-473 Defect Orientation and Sensitivity
F-480 Evaluation
F-481 Detection <\/td>\n<\/tr>\n
222<\/td>\nF-471-1 Ultrasonic Imaging Paths\/Modes <\/td>\n<\/tr>\n
223<\/td>\nF-471-1 Examples of Ultrasonic Imaging Modes <\/td>\n<\/tr>\n
224<\/td>\nNonmandatory Appendix G Alternate Calibration Block Configuration
G-410 Scope
G-460 Calibration
G-461 Determination of Gain Correction
G-461 Transducer Factor, F1, for Various Ultrasonic Transducer Diameters and Frequencies <\/td>\n<\/tr>\n
225<\/td>\nG-461(a) Critical Radius, RC, for Transducer\/Couplant Combinations <\/td>\n<\/tr>\n
226<\/td>\nG-461(b) Correction Factor (Gain) for Various Ultrasonic Examination Parameters <\/td>\n<\/tr>\n
227<\/td>\nNonmandatory Appendix I Examination of Welds Using Angle Beam Search Units
I-410 Scope
I-470 Examination
I-471 General Scanning Requirements
I-472 Exceptions To General Scanning Requirements
I-473 Examination Coverage <\/td>\n<\/tr>\n
228<\/td>\nNonmandatory Appendix J Alternative Basic Calibration Block
J-410 Scope
J-430 Equipment
J-431 Basic Calibration Block
J-432 Basic Calibration Block Material
J-433 Calibration Reflectors <\/td>\n<\/tr>\n
229<\/td>\nJ-431 Basic Calibration Block <\/td>\n<\/tr>\n
231<\/td>\nNonmandatory Appendix K Recording Straight Beam Examination Data for Planar Reflectors
K-410 Scope
K-470 Examination
K-471 Overlap
K-490 Records\/Documentation <\/td>\n<\/tr>\n
232<\/td>\nNonmandatory Appendix L TOFD Sizing Demonstration\/Dual Probe \u2014 Computer Imaging Technique
L-410 Scope
L-420 General
L-430 Equipment
L-431 System
L-432 Demonstration Block
L-460 Calibration
L-461 System
L-462 System Checks
L-470 Examination
L-480 Evaluation
L-481 Sizing Determinations <\/td>\n<\/tr>\n
233<\/td>\nL-482 Sizing Accuracy Determinations
L-483 Classification\/Sizing System
L-432 Example of a Flat Demonstration Block Containing Three Notches <\/td>\n<\/tr>\n
234<\/td>\nL-490 Documentation
L-491 Demonstration Report <\/td>\n<\/tr>\n
235<\/td>\nNonmandatory Appendix M General Techniques for Angle Beam Longitudinal Wave Calibrations
M-410 Scope
M-460 Calibration
M-461 Sweep Range Calibration
M-461.1 Sweep Range (Side-Drilled Holes) <\/td>\n<\/tr>\n
236<\/td>\nM-461.2 Sweep Range (Cylindrical Surfaces)
M-461.3 Sweep Range (Straight Beam Search Unit) <\/td>\n<\/tr>\n
237<\/td>\nM-462 Distance\u2013Amplitude Correction (DAC) (See Figure M-462)
M-462 Sensitivity and Distance\u2013Amplitude Correction <\/td>\n<\/tr>\n
238<\/td>\nNonmandatory Appendix N Time of Flight Diffraction (TOFD) Interpretation
N-410 Scope
N-420 General
N-421 TOFD Images \u2014 Data Visualization
N-421(a) Schematic Showing Waveform Transformation Into Grayscale <\/td>\n<\/tr>\n
239<\/td>\nN-421(b) Schematic Showing Generation of Grayscale Image From Multiple A-Scans
N-421(c) Schematic Showing Standard TOFD Setup and Display With Waveform and Signal Phases <\/td>\n<\/tr>\n
240<\/td>\nN-450 Procedure
N-451 Measurement Tools
N-452 Flaw Position Errors
N-421(d) TOFD Display With Flaws and Displayed A-Scan <\/td>\n<\/tr>\n
241<\/td>\nN-451 Measurement Tools for Flaw Heights
N-452(a) Schematic Showing the Detection of Off-Axis Flaws <\/td>\n<\/tr>\n
242<\/td>\nN-453 Measuring Flaw Length
N-454 Measuring Flaw Depth
N-452(b) Measurement Errors From Flaw Position Uncertainty
N-453 TOFD Image Showing Hyperbolic \u201cTails\u201d From the Ends of a Flaw Image Used to Measure Flaw Length <\/td>\n<\/tr>\n
243<\/td>\nN-454(a) TOFD Image Showing Top and Bottom Diffracted Signals From Midwall Flaw and A-Scan Interpretation
N-454(b) TOFD Image Showing Top and Bottom Diffracted Signals From Centerline Crack and A-Scan Interpretation <\/td>\n<\/tr>\n
244<\/td>\nN-480 Evaluation
N-481 Single Flaw Images
N-481(a) Schematics of Image Generation, Scan Pattern, Waveform, and TOFD Display Showing the Image of the Point Flaw <\/td>\n<\/tr>\n
245<\/td>\nN-481(b) Schematics of Image Generation, Flaw Location, and TOFD Display Showing the Image of the Inside (ID) Surface-Breaking Flaw
N-481(c) Schematics of Image Generation, Flaw Location, and TOFD Display Showing the Image of the Outside (OD) Surface-Breaking Flaw <\/td>\n<\/tr>\n
246<\/td>\nN-481(d) Schematics of Flaw Location, Signals, and TOFD Display Showing the Image of the Midwall Flaw <\/td>\n<\/tr>\n
247<\/td>\nN-481(e) Flaw Location and TOFD Display Showing the Image of the Lack of Root Penetration
N-481(f) Flaw Location and TOFD Display Showing the Image of the Concave Root Flaw <\/td>\n<\/tr>\n
248<\/td>\nN-481(g) Flaw Location, TOFD Display Showing the Image of the Midwall Lack of Fusion Flaw, and the A-Scan
N-481(h) Flaw Location and TOFD Display Showing the Image of the Porosity <\/td>\n<\/tr>\n
249<\/td>\nN-481(i) Flaw Location and TOFD Display Showing the Image of the Transverse Crack
N-481(j) Schematics of Image Generation, Flaw Location, and TOFD Display Showing the Image of the Interpass Lack of Fusion <\/td>\n<\/tr>\n
250<\/td>\nN-482 Multiple Flaw Images
N-482(a) Schematic of Flaw Locations and TOFD Image Showing the Lateral Wave, Backwall, and Three of the Four Flaws <\/td>\n<\/tr>\n
251<\/td>\nN-483 Typical Problems With TOFD Interpretation
N-482(b) Schematic of Flaw Locations and TOFD Display Showing the Lateral Wave, Backwall, and Four Flaws <\/td>\n<\/tr>\n
252<\/td>\nN-483(a) Acceptable Noise Levels, Flaws, Lateral Wave, and Longitudinal Wave Backwall <\/td>\n<\/tr>\n
253<\/td>\nN-483(b) TOFD Image With Gain Too Low <\/td>\n<\/tr>\n
254<\/td>\nN-483(c) TOFD Image With Gain Set Too High
N-483(d)(1) TOFD Image With the Gate Set Too Early <\/td>\n<\/tr>\n
255<\/td>\nN-483(d)(2) TOFD Image With the Gate Set Too Late
N-483(d)(3) TOFD Image With the Gate Set Too Long <\/td>\n<\/tr>\n
256<\/td>\nN-483(e) TOFD Image With Transducers Set Too Far Apart
N-483(f) TOFD Image With Transducers Set Too Close Together <\/td>\n<\/tr>\n
257<\/td>\nN-483(g) TOFD Image With Transducers Not Centered on the Weld Axis
N-483(h) TOFD Image Showing Electrical Noise Interference <\/td>\n<\/tr>\n
258<\/td>\nNonmandatory Appendix O Time of Flight Diffraction (TOFD) Technique \u2014 General Examination Configurations
O-410 Scope
O-430 Equipment
O-432 Search Units
O-470 Examination
O-432(a) Search Unit Parameters for Single Zone Examinations Up to 3 in. (75 mm)
O-432(b) Search Unit Parameters for Multiple Zone Examinations Up to 12 in. (300 mm) Thick
O-470 Recommended TOFD Zones for Butt Welds Up to 12 in. (300 mm) Thick <\/td>\n<\/tr>\n
259<\/td>\nO-470(a) Example of a Single Zone TOFD Setup
O-470(b) Example of a Two Zone TOFD Setup (Equal Zone Heights)
O-470(c) Example of a Three Zone TOFD Setup (Unequal Zone Heights With Zone 3 Addressed by Two Offset Scans) <\/td>\n<\/tr>\n
260<\/td>\nO-470(d) Example of a Four Zone TOFD Setup (Equal Zone Heights) <\/td>\n<\/tr>\n
261<\/td>\nNonmandatory Appendix P Phased Array (PAUT) Interpretation
P-410 Scope
P-420 General
P-421 PAUT Images \u2014 Data Visualization
P-450 Procedure
P-451 Measurement Tools
P-452 Flaw Sizing Techniques
P-480 Evaluation <\/td>\n<\/tr>\n
262<\/td>\nP-481 I.D. (Inside Diameter) Connected Crack <\/td>\n<\/tr>\n
263<\/td>\nP-421-1 Black and White (B&W) Version of Color Palette
P-421-2 Scan Pattern Format <\/td>\n<\/tr>\n
264<\/td>\nP-421-3 Example of an E-Scan Image Display <\/td>\n<\/tr>\n
265<\/td>\nP-421-4 Example of an S-Scan Image Display
P-452.1 Flaw Length Sizing Using Amplitude Drop Technique and the Vertical Cursors on the C-Scan Display <\/td>\n<\/tr>\n
266<\/td>\nP-452.2-1 Scan Showing Flaw Height Sizing Using Amplitude Drop Technique and the Horizontal Cursors on the B-Scan Display
P-452.2-2 Flaw Height Sizing Using Top Diffraction Technique and the Horizontal Cursors on the S-Scan Display <\/td>\n<\/tr>\n
267<\/td>\nP-481 S-Scan of I.D. Connected Crack
P-481.1 E-Scan of LOF in Midwall <\/td>\n<\/tr>\n
268<\/td>\nP-481.2 S-Scan of Porosity, Showing Multiple Reflectors
P-481.3 O.D. Toe Crack Detected Using S-Scan <\/td>\n<\/tr>\n
269<\/td>\nP-481.4 IP Signal on S-Scan, Positioned on Root
P-481.5 Slag Displayed as a Midwall Defect on S-Scan <\/td>\n<\/tr>\n
270<\/td>\nNonmandatory Appendix Q Example of a Split DAC Curve
Q-410 Scope
Q-420 General
Q-421 First DAC
Q-422 Second DAC
Q-423 Notch Reflectors
Q-410 Distance\u2013Amplitude Correction <\/td>\n<\/tr>\n
271<\/td>\nQ-421 First DAC Curve
Q-422 Second DAC Curve <\/td>\n<\/tr>\n
272<\/td>\nNonmandatory Appendix R Straight Beam Calibration Blocks for Restricted Access Weld Examinations
R-410 Scope
R-420 General
R-430 Equipment
R-434 Calibration Blocks <\/td>\n<\/tr>\n
273<\/td>\nR-434-1 Corner Weld Example <\/td>\n<\/tr>\n
274<\/td>\nR-434-2 Tee Weld Example <\/td>\n<\/tr>\n
275<\/td>\nNonmandatory Appendix S General Techniques for Straight-Beam Transfer Correction
S-410 Scope
S-420 Calibration
S-430 Signal Adjustment
S-440 Distance\u2013Amplitude Correction (DAC)
S-450 Test Material Adjustment
S-460 Calculate the Transfer Correction
S-430-1 Signal Adjustment (Back Wall) <\/td>\n<\/tr>\n
276<\/td>\nS-440-1 DAC Curve for Straight Beam Transfer Correction
S-460-1 Example 1 (Straight-Beam Transfer Correction) <\/td>\n<\/tr>\n
277<\/td>\nS-460-2 Example 2 (Straight-Beam Transfer Correction) <\/td>\n<\/tr>\n
278<\/td>\nNonmandatory Appendix U General Techniques for Angle-Beam Transfer Correction
U-410 Scope
U-420 Calibration
U-430 Signal Adjustment
U-440 Distance-Amplitude Correction (DAC)
U-450 Test Material Adjustment
U-460 Calculate the Transfer Correction <\/td>\n<\/tr>\n
279<\/td>\nU-430-1 Signal Adjustment (Angle Beam)
U-440-1 DAC Curve
U-450-1 Signal Adjustment (Angle Beam) <\/td>\n<\/tr>\n
280<\/td>\nU-460-1 Example 1 (Angle-Beam Transfer Correction)
U-460-2 Example 2 (Angle-Beam Transfer Correction) <\/td>\n<\/tr>\n
281<\/td>\nArticle 5 Ultrasonic Examination Methods for Materials
T-510 Scope
T-520 General
T-521 Basic Requirements
T-522 Written Procedure Requirements
T-530 Equipment
T-531 Instrument
T-532 Search Units
T-533 Couplant
T-534 Calibration Block Requirements <\/td>\n<\/tr>\n
282<\/td>\nT-560 Calibration
T-561 Instrument Linearity Checks
T-522 Variables of an Ultrasonic Examination Procedure <\/td>\n<\/tr>\n
283<\/td>\nT-534.3 Straight Beam Calibration Blocks for Bolting <\/td>\n<\/tr>\n
284<\/td>\nT-562 General Calibration Requirements
T-563 Calibration Confirmation
T-564 Casting Calibration for Supplementary Angle Beam Examinations
T-570 Examination
T-571 Examination of Product Forms <\/td>\n<\/tr>\n
285<\/td>\nT-572 Examination of Pumps and Valves
T-573 Inservice Examination
T-574 Thickness Measurement
T-577 Post-Examination Cleaning
T-580 Evaluation
T-590 Documentation
T-591 Recording Indications
T-592 Examination Records <\/td>\n<\/tr>\n
286<\/td>\nT-593 Report
T-594 Storage Media <\/td>\n<\/tr>\n
287<\/td>\nMandatory Appendix I Ultrasonic Examination of Pumps and Valves
I-510 Scope
I-530 Equipment
I-531 Calibration Blocks
I-560 Calibration
I-561 System Calibration
I-570 Examination <\/td>\n<\/tr>\n
288<\/td>\nMandatory Appendix II Inservice Examination of Nozzle Inside Corner Radius and Inner Corner Regions
II-510 Scope
II-530 Equipment
II-531 Calibration Blocks
II-560 Calibration
II-561 System Calibration
II-570 Examination <\/td>\n<\/tr>\n
289<\/td>\nMandatory Appendix IV Inservice Examination of Bolts
IV-510 Scope
IV-530 Equipment
IV-531 Calibration Blocks
IV-560 Calibration
IV-561 DAC Calibration
IV-570 Examination
IV-571 General Examination Requirements <\/td>\n<\/tr>\n
290<\/td>\nArticle 6 Liquid Penetrant Examination
T-610 Scope
T-620 General
T-621 Written Procedure Requirements
T-630 Equipment
T-640 Miscellaneous Requirements
T-641 Control of Contaminants
T-642 Surface Preparation <\/td>\n<\/tr>\n
291<\/td>\nT-643 Drying After Preparation
T-650 Technique
T-651 Techniques
T-621.1 Requirements of a Liquid Penetrant Examination Procedure
T-621.3 Minimum and Maximum Time Limits for Steps in Penetrant Examination Procedures <\/td>\n<\/tr>\n
292<\/td>\nT-652 Techniques for Standard Temperatures
T-653 Techniques for Nonstandard Temperatures
T-654 Technique Restrictions
T-660 Calibration
T-670 Examination
T-671 Penetrant Application
T-672 Penetration (Dwell) Time
T-673 Excess Penetrant Removal <\/td>\n<\/tr>\n
293<\/td>\nT-674 Drying After Excess Penetrant Removal
T-675 Developing
T-672 Minimum Dwell Times <\/td>\n<\/tr>\n
294<\/td>\nT-676 Interpretation
T-677 Post-Examination Cleaning
T-680 Evaluation
T-690 Documentation
T-691 Recording of Indications
T-692 Examination Records <\/td>\n<\/tr>\n
295<\/td>\nMandatory Appendix II Control of Contaminants for Liquid Penetrant Examination
II-610 Scope
II-640 Requirements
II-641 Nickel Base Alloys
II-642 Austenitic or Duplex Stainless Steel and Titanium
II-643 Water
II-690 Documentation <\/td>\n<\/tr>\n
296<\/td>\nMandatory Appendix III Qualification Techniques for Examinations at Nonstandard Temperatures
III-610 Scope
III-630 Materials
III-640 Requirements
III-641 Comparator Application
III-630 Liquid Penetrant Comparator <\/td>\n<\/tr>\n
298<\/td>\nArticle 7 Magnetic Particle Examination
T-710 Scope
T-720 General
T-721 Written Procedure Requirements
T-730 Equipment
T-731 Examination Medium <\/td>\n<\/tr>\n
299<\/td>\nT-740 Miscellaneous Requirements
T-741 Surface Conditioning
T-750 Technique
T-751 Techniques
T-752 Prod Technique
T-721 Requirements of a Magnetic Particle Examination Procedure <\/td>\n<\/tr>\n
300<\/td>\nT-753 Longitudinal Magnetization Technique
T-754 Circular Magnetization Technique <\/td>\n<\/tr>\n
301<\/td>\nT-755 Yoke Technique
T-756 Multidirectional Magnetization Technique
T-754.2.1 Single-Pass and Two-Pass Central Conductor Technique
T-754.2.2 The Effective Region of Examination When Using an Offset Central Conductor <\/td>\n<\/tr>\n
302<\/td>\nT-760 Calibration
T-761 Frequency of Calibration
T-762 Lifting Power of Yokes
T-763 Gaussmeters
T-764 Magnetic Field Adequacy and Direction <\/td>\n<\/tr>\n
303<\/td>\nT-765 Wet Particle Concentration and Contamination
T-764.2(a) Pie-Shaped Magnetic Particle Field Indicator
T-764.2(b)(1) Artificial Flaw Shims <\/td>\n<\/tr>\n
304<\/td>\nT-764.2(b)(2) Artificial Flaw Shims <\/td>\n<\/tr>\n
305<\/td>\nT-766 System Performance of Horizontal Units
T-770 Examination
T-771 Preliminary Examination
T-772 Direction of Magnetization
T-773 Method of Examination <\/td>\n<\/tr>\n
306<\/td>\nT-766.1 Ketos (Betz) Test Ring <\/td>\n<\/tr>\n
307<\/td>\nT-774 Examination Coverage
T-775 Rectified Current
T-776 Excess Particle Removal
T-777 Interpretation <\/td>\n<\/tr>\n
308<\/td>\nT-778 Demagnetization
T-779 Post-Examination Cleaning
T-780 Evaluation
T-790 Documentation
T-791 Multidirectional Magnetization Technique Sketch
T-792 Recording of Indications
T-793 Examination Records <\/td>\n<\/tr>\n
309<\/td>\nMandatory Appendix I Magnetic Particle Examination Using the AC Yoke Technique on Ferromagnetic Materials Coated With Nonferromagnetic Coatings
I-710 Scope
I-720 General
I-721 Written Procedure Requirements
I-722 Personnel Qualification
I-721 Requirements of AC Yoke Technique on Coated Ferritic Component <\/td>\n<\/tr>\n
310<\/td>\nI-723 Procedure\/Technique Demonstration
I-730 Equipment
I-740 Miscellaneous Requirements
I-741 Coating Thickness Measurement
I-750 Technique
I-751 Technique Qualification
I-760 Calibration
I-761 Yoke Maximum Lifting Force <\/td>\n<\/tr>\n
311<\/td>\nI-762 Light Intensity Measurement
I-770 Examination
I-780 Evaluation
I-790 Documentation
I-791 Examination Record <\/td>\n<\/tr>\n
312<\/td>\nMandatory Appendix III Magnetic Particle Examination Using the Yoke Technique With Fluorescent Particles in an Undarkened Area
III-710 Scope
III-720 General
III-721 Written Procedure Requirements
III-723 Procedure Demonstration
III-750 Technique
III-751 Qualification Standard
III-760 Calibration
III-761 Black Light Intensity Measurement
III-762 White Light Intensity Measurement
III-770 Examination
III-721 Requirements for an AC or HWDC Yoke Technique With Fluorescent Particles in an Undarkened Area <\/td>\n<\/tr>\n
313<\/td>\nIII-777 Interpretation
III-790 Documentation
III-791 Examination Record <\/td>\n<\/tr>\n
314<\/td>\nMandatory Appendix IV Qualification of Alternate Wavelength Light Sources for Excitation of Fluorescent Particles
IV-710 Scope
IV-720 General
IV-721 Written Procedure Requirements
IV-723 Procedure Demonstration
IV-750 Technique
IV-751 Qualification Standard
IV-752 Filter Glasses
IV-770 Qualification Examinations
IV-771 Black Light Intensity
IV-772 Examination Requirements
IV-721 Requirements for Qualifying Alternate Wavelength Light Sources for Excitation of Specific Fluorescent Particles <\/td>\n<\/tr>\n
315<\/td>\nIV-773 Qualification of Alternate Wavelength Light Source and Specific Particles
IV-790 Documentation
IV-791 Examination Record <\/td>\n<\/tr>\n
316<\/td>\nMandatory Appendix V Requirements for the Use of Magnetic Rubber Techniques
V-710 Scope
V-720 General Requirements
V-721 Written Procedure Requirements
V-730 Equipment
V-731 Magnetizing Apparatus
V-732 Magnetic Rubber Materials
V-733 Magnetic Field Strength
V-734 Magnification
V-740 Miscellaneous Requirements
V-741 Surface Preparation <\/td>\n<\/tr>\n
317<\/td>\nV-742 Taping and Damming
V-743 Release Treatment
V-750 Techniques
V-751 Techniques
V-752 Application of Magnetic Field
V-721 Requirements of a Magnetic Rubber Examination Procedure <\/td>\n<\/tr>\n
318<\/td>\nV-760 Calibration
V-764 Magnetic Field Adequacy and Direction
V-770 Examination
V-773 Application of Liquid Polymer- Magnetic Particle Material
V-774 Movement During Cure
V-776 Removal of Replicas
V-780 Evaluation
V-790 Documentation
V-793 Examination Records <\/td>\n<\/tr>\n
319<\/td>\nNonmandatory Appendix A Measurement of Tangential Field Strength With Gaussmeters
A-710 Scope
A-720 General Requirements
A-730 Equipment
A-750 Procedure
A-790 Documentation\/Records <\/td>\n<\/tr>\n
320<\/td>\nArticle 8 Eddy Current Examination
T-810 Scope <\/td>\n<\/tr>\n
321<\/td>\nMandatory Appendix II Eddy Current Examination of Nonferromagnetic Heat Exchanger Tubing
II-810 Scope
II-820 General
II-821 Written Procedure Requirements
II-822 Personnel Requirements
II-830 Equipment
II-831 Data Acquisition System
II-832 Analog Data Acquisition System <\/td>\n<\/tr>\n
322<\/td>\nII-833 Digital Data Acquisition System
II-834 Bobbin Coils
II-821 Requirements of an Eddy Current Examination Procedure <\/td>\n<\/tr>\n
323<\/td>\nII-835 Data Analysis System
II-836 Analog Data Analysis System
II-837 Digital Data Analysis System
II-838 Hybrid Data Analysis System
II-840 Requirements
II-841 Recording and Sensitivity Level
II-842 Probe Traverse Speed
II-843 Fixture Location Verification
II-844 Automated Data Screening System
II-860 Calibration
II-861 Equipment Calibration <\/td>\n<\/tr>\n
324<\/td>\nII-862 Calibration Reference Standards
II-863 Analog System Setup and Adjustment <\/td>\n<\/tr>\n
325<\/td>\nII-864 Digital System Off-Line Calibration
II-870 Examination
II-880 Evaluation
II-881 Data Evaluation
II-863.1 Differential Technique Response From Calibration Reference Standard
II-863.2 Absolute Technique Response From Calibration Reference Standard <\/td>\n<\/tr>\n
326<\/td>\nII-882 Means of Determining Indication Depth
II-883 Frequencies Used for Data Evaluation
II-890 Documentation
II-891 Reporting
II-892 Records
II-880 Flaw Depth as a Function of Phase Angle at 400 kHz [Ni\u2013Cr\u2013Fe 0.050 in. (1.24 mm) Wall Tube] <\/td>\n<\/tr>\n
328<\/td>\nMandatory Appendix III Eddy Current Examination on Coated Ferromagnetic Materials
III-810 Scope
III-820 General
III-821 Personnel Qualification
III-822 Written Procedure Requirements
III-823 Procedure Demonstration
III-830 Equipment
III-850 Technique
III-860 Calibration <\/td>\n<\/tr>\n
329<\/td>\nIII-870 Examination
III-890 Documentation
III-891 Examination Report
III-893 Record Retention <\/td>\n<\/tr>\n
330<\/td>\nMandatory Appendix IV External Coil Eddy Current Examination of Tubular Products
IV-810 Scope
IV-820 General
IV-821 Performance
IV-822 Personnel Qualification
IV-823 Written Procedure Requirements
IV-830 Equipment
IV-831 Test Coils and Probes
IV-823 Requirements of an External Coil Eddy Current Examination Procedure <\/td>\n<\/tr>\n
331<\/td>\nIV-832 Scanners
IV-833 Reference Specimen
IV-850 Technique
IV-860 Calibration
IV-861 Performance Verification
IV-862 Calibration of Equipment
IV-870 Examination
IV-880 Evaluation
IV-890 Documentation
IV-891 Examination Reports
IV-893 Record Retention <\/td>\n<\/tr>\n
332<\/td>\nMandatory Appendix V Eddy Current Measurement of Nonconductive-Nonferromagnetic Coating Thickness on a Nonferromagnetic Metallic Material
V-810 Scope
V-820 General
V-821 Written Procedure Requirements
V-822 Personnel Qualification
V-823 Procedure\/Technique Demonstration
V-830 Equipment
V-821 Requirements of an Eddy Current Examination Procedure for the Measurement of Nonconductive-Nonferromagnetic Coating Thickness on a Metallic Material <\/td>\n<\/tr>\n
333<\/td>\nV-831 Probes
V-850 Technique
V-860 Calibration
V-870 Examination
V-880 Evaluation
V-890 Documentation
V-891 Examination Report
V-893 Record Retention <\/td>\n<\/tr>\n
334<\/td>\nV-860 Typical Lift-off Calibration Curve for Coating Thickness Showing Thickness Calibration Points Along the Curve <\/td>\n<\/tr>\n
335<\/td>\nMandatory Appendix VI Eddy Current Detection and Measurement of Depth of Surface Discontinuities in Nonferromagnetic Metals With Surface Probes
VI-810 Scope
VI-820 General
VI-821 Written Procedure Requirements
VI-822 Personnel Qualification
VI-823 Procedure\/Technique Demonstration
VI-821 Requirements of an Eddy Current Examination Procedure for the Detection and Measurement of Depth for Surface Discontinuities in Nonferromagnetic Metallic Materials <\/td>\n<\/tr>\n
336<\/td>\nVI-830 Equipment
VI-831 Probes
VI-832 Reference Specimen
VI-850 Technique
VI-860 Calibration
VI-870 Examination
VI-880 Evaluation <\/td>\n<\/tr>\n
337<\/td>\nVI-890 Documentation
VI-891 Examination Report
VI-893 Record Retention
VI-832 Reference Specimen
VI-850 Impedance Plane Representations of Indications From Figure VI-832 <\/td>\n<\/tr>\n
338<\/td>\nMandatory Appendix VII Eddy Current Examination of Ferromagnetic and Nonferromagnetic Conductive Metals to Determine If Flaws Are Surface Connected
VII-810 Scope
VII-820 General
VII-821 Performance
VII-822 Personnel Qualification
VII-823 Written Procedure Requirements
VII-830 Equipment
VII-831 System Description
VII-832 Surface Probes
VII-833 Cables
VII-823 Requirements of an Eddy Current Surface Examination Procedure <\/td>\n<\/tr>\n
339<\/td>\nVII-834 Instrumentation
VII-835 Reference Specimen
VII-850 Technique
VII-860 Calibration
VII-861 General
VII-862 Calibration Response
VII-870 Examination
VII-880 Evaluation
VII-890 Documentation
VII-891 Examination Report <\/td>\n<\/tr>\n
340<\/td>\nVII-892 Record Retention
VII-835 Eddy Current Reference Specimen <\/td>\n<\/tr>\n
341<\/td>\nVII-862 Impedance Plane Responses for Stainless Steel and Carbon Steel Reference Specimens <\/td>\n<\/tr>\n
342<\/td>\nMandatory Appendix VIII Alternative Technique for Eddy Current Examination of Nonferromagnetic Heat Exchanger Tubing, Excluding Nuclear Steam Generator Tubing
VIII-810 Scope
VIII-820 General
VIII-821 Written Procedure Requirements
VIII-830 Equipment
VIII-831 Data Acquisition System
VIII-832 Analog Data Acquisition System <\/td>\n<\/tr>\n
343<\/td>\nVIII-833 Digital Data Acquisition System
VIII-834 Bobbin Coils
VIII-821 Requirements of an Eddy Current Examination Procedure <\/td>\n<\/tr>\n
344<\/td>\nVIII-850 Technique
VIII-851 Probe Data Acquisition Speed
VIII-852 Recording
VIII-853 Automated Data Screening System
VIII-860 Calibration
VIII-861 Equipment Calibration
VIII-862 Calibration Reference Standards <\/td>\n<\/tr>\n
345<\/td>\nVIII-863 Base Frequency
VIII-864 Setup and Adjustment
VIII-864.1 Differential Technique Response From Calibration Reference
VIII-864.2 Absolute Technique From Calibration Reference Standard <\/td>\n<\/tr>\n
346<\/td>\nVIII-870 Examination
VIII-880 Evaluation
VIII-881 Data Evaluation
VIII-882 Means of Determining Indication Depth
VIII-883 Frequencies Used for Data Evaluation
VIII-890 Documentation
VIII-891 Reporting
VIII-892 Support Members
VIII-893 Records <\/td>\n<\/tr>\n
348<\/td>\nMandatory Appendix IX Eddy Current Array Examination of Ferromagnetic and Nonferromagnetic Materials for the Detection of Surface-Breaking Flaws
IX-810 Scope
IX-820 General Requirements
IX-821 ECA Technique
IX-822 Written Procedure Requirements
IX-823 Procedure Qualification
IX-824 Personnel Qualification
IX-825 Procedure Demonstration
IX-821-1 ECA Technique Compared to Raster Scan <\/td>\n<\/tr>\n
349<\/td>\nIX-830 Equipment
IX-831 Digital Data Acquisition Equipment
IX-832 Probes
IX-833 Reference Standard (See Figure IX-833-1)
IX-832-1 Array Coil Sensitivity Variance
IX-822-1 Written Procedure Requirements for an ECA Examination <\/td>\n<\/tr>\n
350<\/td>\nIX-840 Application Requirements
IX-841 Scanning Speed
IX-842 Coated Surfaces
IX-843 Magnetic Permeability Variance
IX-844 Automated Data Screening System
IX-850 Technique
IX-851 Frequency, Probe Drive, and Gain Selection
IX-833-1 Example Reference Standard <\/td>\n<\/tr>\n
351<\/td>\nIX-852 Channel Standardization
IX-853 Color Palette Adjustment
IX-860 Calibration
IX-861 Equipment Calibration
IX-862 System Calibration and Verification
IX-870 Examination
IX-871 Surface Condition
IX-872 Scanning Method (See Figure IX-872-1)
IX-873 Secondary Scanning
IX-880 Evaluation
IX-881 Relevant vs. Nonrelevant Indications
IX-882 Length Sizing
IX-890 Documentation
IX-891 Examination Report <\/td>\n<\/tr>\n
352<\/td>\nIX-892 Record Retention
IX-872-1 Scanning Overlap <\/td>\n<\/tr>\n
353<\/td>\nMandatory Appendix X Eddy Current Array Examination of Ferromagnetic and Nonferromagnetic Welds for the Detection of Surface-Breaking Flaws
X-810 Scope
X-820 General Requirements
X-821 ECA Technique
X-822 Written Procedure Requirements
X-823 Procedure Qualification
X-824 Personnel Qualification
X-825 Procedure Demonstration
X-830 Equipment
X-831 Digital Data Acquisition Equipment <\/td>\n<\/tr>\n
354<\/td>\nX-832 Probes
X-833 Reference Standard (See Figure X-833-1)
X-822-1 Written Procedure Requirements for an ECA Examination <\/td>\n<\/tr>\n
355<\/td>\nX-840 Application Requirements
X-841 Scanning Speed
X-842 Coated Surfaces
X-843 Magnetic Permeability Variance
X-844 Automated Data Screening System
X-850 Technique
X-851 Frequency, Probe Drive, and Gain Selection
X-852 Channel Standardization
X-853 Color Palette Adjustment
X-860 Calibration
X-861 Equipment Calibration
X-833-1 Example Reference Standard <\/td>\n<\/tr>\n
356<\/td>\nX-862 Calibration and Verification
X-870 Examination
X-871 Surface Condition
X-872 Scanning Method (See Mandatory Appendix IX, Figure IX-872-1)
X-873 Secondary Scanning
X-880 Evaluation
X-881 Relevant vs. Nonrelevant Indications
X-882 Length Sizing
X-890 Documentation
X-891 Examination Report
X-892 Record Retention <\/td>\n<\/tr>\n
357<\/td>\nArticle 9 Visual Examination
T-910 Scope
T-920 General
T-921 Written Procedure Requirements
T-922 Personnel Requirements
T-923 Physical Requirements
T-921 Requirements of a Visual Examination Procedure <\/td>\n<\/tr>\n
358<\/td>\nT-930 Equipment
T-950 Technique
T-951 Applications
T-952 Direct Visual Examination
T-953 Remote Visual Examination
T-954 Translucent Visual Examination
T-955 Light Meter Calibration
T-980 Evaluation
T-990 Documentation
T-991 Report of Examination
T-993 Record Maintenance <\/td>\n<\/tr>\n
359<\/td>\nArticle 10 Leak Testing
T-1010 Scope
T-1020 General
T-1021 Written Procedure Requirements
T-1022 Referencing Code <\/td>\n<\/tr>\n
360<\/td>\nT-1030 Equipment
T-1031 Gages
T-1040 Miscellaneous Requirements
T-1041 Cleanliness
T-1042 Openings
T-1043 Temperature
T-1044 Pressure\/Vacuum (Pressure Limits)
T-1050 Procedure
T-1051 Preliminary Leak Test
T-1052 Test Sequence
T-1060 Calibration
T-1061 Pressure\/Vacuum Gages
T-1062 Temperature Measuring Devices
T-1063 Calibration Leak Standards <\/td>\n<\/tr>\n
361<\/td>\nT-1070 Test
T-1080 Evaluation
T-1081 Acceptance Standards
T-1090 Documentation
T-1091 Test Report
T-1092 Record Retention <\/td>\n<\/tr>\n
362<\/td>\nMandatory Appendix I Bubble Test \u2014 Direct Pressure Technique
I-1010 Scope
I-1020 General
I-1021 Written Procedure Requirements
I-1030 Equipment
I-1031 Gases
I-1032 Bubble Solution
I-1033 Immersion Bath
I-1070 Test
I-1071 Soak Time
I-1021 Requirements of a Direct Pressure Bubble Leak Testing Procedure <\/td>\n<\/tr>\n
363<\/td>\nI-1072 Surface Temperature
I-1073 Application of Solution
I-1074 Immersion in Bath
I-1075 Lighting and Visual Aids
I-1076 Indication of Leakage
I-1077 Posttest Cleaning
I-1080 Evaluation
I-1081 Leakage
I-1082 Repair\/Retest <\/td>\n<\/tr>\n
364<\/td>\nMandatory Appendix II Bubble Test \u2014 Vacuum Box Technique
II-1010 Scope
II-1020 General
II-1021 Written Procedure Requirements
II-1030 Equipment
II-1031 Bubble Solution
II-1032 Vacuum Box
II-1021 Requirements of a Vacuum Box Leak Testing Procedure <\/td>\n<\/tr>\n
365<\/td>\nII-1033 Vacuum Source
II-1070 Test
II-1071 Surface Temperature
II-1072 Application of Solution
II-1073 Vacuum Box Placement
II-1074 Pressure (Vacuum) Retention
II-1075 Vacuum Box Overlap
II-1076 Lighting and Visual Aids
II-1077 Indication of Leakage
II-1078 Posttest Cleaning
II-1080 Evaluation
II-1081 Leakage
II-1082 Repair\/Retest <\/td>\n<\/tr>\n
366<\/td>\nMandatory Appendix III Halogen Diode Detector Probe Test
III-1010 Introduction and Scope
III-1011 Alkali-Ion Diode (Heated Anode) Halogen Leak Detectors
III-1012 Electron Capture Halogen Leak Detectors
III-1020 General
III-1021 Written Procedure Requirements
III-1030 Equipment
III-1031 Tracer Gas
III-1032 Instrument
III-1033 Calibration Leak Standards
III-1060 Calibration
III-1061 Standard Leak Size <\/td>\n<\/tr>\n
367<\/td>\nIII-1062 Warm Up
III-1063 Scanning Rate
III-1064 Detection Time
III-1065 Frequency and Sensitivity
III-1070 Test
III-1071 Location of Test
III-1072 Concentration of Tracer Gas
III-1073 Soak Time
III-1021 Requirements of a Halogen Diode Detector Probe Testing Procedure
III-1031 Tracer Gases <\/td>\n<\/tr>\n
368<\/td>\nIII-1074 Scanning Distance
III-1075 Scanning Rate
III-1076 Scanning Direction
III-1077 Leakage Detection
III-1078 Application
III-1080 Evaluation
III-1081 Leakage
III-1082 Repair\/Retest <\/td>\n<\/tr>\n
369<\/td>\nMandatory Appendix IV Helium Mass Spectrometer Test \u2014 Detector Probe Technique
IV-1010 Scope
IV-1020 General
IV-1021 Written Procedure Requirements
IV-1030 Equipment
IV-1031 Instrument
IV-1032 Auxiliary Equipment
IV-1033 Calibration Leak Standards
IV-1060 Calibration
IV-1061 Instrument Calibration
IV-1062 System Calibration <\/td>\n<\/tr>\n
370<\/td>\nIV-1070 Test
IV-1071 Location of Test
IV-1072 Concentration of Tracer Gas
IV-1073 Soak Time
IV-1074 Scanning Distance
IV-1075 Scanning Rate
IV-1021 Requirements of a Helium Mass Spectrometer Detector Probe Testing Procedure <\/td>\n<\/tr>\n
371<\/td>\nIV-1076 Scanning Direction
IV-1077 Leakage Detection
IV-1078 Application
IV-1080 Evaluation
IV-1081 Leakage
IV-1082 Repair\/Retest <\/td>\n<\/tr>\n
372<\/td>\nMandatory Appendix V Helium Mass Spectrometer Test \u2014 Tracer Probe Technique
V-1010 Scope
V-1020 General
V-1021 Written Procedure Requirements
V-1030 Equipment
V-1031 Instrument
V-1032 Auxiliary Equipment
V-1033 System Calibration Leak Standard
V-1060 Calibration
V-1061 Instrument Calibration <\/td>\n<\/tr>\n
373<\/td>\nV-1062 System Calibration
V-1070 Test
V-1071 Scanning Rate
V-1072 Scanning Direction
V-1073 Scanning Distance
V-1074 Leakage Detection
V-1075 Flow Rate
V-1080 Evaluation
V-1081 Leakage
V-1021 Requirements of a Helium Mass Spectrometer Tracer Probe Testing Procedure <\/td>\n<\/tr>\n
374<\/td>\nV-1082 Repair\/Retest <\/td>\n<\/tr>\n
375<\/td>\nMandatory Appendix VI Pressure Change Test
VI-1010 Scope
VI-1020 General
VI-1021 Written Procedure Requirements
VI-1030 Equipment
VI-1031 Pressure Measuring Instruments
VI-1032 Temperature Measuring Instruments
VI-1021 Requirements of a Pressure Change Testing Procedure <\/td>\n<\/tr>\n
376<\/td>\nVI-1060 Calibration
VI-1061 Pressure Measuring Instruments
VI-1062 Temperature Measuring Instruments
VI-1070 Test
VI-1071 Pressure Application
VI-1072 Vacuum Application
VI-1073 Test Duration
VI-1074 Small Pressurized Systems
VI-1075 Large Pressurized Systems
VI-1076 Start of Test
VI-1077 Essential Variables
VI-1080 Evaluation
VI-1081 Acceptable Test
VI-1082 Rejectable Test <\/td>\n<\/tr>\n
377<\/td>\nMandatory Appendix VIII Thermal Conductivity Detector Probe Test
VIII-1010 Introduction and Scope
VIII-1011 Thermal Conductivity Leak Detectors
VIII-1020 General
VIII-1021 Written Procedure Requirements
VIII-1030 Equipment
VIII-1031 Tracer Gas
VIII-1032 Instrument
VIII-1033 Calibration Leak Standard
VIII-1060 Calibration
VIII-1061 Standard Leak Size
VIII-1062 Warm Up
VIII-1063 Scanning Rate <\/td>\n<\/tr>\n
378<\/td>\nVIII-1064 Detection Time
VIII-1065 Frequency and Sensitivity
VIII-1070 Test
VIII-1071 Location of Test
VIII-1072 Concentration of Tracer Gas
VIII-1073 Soak Times
VIII-1074 Scanning Distance
VIII-1075 Scanning Rate
VIII-1021 Requirements of a Thermal Conductivity Detector Probe Testing Procedure
VIII-1031 Tracer Gases <\/td>\n<\/tr>\n
379<\/td>\nVIII-1076 Scanning Direction
VIII-1077 Leakage Detection
VIII-1078 Application
VIII-1080 Evaluation
VIII-1081 Leakage
VIII-1082 Repair\/Retest <\/td>\n<\/tr>\n
380<\/td>\nMandatory Appendix IX Helium Mass Spectrometer Test \u2014 Hood Technique
IX-1010 Scope
IX-1020 General
IX-1021 Written Procedure Requirements
IX-1030 Equipment
IX-1031 Instrument
IX-1032 Auxiliary Equipment
IX-1021 Requirements of a Helium Mass Spectrometer Hood Testing Procedure <\/td>\n<\/tr>\n
381<\/td>\nIX-1033 System Calibration Leak Standard
IX-1050 Technique
IX-1051 Permeation
IX-1052 Repetitive or Similar Tests
IX-1053 Multiple-Mode Mass Spectrometer Leak Detectors
IX-1060 Calibration
IX-1061 Instrument Calibration <\/td>\n<\/tr>\n
382<\/td>\nIX-1062 System Calibration
IX-1070 Test
IX-1071 Standard Technique <\/td>\n<\/tr>\n
383<\/td>\nIX-1072 Alternative Technique
IX-1080 Evaluation
IX-1081 Leakage
IX-1082 Repair\/Retest <\/td>\n<\/tr>\n
384<\/td>\nMandatory Appendix X Ultrasonic Leak Detector Test
X-1010 Introduction
X-1020 General
X-1021 Written Procedure Requirements
X-1030 Equipment
X-1031 Instrument
X-1032 Capillary Calibration Leak Standard
X-1021 Requirements of an Ultrasonic Leak Testing Procedure <\/td>\n<\/tr>\n
385<\/td>\nX-1060 Calibration
X-1061 Standard Leak Size
X-1062 Warm Up
X-1063 Scanning Rate
X-1064 Frequency and Sensitivity
X-1070 Test
X-1071 Location of Test
X-1072 Soak Time
X-1073 Scanning Distance
X-1074 Scanning Rate
X-1075 Leakage Detection
X-1080 Evaluation
X-1081 Leakage
X-1082 Repair\/Retest <\/td>\n<\/tr>\n
386<\/td>\nMandatory Appendix XI Helium Mass Spectrometer \u2014 Helium-Filled-Container Leakage Rate Test
XI-1010 Scope
XI-1020 General
XI-1021 Written Procedure Requirements
XI-1030 Equipment
XI-1031 Instrument
XI-1032 Auxiliary Equipment
XI-1033 System Calibration Leak Standard <\/td>\n<\/tr>\n
387<\/td>\nXI-1050 Technique
XI-1051 Helium Depletion
XI-1052 Multiple-Mode Mass Spectrometer Leak Detectors
XI-1053 Tracer Gas Supply in the Upstream Volume
XI-1060 Calibration
XI-1061 Instrument Calibration
XI-1021.1-1 Requirements of a Helium Mass Spectrometer Sealed-Object Leakage Rate Test <\/td>\n<\/tr>\n
388<\/td>\nXI-1062 Test Sequence and System Calibration \u2014 Standard Technique
XI-1063 Test Sequence and System Calibration \u2014 Alternative Sequence for Small Upstream Volume <\/td>\n<\/tr>\n
389<\/td>\nXI-1070 Calculation of Test Reliability and Corrected Leakage Rate
XI-1071 Test Reliability
XI-1072 Calculation and Report of Corrected Leakage Rates
XI-1080 Evaluation
XI-1081 Leakage
XI-1082 Repair\/Retest <\/td>\n<\/tr>\n
390<\/td>\nNonmandatory Appendix A Supplementary Leak Testing Equation Symbols
A-1010 Applicability of the Formulas <\/td>\n<\/tr>\n
391<\/td>\nArticle 11 Acoustic Emission Examination of Fiber-Reinforced Plastic Vessels
T-1110 Scope
T-1120 General
T-1121 Vessel Conditioning
T-1122 Vessel Loading
T-1121 Requirements for Reduced Operating Level Immediately Prior to Examination <\/td>\n<\/tr>\n
392<\/td>\nT-1123 Vessel Support
T-1124 Environmental Conditions
T-1125 Noise Elimination
T-1126 Instrumentation Settings
T-1127 Sensors
T-1128 Procedure Requirements
T-1130 Equipment <\/td>\n<\/tr>\n
393<\/td>\nT-1160 Calibration
T-1161 System Calibration
T-1162 Sensor Locations and Spacings
T-1163 Systems Performance Check
T-1170 Examination
T-1171 General Guidelines
T-1172 Background Noise <\/td>\n<\/tr>\n
394<\/td>\nT-1173 Loading
T-1174 AE Activity
T-1175 Test Termination
T-1180 Evaluation
T-1181 Evaluation Criteria
T-1182 Emissions During Load Hold, EH
T-1183 Felicity Ratio Determination
T-1184 High Amplitude Events Criterion
T-1185 Total Counts Criterion
T-1190 Documentation
T-1191 Report <\/td>\n<\/tr>\n
395<\/td>\nT-1192 Record <\/td>\n<\/tr>\n
396<\/td>\nT-1173(a)(1) Atmospheric Vessels Loading Sequence <\/td>\n<\/tr>\n
397<\/td>\nT-1173(a)(2) Vacuum Vessels Loading Sequence <\/td>\n<\/tr>\n
398<\/td>\nT-1173(a)(3) Test Algorithm \u2014 Flowchart for Atmospheric Vessels <\/td>\n<\/tr>\n
399<\/td>\nT-1173(b)(1) Pressure Vessel Loading Sequence <\/td>\n<\/tr>\n
400<\/td>\nT-1173(b)(2) Algorithm \u2014 Flowchart for Pressure Vessels <\/td>\n<\/tr>\n
401<\/td>\nT-1181 Evaluation Criteria <\/td>\n<\/tr>\n
402<\/td>\nMandatory Appendix I Instrumentation Performance Requirements
I-1110 AE Sensors
I-1111 High Frequency Sensors
I-1112 Low Frequency Sensors
I-1120 Signal Cable
I-1130 Couplant
I-1140 Preamplifier
I-1150 Filters
I-1160 Power-Signal Cable
I-1161 Power Supply <\/td>\n<\/tr>\n
403<\/td>\nI-1170 Main Amplifier
I-1180 Main Processor
I-1181 General
I-1182 Peak Amplitude Detection
I-1183 Signal Outputs and Recording <\/td>\n<\/tr>\n
404<\/td>\nI-1183 Sample of Schematic of AE Instrumentation for Vessel Examination <\/td>\n<\/tr>\n
405<\/td>\nMandatory Appendix II Instrument Calibration
II-1110 General
II-1120 Threshold
II-1130 Reference Amplitude Threshold
II-1140 Count Criterion Nc and AM Value
II-1160 Field Performance <\/td>\n<\/tr>\n
406<\/td>\nNonmandatory Appendix A Sensor Placement Guidelines
A-1110 Case 1 \u2014 Atmospheric Vertical Vessel <\/td>\n<\/tr>\n
407<\/td>\nA-1120 Case 2 \u2014 Atmospheric Vertical Vessel <\/td>\n<\/tr>\n
408<\/td>\nA-1130 Case 3 \u2014 Atmospheric\/Pressure Vessel <\/td>\n<\/tr>\n
409<\/td>\nA-1140 Case 4 \u2014 Atmospheric\/Pressure Vertical Vessel <\/td>\n<\/tr>\n
410<\/td>\nA-1150 Case 5 \u2014 Atmospheric\/Vacuum Vertical Vessel <\/td>\n<\/tr>\n
411<\/td>\nA-1160 Case 6 \u2014 Atmospheric\/Pressure Horizontal Tank <\/td>\n<\/tr>\n
412<\/td>\nArticle 12 Acoustic Emission Examination of Metallic Vessels During Pressure Testing
T-1210 Scope
T-1220 General
T-1221 Vessel Stressing
T-1222 Noise Reduction
T-1223 Sensors
T-1224 Location of Acoustic Emission Sources <\/td>\n<\/tr>\n
413<\/td>\nT-1225 Procedure Requirements
T-1230 Equipment
T-1260 Calibration
T-1261 System Calibration
T-1262 On-Site System Calibration
T-1263 Attenuation Characterization
T-1264 Sensor Location
T-1265 Sensor Spacing <\/td>\n<\/tr>\n
414<\/td>\nT-1266 Systems Performance Check
T-1270 Examination
T-1271 General Guidelines
T-1272 Background Noise
T-1273 Vessel Pressurization <\/td>\n<\/tr>\n
415<\/td>\nT-1280 Evaluation
T-1281 Evaluation Criteria
T-1290 Documentation
T-1291 Written Report
T-1292 Record <\/td>\n<\/tr>\n
416<\/td>\nT-1273.2.1 An Example of Pressure Vessel Test Stressing Sequence <\/td>\n<\/tr>\n
417<\/td>\nT-1273.2.2 An Example of In-Service, Pressure Vessel, Test Loading Sequence <\/td>\n<\/tr>\n
418<\/td>\nT-1281 An Example of Evaluation Criteria for Zone Location <\/td>\n<\/tr>\n
419<\/td>\nMandatory Appendix I Instrumentation Performance Requirements
I-1210 Acoustic Emission Sensors
I-1211 General
I-1212 Sensor Characteristics
I-1220 Signal Cable
I-1230 Couplant
I-1240 Preamplifier
I-1250 Filter
I-1260 Power-Signal Cable
I-1270 Power Supply
I-1280 Main Amplifier
I-1290 Main Processor
I-1291 General <\/td>\n<\/tr>\n
420<\/td>\nI-1292 Peak Amplitude Detection <\/td>\n<\/tr>\n
421<\/td>\nMandatory Appendix II Instrument Calibration and Cross-Referencing
II-1210 Manufacturer\u2019s Calibration
II-1211 Annual Calibration
II-1220 Instrument Cross-Referencing
II-1221 Sensor Characterization <\/td>\n<\/tr>\n
422<\/td>\nNonmandatory Appendix A Sensor Placement Guidelines
A-1210 Case 1 \u2014 Vertical Pressure Vessel Dished Heads, Lug or Leg Supported <\/td>\n<\/tr>\n
423<\/td>\nA-1220 Case 2 \u2014 Vertical Pressure Vessel Dished Heads, Agitated, Baffled Lug, or Leg Support <\/td>\n<\/tr>\n
424<\/td>\nA-1230 Case 3 \u2014 Horizontal Pressure Vessel Dished Heads, Saddle Supported <\/td>\n<\/tr>\n
425<\/td>\nA-1240 Case 4 \u2014 Vertical Pressure Vessel Packed or Trayed Column Dished Heads, Lug or Skirt Supported <\/td>\n<\/tr>\n
426<\/td>\nA-1250 Case 5 \u2014 Spherical Pressure Vessel, Leg Supported <\/td>\n<\/tr>\n
427<\/td>\nNonmandatory Appendix B Supplemental Information for Conducting Acoustic Emission Examinations
B-1210 Frequency Selection
B-1220 Combining More Than One Sensor in a Single Channel
B-1230 Attenuative Welds
B-1240 Production Line Testing of Identical Vessels <\/td>\n<\/tr>\n
428<\/td>\nArticle 13 Continuous Acoustic Emission Monitoring of Pressure Boundary Components
T-1310 Scope
T-1311 References
T-1320 General
T-1321 Relevant Indications
T-1322 Personnel Qualification
T-1323 Written Procedures <\/td>\n<\/tr>\n
429<\/td>\nT-1330 Equipment
T-1331 General
T-1332 AE Sensors
T-1331 Functional Flow Diagram \u2014 Continuous AE Monitoring System <\/td>\n<\/tr>\n
430<\/td>\nT-1333 Signal Cables
T-1334 Amplifiers
T-1335 AE Instrument and Monitor
T-1332.2 Response of a Waveguide AE Sensor Inductively Tuned to 500 kHz <\/td>\n<\/tr>\n
431<\/td>\nT-1340 Miscellaneous Requirements
T-1341 Equipment Verification
T-1342 Sensor Calibration
T-1343 Signal Pattern Recognition <\/td>\n<\/tr>\n
432<\/td>\nT-1344 Material Attenuation\/Characterization
T-1345 Background Noise
T-1346 Verification Records
T-1347 Sensor Installation
T-1348 Signal Lead Installation
T-1349 AE Monitor Installation
T-1350 Technique\/Procedure Requirements <\/td>\n<\/tr>\n
433<\/td>\nT-1351 AE System Operation
T-1352 Data Processing, Interpretation, and Evaluation
T-1353 Data Recording and Storage
T-1354 Component Loading
T-1355 Noise Interference
T-1356 Coordination with Plant System Owner\/Operator <\/td>\n<\/tr>\n
434<\/td>\nT-1357 Source Location and Sensor Mounting
T-1360 Calibration
T-1361 Sensors
T-1362 Complete AE Monitor System
T-1363 Verification Intervals
T-1364 Verification Records
T-1370 Examination
T-1371 Plant Startup and Shutdown
T-1373 Plant Steady-State Operation <\/td>\n<\/tr>\n
435<\/td>\nT-1374 Nuclear Metal Components
T-1375 Non-Nuclear Metal Components
T-1376 Nonmetallic Components
T-1377 Limited Zone Monitoring
T-1378 Hostile Environment Applications
T-1379 Leak Detection Applications
T-1380 Evaluation\/Results
T-1381 Data Processing, Interpretation, and Evaluation
T-1382 Data Requirements
T-1390 Reports\/Records
T-1391 Reports to Plant System Owner\/Operator
T-1392 Records <\/td>\n<\/tr>\n
436<\/td>\nT-1393 Record Retention Requirements <\/td>\n<\/tr>\n
437<\/td>\nMandatory Appendix I Nuclear Components
I-1310 Scope
I-1330 Equipment
I-1331 Preamplifiers
I-1332 AE Sensors
I-1333 Frequency Response
I-1334 Signal Processing
I-1340 Miscellaneous Requirements
I-1341 Equipment Qualification
I-1360 Calibration
I-1361 Calibration Block
I-1362 Calibration Interval
I-1380 Evaluation <\/td>\n<\/tr>\n
439<\/td>\nMandatory Appendix II Non-Nuclear Metal Components
II-1310 Scope
II-1330 Equipment
II-1331 Sensors
II-1333 Amplifiers
II-1334 Main Processor <\/td>\n<\/tr>\n
440<\/td>\nII-1360 Calibration
II-1361 System Performance Check
II-1362 System Performance Check Verification
II-1380 Evaluation
II-1381 Evaluation Criteria \u2014 Zone Location
II-1382 Evaluation Criteria \u2014 Multisource Location
II-1381 An Example of Evaluation Criteria for Zone Location
II-1382 An Example of Evaluation Criteria for Multisource Location <\/td>\n<\/tr>\n
441<\/td>\nMandatory Appendix III Nonmetallic Components
III-1310 Scope
III-1320 General
III-1321 Applications
III-1330 Equipment
III-1331 Sensors
III-1332 Source Location Accuracy
III-1360 Calibration
III-1361 Annual Field Calibration
III-1362 Performance Verification
III-1363 Low Amplitude Threshold
III-1364 High Amplitude Threshold <\/td>\n<\/tr>\n
442<\/td>\nIII-1380 Evaluation
III-1381 Evaluation Criteria
III-1382 Source Mechanism <\/td>\n<\/tr>\n
443<\/td>\nMandatory Appendix IV Limited Zone Monitoring
IV-1310 Scope
IV-1320 General
IV-1321 Guard Sensor Technique
IV-1340 Miscellaneous Requirements
IV-1341 Redundant Sensors
IV-1350 Technique
IV-1351 Techniques
IV-1352 Procedure
IV-1353 Other Techniques
IV-1360 Calibration
IV-1380 Evaluation <\/td>\n<\/tr>\n
444<\/td>\nIV-1390 Documentation <\/td>\n<\/tr>\n
445<\/td>\nMandatory Appendix V Hostile Environment Applications
V-1310 Scope
V-1330 Equipment
V-1331 AE Sensors
V-1332 AE Sensor Types
V-1333 Waveguide
V-1334 AE Signal Transmission
V-1340 Miscellaneous Requirements
V-1341 Sensor Mounting <\/td>\n<\/tr>\n
446<\/td>\nV-1333 Metal Waveguide AE Sensor Construction <\/td>\n<\/tr>\n
447<\/td>\nV-1341 Mounting Fixture for Steel Waveguide AE Sensor <\/td>\n<\/tr>\n
448<\/td>\nMandatory Appendix VI Leak Detection Applications
VI-1310 Scope
VI-1320 General
VI-1330 Equipment
VI-1331 Sensor Type
VI-1332 Waveguide <\/td>\n<\/tr>\n
449<\/td>\nVI-1333 Electronic Filters
VI-1350 Technique
VI-1351 Procedure
VI-1360 Calibration
VI-1361 Calibration Checks
VI-1370 Examination
VI-1371 Implementation of System Requirements
VI-1372 Verification Procedure
VI-1373 Equipment Qualification and Calibration Data
VI-1380 Evaluation
VI-1381 Leak Indications
VI-1382 Leak Location <\/td>\n<\/tr>\n
450<\/td>\nArticle 14 Examination System Qualification
T-1410 Scope
T-1420 General Requirements
T-1421 The Qualification Process
T-1422 Technical Justification
T-1423 Performance Demonstration
T-1424 Levels of Rigor <\/td>\n<\/tr>\n
451<\/td>\nT-1425 Planning a Qualification Demonstration
T-1430 Equipment
T-1440 Application Requirements
T-1441 Technical Justification Report <\/td>\n<\/tr>\n
452<\/td>\nT-1442 Performance Demonstration <\/td>\n<\/tr>\n
453<\/td>\nT-1443 Examination System Requalification
T-1450 Conduct of Qualification Demonstration
T-1451 Protocol Document
T-1452 Individual Qualification <\/td>\n<\/tr>\n
454<\/td>\nT-1460 Calibration
T-1470 Examination
T-1471 Intermediate Rigor Detection Test
T-1472 High Rigor Detection Tests <\/td>\n<\/tr>\n
455<\/td>\nT-1472.1 Total Number of Samples for a Given Number of Misses at a Specified Confidence Level and POD <\/td>\n<\/tr>\n
456<\/td>\nT-1480 Evaluation
T-1490 Documentation and Records
T-1472.2 Required Number of First Stage Examiners vs. Target Pass Rate <\/td>\n<\/tr>\n
457<\/td>\nMandatory Appendix II UT Performance Demonstration Criteria
II-1410 Scope
II-1420 General
II-1430 Equipment
II-1434 Qualification Blocks
II-1440 Application Requirements <\/td>\n<\/tr>\n
458<\/td>\nII-1450 Conduct of Qualification Demonstration
II-1434 Flaw Characterization for Tables II-1434-1 and II-1434-2
II-1434-1 Flaw Acceptance Criteria for 4-in. to 12-in. Thick Weld
II-1434-2 Flaw Acceptance Criteria for Larger Than 12-in. Thick Weld <\/td>\n<\/tr>\n
459<\/td>\nII-1460 Calibration
II-1470 Examination
II-1480 Evaluation
II-1481 Low Level
II-1482 Intermediate Level
II-1483 High Level
II-1490 Documentation <\/td>\n<\/tr>\n
460<\/td>\nArticle 15 Alternating Current Field Measurement Technique (ACFMT)
T-1510 Scope
T-1520 General
T-1521 Supplemental Requirements
T-1522 Written Procedure Requirements
T-1530 Equipment
T-1531 Instrument
T-1532 Probes
T-1533 Calibration Blocks <\/td>\n<\/tr>\n
461<\/td>\nT-1540 Miscellaneous Requirements
T-1541 Surface Conditioning
T-1542 Demagnetization
T-1543 Identification of Weld Examination Areas
T-1560 Calibration
T-1561 General Requirements
T-1562 Calibration
T-1522 Requirements of an ACFMT Examination Procedure <\/td>\n<\/tr>\n
462<\/td>\nT-1563 Performance Confirmation
T-1533 ACFMT Calibration Block <\/td>\n<\/tr>\n
463<\/td>\nT-1570 Examination
T-1571 General Examination Requirements
T-1572 Examination Coverage
T-1573 Overlap
T-1574 Interpretation
T-1580 Evaluation
T-1590 Documentation
T-1591 Recording Indication
T-1592 Examination Record
T-1593 Report <\/td>\n<\/tr>\n
464<\/td>\nArticle 16 Magnetic Flux Leakage (MFL) Examination
T-1610 Scope
T-1620 General
T-1621 Personnel Qualification Requirements
T-1622 Equipment Qualification Requirements
T-1623 Written Procedure Requirements <\/td>\n<\/tr>\n
465<\/td>\nT-1630 Equipment
T-1640 Requirements
T-1650 Calibration
T-1660 Examination
T-1622.1.1 Reference Plate Dimensions <\/td>\n<\/tr>\n
466<\/td>\nT-1670 Evaluation
T-1680 Documentation
T-1622.1.2 Reference Pipe or Tube Dimensions <\/td>\n<\/tr>\n
467<\/td>\nT-1623 Requirements of an MFL Examination Procedure <\/td>\n<\/tr>\n
468<\/td>\nArticle 17 Remote Field Testing (RFT) Examination Method
T-1710 Scope
T-1720 General
T-1721 Written Procedure Requirements
T-1722 Personnel Requirements
T-1730 Equipment
T-1750 Technique
T-1721 Requirements of an RFT Examination Procedure <\/td>\n<\/tr>\n
469<\/td>\nT-1760 Calibration
T-1761 Instrument Calibration
T-1762 System Preparation
T-1763 System Setup and Calibration
T-1762 Pit Reference Tube (Typical) <\/td>\n<\/tr>\n
470<\/td>\nT-1763.1(a) Voltage Plane Display of Differential Channel Response for Through-Wall Hole (Through-Hole Signal) and 20% Groove Showing Preferred Angular Relationship
T-1763.1(b) Voltage Plane Display of Differential Channel Response for the Tube Support Plate (TSP), 20% Groove, and Through-Wall Hole (Through-Hole Signal) <\/td>\n<\/tr>\n
471<\/td>\nT-1764 Auxiliary Frequency(ies) Calibration Procedure
T-1765 Calibration Confirmation
T-1766 Correlation of Signals to Estimate Depth of Flaws
T-1770 Examination
T-1771 General
T-1772 Probe Speed
T-1780 Evaluation
T-1790 Documentation
T-1763.2 Reference Curve and the Absolute Channel Signal Response From Two Circumferential Grooves and a Tube Support Plate <\/td>\n<\/tr>\n
472<\/td>\nT-1793 Record Retention <\/td>\n<\/tr>\n
473<\/td>\nArticle 18 Acoustic Pulse Reflectometry (APR) Examination
T-1810 Scope
T-1820 General
T-1821 Written Procedure Requirements
T-1830 Equipment
T-1831 Instrumentation
T-1832 Reference Specimen
T-1821 Requirements of an Acoustic Pulse Reflectometry Examination Procedure <\/td>\n<\/tr>\n
474<\/td>\nT-1832 Reference Specimens <\/td>\n<\/tr>\n
475<\/td>\nT-1840 Miscellaneous Requirements
T-1841 Tube or Pipe Precleaning
T-1850 Prior to the Examination
T-1860 Calibration
T-1861 Instrument Calibration
T-1862 System Preparation
T-1863 System Setup
T-1864 Functional Test <\/td>\n<\/tr>\n
476<\/td>\nT-1865 Analysis of Signals to Determine Flaw Type and Estimate Flaw Size
T-1870 Examination
T-1880 Evaluation
T-1890 Documentation
T-1891 Recording Indications <\/td>\n<\/tr>\n
477<\/td>\nT-1892 Examination Records
T-1893 Storage Media
T-1865.1 Signal Analysis From Various Types of Discontinuities <\/td>\n<\/tr>\n
478<\/td>\nT-1865.2 Reflection From a Through-Wall Hole <\/td>\n<\/tr>\n
479<\/td>\nArticle 19 Guided Wave Examination Method for Piping
T-1910 Scope
T-1920 General
T-1921 Written Procedure Requirements
T-1922 Personnel Qualification
T-1930 Equipment
T-1931 Instrumentation Requirements
T-1932 Sensors
T-1950 Wave Modes <\/td>\n<\/tr>\n
480<\/td>\nT-1951 Miscellaneous Requirements
T-1960 Calibration
T-1961 Instrument Calibration
T-1921.1 Requirements of a GWT Examination Procedure <\/td>\n<\/tr>\n
481<\/td>\nT-1962 System Calibration
T-1963 Distance\u2013Amplitude Correction (DAC) or Time-Corrected Gain (TCG)
T-1964 Detection Threshold
T-1965 Call Level
T-1970 Examination
T-1971 Examination Coverage
T-1980 Evaluation
T-1981 General
T-1982 Evaluation Level
T-1990 Documentation
T-1992 Examination Records <\/td>\n<\/tr>\n
483<\/td>\nNonmandatory Appendix A Operation of GWT Systems
A-1910 Scope
A-1920 General <\/td>\n<\/tr>\n
484<\/td>\nA-1921 Call Level
A-1922 Effect of Pipe Geometry on Examination Range
A-1920 Illustration of the Guided Wave Examination Procedure <\/td>\n<\/tr>\n
485<\/td>\nA-1923 Effect of Pipe Coating
A-1924 Effect of General Corrosion on Examination Range
A-1925 Special Applications of Guided Wave Testing <\/td>\n<\/tr>\n
486<\/td>\nArticle 20 Computed Tomography Examination
T-2010 Scope
T-2020 General
T-2021 Written Procedure Requirements
T-2022 Image Acquisition Plan
T-2023 Personnel Qualifications
T-2024 System of Identification
T-2025 Referencing Code Requirements
T-2030 Equipment
T-2031 Radiation Sources <\/td>\n<\/tr>\n
487<\/td>\nT-2032 Computer Hardware
T-2033 Image Display
T-2060 Detector Pixel Correction
T-2061 Types of Correction
T-2062 Bad Pixel Maps
T-2070 Examination
T-2071 Extent of Examination
T-2072 Image Acquisition Plan
T-2073 Geometric Unsharpness
T-2074 Image Quality Verification
T-2080 Evaluation
T-2081 Preliminary Evaluation
T-2082 Evaluation by the Manufacturer <\/td>\n<\/tr>\n
488<\/td>\nT-2090 Documentation
T-2091 Radiographic Technique Details
T-2092 Radiograph Review Form <\/td>\n<\/tr>\n
489<\/td>\nT-2021.1-1 Requirements of a Computed Tomography Examination Procedure <\/td>\n<\/tr>\n
490<\/td>\nArticle 21 Pulsed Eddy Current (PEC) Technique for Corrosion Screening
T-2110 Scope
T-2120 General
T-2121 Written Procedure Requirements <\/td>\n<\/tr>\n
491<\/td>\nT-2122 Scan Plan
T-2123 Personnel Qualifications
T-2130 Equipment
T-2131 Instrument
T-2132 Probes
T-2150 Techniques
T-2151 Reference Location
T-2160 Calibration <\/td>\n<\/tr>\n
492<\/td>\nT-2170 Examination
T-2180 Evaluation
T-2181 General
T-2182 Evaluation Level
T-2190 Documentation
T-2192 Examination Records
T-2194 Data Storage <\/td>\n<\/tr>\n
493<\/td>\nT-2121.1-1 Requirements of a PEC Examination Procedure <\/td>\n<\/tr>\n
494<\/td>\nNonmandatory Appendix A Applications of Pulsed Eddy Current Examination
A-2110 Scope
A-2120 General
A-2121 Disambiguation
A-2122 Basic Principle of PEC Examination
A-2121-1 Basic Decay Curve in a Log-Linear Graph <\/td>\n<\/tr>\n
495<\/td>\nA-2123 Effect of Materials Between the Probe and the Object
A-2121-2 Basic Decay Curve in a Log-Log Graph
A-2123.1-1 Impact of Aluminum Jacketing With a Thickness of 0.04 in. (1 mm) on the Decay Curve in a Log-Linear Graph <\/td>\n<\/tr>\n
496<\/td>\nA-2124 Common Sources of Noise and Their Mitigation
A-2125 Common Applications
A-2123.1-2 Impact of Aluminum Jacketing With a Thickness of 0.04 in. (1 mm) on the Decay Curve in a Log-Log Graph <\/td>\n<\/tr>\n
498<\/td>\nA-2150 Process Used With PEC Equipment
A-2151 System Checks
A-2152 Determination of the Footprint Diameter <\/td>\n<\/tr>\n
499<\/td>\nA-2160 Reference Measurement
A-2152-1 Image of Reference Plate With Two Thicknesses
A-2152.1-1 Image of Trajectory A\u2013B on Which Measurements Are Performed to Determine the Footprint
A-2152.1-2 Wall Thickness Response of the Measurement of Trajectory A\u2013B <\/td>\n<\/tr>\n
500<\/td>\nA-2170 Examination
A-2171 Guidelines for the Examination Grid
A-2172 Examination Preparation
A-2152.1-3 Derivative of the Wall Thickness Response of the Measurement of Trajectory A\u2013B
A-2152.2-1 Wall Thickness Response of the Measurement of Trajectory A\u2013B With a Plotted Line <\/td>\n<\/tr>\n
501<\/td>\nNonmandatory Appendix B Training Outline for Pulsed Eddy Current Examination
B-2110 Scope
B-2120 Training Outline for Level II Personnel <\/td>\n<\/tr>\n
503<\/td>\nSubsection B Documents Adopted by Section V <\/td>\n<\/tr>\n
504<\/td>\nArticle 22 Radiographic Standards <\/td>\n<\/tr>\n
505<\/td>\nSE-94\/SE-94M <\/td>\n<\/tr>\n
519<\/td>\nSE-747 <\/td>\n<\/tr>\n
533<\/td>\nSE-999 <\/td>\n<\/tr>\n
539<\/td>\nSE-1025 <\/td>\n<\/tr>\n
547<\/td>\nSE-1030\/SE-1030M <\/td>\n<\/tr>\n
559<\/td>\nSE-1114 <\/td>\n<\/tr>\n
565<\/td>\nSE-1165 <\/td>\n<\/tr>\n
579<\/td>\nSE-1255 <\/td>\n<\/tr>\n
589<\/td>\nSE-1416 <\/td>\n<\/tr>\n
597<\/td>\nSE-1475 <\/td>\n<\/tr>\n
605<\/td>\nSE-1647 <\/td>\n<\/tr>\n
611<\/td>\nSE-2597\/SE-2597M <\/td>\n<\/tr>\n
630<\/td>\nArticle 23 Ultrasonic Standards <\/td>\n<\/tr>\n
631<\/td>\nSA-388\/SA-388M <\/td>\n<\/tr>\n
641<\/td>\nSA-435\/SA-435M <\/td>\n<\/tr>\n
645<\/td>\nSA-577\/SA-577M <\/td>\n<\/tr>\n
649<\/td>\nSA-578\/SA-578M <\/td>\n<\/tr>\n
655<\/td>\nSA-609\/SA-609M <\/td>\n<\/tr>\n
665<\/td>\nSA-745\/SA-745M <\/td>\n<\/tr>\n
671<\/td>\nSB-548 <\/td>\n<\/tr>\n
677<\/td>\nSD-7091 <\/td>\n<\/tr>\n
685<\/td>\nSE-213 <\/td>\n<\/tr>\n
697<\/td>\nSE-273 <\/td>\n<\/tr>\n
703<\/td>\nSE-317 <\/td>\n<\/tr>\n
717<\/td>\nSE-797\/SE-797M <\/td>\n<\/tr>\n
725<\/td>\nSE-2491 <\/td>\n<\/tr>\n
745<\/td>\nSE-2700 <\/td>\n<\/tr>\n
754<\/td>\nArticle 24 Liquid Penetrant Standards <\/td>\n<\/tr>\n
755<\/td>\nSD-129 <\/td>\n<\/tr>\n
761<\/td>\nSD-516 <\/td>\n<\/tr>\n
767<\/td>\nSD-808 <\/td>\n<\/tr>\n
773<\/td>\nSE-165\/SE-165M <\/td>\n<\/tr>\n
793<\/td>\nSE-2297 <\/td>\n<\/tr>\n
799<\/td>\nSE-3022 <\/td>\n<\/tr>\n
808<\/td>\nArticle 25 Magnetic Particle Standards <\/td>\n<\/tr>\n
809<\/td>\nSD-1186 <\/td>\n<\/tr>\n
815<\/td>\nSE-709 <\/td>\n<\/tr>\n
863<\/td>\nArticle 26 Eddy Current Standard <\/td>\n<\/tr>\n
865<\/td>\nSE-243 <\/td>\n<\/tr>\n
871<\/td>\nArticle 29 Acoustic Emission Standards <\/td>\n<\/tr>\n
873<\/td>\nSE-650\/SE-650M <\/td>\n<\/tr>\n
877<\/td>\nSE-750 <\/td>\n<\/tr>\n
889<\/td>\nSE-976 <\/td>\n<\/tr>\n
897<\/td>\nSE-1067\/SE-1067M <\/td>\n<\/tr>\n
913<\/td>\nSE-1118\/SE-1118M <\/td>\n<\/tr>\n
927<\/td>\nSE-1139\/SE-1139M <\/td>\n<\/tr>\n
935<\/td>\nSE-1211\/SE-1211M <\/td>\n<\/tr>\n
941<\/td>\nSE-1419\/SE-1419M <\/td>\n<\/tr>\n
951<\/td>\nSE-2075\/SE-2075M <\/td>\n<\/tr>\n
956<\/td>\nArticle 31 Alternating Current Field Measurement Standard <\/td>\n<\/tr>\n
957<\/td>\nSE-2261\/SE-2261M <\/td>\n<\/tr>\n
972<\/td>\nArticle 32 Remote Field Testing Standard <\/td>\n<\/tr>\n
973<\/td>\nSE-2096\/SE-2096M <\/td>\n<\/tr>\n
983<\/td>\nArticle 33 Guided Wave Standards <\/td>\n<\/tr>\n
985<\/td>\nSE-2775 <\/td>\n<\/tr>\n
997<\/td>\nSE-2929 <\/td>\n<\/tr>\n
1008<\/td>\nMandatory Appendices
Mandatory Appendix II Standard Units for Use in Equations
II-1 Standard Units for Use in Equations <\/td>\n<\/tr>\n
1009<\/td>\nNonmandatory Appendices
Nonmandatory Appendix A Guidance for the Use of U.S. Customary and SI Units in the ASME Boiler and Pressure Vessel Code
A-1 Use of Units in Equations
A-2 Guidelines Used to Develop SI Equivalents <\/td>\n<\/tr>\n
1011<\/td>\nA-3 Soft Conversion Factors <\/td>\n<\/tr>\n
1013<\/td>\nEndnotes <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

ASME BPVC – V -2021 BPVC Section V, Nondestructive Examination<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
ASME<\/b><\/a><\/td>\n2021<\/td>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":374269,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2643],"product_tag":[],"class_list":{"0":"post-374265","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-asme","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/374265","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/374269"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=374265"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=374265"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=374265"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}