| PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
|---|---|---|---|---|---|---|---|
| 2<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
| 4<\/td>\n | CONTENTS <\/td>\n<\/tr>\n | ||||||
| 8<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
| 10<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n | ||||||
| 11<\/td>\n | 1 Scope 2 Normative references <\/td>\n<\/tr>\n | ||||||
| 12<\/td>\n | 3 Terms and definitions <\/td>\n<\/tr>\n | ||||||
| 17<\/td>\n | 4 HEMP test concepts 4.1 General <\/td>\n<\/tr>\n | ||||||
| 18<\/td>\n | 4.2 Testing of shielding enclosures 4.2.1 General <\/td>\n<\/tr>\n | ||||||
| 19<\/td>\n | Figures Figure 1 \u2013 Example of measured magnitude and phase of the transfer function T(\u03c9) = Hin\/Hout for a shielded enclosure <\/td>\n<\/tr>\n | ||||||
| 20<\/td>\n | Figure 2 \u2013 Electric field and magnetic field shielding effectiveness of a 0,5 mm thick aluminum enclosure [29] <\/td>\n<\/tr>\n | ||||||
| 21<\/td>\n | 4.2.2 Buildings Figure 3 \u2013 Measured magnetic field shielding effectiveness SEH for a building Figure 4 \u2013 Conceptual illustration of the HEMP test of a building <\/td>\n<\/tr>\n | ||||||
| 22<\/td>\n | 4.2.3 Shelters and shielded rooms <\/td>\n<\/tr>\n | ||||||
| 23<\/td>\n | 4.2.4 Cabinets, racks and boxes Figure 5 \u2013 Illustration of a shielded room or enclosure excited by HEMP fields Figure 6 \u2013 Illustration of equipment racks, cabinets and box excited by internal HEMP disturbance <\/td>\n<\/tr>\n | ||||||
| 24<\/td>\n | Figure 7 \u2013 A general shield excited by current injection <\/td>\n<\/tr>\n | ||||||
| 25<\/td>\n | 4.3 Testing of shielded cables and connectors 4.3.1 General 4.3.2 Testing of cable shields <\/td>\n<\/tr>\n | ||||||
| 26<\/td>\n | Figure 8 \u2013 Basic configuration for transfer impedance measurement <\/td>\n<\/tr>\n | ||||||
| 27<\/td>\n | Figure 9 \u2013 Measured transfer impedance magnitude and phase of transfer impedance per unit length for four braided shield cables with good shielding properties <\/td>\n<\/tr>\n | ||||||
| 28<\/td>\n | 4.3.3 Testing of cable connectors Figure 10 \u2013 Basic configuration for transfer admittance measurement Figure 11 \u2013 Test configuration for transfer impedance measurement of a cable connector <\/td>\n<\/tr>\n | ||||||
| 29<\/td>\n | 4.4 Testing of shielding materials 4.4.1 General 4.4.2 Conducting gaskets <\/td>\n<\/tr>\n | ||||||
| 30<\/td>\n | Figure 12 \u2013 Examples of conducting gaskets used as HEMP protection devices Figure 13 \u2013 Circuit model representing the behaviour of a conducting gasket for HEMP protection <\/td>\n<\/tr>\n | ||||||
| 31<\/td>\n | 4.4.3 Conducting sheets and screens Figure 14 \u2013 Measurement configuration for the resistivity of a sample <\/td>\n<\/tr>\n | ||||||
| 32<\/td>\n | Figure 15 \u2013 Test concept for measuring the resistivity with surface probes <\/td>\n<\/tr>\n | ||||||
| 34<\/td>\n | 4.4.4 Cut-off waveguides and honeycombs Figure 16 \u2013 Concepts for shielding effectiveness measurement of conducting sheets and screens Figure 17 \u2013 Example of the calculated plane-wave shielding effectivenes sof a 0,01 mm thick plate of different material as a function of frequency <\/td>\n<\/tr>\n | ||||||
| 35<\/td>\n | 4.5 Summary of test concepts Figure 18 \u2013 Cut-off waveguides and honeycomb used as protective elements <\/td>\n<\/tr>\n | ||||||
| 36<\/td>\n | 5 Test methods for measuring the shielding effectiveness of HEMP protection facilities 5.1 General 5.2 Electromagnetic field testing 5.2.1 General 5.2.2 Pulse field testing Tables Table 1 \u2013 Recommended test procedure for different test objects <\/td>\n<\/tr>\n | ||||||
| 39<\/td>\n | Figure 19 \u2013 Examples of full-scale, pulse-radiating HEMP simulators <\/td>\n<\/tr>\n | ||||||
| 41<\/td>\n | Figure 20 \u2013 Test procedure for the pulse test <\/td>\n<\/tr>\n | ||||||
| 42<\/td>\n | 5.2.3 CW field testing Figure 21 \u2013 Typical configuration of a CW test facility <\/td>\n<\/tr>\n | ||||||
| 43<\/td>\n | Figure 22 \u2013 Example CW measurement set-up <\/td>\n<\/tr>\n | ||||||
| 44<\/td>\n | Figure 23 \u2013 Test and analysis procedures for conducting a CW test <\/td>\n<\/tr>\n | ||||||
| 45<\/td>\n | Figure 24 \u2013 Analysis flow diagram for extrapolatinga measured CW spectrum to the HEMP response <\/td>\n<\/tr>\n | ||||||
| 46<\/td>\n | Figure 25 \u2013 Example scan from 9 kHz to 3 GHz for the ambient electromagnetic field from communication signals <\/td>\n<\/tr>\n | ||||||
| 47<\/td>\n | Figure 26 \u2013 Test procedure for the ambient EM excitation test <\/td>\n<\/tr>\n | ||||||
| 48<\/td>\n | Figure 27 \u2013 Double-ended TEM cell for field illumination testing of small enclosures <\/td>\n<\/tr>\n | ||||||
| 49<\/td>\n | Figure 28 \u2013 Example test set-up for field illumination in the TEM cell <\/td>\n<\/tr>\n | ||||||
| 50<\/td>\n | Figure 29 \u2013 Illustration of the single-ended TEM cell and associated equipment <\/td>\n<\/tr>\n | ||||||
| 52<\/td>\n | Figure 30 \u2013 Test set-up for the plane-wave shielding effectiveness measurements Table 2 \u2013 Dimensions and composition of distances d1 to d3, with reference to Figure 30 <\/td>\n<\/tr>\n | ||||||
| 53<\/td>\n | Figure 31 \u2013 Test set-up for the H-field shielding effectiveness measurements Table 3 \u2013 Dimensions and composition of distances d1 to d3, with reference to Figure 31 <\/td>\n<\/tr>\n | ||||||
| 54<\/td>\n | Figure 32 \u2013 Example of antenna locations for the localized antenna tests for a hypothetical shielded enclosure or facility Table 4 \u2013 Measurement frequencies and antennas in plane-wave <\/td>\n<\/tr>\n | ||||||
| 56<\/td>\n | Table 5 \u2013 Measurement frequencies and antennas in magnetic field <\/td>\n<\/tr>\n | ||||||
| 57<\/td>\n | 5.3 Current injection test procedures 5.3.1 General 5.3.2 Injection testing of enclosures <\/td>\n<\/tr>\n | ||||||
| 58<\/td>\n | Figure 33 \u2013 Test concept and equipment configuration for current injection testing of a shielded enclosure or box <\/td>\n<\/tr>\n | ||||||
| 59<\/td>\n | 5.3.3 Transfer impedance and admittance of cable shields and connectors 5.3.4 Testing of gasket material <\/td>\n<\/tr>\n | ||||||
| 61<\/td>\n | Figure 34 \u2013 Surface probe for volume resistivity measurement <\/td>\n<\/tr>\n | ||||||
| 62<\/td>\n | Annexes Annex A (informative) HEMP test concepts for electrical systems A.1 Overview A.2 Types of HEMP tests A.2.1 General A.2.2 System-level transient tests <\/td>\n<\/tr>\n | ||||||
| 63<\/td>\n | A.2.3 CW field illumination tests A.2.4 Current injection testing <\/td>\n<\/tr>\n | ||||||
| 64<\/td>\n | A.2.5 Partial illumination testing A.2.6 Subsystem and component testing <\/td>\n<\/tr>\n | ||||||
| 65<\/td>\n | A.3 Definition of the testing interface <\/td>\n<\/tr>\n | ||||||
| 66<\/td>\n | Figure A.1 \u2013 Sample HEMP interaction diagram illustrating penetration mechanisms, system responses and generic test interface locations <\/td>\n<\/tr>\n | ||||||
| 67<\/td>\n | A.4 Use of test data A.4.1 General A.4.2 Acceptance of new systems A.4.3 System assessments A.4.4 Hardness surveillance monitoring A.4.5 System design <\/td>\n<\/tr>\n | ||||||
| 68<\/td>\n | A.5 Testing uncertainties <\/td>\n<\/tr>\n | ||||||
| 69<\/td>\n | Annex B (informative) Characterization of shielded cables B.1 Fundamentals of cable shielding Figure B.1 \u2013 Geometry of a shielded coaxial line with an internal circuit <\/td>\n<\/tr>\n | ||||||
| 70<\/td>\n | B.2 Definitions of transfer impedance and transfer admittance Figure B.2 \u2013 Coaxial cable located over a conducting ground plane <\/td>\n<\/tr>\n | ||||||
| 71<\/td>\n | Figure B.3 \u2013 Two per-unit-length circuits formed by the sheath and its ground return, and the sheath and the internal conductor <\/td>\n<\/tr>\n | ||||||
| 73<\/td>\n | B.3 Relative significance of Z\u2032t and Y\u2032t <\/td>\n<\/tr>\n | ||||||
| 74<\/td>\n | Annex C (informative) Equipment for HEMP pulse measurements C.1 General C.2 Sensors for HEMP measurements C.2.1 B- and H-field sensors <\/td>\n<\/tr>\n | ||||||
| 75<\/td>\n | Figure C.1 \u2013 Magnetic field sensors [23] Figure C.2 \u2013 Single-slot, cylindrical coil sensor [23] <\/td>\n<\/tr>\n | ||||||
| 76<\/td>\n | C.2.2 D- and E-field sensors Figure C.3 \u2013 Two- and four-slot cylindrical coil sensors [23] Figure C.4 \u2013 Electrical configuration of an E-field sensor [23] <\/td>\n<\/tr>\n | ||||||
| 77<\/td>\n | Figure C.5 \u2013 Biconical E-field sensor Figure C.6 \u2013 E-field sensor mounted on a conducting ground plane [23] Figure C.7 \u2013 Equipotential shapes for an optimally designed E-field sensor [23] <\/td>\n<\/tr>\n | ||||||
| 78<\/td>\n | C.2.3 Current sensors Figure C.8 \u2013 Rogowski coil used for current measurements [23] Figure C.9 \u2013 Toroidal current sensor made of magnetic material [23] Figure C.10 \u2013 Voltage pick-up points on the edges of the toroidal sensor [23] <\/td>\n<\/tr>\n | ||||||
| 79<\/td>\n | C.3 Signal transmission C.3.1 General C.3.2 Fibre optic links Figure C.11 \u2013 Example of a single-channel fibre optic transmission system [23] <\/td>\n<\/tr>\n | ||||||
| 80<\/td>\n | C.3.3 Fibre optic transducers C.4 Signal detection and processing Figure C.12 \u2013 Attenuation of coaxial linesand fibre optic cables as a function of frequency <\/td>\n<\/tr>\n | ||||||
| 82<\/td>\n | Annex D (informative) Equipment for CW testing D.1 General D.2 Antenna system <\/td>\n<\/tr>\n | ||||||
| 83<\/td>\n | Figure D.1 \u2013 Various antennas for CW testing <\/td>\n<\/tr>\n | ||||||
| 84<\/td>\n | D.3 Power amplifier Figure D.2 \u2013 Relationship between the CW antenna and the incident HEMP field <\/td>\n<\/tr>\n | ||||||
| 85<\/td>\n | D.4 Receiver (network analyser) D.5 Reference and response sensors <\/td>\n<\/tr>\n | ||||||
| 86<\/td>\n | Figure D.3 \u2013 Incident and ground-reflected field contributions to the reference sensor excitations <\/td>\n<\/tr>\n | ||||||
| 87<\/td>\n | D.6 Fibre optic system Figure D.4 \u2013 Measured reference H-field spectrum and its inverse Fourier transform <\/td>\n<\/tr>\n | ||||||
| 89<\/td>\n | Figure D.5 \u2013 Measured sensor responses and calibration function Figure D.6 \u2013 Measured transfer function, corrected by calibration file <\/td>\n<\/tr>\n | ||||||
| 90<\/td>\n | D.7 Limitations of measurements <\/td>\n<\/tr>\n | ||||||
| 91<\/td>\n | Annex E (informative) Characterization of a planar shield for HEMP protection E.1 General Figure E.1 \u2013 Example of a general shielding problem <\/td>\n<\/tr>\n | ||||||
| 92<\/td>\n | E.2 Problem geometry Figure E.2 \u2013 Behaviour of the impedance ratio |E|\/|H | as a function of distance from a source [29] <\/td>\n<\/tr>\n | ||||||
| 93<\/td>\n | E.3 Equivalent circuit representation E.3.1 General Figure E.3 \u2013 Conducting slab of thickness, d, and infinite extent serving as an electromagnetic barrier <\/td>\n<\/tr>\n | ||||||
| 94<\/td>\n | E.3.2 Chain parameter representation of the shield Figure E.4 \u2013 Equivalent circuit representation of the shielding problem <\/td>\n<\/tr>\n | ||||||
| 95<\/td>\n | E.3.3 Circuit responses Figure E.5 \u2013 Two-port representation of a circuit <\/td>\n<\/tr>\n | ||||||
| 97<\/td>\n | Table E.1 \u2013 Surface resistance and electrical parameters for selected materials <\/td>\n<\/tr>\n | ||||||
| 99<\/td>\n | Annex F (informative) Inside-to-out measurement method F.1 Purpose F.2 Comparison of existing SE test methods <\/td>\n<\/tr>\n | ||||||
| 100<\/td>\n | F.3 Inside-to-out SE test of shielded rooms F.3.1 Measurements of the inside-to-out SE Table F.1 \u2013 Comparison with other standards <\/td>\n<\/tr>\n | ||||||
| 101<\/td>\n | Table F.2 \u2013 Test shielded rooms <\/td>\n<\/tr>\n | ||||||
| 102<\/td>\n | Figure F.1 \u2013 Test set-up for the outside-to-in and inside-to-out SE measurement <\/td>\n<\/tr>\n | ||||||
| 103<\/td>\n | F.3.2 Summary Table F.3 \u2013 Comparison of the SE measurement results <\/td>\n<\/tr>\n | ||||||
| 104<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Electromagnetic Compatibility (EMC) – Testing and measurement techniques. Test methods for protective devices for HEMP and other radiated disturbances<\/b><\/p>\n |