{"id":396824,"date":"2024-10-20T04:26:42","date_gmt":"2024-10-20T04:26:42","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-c62-36-1991\/"},"modified":"2024-10-26T08:14:15","modified_gmt":"2024-10-26T08:14:15","slug":"ieee-c62-36-1991","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-c62-36-1991\/","title":{"rendered":"IEEE C62.36-1991"},"content":{"rendered":"

New IEEE Standard – Superseded. Superseded by C62.36-1994. Methods for testing and measuring the characteristics of surge protectors used in low voltage data, communications, and signaling circuits with voltages less than or equal to 1000 V rms or 1200 V dc are established. The surge protectors are designed to limit voltage surges, current surges, or both. The surge protectors covered are multiple-component series or parallel combinations of linear or nonlinear elements. Tests are included for characterizing standby performance, surge-limiting capabilities, and surge lifetime. Packaged single gas-tube, air-gap, varistor, or avalanche junction surge-protective devices are not covered, nor are test methods for low-voltage power circuit applications.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
6<\/td>\n4.3 Radiation
Basic Configurations
Basic Configurations <\/td>\n<\/tr>\n
7<\/td>\n1 Scope
2 Definitions
3 References <\/td>\n<\/tr>\n
8<\/td>\nService Conditions
4.1 Normal Service Conditions
4.1.1 Environmental Conditions
4.1.2 Physical Properties
4.1.3 System Conditions
Surge Rating of the Surge Protector Under System Conditions
Unusual Service Conditions
4.2.1 Environmental Conditions
4.2.2 Physical Conditions
4.2.3 System Conditions <\/td>\n<\/tr>\n
10<\/td>\nStandard Design Test Procedure
Standard Design Test Criteria
6.2 Statistical Procedures
6.3 Test Conditions
Nonsurge Performance Tests
Rated Voltage Test
Rated Current Test <\/td>\n<\/tr>\n
11<\/td>\nDC Series Resistance Test
Test Circuits for the Rated Voltage Test <\/td>\n<\/tr>\n
12<\/td>\nStandby Current and Insulation Resistance Test
Test Circuits for the Rated Current Test <\/td>\n<\/tr>\n
13<\/td>\nTest Circuits for the Analog Insertion Loss Test
Fig 4a Test Circuit Before Insertion of Surge Protector
Fig 4b Test Circuits After Insertion of Surge Protector <\/td>\n<\/tr>\n
14<\/td>\n7.5 Capacitance Test
7.6 Inductance Test
Analog Insertion Loss Test
Phase Shift Test
Return Loss Test <\/td>\n<\/tr>\n
15<\/td>\nLongitudinal Balance Test
Test Circuits for the Phase Shift Test <\/td>\n<\/tr>\n
16<\/td>\nTest Circuit for the Return Loss Test
Fig 6a Circuit Without Surge Protector
Circuit With Surge Protector <\/td>\n<\/tr>\n
17<\/td>\nDigital Insertion Loss Test
Decay-Time Test <\/td>\n<\/tr>\n
18<\/td>\nRise- and Decay-Time Test
Bit Error Rate (BER) Test <\/td>\n<\/tr>\n
19<\/td>\nTest Circuits for the Bit Error Rate (BER) Test <\/td>\n<\/tr>\n
20<\/td>\nActive Performance Tests
8.1 DC-Limiting-Voltage Test
8.2 Impulse-Limiting-Voltage Test
Test Circuit for the DC-Limiting-Voltage Test <\/td>\n<\/tr>\n
21<\/td>\nUsing Fig
Using Fig
Voltage Test <\/td>\n<\/tr>\n
22<\/td>\nTest Circuits for the Impulse-Limiting-Voltage Test <\/td>\n<\/tr>\n
23<\/td>\nTransition Current Test
Impulse-Limiting-Voltage Test Waveform <\/td>\n<\/tr>\n
24<\/td>\nTest Circuits for the Transition Current Test <\/td>\n<\/tr>\n
25<\/td>\n8.4 Current-Response-Time Test
Test Circuits for the Current-Response-Time Test <\/td>\n<\/tr>\n
26<\/td>\nImpulse Reset Test
Test Circuits of Fig <\/td>\n<\/tr>\n
27<\/td>\nTest Circuits for the Impulse Reset Test <\/td>\n<\/tr>\n
28<\/td>\nCurrent Reset Test
AC Life Test <\/td>\n<\/tr>\n
29<\/td>\nTest Circuits for the Current Reset Test <\/td>\n<\/tr>\n
30<\/td>\nImpulse Life Test
Test Circuits for the AC Life Test
Examples of Parameters for the AC Life Test <\/td>\n<\/tr>\n
31<\/td>\nMaximum Single-Impulse Discharge Test
Between Impulses for the Impulse Life Test
Standard Terminal Combinations for the Impulse Life Test <\/td>\n<\/tr>\n
32<\/td>\nFailure Modes
Discharge Test <\/td>\n<\/tr>\n
33<\/td>\nAppendix <\/td>\n<\/tr>\n
34<\/td>\nPossible Internal Arrangement of Station Protector Components <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
IEEE<\/b><\/a><\/td>\n1991<\/td>\n34<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":396833,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2644],"product_tag":[],"class_list":{"0":"post-396824","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-ieee","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/396824","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/396833"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=396824"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=396824"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=396824"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}