{"id":396828,"date":"2024-10-20T04:26:43","date_gmt":"2024-10-20T04:26:43","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-c62-36-1994\/"},"modified":"2024-10-26T08:14:15","modified_gmt":"2024-10-26T08:14:15","slug":"ieee-c62-36-1994","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-c62-36-1994\/","title":{"rendered":"IEEE C62.36-1994"},"content":{"rendered":"
Revision Standard – Superseded. Methods are established for testing and measuring the characteristics of surge protectors used in low-voltage data, communications, and signaling circuits with voltages less than or equal to 1000 V rms or 1200 Vdc. The surge protectors are designed to limit voltage surges, current surges, or both. The surge protectors covered are multiple-component series or parallel combinations of linear or nonlinear elements. Tests are included for characterizing standby performance, surge-limiting capabilities, and surge lifetime. Packaged single gas-tube, air-gap, varistor, or avalanche junction surge-protective devices are not covered, nor are test methods for low-voltage power circuit applications.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
1<\/td>\n | Title page <\/td>\n<\/tr>\n | ||||||
3<\/td>\n | Introduction Participants <\/td>\n<\/tr>\n | ||||||
6<\/td>\n | CONTENTS <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | 1. Scope 2. References <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | 3. Definitions 4. Service conditions 4.1 Normal service conditions <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 4.2 Unusual service conditions <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 4.3 Radiation 5. Basic configurations <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 6. Standard design test procedure 6.1 Standard design test criteria 6.2 Statistical procedures 6.3 Test conditions 7. Nonsurge performance tests 7.1 Rated voltage test <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 7.2 Rated current test 7.3 DC series resistance test 7.4 Standby current and insulation resistance test <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 7.5 Capacitance test 7.6 Inductance test 7.7 Analog insertion loss test 7.8 Phase shift test <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | 7.9 Return loss test <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | 7.10 Longitudinal balance test 7.11 Digital insertion loss test <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | 7.12 Rise- and decay-time test <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | 7.13 Bit error rate (BER) test <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | 8. Active performance tests 8.1 DC-limiting-voltage test <\/td>\n<\/tr>\n | ||||||
25<\/td>\n | 8.2 Impulse-limiting-voltage test <\/td>\n<\/tr>\n | ||||||
29<\/td>\n | 8.3 Transition current test 8.4 Current-response-time test <\/td>\n<\/tr>\n | ||||||
31<\/td>\n | 8.5 Impulse reset test <\/td>\n<\/tr>\n | ||||||
33<\/td>\n | 8.6 Current reset test <\/td>\n<\/tr>\n | ||||||
36<\/td>\n | 8.7 AC life test <\/td>\n<\/tr>\n | ||||||
37<\/td>\n | 8.8 Impulse life test <\/td>\n<\/tr>\n | ||||||
39<\/td>\n | 8.9 Maximum single-impulse discharge test <\/td>\n<\/tr>\n | ||||||
40<\/td>\n | 8.10 Trip endurance test <\/td>\n<\/tr>\n | ||||||
41<\/td>\n | 8.11 Blocking-cycle life test 8.12 Environmental cycling with impulse surges test <\/td>\n<\/tr>\n | ||||||
43<\/td>\n | 8.13 Environmental cycling with ac surges test <\/td>\n<\/tr>\n | ||||||
44<\/td>\n | 9. Failure modes <\/td>\n<\/tr>\n | ||||||
45<\/td>\n | Annex\u2014Examples of internal arrangements of surge-limiting devices <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits<\/b><\/p>\n |