{"id":397284,"date":"2024-10-20T04:29:22","date_gmt":"2024-10-20T04:29:22","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-1149-4-2010\/"},"modified":"2024-10-26T08:17:00","modified_gmt":"2024-10-26T08:17:00","slug":"ieee-1149-4-2010","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-1149-4-2010\/","title":{"rendered":"IEEE 1149.4-2010"},"content":{"rendered":"

Revision Standard – Active. The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to, both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration. Also, extensions to the standard BSDL are defined that allow description of key component-specific aspects of such testability features.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
1<\/td>\nIEEE Std 1149.4-2010 Front Cover
\n <\/td>\n<\/tr>\n
3<\/td>\nTitle page
\n <\/td>\n<\/tr>\n
6<\/td>\nIntroduction
Notice to users
Laws and regulations
Copyrights
Updating of IEEE documents <\/td>\n<\/tr>\n
7<\/td>\nErrata
Interpretations
Patents <\/td>\n<\/tr>\n
8<\/td>\nParticipants <\/td>\n<\/tr>\n
9<\/td>\nContents <\/td>\n<\/tr>\n
11<\/td>\nImportant notice
\n
1. Overview
1.1 Organization of the standard <\/td>\n<\/tr>\n
12<\/td>\n1.2 Context <\/td>\n<\/tr>\n
13<\/td>\n1.3 Scope <\/td>\n<\/tr>\n
16<\/td>\n1.4 Background reading
2. Normative references
3. Definitions, acronyms, abbreviations, and voltage symbols
3.1 Definitions <\/td>\n<\/tr>\n
20<\/td>\n3.2 Acronyms and abbreviations <\/td>\n<\/tr>\n
21<\/td>\n3.3 Voltage source symbols
4. Testability architecture
4.1 Overview <\/td>\n<\/tr>\n
23<\/td>\n4.2 TAP controller <\/td>\n<\/tr>\n
24<\/td>\n4.3 ATAP <\/td>\n<\/tr>\n
25<\/td>\n4.4 Register architecture <\/td>\n<\/tr>\n
26<\/td>\n5. Instructions
5.1 General <\/td>\n<\/tr>\n
27<\/td>\n5.2 Response of test logic to instructions
5.3 Mandatory instructions <\/td>\n<\/tr>\n
30<\/td>\n5.4 Optional instructions <\/td>\n<\/tr>\n
35<\/td>\n6. The TBIC
6.1 General <\/td>\n<\/tr>\n
36<\/td>\n6.2 Test bus and TBIC structure <\/td>\n<\/tr>\n
40<\/td>\n6.3 Control of the TBIC <\/td>\n<\/tr>\n
43<\/td>\n6.4 Differential I\/O <\/td>\n<\/tr>\n
44<\/td>\n6.5 Partitioned internal test bus structure <\/td>\n<\/tr>\n
48<\/td>\n7. The boundary-scan structure
7.1 Structure <\/td>\n<\/tr>\n
49<\/td>\n7.2 DBMs <\/td>\n<\/tr>\n
51<\/td>\n7.3 ABMs <\/td>\n<\/tr>\n
61<\/td>\n7.4 Differential ABMs <\/td>\n<\/tr>\n
67<\/td>\n8. Measurement methodology
8.1 Interconnect testing <\/td>\n<\/tr>\n
70<\/td>\n8.2 Extended interconnect testing <\/td>\n<\/tr>\n
74<\/td>\n8.3 Network measurements <\/td>\n<\/tr>\n
75<\/td>\n9. Analog parametric limits
9.1 General
9.2 Switch limitations <\/td>\n<\/tr>\n
76<\/td>\n9.3 Electrostatic protection <\/td>\n<\/tr>\n
77<\/td>\n9.4 Performance specifications <\/td>\n<\/tr>\n
79<\/td>\n9.5 Measuring performance <\/td>\n<\/tr>\n
86<\/td>\n9.6 Calibration and errors <\/td>\n<\/tr>\n
88<\/td>\n10. Conformance and documentation requirements
10.1 Conformance <\/td>\n<\/tr>\n
89<\/td>\n10.2 General documentation <\/td>\n<\/tr>\n
92<\/td>\n10.3 Documentation of residual elements <\/td>\n<\/tr>\n
94<\/td>\n10.4 BSDL Documentation <\/td>\n<\/tr>\n
116<\/td>\nAnnex A (informative) Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

IEEE Standard for a Mixed-Signal Test Bus<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
IEEE<\/b><\/a><\/td>\n2010<\/td>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":397288,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2644],"product_tag":[],"class_list":{"0":"post-397284","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-ieee","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/397284","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/397288"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=397284"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=397284"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=397284"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}