This part of IEC 62228 specifies test and measurement methods for the EMC evaluation of CXPI transceiver ICs under network condition. It defines test configurations, test conditions, test signals, failure criteria, test procedures, test setups and test boards. This specification is applicable for standard CXPI transceiver ICs and ICs with embedded CXPI transceiver and covers – the emission of RF disturbances, – the immunity against RF disturbances, – the immunity against impulses and – the immunity against electrostatic discharges (ESD).<\/p>\n
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| 2<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
| 5<\/td>\n | Annex ZA (normative)Normative references to international publicationswith their corresponding European publications <\/td>\n<\/tr>\n | ||||||
| 6<\/td>\n | Blank Page <\/td>\n<\/tr>\n | ||||||
| 7<\/td>\n | English CONTENTS <\/td>\n<\/tr>\n | ||||||
| 10<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
| 12<\/td>\n | 1 Scope 2 Normative references <\/td>\n<\/tr>\n | ||||||
| 13<\/td>\n | 3 Terms, definitions and abbreviated terms 3.1 Terms and definitions 3.2 Abbreviated terms <\/td>\n<\/tr>\n | ||||||
| 14<\/td>\n | 4 General Tables Table 1 \u2013 Types for CXPI transceiver <\/td>\n<\/tr>\n | ||||||
| 15<\/td>\n | Figures Figure 1 \u2013 PHY sub-layers overview and CXPI transceiver types Table 2 \u2013 Overview of required measurement and tests <\/td>\n<\/tr>\n | ||||||
| 16<\/td>\n | 5 Test and operating conditions 5.1 Supply and ambient conditions 5.2 Test operation modes Table 3 \u2013 Supply and ambient conditions for functional operation <\/td>\n<\/tr>\n | ||||||
| 17<\/td>\n | 5.3 Test configuration 5.3.1 General test configuration for functional test Figure 2 \u2013 General test configuration for tests in functional operation modes <\/td>\n<\/tr>\n | ||||||
| 18<\/td>\n | 5.3.2 General test configuration for unpowered ESD test 5.3.3 Coupling ports and coupling networks for functional tests Figure 3 \u2013 General test configuration for unpowered ESD test Figure 4 \u2013 Coupling ports and networks for functional tests <\/td>\n<\/tr>\n | ||||||
| 19<\/td>\n | 5.3.4 Coupling ports and coupling networks for unpowered ESD tests Figure 5 \u2013 Coupling ports and networks for unpowered ESD tests Table 4 \u2013 Definition of coupling ports and couplingnetwork components for functional tests <\/td>\n<\/tr>\n | ||||||
| 20<\/td>\n | 5.3.5 Power supply with decoupling network 5.4 Test signals 5.4.1 General 5.4.2 Test signals for normal operation mode Table 5 \u2013 Definitions of coupling ports for unpowered ESD tests <\/td>\n<\/tr>\n | ||||||
| 21<\/td>\n | Table 6 \u2013 Communication test signal TX1 <\/td>\n<\/tr>\n | ||||||
| 22<\/td>\n | 5.4.3 Test signal for wake-up from sleep mode Table 7 \u2013 Communication test signal TX2 Table 8 \u2013 Communication test signal TX3 <\/td>\n<\/tr>\n | ||||||
| 23<\/td>\n | 5.5 Evaluation criteria 5.5.1 General 5.5.2 Evaluation criteria in functional operation modes during exposure to disturbances Table 9 \u2013 Wake-up test signal TX4 <\/td>\n<\/tr>\n | ||||||
| 24<\/td>\n | Table 10 \u2013 Evaluation criteria for standard type-A in functional operation modes Table 11 \u2013 Evaluation criteria for standard type-B in functional operation modes <\/td>\n<\/tr>\n | ||||||
| 25<\/td>\n | 5.5.3 Evaluation criteria in unpowered condition after exposure to disturbances Figure 6 \u2013 Principal drawing of the maximum deviation in the I-V characteristic Table 12 \u2013 Evaluation criteria for ICs with embedded CXPItransceiver in functional operation modes <\/td>\n<\/tr>\n | ||||||
| 26<\/td>\n | 5.5.4 Status classes 6 Test and measurement 6.1 Emission of RF disturbances 6.1.1 Test method 6.1.2 Test setup Figure 7 \u2013 Test setup for measurement of RF disturbances <\/td>\n<\/tr>\n | ||||||
| 27<\/td>\n | 6.1.3 Test procedure and parameters 6.2 Immunity to RF disturbances 6.2.1 Test method Table 13 \u2013 Parameters for emission measurements Table 14 \u2013 Settings for the RF measurement equipment <\/td>\n<\/tr>\n | ||||||
| 28<\/td>\n | 6.2.2 Test setup Figure 8 \u2013 Test setup for DPI tests <\/td>\n<\/tr>\n | ||||||
| 29<\/td>\n | 6.2.3 Test procedure and parameters Table 15 \u2013 Specifications for DPI tests <\/td>\n<\/tr>\n | ||||||
| 30<\/td>\n | Table 16 \u2013 Required DPI tests for functional statusclass AIC evaluation of standard type-A Table 17 \u2013 Required DPI tests for functional statusclass AIC evaluation of standard type-B Table 18 \u2013 Required DPI tests for functional statusclass AIC evaluation of ICs with embedded CXPI transceiver <\/td>\n<\/tr>\n | ||||||
| 31<\/td>\n | 6.3 Immunity to impulses 6.3.1 Test method 6.3.2 Test setup Table 19 \u2013 Required DPI tests for functional status class CIC, D1IC or D2IC evaluation of standard CXPI transceiver ICs and ICs with embedded CXPI transceiver <\/td>\n<\/tr>\n | ||||||
| 32<\/td>\n | 6.3.3 Test procedure and parameters Figure 9 \u2013 Test setup for impulse immunity tests <\/td>\n<\/tr>\n | ||||||
| 33<\/td>\n | Table 20 \u2013 Specifications for impulse immunity tests Table 21 \u2013 Parameters for impulse immunity tests <\/td>\n<\/tr>\n | ||||||
| 34<\/td>\n | Table 22 \u2013 Required impulse immunity tests for functional statusclass AIC evaluation of standard type-A Table 23 \u2013 Required impulse immunity tests for functional statusclass AIC evaluation of standard type-B Table 24 \u2013 Required impulse immunity tests for functional statusclass AIC evaluation of ICs with embedded CXPI transceiver <\/td>\n<\/tr>\n | ||||||
| 35<\/td>\n | 6.4 Electrostatic discharge (ESD) 6.4.1 Test method 6.4.2 Test setup Table 25 \u2013 Required impulse immunity tests for functional status class CIC, D1IC or D2IC evaluation of standard CXPI transceiver ICs and ICs with embedded CXPI transceiver <\/td>\n<\/tr>\n | ||||||
| 36<\/td>\n | Figure 10 \u2013 Test setup for direct ESD tests <\/td>\n<\/tr>\n | ||||||
| 37<\/td>\n | 6.4.3 Test procedure and parameters 7 Test report Table 26 \u2013 Specifications for direct ESD tests <\/td>\n<\/tr>\n | ||||||
| 38<\/td>\n | Annex A (normative)CXPI test circuits A.1 General A.2 CXPI test circuit for functional tests on standard type-A CXPI transceiverICs <\/td>\n<\/tr>\n | ||||||
| 40<\/td>\n | Figure A.1 \u2013 General drawing of the circuit diagram of the test networkfor standard type-A CXPI transceiver ICs for functional tests <\/td>\n<\/tr>\n | ||||||
| 41<\/td>\n | A.3 CXPI test circuit for functional tests on standard type-B CXPI transceiverICs <\/td>\n<\/tr>\n | ||||||
| 42<\/td>\n | Figure A.2 \u2013 General drawing of the circuit diagram of the test networkfor standard type-B CXPI transceiver ICs for functional tests <\/td>\n<\/tr>\n | ||||||
| 43<\/td>\n | A.4 CXPI test circuit for functional tests on ICs with embedded CXPItransceiver <\/td>\n<\/tr>\n | ||||||
| 44<\/td>\n | A.5 CXPI test circuit for unpowered ESD test on a standard type-A CXPI transceiver IC Figure A.3 \u2013 General drawing of the circuit diagram of the test networkfor ICs with embedded CXPI transceiver for functional tests <\/td>\n<\/tr>\n | ||||||
| 45<\/td>\n | A.6 CXPI test circuit for unpowered ESD test on a standard type-B CXPI transceiver IC Figure A.4 \u2013 A general drawing of the test circuit diagram fortesting direct ESD of CXPI transceiver in unpowered mode <\/td>\n<\/tr>\n | ||||||
| 46<\/td>\n | Figure A.5 \u2013 A general drawing of the test circuit diagram for testing direct ESD of CXPI standard Type-B transceiver in unpowered mode <\/td>\n<\/tr>\n | ||||||
| 47<\/td>\n | Annex B (normative)Test circuit boards B.1 Test circuit board for functional tests Figure B.1 \u2013 Example of IC interconnections of CXPI signal <\/td>\n<\/tr>\n | ||||||
| 48<\/td>\n | B.2 ESD test Figure B.2 \u2013 Example of ESD test board for CXPI transceiver ICs Table B.1 \u2013 Parameter ESD test circuit board <\/td>\n<\/tr>\n | ||||||
| 49<\/td>\n | Annex C (informative)Examples for test limits for CXPI transceiver in automotive application C.1 General C.2 Emission of RF disturbances C.3 Immunity to RF disturbances C.4 Immunity to impulse C.5 Electrostatic discharge (ESD) Table C.1 \u2013 Example of limits for impulse immunity for functional status class CIC or DIC <\/td>\n<\/tr>\n | ||||||
| 50<\/td>\n | Annex D (informative)Example of setting for test signals Figure D.1 \u2013 Example of signal setting for standardtype-A in 2 transceiver configuration <\/td>\n<\/tr>\n | ||||||
| 51<\/td>\n | Figure D.2 \u2013 Example of signal setting for standardtype-B in 2 transceiver configuration <\/td>\n<\/tr>\n | ||||||
| 52<\/td>\n | Annex E (informative)Points to note for impulse immunity measurementfor functional status class AIC E.1 General E.2 Points to note when testing Pulse 1 Figure E.1 \u2013 Relationship between ISO 7637-2 Pulse 1 and transceiver VBAT supply <\/td>\n<\/tr>\n | ||||||
| 53<\/td>\n | Figure E.2 \u2013 Transceiver VBAT supply image when t2 time is shortened <\/td>\n<\/tr>\n | ||||||
| 54<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Integrated circuits. EMC evaluation of transceivers – Part 7. CXPI transceivers<\/b><\/p>\n |