{"id":401740,"date":"2024-10-20T04:57:49","date_gmt":"2024-10-20T04:57:49","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-iso-121792022\/"},"modified":"2024-10-26T08:47:28","modified_gmt":"2024-10-26T08:47:28","slug":"bs-en-iso-121792022","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-iso-121792022\/","title":{"rendered":"BS EN ISO 12179:2022"},"content":{"rendered":"
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
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2<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
4<\/td>\n | European foreword Endorsement notice <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | Foreword <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | Introduction <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 4 Conditions of use 4.1 Components and configurations of the contact (stylus) instrument 4.2 Calibration of a configuration 4.3 Place of calibration 4.4 Defects 5 Measurement standards <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 6 Contact (stylus) instrument metrological characteristics 6.1 General 6.2 Residual profile calibration 6.3 Vertical profile component calibration 6.4 Horizontal profile component calibration 6.5 Profile coordinate system calibration 6.6 Total contact (stylus) instrument calibration <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 7 Calibration 7.1 Preparation for calibration 7.2 \u200bEvaluation of the residual profile 7.3 Calibration of the vertical profile component 7.3.1 Overall objective 7.3.2 Procedure <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 7.4 Calibration of the horizontal profile component 7.4.1 Overall objective 7.4.2 Procedure 7.5 Calibration of the profile coordinate system 7.5.1 Overall objective 7.5.2 Procedure 7.6 Calibration of the total contact (stylus) instrument 7.6.1 Overall objective <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | 7.6.2 Procedure 7.7 Other calibrations 8 Measurement uncertainty 8.1 Information from the calibration certificate for a measurement standard 8.2 The uncertainty of the values measured during calibration of a measuring instrument using a measurement standard <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | 9 Contact (stylus) instrument calibration certificate 10 General information <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | Annex A (normative) Calibration of instruments measuring parameters of the motifs method <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | Annex B (normative) Calibration of simplified operator instruments for the measurements of surface texture <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | Annex C (informative) Example: roughness measurement standard parameter Ra <\/td>\n<\/tr>\n | ||||||
25<\/td>\n | Annex D (informative) Concept diagram <\/td>\n<\/tr>\n | ||||||
26<\/td>\n | Annex E (informative) Overview of profile and areal standards in the GPS matrix model <\/td>\n<\/tr>\n | ||||||
27<\/td>\n | Annex F (informative) Relation to the GPS matrix model <\/td>\n<\/tr>\n | ||||||
28<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Geometrical product specifications (GPS). Surface texture: Profile method. Calibration of contact (stylus) instruments<\/b><\/p>\n |