{"id":401787,"date":"2024-10-20T04:58:02","date_gmt":"2024-10-20T04:58:02","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bsi-22-30400660-dc-2022\/"},"modified":"2024-10-26T08:47:51","modified_gmt":"2024-10-26T08:47:51","slug":"bsi-22-30400660-dc-2022","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bsi-22-30400660-dc-2022\/","title":{"rendered":"BSI 22\/30400660 DC 2022"},"content":{"rendered":"
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
1<\/td>\n | 30400660-NC.pdf <\/td>\n<\/tr>\n | ||||||
3<\/td>\n | ISO_IEC DIS 23837-2 ed.1 – id.77309 Enquiry PDF (en).pdf <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | Foreword <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | Introduction <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 4 Abbreviated terms <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 5 Overview of the evaluation method for QKD modules 5.1 General 5.2 Scope of the evaluation method <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 5.3 Overview of evaluation activities for SFRs 5.3.1 General <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 5.3.2 Evaluation activities for SFRs FTP_QKD.1 and FTP_QKD.2 5.3.3 Evaluation activities for SFRs on quantum optical components and parameter adjustment procedure(s) <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | 5.3.4 Evaluation activities for SFRs on conventional network components 5.3.5 Thresholds and input parameters related to the evaluation activities 5.4 Overview of evaluation activities for SARs <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | 6 Supplementary activities for the evaluation of FTP_QKD 6.1 General <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | 6.2 Evaluation activity to test quantum state transmission and sifting procedures 6.2.1 General aspects <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | 6.2.2 Test procedure <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | 6.2.3 Pass\/fail criteria <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | 6.3 Evaluation activity to test other post-processing procedures 6.3.1 General aspects <\/td>\n<\/tr>\n | ||||||
25<\/td>\n | 6.3.2 Test procedure <\/td>\n<\/tr>\n | ||||||
26<\/td>\n | 6.3.3 Pass\/fail criteria 6.4 Evaluation activity to test parameter adjustment procedure(s) 6.4.1 General aspects <\/td>\n<\/tr>\n | ||||||
28<\/td>\n | 6.4.2 Test procedure 6.4.3 Pass\/fail criteria 7 Supplementary activities for the evaluation of quantum optical components in the transmitter module 7.1 General <\/td>\n<\/tr>\n | ||||||
31<\/td>\n | 7.2 Evaluation activity to test the photon-number distribution of optical pulses 7.2.1 General aspects <\/td>\n<\/tr>\n | ||||||
33<\/td>\n | 7.2.2 Test procedure 7.2.3 Pass\/fail criteria <\/td>\n<\/tr>\n | ||||||
34<\/td>\n | 7.3 Evaluation activity to test the mean photon number and stability of optical pulses 7.3.1 General aspects <\/td>\n<\/tr>\n | ||||||
35<\/td>\n | 7.3.2 Test procedure <\/td>\n<\/tr>\n | ||||||
36<\/td>\n | 7.3.3 Pass\/fail criteria 7.4 Evaluation activity to test the independence of the intensities of optical pulses 7.4.1 General aspects <\/td>\n<\/tr>\n | ||||||
37<\/td>\n | 7.4.2 Test procedure <\/td>\n<\/tr>\n | ||||||
38<\/td>\n | 7.4.3 Pass\/fail criteria <\/td>\n<\/tr>\n | ||||||
39<\/td>\n | 7.5 Evaluation activity to test the accuracy of state encoding 7.5.1 General aspects 7.5.2 Test procedure <\/td>\n<\/tr>\n | ||||||
40<\/td>\n | 7.5.3 Pass\/fail criteria 7.6 Evaluation activity to test the indistinguishability of encoded states from the perspective of non-encoding degrees of freedom 7.6.1 General aspects <\/td>\n<\/tr>\n | ||||||
42<\/td>\n | 7.6.2 Test procedure <\/td>\n<\/tr>\n | ||||||
43<\/td>\n | 7.6.3 Pass\/fail criteria <\/td>\n<\/tr>\n | ||||||
44<\/td>\n | 7.7 Evaluation activity to test the uniform distribution of the global phase of optical pulses 7.7.1 General aspects <\/td>\n<\/tr>\n | ||||||
45<\/td>\n | 7.7.2 Test procedure <\/td>\n<\/tr>\n | ||||||
46<\/td>\n | 7.7.3 Pass\/fail criteria 7.8 Evaluation activity to test the degree of optical isolation of the TX module 7.8.1 General aspects <\/td>\n<\/tr>\n | ||||||
47<\/td>\n | 7.8.2 Test procedure <\/td>\n<\/tr>\n | ||||||
48<\/td>\n | 7.8.3 Pass\/fail criteria 7.9 Evaluation activity to test the sensitivity of the injected light monitor in the TX module 7.9.1 General aspects <\/td>\n<\/tr>\n | ||||||
49<\/td>\n | 7.9.2 Test procedure <\/td>\n<\/tr>\n | ||||||
50<\/td>\n | 7.9.3 Pass\/fail criteria 7.10 Evaluation activity to test the robustness of the TX module against laser injection 7.10.1 General aspects <\/td>\n<\/tr>\n | ||||||
52<\/td>\n | 7.10.2 Test procedure <\/td>\n<\/tr>\n | ||||||
54<\/td>\n | 7.10.3 Pass\/fail criteria 8 Supplementary activities for the evaluation of quantum optical components in the receiver module 8.1 General <\/td>\n<\/tr>\n | ||||||
56<\/td>\n | 8.2 Evaluation activity to test the consistency of detection probability in the RX module 8.2.1 General aspects <\/td>\n<\/tr>\n | ||||||
58<\/td>\n | 8.2.2 Test procedure 8.2.3 Pass\/fail criteria 8.3 Evaluation activity to test if back-flashes from the RX module can leak information 8.3.1 General aspects <\/td>\n<\/tr>\n | ||||||
60<\/td>\n | 8.3.2 Test procedure 8.3.3 Pass\/fail criteria 8.4 Evaluation activity to test the degree of optical isolation of the RX module 8.4.1 General aspects <\/td>\n<\/tr>\n | ||||||
61<\/td>\n | 8.4.2 Test procedure <\/td>\n<\/tr>\n | ||||||
62<\/td>\n | 8.4.3 Pass\/fail criteria 8.5 Evaluation activity to test the sensitivity of the injected light monitor in the RX module 8.5.1 General aspects <\/td>\n<\/tr>\n | ||||||
63<\/td>\n | 8.5.2 Test procedure <\/td>\n<\/tr>\n | ||||||
64<\/td>\n | 8.5.3 Pass\/fail criteria 8.6 Evaluation activity to test the robustness of the RX module against bright light blinding 8.6.1 General aspects <\/td>\n<\/tr>\n | ||||||
65<\/td>\n | 8.6.2 Test procedure <\/td>\n<\/tr>\n | ||||||
66<\/td>\n | 8.6.3 Pass\/fail criteria 8.7 Evaluation activity to test the appropriateness of dead time settings of single-photon detectors 8.7.1 General aspect <\/td>\n<\/tr>\n | ||||||
67<\/td>\n | 8.7.2 Test procedure 8.7.3 Pass\/fail criteria <\/td>\n<\/tr>\n | ||||||
68<\/td>\n | 8.8 Evaluation activity to test the temporal profile of the detection efficiency for single-photon detectors 8.8.1 General aspects 8.8.2 Test procedure <\/td>\n<\/tr>\n | ||||||
69<\/td>\n | 8.8.3 Pass\/fail criteria 8.9 Evaluation activity to test the robustness of the RX module against laser injection 8.9.1 General aspects <\/td>\n<\/tr>\n | ||||||
70<\/td>\n | 8.9.2 Test procedure <\/td>\n<\/tr>\n | ||||||
71<\/td>\n | 8.9.3 Pass\/fail criteria <\/td>\n<\/tr>\n | ||||||
72<\/td>\n | 8.10 Evaluation activity to test the detection limits of homodyne detectors in the RX module 8.10.1 General aspects <\/td>\n<\/tr>\n | ||||||
73<\/td>\n | 8.10.2 Test procedure 8.10.3 Pass\/fail criteria 8.11 Evaluation activity to test the appropriateness of double-click events handling 8.11.1 General aspects <\/td>\n<\/tr>\n | ||||||
74<\/td>\n | 8.11.2 Test procedure 8.11.3 Pass\/fail criteria 9 Supplementary activities for the evaluation of parameter adjustment procedures 9.1 General <\/td>\n<\/tr>\n | ||||||
75<\/td>\n | 9.2 Evaluation activity to test if detection probability mismatch can be induced by tampering with the temporal alignment procedure(s) 9.2.1 General aspects <\/td>\n<\/tr>\n | ||||||
77<\/td>\n | 9.2.2 Test procedure <\/td>\n<\/tr>\n | ||||||
79<\/td>\n | 9.2.3 Pass\/fail criteria 9.3 Evaluation activity to test if the shot noise is properly aligned 9.3.1 General aspects <\/td>\n<\/tr>\n | ||||||
80<\/td>\n | 9.3.2 Test procedure <\/td>\n<\/tr>\n | ||||||
81<\/td>\n | 9.3.3 pass\/fail criteria 10 Supplementary activities for the evaluation of SFRs on conventional network components 10.1 General <\/td>\n<\/tr>\n | ||||||
82<\/td>\n | 10.2 Evaluation activities for FCS related SFRs overview 10.3 Evaluation activities for other SFRs overview 11 Supplementary activities for SARs 11.1 General 11.2 Supplementary activities for Class APE: Protection Profile evaluation <\/td>\n<\/tr>\n | ||||||
84<\/td>\n | 11.3 Supplementary activities for Class ASE: Security Target evaluation 11.4 Supplementary activities for Class ADV: Development 11.4.1 Supplementary activities for ADV_ARC <\/td>\n<\/tr>\n | ||||||
85<\/td>\n | 11.4.2 Supplementary activities for ADV_FSP <\/td>\n<\/tr>\n | ||||||
86<\/td>\n | 11.5 Supplementary activities for Class AGD: Guidance documents 11.5.1 Supplementary activities for AGD_OPE <\/td>\n<\/tr>\n | ||||||
87<\/td>\n | 11.5.2 Supplementary activities for AGD_PRE 11.6 Supplementary activities for Class ATE: Test 11.6.1 Supplementary activities for ATE_FUN <\/td>\n<\/tr>\n | ||||||
88<\/td>\n | 11.6.2 Supplementary activities for ATE_IND <\/td>\n<\/tr>\n | ||||||
89<\/td>\n | 11.7 Supplementary activities for Class AVA: Vulnerability assessment <\/td>\n<\/tr>\n | ||||||
92<\/td>\n | 12 Conformance statement 12.1 General 12.2 Conformance statement specific to evaluation activities for SFRs 12.3 Conformance statement specific to evaluation activities for SARs <\/td>\n<\/tr>\n | ||||||
94<\/td>\n | Annex\u20acA (informative) Calculation of attack potential for the evaluation of QKD modules <\/td>\n<\/tr>\n | ||||||
101<\/td>\n | Annex\u20acB (informative) Rating examples for AVA attack potential computation <\/td>\n<\/tr>\n | ||||||
104<\/td>\n | Annex\u20acC (informative) Thresholds collection <\/td>\n<\/tr>\n | ||||||
108<\/td>\n | Annex\u20acD (informative) Correspondence between EAs and known attacks to quantum optical components and parameter adjustment procedure(s) of QKD modules <\/td>\n<\/tr>\n | ||||||
110<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" BS ISO\/IEC 23837-2. Information technology security techniques. Security requirements, test and evaluation methods for quantum key distribution – Part 2. Evaluation and testing methods<\/b><\/p>\n |