IEC 62899-402-3:2021(E) specifies the optical measurement method for acquiring two-dimensional images of voids and obtaining the void-related attributes in the dried or cured printed patterns which are part of the electronic products in the field of printed electronics. The measurable voids using this document are limited to those that are distinguishable by the optical image measurement. NOTE?In this document, void means an imperfection of pattern observed from a two-dimensional (2D) top-view.<\/p>\n
| PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
|---|---|---|---|---|---|---|---|
| 2<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
| 4<\/td>\n | CONTENTS <\/td>\n<\/tr>\n | ||||||
| 5<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
| 7<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n | ||||||
| 8<\/td>\n | 1 Scope 2 Normative references 3 Terms, definitions and abbreviated terms <\/td>\n<\/tr>\n | ||||||
| 9<\/td>\n | 4 Atmospheric conditions for evaluation and conditioning 5 Measuring methods and instruments 5.1 Measuring instrument <\/td>\n<\/tr>\n | ||||||
| 10<\/td>\n | 5.2 Preparation of specimen 5.3 Measuring method Figures Figure 1 \u2013 Definition of pattern area and background areain the ROI of the captured image <\/td>\n<\/tr>\n | ||||||
| 11<\/td>\n | Figure 2 \u2013 Distribution of the brightness of the pixels of the pattern area and mean value, and distribution of the brightness of the pixels of the background areaand mean value <\/td>\n<\/tr>\n | ||||||
| 12<\/td>\n | 5.4 Obtaining void-related attributes 6 Report of results 6.1 Measurement identification information Figure 3 \u2013 Binarization of pattern and detected voids <\/td>\n<\/tr>\n | ||||||
| 13<\/td>\n | 6.2 Instrument system and its specification 6.3 Sampling position 6.4 Results Table 1 \u2013 Reporting items example <\/td>\n<\/tr>\n | ||||||
| 14<\/td>\n | Annex A (normative)Void threshold Figure A.1 \u2013 Different images of a void Figure A.2 \u2013 Dependence of the void threshold on the void threshold index <\/td>\n<\/tr>\n | ||||||
| 15<\/td>\n | Figure A.3 \u2013 Distribution of the brightness of pixelsof the printed pattern and effect of Z <\/td>\n<\/tr>\n | ||||||
| 16<\/td>\n | Figure A.4 \u2013 Example of void detection depending on Z <\/td>\n<\/tr>\n | ||||||
| 17<\/td>\n | Figure A.5 \u2013 Additional examples of void detection depending on Z <\/td>\n<\/tr>\n | ||||||
| 18<\/td>\n | Figure A.6 \u2013 Total numbers and areas of voids in the sample imagesof Figure A.4 and Figure A.5 <\/td>\n<\/tr>\n | ||||||
| 19<\/td>\n | Annex B (normative)Additional attribute from measurement \u2013 Size distribution of voids Figure B.1 \u2013 Size distribution of voids in the sample images of Figure A.3 or Figure A.4 <\/td>\n<\/tr>\n | ||||||
| 20<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Printed electronics – Printability. Measurement of qualities. Voids in printed pattern using a two-dimensional optical image<\/b><\/p>\n |