This part of IEC 62899-402, which is a Technical Report, is a preparatory work for the documents dealing with the measurement method of the vertical direction (surface forms) of printed patterns made by printed electronics technology.<\/p>\n
The printed pattern of interest in this document is limited to straight lines on substrates with a flat surface. This document focuses on the classification and measurement methods for surface forms from the nanometer scale to the micrometer scale, and suggests the strategy for the subsequent documents.<\/p>\n
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| 2<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
| 4<\/td>\n | CONTENTS <\/td>\n<\/tr>\n | ||||||
| 5<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
| 7<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n | ||||||
| 8<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions Figures Figure 1 \u2013 Typical pattern profile <\/td>\n<\/tr>\n | ||||||
| 9<\/td>\n | 4 Classification of surface forms for future standardization work Figure 2 \u2013 Classification of parameters and future standardization work in TC 119 <\/td>\n<\/tr>\n | ||||||
| 10<\/td>\n | 5 ISO documents concerning surface roughness Figure 3 \u2013 Flow of data processing and related standards Tables Table 1 \u2013 The ISO standards related to the surface roughness <\/td>\n<\/tr>\n | ||||||
| 11<\/td>\n | 6 Examples of measurement 6.1 Micro surface roughness of the printed pattern 6.1.1 AFM approach Figure 4 \u2013 AFM image of MWCNT printed pattern <\/td>\n<\/tr>\n | ||||||
| 12<\/td>\n | Figure 5 \u2013 Three-dimensional AFM nanoscale surface images and parameters Table 2 \u2013 Surface grain structure estimation on a working platform <\/td>\n<\/tr>\n | ||||||
| 13<\/td>\n | Figure 6 \u2013 Surface image of printed electrode and sensor and grain size distribution histogram on working surface of SPCE, SPCE-Chi, and SPCE-Chi-GST at 1 \u03bcm x 1 \u03bcm AFM scan size <\/td>\n<\/tr>\n | ||||||
| 14<\/td>\n | 6.1.2 Shape of the droplet on substrates using inkjet printing Table 3 \u2013 R-parameters exploration from AFM micrographs at 1 \u03bcm x1 \u03bcm scan size <\/td>\n<\/tr>\n | ||||||
| 15<\/td>\n | 6.2 Thickness of the printed pattern (improved thickness) 6.2.1 Measurement of trapezoid and semi ellipse Figure 7 \u2013 Example of “side horns” <\/td>\n<\/tr>\n | ||||||
| 16<\/td>\n | 6.2.2 Measurement of side horn 6.3 Roughness for the printed conductive line Figure 8 \u2013 Electrode formed by gravure offset printing <\/td>\n<\/tr>\n | ||||||
| 17<\/td>\n | Figure 9 \u2013 An example of roughness in the cross-section in the width direction of a printed line <\/td>\n<\/tr>\n | ||||||
| 18<\/td>\n | 7 Suggestions for future standardization on morphology Figure 10 \u2013 An example of average value of the cross section area <\/td>\n<\/tr>\n | ||||||
| 19<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Printed electronics – Printability. Measurement of qualities. Classification and measurement methods for morphology<\/b><\/p>\n |