{"id":424639,"date":"2024-10-20T06:52:41","date_gmt":"2024-10-20T06:52:41","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/asme-ptc-19-22-2007-r2023\/"},"modified":"2024-10-26T12:56:07","modified_gmt":"2024-10-26T12:56:07","slug":"asme-ptc-19-22-2007-r2023","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/asme\/asme-ptc-19-22-2007-r2023\/","title":{"rendered":"ASME PTC 19.22 2007 R2023"},"content":{"rendered":"

The scope of this Code includes signal conditioning, signal multiplexing, analog-to-digital conversion, and data processing. This Code addresses stand-alone data acquisition systems, typified by a sensor with an integral digital display, data acquisition systems that link multiple sensors to a common digital processor tied to a computer or printer, and systems that link multiple digital processes to one or more stand-alone or net-worked computers. This Code incorporates instrumentation practices covered by other Instruments and Apparatus Supplements (PTC 19 Series) as well as by the equipment Performance Test Codes. It also provides a means to determine the uncertainty associated with the data acquisition system, and its impact on the overall uncertainty of the performance test. The Code does not directly address specific sensors or instruments used for ASME Performance Testing. Those are address in other ASME Performance Test Codes.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
5<\/td>\nCONTENTS <\/td>\n<\/tr>\n
7<\/td>\nNOTICE <\/td>\n<\/tr>\n
8<\/td>\nFOREWORD <\/td>\n<\/tr>\n
9<\/td>\nASME PTC COMMITTEE Performance Test Codes <\/td>\n<\/tr>\n
10<\/td>\nCORRESPONDENCE WITH THE PTC 19.22 COMMITTEE <\/td>\n<\/tr>\n
11<\/td>\nINTRODUCTION <\/td>\n<\/tr>\n
13<\/td>\nDATA ACQUISITION SYSTEMS
Section 1 Object and Scope
1-1 OBJECT
1-2 SCOPE <\/td>\n<\/tr>\n
14<\/td>\nSection 2 Definitions and Descriptions of Terms <\/td>\n<\/tr>\n
16<\/td>\nSection 3 Guiding Principles
3-1 CAPABILITY
3-2 TYPICAL DATA ACQUISITION SYSTEMS
3-2.1 Basic Data Acquisition System
3-2.2 Intermediate Data Acquisition System <\/td>\n<\/tr>\n
17<\/td>\n3-2.3 Advanced Data Acquisition System
3-3 SYSTEM PLANNING
3-3.1 Test Plan
3-3.2 Hardware <\/td>\n<\/tr>\n
19<\/td>\n3-3.3 Software <\/td>\n<\/tr>\n
20<\/td>\n3-4 OPERATIONAL CONSIDERATIONS
3-4.1 Calibration
3-4.2 System Validation <\/td>\n<\/tr>\n
21<\/td>\nSection 4 Signal Conversion
4-1 SENSORS
4-1.1 Sensor Considerations
4-1.2 Sensor Signal Types
4-1.2.1 Analog Signals.
4-1.2.2 Digital Signals.
4-1.2.3 Pulse Inputs.
4-1.2.4 Contact Input Signals.
4-2 SIGNAL CONDITIONING
4-2.1 A\/D Conversion <\/td>\n<\/tr>\n
22<\/td>\n4-2.1.1 Counter or Ramp Type.
4-2.1.2 Successive Approximation Type.
4-2.1.3 Dual Slope Integrating Type.
4-2.1.4 Voltage to Frequency Integrating Type. <\/td>\n<\/tr>\n
23<\/td>\n4-2.1.5 Parallel Type.
4-2.1.6 Sigma-Delta Type.
4-2.2 Signal Amplification
4-2.3 Current to Voltage
4-2.4 Voltage Divider
4-2.5 AC to DC Conversion <\/td>\n<\/tr>\n
24<\/td>\n4-2.6 Filtering
4-2.6.1 Passive Filters.
4-2.6.2 Active Filters.
4-2.7 Digital Signal Conditioning
4-3 SIGNAL MULTIPLEXING
4-3.1 Analog Signal Multiplexing
4-3.1.1 Switch Type Multiplexing.
4-3.1.2 Relay Type Multiplexing. <\/td>\n<\/tr>\n
25<\/td>\n4-3.1.3 Solid State Multiplexing.
4-3.2 Digital Signal Multiplexing <\/td>\n<\/tr>\n
26<\/td>\nSection 5 Data Acquisition System Calibration
5-1 SYSTEM CALIBRATION
5-1.1 Reference Standards
5-1.2 Quality Assurance Program
5-1.3 Ambient Conditions
5-1.4 Calibration Points and Ranges <\/td>\n<\/tr>\n
27<\/td>\n5-1.5 Timing of Calibration
5-1.6 Drift
5-1.7 Calibration Corrections
5-1.8 Documentation and Traceability
5-2 CALIBRATION METHODS
5-2.1 Loop Calibration
5-2.2 Component Calibration
5-3 FIELD CALIBRATION
5-4 LABORATORY CALIBRATION <\/td>\n<\/tr>\n
28<\/td>\nSection 6 System Uncertainty
6-1 SYSTEM UNCERTAINTY CONTRIBUTORS
6-1.1 Component Base Uncertainty
6-1.2 System Application Uncertainty
6-1.2.1 Environmental Effects. <\/td>\n<\/tr>\n
29<\/td>\n6-1.2.2 Drift Effects.
6-1.2.3 Measurement Resolution.
6-1.2.4 Measurement Methodology.
6-1.2.5 Transient Effects. <\/td>\n<\/tr>\n
30<\/td>\n6-1.3 Analytical Uncertainty
6-2 OVERALL SYSTEM UNCERTAINTY
6-2.1 Combination of Individual Component Uncertainties
6-2.2 Overall Measurement System Loop Uncertainty <\/td>\n<\/tr>\n
31<\/td>\nSection 7 Data Management
7-1 DIGITAL DATA REPRESENTATION
7-1.1 Data Resolution
7-1.2 Computational Accuracy and Precision
7-2 DATA OUTPUT REQUIREMENTS <\/td>\n<\/tr>\n
32<\/td>\n7-3 MANUALLY PREPARED DATA
7-4 CALCULATIONS
7-4.1 Data Reduction
7-4.1.1 Scaling.
7-4.1.2 Unit Conversions.
7-4.1.3 Calibration Corrections. <\/td>\n<\/tr>\n
33<\/td>\n7-4.1.4 Other Corrections.
7-4.1.5 Averaging. <\/td>\n<\/tr>\n
36<\/td>\n7-4.1.6 Statistical.
7-4.1.7 Signal Conditioning: Software Filtering or Data Smoothing.
7-4.2 Results
7-4.2.1 Test Results.
7-4.2.2 Test Uncertainty.
7-4.3 Validation
7-5 DATA STORAGE GUIDELINES
7-5.1 Storage Capacity
7-5.2 Stored Attributes
7-5.3 Data Compression <\/td>\n<\/tr>\n
37<\/td>\n7-6 REPORTING <\/td>\n<\/tr>\n
39<\/td>\nMANDATORY APPENDIX I BIBLIOGRAPHY <\/td>\n<\/tr>\n
40<\/td>\nNONMANDATORY APPENDIX A DATA ACQUISITION SYSTEM COMPONENT ERRORS AND OVERALL SYSTEM UNCERTAINTY REPRESENTATION
A-1 INTRODUCTION
A-2 SYSTEM COMPONENT ERRORS
A-2.1 Sensors
A-2.2 Signal Conditioning
A-2.3 Multiplexing
A-2.4 A\/D Conversion <\/td>\n<\/tr>\n
41<\/td>\nA-2.5 Data Processing Errors
A-3 SYSTEM APPLICATION ERRORS
A-3.1 Zero Offset Errors
A-3.2 Gain Errors
A-3.3 Reference Voltage Errors
A-3.4 Common Mode Errors
A-3.5 System Noise Error
A-4 OVERALL DATA ACQUISITION SYSTEM ERRORS <\/td>\n<\/tr>\n
42<\/td>\nA-5 SUMMARY <\/td>\n<\/tr>\n
43<\/td>\nNONMANDATORY APPENDIX B DATA ACQUISITION SYSTEM UNCERTAINTY CALCULATION EXAMPLES
B-1 PURPOSE
B-2 UNCERTAINTY OF FOUR-WIRE RESISTANCE MEASUREMENT
B-2.1 System Configuration\/Specifications
B-2.2 Assumptions
B-2.3 Analysis
B-2.3.1 DAS Systematic Uncertainty Contributors.
B-2.3.1.1 Base Systematic Uncertainty. <\/td>\n<\/tr>\n
44<\/td>\nB-2.3.1.2 Environmental Effects.
B-2.3.1.3 Drift.
B-2.3.1.4 Measurement Resolution.
B-2.3.1.5 Measurement Methodology. <\/td>\n<\/tr>\n
46<\/td>\nB-2.3.1.6 Composite Systematic Uncertainty Due to DAS Effects.
B-2.3.2 Sensor Systematic Uncertainty Contributors.
B-2.3.2.1 Four-Wire RTD Sensor Base Systematic Uncertainty.
B-2.3.2.2 Environmental Effects.
B-2.3.2.3 Drift.
B-2.3.2.4 Resolution.
B-2.3.2.5 Measurement Methodology. <\/td>\n<\/tr>\n
47<\/td>\nB-2.3.2.6 Composite Systematic Uncertainty Due to RTD Sensor Effects.
B-2.3.3 Analytical Uncertainty.
B-2.3.4 Total Systematic Uncertainty of Measurement Loop.
B-2.3.4.1 Non-Loop Calibrated System.
B-2.3.4.2 Loop Calibrated System.
B-3 UNCERTAINTY OF DC VOLTAGE MEASUREMENT
B-3.1 System Configuration\/Specifications
B-3.2 Assumptions <\/td>\n<\/tr>\n
48<\/td>\nB-3.3 Analysis
B-3.3.1 DAS Systematic Uncertainty Contributors.
B-3.3.1.1 Base Systematic Uncertainty.
B-3.3.1.2 Environmental Effects.
B-3.3.1.3 Drift.
B-3.3.1.4 Measurement Resolution.
B-3.3.1.5 Measurement Methodology. <\/td>\n<\/tr>\n
49<\/td>\nB-3.3.1.6 Composite Systematic Uncertainty Due to DAS Effects.
B-3.3.2 Sensor Systematic Uncertainty Contributors.
B-3.3.2.1 DC Voltage Base Systematic Uncertainty.
B-3.3.2.2 Environmental Effects. <\/td>\n<\/tr>\n
50<\/td>\nB-3.3.2.3 Drift.
B-3.3.2.4 Resolution.
B-3.3.2.5 Measurement Methodology.
B-3.3.2.6 Composite Systematic Uncertainty Due to DC Voltage Sensor Effects.
B-3.3.3 Analytical Uncertainty.
B-3.3.4 Total Systematic Uncertainty of Measurement Loop.
B-4 UNCERTAINTY OF DIGITAL SIGNAL INPUT
B-4.1 System Configuration\/Specifications
B-4.2 Assumptions
B-4.3 Analysis
B-4.3.1 DAS Systematic Uncertainty Contributors.
B-4.3.1.1 Measurement Methodology. <\/td>\n<\/tr>\n
51<\/td>\nB-4.3.1.2 Composite Systematic Uncertainty Due to DAS Effects.
B-4.3.2 Sensor Systematic Uncertainty Contributors.
B-4.3.2.1 Digital Signal Base Uncertainty.
B-4.3.2.2 Environmental Effects.
B-4.3.2.3 Drift.
B-4.3.2.4 Resolution.
B-4.3.2.5 Measurement Methodology.
B-4.3.2.6 Composite Systematic Uncertainty Due to Digital Sensor Effects.
B-4.3.3 Analytical Uncertainty.
B-4.3.4 Total Systematic Uncertainty of Measurement Loop.
B-5 CONCLUSIONS
B-5.1 Four-Wire RTD Measurements <\/td>\n<\/tr>\n
52<\/td>\nB-5.2 DC Voltage Measurements
B-5.3 Digital Inputs
B-5.4 Summary <\/td>\n<\/tr>\n
53<\/td>\nNONMANDATORY APPENDIX C FLOATING-POINT DATA REPRESENTATION IEEE 754-1985 <\/td>\n<\/tr>\n
54<\/td>\nNONMANDATORY APPENDIX D SAMPLE DATA ACQUISITION SYSTEM OUTPUT EXAMPLE <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

ASME PTC 19.22 – 2007(R2023): Data Acquisition Systems<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
ASME<\/b><\/a><\/td>\n2007<\/td>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":424645,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2643],"product_tag":[],"class_list":{"0":"post-424639","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-asme","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/424639","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/424645"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=424639"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=424639"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=424639"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}