{"id":424937,"date":"2024-10-20T06:54:11","date_gmt":"2024-10-20T06:54:11","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-iec-60749-412020-3\/"},"modified":"2024-10-26T12:59:50","modified_gmt":"2024-10-26T12:59:50","slug":"bs-en-iec-60749-412020-3","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-iec-60749-412020-3\/","title":{"rendered":"BS EN IEC 60749-41:2020"},"content":{"rendered":"
This Part of IEC 60749 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.<\/p>\n
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2<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
5<\/td>\n | Annex ZA(normative)Normative references to international publicationswith their corresponding European publications <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | English CONTENTS <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 4 Apparatus 5 Procedure 5.1 Qualification specifications <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 5.2 Program\/erase endurance 5.2.1 Test setup Figure 1 \u2013 Schematic flow <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 5.2.2 Data cycling <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | 5.2.3 Electrical test verification 5.3 Data retention 5.3.1 Data programming <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | 5.3.2 Electrical testing and pattern verification (excluding any EEPROM program\/erase testing) 5.3.3 Data retention stress 5.3.4 Electrical testing and pattern verification 5.4 Precautions 5.5 Measurements 5.5.1 Electrical measurements 5.5.2 Required measurements <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | 5.5.3 Measurement conditions 6 Failure criteria and calculation 6.1 Failure definition 6.2 Handling of transient failures 6.3 Separation of failures into data errors and device failures <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | 6.4 Calculation of UBER 6.4.1 UBER definition calculation 6.4.2 Calculation of UBER in the ideal case <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | 6.4.3 Calculation of UBER in other cases 7 Summary <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | Annex A (informative)Supplementary test condition Figure A.1 \u2013 Endurance-retention testing model Figure A.2 \u2013 Test concept of data retention bake as a function of endurance <\/td>\n<\/tr>\n | ||||||
25<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Semiconductor devices. Mechanical and climatic test methods – Standard reliability testing methods of non-volatile memory devices<\/b><\/p>\n |