{"id":42849,"date":"2024-10-17T06:31:38","date_gmt":"2024-10-17T06:31:38","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/astm-e766-2008\/"},"modified":"2024-10-24T15:42:45","modified_gmt":"2024-10-24T15:42:45","slug":"astm-e766-2008","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/astm\/astm-e766-2008\/","title":{"rendered":"ASTM-E766 2008"},"content":{"rendered":"<\/p>\n<p id=\"s00002\">1.1 This practice covers general procedures necessary for the calibration of magnification of scanning electron microscopes. The relationship between true magnification and indicated magnification is a complicated function of operating conditions. Therefore, this practice must be applied to each set of standard operating conditions to be used.<\/p>\n<p id=\"s00003\">1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.<\/p>\n<p id=\"s00004\">1.3 <span class=\"italic\">This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.<\/span><\/p>\n<p><h4>PDF Catalog<\/h4>\n<table border=\"1px\" class=\"des-table\">\n<tr>\n<th>PDF Pages<\/th>\n<th>PDF Title<\/th>\n<\/tr>\n<tr>\n<td><b>1<b><\/td>\n<td>Scope <br \/> Referenced Documents <br \/> Terminology  <\/td>\n<\/tr>\n<tr>\n<td><b>2<b><\/td>\n<td>Significance and Use <br \/> Calibration Specimen <br \/> Procedure  <\/td>\n<\/tr>\n<tr>\n<td><b>3<b><\/td>\n<td>FIG. 1   <\/td>\n<\/tr>\n<tr>\n<td><b>4<b><\/td>\n<td>Report <br \/> Precision and Bias <br \/> FIG. 2   <\/td>\n<\/tr>\n<tr>\n<td><b>5<b><\/td>\n<td>Application of Magnification Accuracy to the Measurement of Sample Detail <br \/> Keywords <br \/> FIG. 3   <\/td>\n<\/tr>\n<tr>\n<td><b>6<b><\/td>\n<td>A1. PARAMETERS THAT INFLUENCE THE RESULTANT MAGNIFICATION OF AN SEM <br \/> A1.1   <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"<p><b>E766-98(2008)e1 Standard Practice for  Calibrating the Magnification of a Scanning Electron Microscope<\/b><\/p>\n<table class=\"shortdes-table\" style=\"width: 100%\" border=\"0\" cellspacing=\"0\" cellpadding=\"0\">\n<tbody>\n<tr>\n<td>Published By<\/td>\n<td>Publication Date<\/td>\n<td>Number of Pages<\/td>\n<\/tr>\n<tr>\n<td><a href=\"https:\/\/pdfstandards.shop\/product-category\/publishers\/astm\/\"><b>ASTM<\/b><\/a><\/td>\n<td>2008<\/td>\n<td>6<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":42850,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2637],"product_tag":[],"class_list":{"0":"post-42849","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-astm","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/42849","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/42850"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=42849"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=42849"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=42849"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}