This part of IEC 61000 relates to the conducted immunity requirements of electrical and electronic equipment to electromagnetic disturbances coming from intended radio-frequency (RF) transmitters in the frequency range 150 kHz up to 80 MHz. NOTE 1 Product committees might decide to use the methods described in this document also for frequencies up to 230 MHz (see Annex B) although the methods and test instrumentation is intended to be used in the frequency range up to 80 MHz. Equipment not having at least one conducting wire and\/or cable (such as mains supply, signal line or earth connection) which can couple the equipment to the disturbing RF fields is excluded from the scope of this publication. NOTE 2 Test methods are specified in this part of IEC 61000 to assess the effect that conducted disturbing signals, induced by electromagnetic radiation, have on the equipment concerned. The simulation and measurement of these conducted disturbances are not adequately exact for the quantitative determination of effects. The test methods specified are structured for the primary objective of establishing adequate repeatability of results at various facilities for quantitative analysis of effects. The object of this standard is to establish a common reference for evaluating the functional immunity of electrical and electronic equipment when subjected to conducted disturbances induced by RF fields. The test method documented in this part of IEC 61000 describes a consistent method to assess the immunity of an equipment or system against a specified phenomenon. NOTE 3 As described in IEC Guide 107, this standard is a basic EMC publication for use by product committees of the IEC. As also stated in Guide 107, the IEC product committees are responsible for determining whether this immunity test standard should be applied or not, and if applied, they are responsible for determining the appropriate test levels and performance criteria.<\/p>\n
| PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
|---|---|---|---|---|---|---|---|
| 1<\/td>\n | compares BS EN IEC 61000-4-6:2023 <\/td>\n<\/tr>\n | ||||||
| 2<\/td>\n | TRACKED CHANGES Text example 1 \u2014 indicates added text (in green) <\/td>\n<\/tr>\n | ||||||
| 132<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
| 135<\/td>\n | Annex ZA (normative)Normative references to international publicationswith their corresponding European publications <\/td>\n<\/tr>\n | ||||||
| 136<\/td>\n | CONTENTS <\/td>\n<\/tr>\n | ||||||
| 140<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
| 142<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n | ||||||
| 143<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions <\/td>\n<\/tr>\n | ||||||
| 145<\/td>\n | 4 General <\/td>\n<\/tr>\n | ||||||
| 146<\/td>\n | Figures Figure 1 \u2013 Diagram showing EM fields near the EUT due to common-mode currents on its cables <\/td>\n<\/tr>\n | ||||||
| 147<\/td>\n | 5 Test levels Figure 2 \u2013 Schematic setup for immunity test to RF conducted disturbances <\/td>\n<\/tr>\n | ||||||
| 148<\/td>\n | Figure 3 \u2013 Example of unmodulated and modulated RF signal Tables Table 1 \u2013 Test levels <\/td>\n<\/tr>\n | ||||||
| 149<\/td>\n | 6 Test equipment and level adjustment procedure 6.1 Test generator Table 2 \u2013 Characteristics of the test generator <\/td>\n<\/tr>\n | ||||||
| 150<\/td>\n | 6.2 Coupling and decoupling devices 6.2.1 General Figure 4 \u2013 Test generator setup Table 3 \u2013 Main parameter of the combination of the coupling and decoupling device <\/td>\n<\/tr>\n | ||||||
| 151<\/td>\n | Figure 5 \u2013 Principle of coupling and decoupling \u2013 Symbols used for the indicated setup principles Figure 6 \u2013 Principle of coupling and decoupling \u2013 Principle of direct injection to screened cables <\/td>\n<\/tr>\n | ||||||
| 152<\/td>\n | 6.2.2 Coupling\/decoupling networks (CDNs) Figure 7 \u2013 Principle of coupling and decoupling \u2013 Principle of coupling to unscreened cables according to the CDN method Figure 8 \u2013 Principle of coupling and decoupling \u2013 Principle of decoupling <\/td>\n<\/tr>\n | ||||||
| 153<\/td>\n | Table 4 \u2013 Usage of CDNs <\/td>\n<\/tr>\n | ||||||
| 154<\/td>\n | 6.2.3 Clamp injection devices <\/td>\n<\/tr>\n | ||||||
| 155<\/td>\n | Figure 9 \u2013 Example of circuit for level-setting setup in a 150 \u03a9 test jig Figure 10 \u2013Example of circuit for evaluating the transmission lossof the current clamp level-setting <\/td>\n<\/tr>\n | ||||||
| 156<\/td>\n | 6.2.4 Direct injection devices 6.2.5 Decoupling networks 6.3 Verification of the common-mode impedance at the EUT port of coupling and decoupling devices 6.3.1 General <\/td>\n<\/tr>\n | ||||||
| 157<\/td>\n | 6.3.2 Insertion loss of the 150 \u03a9 to 50 \u03a9 adapters Figure 11 \u2013 Example of the setup geometry to verify the impedance characteristics of the coupling and decoupling devices <\/td>\n<\/tr>\n | ||||||
| 158<\/td>\n | Figure 12 \u2013 Setup principle to verify Zce of the coupling and decoupling device Figure 13 \u2013 Setup principle for measuring the insertion loss of two 150 \u03a9 to 50 \u03a9 adapters Figure 14 \u2013 Circuit and construction of the 150 \u03a9 to 50 \u03a9 adapter <\/td>\n<\/tr>\n | ||||||
| 159<\/td>\n | 6.4 Setting of the test generator 6.4.1 General 6.4.2 Setting of the output level at the EUT port of the coupling device <\/td>\n<\/tr>\n | ||||||
| 160<\/td>\n | Figure 15 \u2013 Definition of a common-mode point for unscreened and screened cables <\/td>\n<\/tr>\n | ||||||
| 161<\/td>\n | 7 Test setup and injection methods 7.1 Test setup Figure 16 \u2013 Setup for level-setting at the EUT port of the coupling\/decoupling devices <\/td>\n<\/tr>\n | ||||||
| 162<\/td>\n | 7.2 EUT comprising a single unit Figure 17 \u2013 Example of test setup with a single unit EUT with only one CDN for injection (top view) <\/td>\n<\/tr>\n | ||||||
| 163<\/td>\n | Figure 18 \u2013 Example of test setup with a single unit EUT (top view) using multiple CDNs <\/td>\n<\/tr>\n | ||||||
| 164<\/td>\n | 7.3 EUT comprising several units Figure 19 \u2013 Example of a test setup with a multi-unit EUT (top view) <\/td>\n<\/tr>\n | ||||||
| 165<\/td>\n | 7.4 Rules for selecting injection methods and test points 7.4.1 General 7.4.2 Injection method Figure 20 \u2013 Rules for selecting the injection method <\/td>\n<\/tr>\n | ||||||
| 166<\/td>\n | 7.4.3 Ports to be tested 7.5 CDN injection application <\/td>\n<\/tr>\n | ||||||
| 168<\/td>\n | 7.6 Clamp injection application Figure 21 \u2013 Immunity test for two-port EUT (when only one CDN can be used) <\/td>\n<\/tr>\n | ||||||
| 169<\/td>\n | Figure 22 \u2013 General principle of a test setup using clamp injection devices <\/td>\n<\/tr>\n | ||||||
| 170<\/td>\n | 7.7 Direct injection application 8 Test procedure Figure 23 \u2013 Example of the test unit locations on the ground plane when using injection clamps (top view) <\/td>\n<\/tr>\n | ||||||
| 171<\/td>\n | 9 Evaluation of the test results <\/td>\n<\/tr>\n | ||||||
| 172<\/td>\n | 10 Test report <\/td>\n<\/tr>\n | ||||||
| 173<\/td>\n | Annexes Annex A (normative) EM and decoupling clamps A.1 EM clamps A.1.1 General A.1.2 Specification of EM clamps <\/td>\n<\/tr>\n | ||||||
| 174<\/td>\n | Figure A.1 \u2013 Example: Construction details of the EM clamp <\/td>\n<\/tr>\n | ||||||
| 175<\/td>\n | A.2 EM clamp characterization A.2.1 Specification of the clamp test jig Figure A.2 \u2013 Example: Concept of the EM clamp <\/td>\n<\/tr>\n | ||||||
| 176<\/td>\n | A.2.2 Clamp characterization Figure A.3 \u2013 Dimension of a reference plane Figure A.4 \u2013 Test jig Figure A.5 \u2013 Test jig with inserted clamp <\/td>\n<\/tr>\n | ||||||
| 177<\/td>\n | Figure A.6 \u2013 Impedance \/ decoupling factor measurement setup <\/td>\n<\/tr>\n | ||||||
| 179<\/td>\n | Figure A.7 \u2013 Typical examples for clamp impedance, three typical clamps Figure A.8 \u2013 Typical examples for decoupling factors, three typical clamps <\/td>\n<\/tr>\n | ||||||
| 180<\/td>\n | Figure A.9 \u2013 Normalization setup for coupling factor measurement Figure A.10 \u2013 S21 coupling factor measurement setup <\/td>\n<\/tr>\n | ||||||
| 181<\/td>\n | A.3 Decoupling clamp characterization A.3.1 General A.3.2 Specification of decoupling clamps A.3.3 Impedance Figure A.11 \u2013 Typical examples for coupling factor, three typical clamps <\/td>\n<\/tr>\n | ||||||
| 182<\/td>\n | A.3.4 Decoupling factor Figure A.12 \u2013 Decoupling clamp characterization measurement setup Figure A.13 \u2013 Typical examples for the decoupling clamp impedance <\/td>\n<\/tr>\n | ||||||
| 183<\/td>\n | Figure A.14 \u2013 Typical examples for decoupling factors <\/td>\n<\/tr>\n | ||||||
| 184<\/td>\n | Annex B (informative) Selection criteria for the frequency range of application Table B.1 \u2013 Main parameter of the combination of the coupling and decoupling device when the frequency range of the test is extended above 80 MHz <\/td>\n<\/tr>\n | ||||||
| 185<\/td>\n | Figure B.1 \u2013 Start frequency as function of cable length and equipment size <\/td>\n<\/tr>\n | ||||||
| 186<\/td>\n | Annex C (informative) Guidelines for selecting test levels <\/td>\n<\/tr>\n | ||||||
| 187<\/td>\n | Annex D (informative) Information on coupling and decoupling networks D.1 Basic features of the coupling and decoupling networks D.2 Examples of coupling and decoupling networks <\/td>\n<\/tr>\n | ||||||
| 188<\/td>\n | Figure D.1 \u2013 Example of a simplified diagram for the circuit of CDN-S1 used with screened cables (see 6.2.2.5) Figure D.2 \u2013 Example of simplified diagram for the circuit of CDN-M1, CDN-M2 andCDN-M3 used with unscreened supply (mains) lines (see 6.2.2.2) <\/td>\n<\/tr>\n | ||||||
| 189<\/td>\n | Figure D.3 \u2013 Example of a simplified diagram for the circuit of CDN-AF2 used with unscreened unbalanced lines (see 6.2.2.4) Figure D.4 \u2013 Example of a simplified diagram for the circuit of CDN-T2, used with an unscreened balanced pair (see 6.2.2.3) <\/td>\n<\/tr>\n | ||||||
| 190<\/td>\n | Figure D.5 \u2013 Example of a simplified diagram of the circuit of CDN-T4 used with unscreened balanced pairs (see 6.2.2.3) Figure D.6 \u2013 Example of a simplified diagram of the circuit of CDN AF8 used with unscreened unbalanced lines (see 6.2.2.4) <\/td>\n<\/tr>\n | ||||||
| 191<\/td>\n | Figure D.7 \u2013 Example of a simplified diagram of the circuit of CDN-T8 used with unscreened balanced pairs (see 6.2.2.3) <\/td>\n<\/tr>\n | ||||||
| 192<\/td>\n | Annex E (informative) Information for the test generator specification Table E.1 \u2013 Required power amplifier output power to obtain a test level of 10 V <\/td>\n<\/tr>\n | ||||||
| 193<\/td>\n | Annex F (informative) Test setup for large EUTs F.1 General F.2 Test setup for large EUTs <\/td>\n<\/tr>\n | ||||||
| 194<\/td>\n | Figure F.1 \u2013 Example of large EUT test setup with elevated horizontal reference ground plane <\/td>\n<\/tr>\n | ||||||
| 195<\/td>\n | Figure F.2 \u2013 Example of large EUT test setup with vertical reference ground plane <\/td>\n<\/tr>\n | ||||||
| 196<\/td>\n | Annex G (informative) Measurement uncertainty of the voltage test level G.1 General G.2 General symbols G.3 Uncertainty budgets for test methods G.3.1 Definition of the measurand <\/td>\n<\/tr>\n | ||||||
| 197<\/td>\n | G.3.2 MU contributors of the measurand Figure G.1 \u2013 Example of influences upon voltage test level using CDN Figure G.2 \u2013 Example of influences upon voltage test level using EM clamp Figure G.3 \u2013 Example of influences upon voltage test level using current clamp <\/td>\n<\/tr>\n | ||||||
| 198<\/td>\n | G.3.3 Input quantities and calculation examples for expanded uncertainty Figure G.4 \u2013 Example of influences upon voltage test level using direct injection <\/td>\n<\/tr>\n | ||||||
| 199<\/td>\n | Figure G.5 \u2013 Circuit for level-setting setup of CDN Table G.1 \u2013 CDN level-setting process Table G.2 \u2013 CDN test process <\/td>\n<\/tr>\n | ||||||
| 201<\/td>\n | Table G.3 \u2013 EM clamp level-setting process <\/td>\n<\/tr>\n | ||||||
| 202<\/td>\n | Table G.4 \u2013 EM clamp test process <\/td>\n<\/tr>\n | ||||||
| 203<\/td>\n | Table G.5 \u2013 Current clamp level-setting process Table G.6 \u2013 Current clamp test process <\/td>\n<\/tr>\n | ||||||
| 204<\/td>\n | Table G.7 \u2013 Direct injection level-setting process <\/td>\n<\/tr>\n | ||||||
| 205<\/td>\n | G.4 Expression of the calculated measurement uncertainty and its application Table G.8 \u2013 Direct injection test process <\/td>\n<\/tr>\n | ||||||
| 207<\/td>\n | Annex H (informative) Testing with multiple signals H.1 General H.2 Intermodulation Figure H.1 \u2013 Test frequencies f1 and f2 and intermodulation frequencies of the second and third order <\/td>\n<\/tr>\n | ||||||
| 208<\/td>\n | H.3 Power requirements <\/td>\n<\/tr>\n | ||||||
| 209<\/td>\n | H.4 Level-setting requirements H.5 Linearity check and harmonics checks of the test generator H.6 EUT performance criteria with multiple signals <\/td>\n<\/tr>\n | ||||||
| 210<\/td>\n | Annex I (informative) Port-to-port injection I.1 General I.2 Test setup for injection on identical ports I.2.1 Selection of ports I.2.2 Procedure for port-to-port injection <\/td>\n<\/tr>\n | ||||||
| 211<\/td>\n | Figure I.1 \u2013 Example of setup, port-to-port injection <\/td>\n<\/tr>\n | ||||||
| 212<\/td>\n | Annex J (informative) Amplifier compression and non-linearity J.1 Objective of limiting amplifier distortion J.2 Possible problems caused by harmonics and saturation J.3 Limiting the harmonic content in the disturbance signal <\/td>\n<\/tr>\n | ||||||
| 213<\/td>\n | J.4 Effect of linearity characteristic on the immunity test J.4.1 General J.4.2 Evaluation of the amplifier linearity characteristic <\/td>\n<\/tr>\n | ||||||
| 214<\/td>\n | Figure J.1 \u2013 Amplifier linearity measurement setup <\/td>\n<\/tr>\n | ||||||
| 215<\/td>\n | Figure J.2 \u2013 Linearity characteristic Figure J.3 \u2013 Measurement setup for modulation depth <\/td>\n<\/tr>\n | ||||||
| 216<\/td>\n | Figure J.4 \u2013 Spectrum of AM modulated signal <\/td>\n<\/tr>\n | ||||||
| 217<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Tracked Changes. Electromagnetic compatibility (EMC) – Testing and measurement techniques. Immunity to conducted disturbances, induced by radio-frequency fields<\/b><\/p>\n |