{"id":439760,"date":"2024-10-20T08:10:58","date_gmt":"2024-10-20T08:10:58","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/asme-ptb-15-2023\/"},"modified":"2024-10-26T15:18:57","modified_gmt":"2024-10-26T15:18:57","slug":"asme-ptb-15-2023","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/asme\/asme-ptb-15-2023\/","title":{"rendered":"ASME PTB 15 2023"},"content":{"rendered":"

Full Matrix Capture Training Manual<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
4<\/td>\nTABLE OF CONTENTS <\/td>\n<\/tr>\n
23<\/td>\nACKNOWLEDGEMENTS <\/td>\n<\/tr>\n
24<\/td>\nFOREWORD <\/td>\n<\/tr>\n
25<\/td>\n1 HISTORY
1.1 ASME History <\/td>\n<\/tr>\n
27<\/td>\n1.2 ASME and FMC <\/td>\n<\/tr>\n
29<\/td>\n1.3 History of FMC and TFM <\/td>\n<\/tr>\n
30<\/td>\n1.4 Equivalence of Early Developments <\/td>\n<\/tr>\n
31<\/td>\n2 FMC-TFM
2.1 Full Matrix Capture (FMC)
2.1.1 Principle for Firing and Data Collection
2.1.2 FMC Signal Characteristics <\/td>\n<\/tr>\n
32<\/td>\n2.1.3 Typical FMC Signal Explained <\/td>\n<\/tr>\n
34<\/td>\n2.1.4 Alternative Firing and Data Collection Methods <\/td>\n<\/tr>\n
36<\/td>\n2.1.5 FMC Processes Using Different TR Methods <\/td>\n<\/tr>\n
38<\/td>\n2.1.6 FMC Data Size and Storage <\/td>\n<\/tr>\n
39<\/td>\n2.1.7 FMC Data Storage
2.2 Total Focusing Method (TFM)
2.2.1 TFM General <\/td>\n<\/tr>\n
40<\/td>\n2.2.2 Principle for Data Reconstruction <\/td>\n<\/tr>\n
44<\/td>\n2.3 Wave Type, Reconstruction Mode
2.3.1 Naming Conventions
2.3.2 TFM Modes <\/td>\n<\/tr>\n
46<\/td>\n2.3.3 Some Flaw Strategies
2.3.4 Beam Spread Considerations <\/td>\n<\/tr>\n
49<\/td>\n2.3.5 Self-Tandem Modes <\/td>\n<\/tr>\n
50<\/td>\n2.3.6 Effects of Thickness <\/td>\n<\/tr>\n
52<\/td>\n2.4 Amplitude Fidelity
2.4.1 Amplitude Fidelity in Signal Processing <\/td>\n<\/tr>\n
54<\/td>\n2.4.2 Grid Construction <\/td>\n<\/tr>\n
55<\/td>\n2.4.3 TFM Grid Resolution <\/td>\n<\/tr>\n
58<\/td>\n2.5 Scan Plan <\/td>\n<\/tr>\n
60<\/td>\n2.5.1 Defining the Specimen and the Probe
2.5.2 Scan Plan for Specific Flaws <\/td>\n<\/tr>\n
61<\/td>\n2.5.3 Locating the TFM Grid
2.5.4 Scan Plan Design <\/td>\n<\/tr>\n
64<\/td>\n2.6 Fourier and Hilbert Transforms
2.6.1 Time vs. Frequency Representation of Signals (Fourier Transform) <\/td>\n<\/tr>\n
69<\/td>\n2.6.2 Hilbert Transform <\/td>\n<\/tr>\n
80<\/td>\n3 TFMS
3.1 Synthetic Aperture Focusing Technique
3.1.1 Data Collection <\/td>\n<\/tr>\n
81<\/td>\n3.1.2 Post Processing <\/td>\n<\/tr>\n
82<\/td>\n3.1.3 Resolution <\/td>\n<\/tr>\n
83<\/td>\n3.2 Virtual Source Aperture <\/td>\n<\/tr>\n
84<\/td>\n3.3 Migration and Inverse Wave Extrapolation (IWEX), crossover between NDT and Geophysics
3.3.1 History of Migration in Geophysics <\/td>\n<\/tr>\n
85<\/td>\n3.3.2 Examples of crossover between geophysics and NDT <\/td>\n<\/tr>\n
86<\/td>\n3.3.3 Difference Between Basic FMC-TFM and IWEX
3.3.4 Data Displays Used for IWEX <\/td>\n<\/tr>\n
89<\/td>\n3.3.5 Electronics Hardware
3.4 Iterative TFM <\/td>\n<\/tr>\n
92<\/td>\n3.5 Adaptive TFM\u2013A Framework
3.5.1 Basic Process <\/td>\n<\/tr>\n
93<\/td>\n3.5.2 Metallurgical Study
3.5.3 Material Anisotropy Distribution Model <\/td>\n<\/tr>\n
94<\/td>\n3.5.4 Material Properties and Wave Propagation in an Elastic Media <\/td>\n<\/tr>\n
95<\/td>\n3.5.5 Cauchy Tensor, Christoffel Matrix, and Key Velocity Parameters
3.5.6 The Slowness Surface, Slowness Curves <\/td>\n<\/tr>\n
96<\/td>\n3.5.7 Group velocity and Phase velocity <\/td>\n<\/tr>\n
97<\/td>\n3.5.8 Detection of Anisotropic Characteristics <\/td>\n<\/tr>\n
98<\/td>\n3.5.9 Path Dependent Adaptation Process <\/td>\n<\/tr>\n
99<\/td>\n3.5.10 Model Evolution
3.5.11 Degrees of Freedom <\/td>\n<\/tr>\n
100<\/td>\n3.5.12 TFM Process
3.6 PWI-ML
3.6.1 Plane Wave Imaging <\/td>\n<\/tr>\n
102<\/td>\n3.7 Sectorial Total Focusing
3.7.1 STF, LTF, CTF Processes (Techniques but not Methods) <\/td>\n<\/tr>\n
104<\/td>\n3.8 TFMi
3.8.1 Terminology <\/td>\n<\/tr>\n
105<\/td>\n3.8.2 FMC Acquisition Characteristics <\/td>\n<\/tr>\n
108<\/td>\n3.8.3 Propagation Modes
3.8.4 Region of Interest <\/td>\n<\/tr>\n
110<\/td>\n3.8.5 Image Sensitivity
3.8.6 TFMi <\/td>\n<\/tr>\n
112<\/td>\n3.8.7 Advantages of TFMi
3.9 Phase Coherence Imaging <\/td>\n<\/tr>\n
113<\/td>\n3.9.1 What is PCI? <\/td>\n<\/tr>\n
115<\/td>\n3.9.2 Interpreting PCI data <\/td>\n<\/tr>\n
116<\/td>\n3.9.3 Conclusion <\/td>\n<\/tr>\n
117<\/td>\n4 INSTRUMENTS
4.1 Hardware Challenges
4.1.1 The Challenge Posed by FMC
4.1.2 TFM Image Data Rate
4.1.3 The TFM Calculation Challenge <\/td>\n<\/tr>\n
118<\/td>\n4.1.4 FPGA Performance
4.1.5 GPU Performance <\/td>\n<\/tr>\n
119<\/td>\n4.1.6 FPGA\/GPU Comparison <\/td>\n<\/tr>\n
120<\/td>\n4.1.7 Adaptive and Iterative TFM <\/td>\n<\/tr>\n
121<\/td>\n4.2 Deployment Schemes\/Scanning Equipment
4.2.1 Introduction
4.2.2 Manual Scanning
4.2.3 Nonautomated Scanner <\/td>\n<\/tr>\n
122<\/td>\n4.2.4 Semi-automated Scanner <\/td>\n<\/tr>\n
123<\/td>\n4.2.5 Fully Automated Scanner <\/td>\n<\/tr>\n
124<\/td>\n4.2.6 Application Specific <\/td>\n<\/tr>\n
125<\/td>\n4.2.7 Conclusion <\/td>\n<\/tr>\n
126<\/td>\n5 ARRAYS
5.1 Abstract
5.2 Basic Overview of Ultrasonic Transducers and Their Construction
5.2.1 What is a Transducer?
5.2.2 The Piezoelectric Effect <\/td>\n<\/tr>\n
127<\/td>\n5.2.3 Types of Transducers <\/td>\n<\/tr>\n
128<\/td>\n5.2.4 Basic Construction <\/td>\n<\/tr>\n
130<\/td>\n5.2.5 Piezocomposite <\/td>\n<\/tr>\n
131<\/td>\n5.3 Transducer Arrays
5.3.1 Linear Arrays <\/td>\n<\/tr>\n
132<\/td>\n5.3.2 Construction of Transducer Arrays <\/td>\n<\/tr>\n
133<\/td>\n5.3.3 Matrix Arrays <\/td>\n<\/tr>\n
135<\/td>\n5.3.4 Common Configurations of Arrays Used in NDE <\/td>\n<\/tr>\n
137<\/td>\n5.4 Transducer Sound Fields
5.4.1 Basic Beam Modeling <\/td>\n<\/tr>\n
138<\/td>\n5.4.2 Near Field Distance <\/td>\n<\/tr>\n
139<\/td>\n5.4.3 Focusing Flat and Curved Oscillators, Spot Size and Depth of Field <\/td>\n<\/tr>\n
141<\/td>\n5.4.4 Beam Divergence\/Array Element Performance <\/td>\n<\/tr>\n
143<\/td>\n5.5 Array Design for FMC
5.5.1 Goal of FMC\/TFM Imaging <\/td>\n<\/tr>\n
144<\/td>\n5.5.2 Near Field Imaging <\/td>\n<\/tr>\n
145<\/td>\n5.5.3 Angle Limitation\/Constant Focal Ratio (F\/D) <\/td>\n<\/tr>\n
148<\/td>\n5.5.4 Selection of Array Parameters (Active Plane) <\/td>\n<\/tr>\n
152<\/td>\n5.5.5 Strategy for Setting Passive Plane Parameters <\/td>\n<\/tr>\n
154<\/td>\n5.5.6 Flat or Focused? <\/td>\n<\/tr>\n
155<\/td>\n5.6 Transducer Standards
5.7 Conclusions and Recommendations <\/td>\n<\/tr>\n
156<\/td>\n6 MODELING
6.1 General benefits of weld simulation
6.1.1 Effects of Material on Inspection Results <\/td>\n<\/tr>\n
158<\/td>\n6.1.2 Better Understanding of Results via Simulation <\/td>\n<\/tr>\n
160<\/td>\n6.2 Inspection Simulation <\/td>\n<\/tr>\n
164<\/td>\n6.3 Using Modeling for TFM Inspection
6.3.1 Probe Selection <\/td>\n<\/tr>\n
165<\/td>\n6.3.2 Mode of Propagation Selection <\/td>\n<\/tr>\n
167<\/td>\n6.3.3 Modeling as TFM Scan Plan Assistance Tool
6.3.4 Example of Modeling as TFM Scan Plan Assistance Tool on ERW pipe <\/td>\n<\/tr>\n
171<\/td>\n7 ADVANTAGES AND LIMITATIONS OF FMC\/TFM VERSUS PAUT
7.1 Advantages
7.1.1 Accurate Visualization <\/td>\n<\/tr>\n
173<\/td>\n7.1.2 Improved Resolution <\/td>\n<\/tr>\n
174<\/td>\n7.1.3 Sound Propagation (dead zone) <\/td>\n<\/tr>\n
176<\/td>\n7.1.4 Near Surface Resolution
7.2 Limitations
7.2.1 Selection of the Correct Mode of Propagation for the Type of Flaws <\/td>\n<\/tr>\n
177<\/td>\n7.2.2 Part Geometry and Material Definition
7.2.3 Attenuation and Penetration in Thick or Difficult to Penetrate Materials <\/td>\n<\/tr>\n
178<\/td>\n7.2.4 Productivity <\/td>\n<\/tr>\n
179<\/td>\n8 SIZING TECHNIQUES
8.1 Length and Height Sizing <\/td>\n<\/tr>\n
180<\/td>\n8.1.1 Length Sizing <\/td>\n<\/tr>\n
183<\/td>\n8.1.2 dB Drop Through-Wall Height Sizing of Embedded Flaws <\/td>\n<\/tr>\n
185<\/td>\n8.1.3 Tip Diffraction for Embedded Indications
8.1.4 Sizing Cluster Indications Such as Porosity <\/td>\n<\/tr>\n
186<\/td>\n8.1.5 Tip Diffraction for Through-Wall Sizing of ID\/OD-connected Cracks <\/td>\n<\/tr>\n
188<\/td>\n8.1.6 Length and Height Sizing Comparisons with Various Methods\u2013TFM, TOFD, PAUT <\/td>\n<\/tr>\n
195<\/td>\n9 FRACTURE MECHANICS FLAW CHARACTERIZATION
9.1 Introduction to Fracture Behavior <\/td>\n<\/tr>\n
196<\/td>\n9.2 Overview of Fracture Mechanics <\/td>\n<\/tr>\n
197<\/td>\n9.3 History of Fracture Mechanics <\/td>\n<\/tr>\n
198<\/td>\n9.4 Two Main Categories of Fracture Mechanics <\/td>\n<\/tr>\n
200<\/td>\n9.4.1 Summary
9.5 Application of Fracture Mechanics <\/td>\n<\/tr>\n
201<\/td>\n9.5.1 Damage Tolerant Design <\/td>\n<\/tr>\n
202<\/td>\n9.5.2 Planning for Inspection Using These Damage Tolerance Principles <\/td>\n<\/tr>\n
204<\/td>\n9.6 ASME Code Margins and Safety
9.7 Flaw Evaluation Procedures Using Fracture Mechanics <\/td>\n<\/tr>\n
205<\/td>\n9.7.1 Steps in the ASME BPVC Section XI Flaw Evaluation Procedure <\/td>\n<\/tr>\n
207<\/td>\n9.8 Acceptance Criteria Examples <\/td>\n<\/tr>\n
211<\/td>\n9.9 Applying the Acceptance Criteria Tables and Using Interpolation <\/td>\n<\/tr>\n
213<\/td>\n9.9.1 Linear Interpolation <\/td>\n<\/tr>\n
217<\/td>\n10 APPLICATIONS
10.1 In-service Inspections: FMC Techniques for High Temperature Hydrogen Attack Assessment
10.1.1 Problem Definition <\/td>\n<\/tr>\n
218<\/td>\n10.1.2 Solution
10.1.3 Array Probes Design and Optimization <\/td>\n<\/tr>\n
223<\/td>\n10.1.4 FMC Capabilities Validation <\/td>\n<\/tr>\n
250<\/td>\n10.1.5 Conclusions
10.2 FMC\/TFM Based Inspection of Small-Diameter Components for FAC Damage
10.2.1 Summary
10.2.2 Background <\/td>\n<\/tr>\n
251<\/td>\n10.2.3 Feeder Pipes
10.2.4 Degradation Mechanism <\/td>\n<\/tr>\n
252<\/td>\n10.2.5 Component Description <\/td>\n<\/tr>\n
253<\/td>\n10.2.6 Inspection Specification Requirements <\/td>\n<\/tr>\n
254<\/td>\n10.2.7 Complicating Factors <\/td>\n<\/tr>\n
256<\/td>\n10.2.8 Overview
10.2.9 Separation of Tasks
10.2.10 Training <\/td>\n<\/tr>\n
257<\/td>\n10.2.11 Equipment <\/td>\n<\/tr>\n
258<\/td>\n10.2.12 Software
10.2.13 Calibration <\/td>\n<\/tr>\n
259<\/td>\n10.2.14 Data Acquisition Process <\/td>\n<\/tr>\n
260<\/td>\n10.2.15 Recording
10.2.16 Data Acquisition Procedure <\/td>\n<\/tr>\n
262<\/td>\n10.2.17 Data Analysis Process <\/td>\n<\/tr>\n
265<\/td>\n10.2.18 Data Analysis Procedure
10.2.19 Results <\/td>\n<\/tr>\n
267<\/td>\n10.2.20 Discussion <\/td>\n<\/tr>\n
270<\/td>\n10.2.21 Further Developments
10.2.22 Conclusions <\/td>\n<\/tr>\n
271<\/td>\n10.3 Crack Growth Monitoring with PAUT and TFM
10.3.1 Introduction
10.3.2 Approach <\/td>\n<\/tr>\n
273<\/td>\n10.3.3 Description of the UT Setup <\/td>\n<\/tr>\n
274<\/td>\n10.3.4 Results
10.3.5 Analysis <\/td>\n<\/tr>\n
280<\/td>\n10.3.6 Conclusions and Next Steps <\/td>\n<\/tr>\n
281<\/td>\n10.4 Weld Examination-Introduction
11.4.1 General Requirements <\/td>\n<\/tr>\n
282<\/td>\n10.4.2 Equipment
10.4.3 Getting Started <\/td>\n<\/tr>\n
283<\/td>\n10.4.4 Scan Plan <\/td>\n<\/tr>\n
285<\/td>\n10.4.5 Equipment Set-Up <\/td>\n<\/tr>\n
287<\/td>\n10.4.6 Scanning\/Data Collection <\/td>\n<\/tr>\n
290<\/td>\n10.4.7 Evaluation <\/td>\n<\/tr>\n
293<\/td>\n10.4.8 Examples <\/td>\n<\/tr>\n
299<\/td>\nREFERENCES <\/td>\n<\/tr>\n
302<\/td>\nAPPENDIX A: FMC-TFM DATA OF INTERNAL SURFACE (ID), EXTERNAL SURFACE (OD) AND MID-WALL TYPES OF DEFECTS REPRESENTED BY NOTCHES <\/td>\n<\/tr>\n
327<\/td>\nAPPENDIX B: TFM DATA PRESENTATION AND FLAWS SIZING <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

ASME PTB-15-2023 Full Matrix Capture Training Manual<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
ASME<\/b><\/a><\/td>\n2023<\/td>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":439767,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2643],"product_tag":[],"class_list":{"0":"post-439760","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-asme","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/439760","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/439767"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=439760"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=439760"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=439760"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}