{"id":444800,"date":"2024-10-20T08:39:06","date_gmt":"2024-10-20T08:39:06","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-1241-2023\/"},"modified":"2024-10-26T16:07:04","modified_gmt":"2024-10-26T16:07:04","slug":"ieee-1241-2023","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-1241-2023\/","title":{"rendered":"IEEE 1241-2023"},"content":{"rendered":"

Revision Standard – Active. The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values are extracted (sampled) and then digitized at known time intervals. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.<\/p>\n

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PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
1<\/td>\nIEEE Std 1241-2023 Front Cover <\/td>\n<\/tr>\n
2<\/td>\nTitle page <\/td>\n<\/tr>\n
4<\/td>\nImportant Notices and Disclaimers Concerning IEEE Standards Documents
Notice and Disclaimer of Liability Concerning the Use of IEEE Standards Documents
Translations <\/td>\n<\/tr>\n
5<\/td>\nOfficial statements
Comments on standards
Laws and regulations
Data privacy
Copyrights <\/td>\n<\/tr>\n
6<\/td>\nPhotocopies
Updating of IEEE Standards documents
Errata
Patents <\/td>\n<\/tr>\n
7<\/td>\nIMPORTANT NOTICE <\/td>\n<\/tr>\n
8<\/td>\nParticipants <\/td>\n<\/tr>\n
9<\/td>\nIntroduction <\/td>\n<\/tr>\n
10<\/td>\nAcknowledgements <\/td>\n<\/tr>\n
11<\/td>\nContents <\/td>\n<\/tr>\n
13<\/td>\n1. Overview
1.1 Scope
1.2 Purpose
1.3 Word usage <\/td>\n<\/tr>\n
14<\/td>\n1.4 Document organization
1.5 Analog-to-digital converter background <\/td>\n<\/tr>\n
18<\/td>\n1.6 Guidance to the user
1.6.1 Interfacing
1.6.2 Test conditions <\/td>\n<\/tr>\n
19<\/td>\n1.6.3 Electrical environment
1.6.4 Test equipment
1.6.5 Test selection
1.7 Manufacturer-supplied information
1.7.1 General information <\/td>\n<\/tr>\n
20<\/td>\n1.7.2 Minimum specifications
1.7.3 Additional specifications <\/td>\n<\/tr>\n
21<\/td>\n1.7.4 Pertinent ADC parameters <\/td>\n<\/tr>\n
23<\/td>\n2. Normative references
3. Definitions, acronyms, and abbreviations
3.1 Definitions <\/td>\n<\/tr>\n
31<\/td>\n3.2 Acronyms, abbreviations, and symbols
3.2.1 Acronyms, abbreviations, and operators <\/td>\n<\/tr>\n
32<\/td>\n3.2.2 Symbols <\/td>\n<\/tr>\n
37<\/td>\n4. General test methods
4.1 Introductory information on test methods
4.2 Test setup
4.2.1 Sine-wave test setup <\/td>\n<\/tr>\n
38<\/td>\n4.2.2 Arbitrary signal test setup
4.2.3 Step signal setup <\/td>\n<\/tr>\n
39<\/td>\n4.3 Taking a record of data
4.3.1 Use of output decimation in taking a record of data
4.4 Equivalent-time sampling and undersampling <\/td>\n<\/tr>\n
40<\/td>\n4.4.1 Extraction method <\/td>\n<\/tr>\n
41<\/td>\n4.4.2 Comments on the extraction method for equivalent-time sampling <\/td>\n<\/tr>\n
42<\/td>\n4.4.3 Alternate extraction method <\/td>\n<\/tr>\n
43<\/td>\n4.4.4 Comments on alternate extraction method <\/td>\n<\/tr>\n
44<\/td>\n5. Sine-wave testing and fitting
5.1 Introductory information on sine-wave testing and fitting
5.2 Curve fitting test method <\/td>\n<\/tr>\n
45<\/td>\n5.3 Comment on three-parameter versus four-parameter sine fit <\/td>\n<\/tr>\n
46<\/td>\n5.4 Choice of frequencies and waveform epoch
5.4.1 Fine-scale frequency selection <\/td>\n<\/tr>\n
47<\/td>\n5.4.2 Medium-scale frequency selection
5.4.3 Coarse-scale frequency selection <\/td>\n<\/tr>\n
48<\/td>\n5.4.4 Special considerations with very long waveform epochs
5.5 Selecting signal amplitudes
5.6 Presenting sine-wave data
5.7 Impurities of sine-wave sources <\/td>\n<\/tr>\n
49<\/td>\n5.8 Estimating impurity problems from sine-fitting results <\/td>\n<\/tr>\n
50<\/td>\n5.9 Measuring and controlling sine-wave impurities <\/td>\n<\/tr>\n
51<\/td>\n6. Locating code transitions
6.1 Introductory information on locating code transitions
6.2 Locating code transitions using a feedback loop <\/td>\n<\/tr>\n
52<\/td>\n6.2.1 Test method for locating code transitions using a feedback loop <\/td>\n<\/tr>\n
54<\/td>\n6.3 Alternate code transition location method based on ramp histogram <\/td>\n<\/tr>\n
55<\/td>\n6.3.1 Comments on number of samples to be averaged per CTL for a given confidence level
6.3.2 Comments on ramp characteristics
6.3.3 Comments on histogram testing
6.4 Alternate code transition location method, based on sine-wave histogram <\/td>\n<\/tr>\n
56<\/td>\n6.4.1 Tolerance and confidence level <\/td>\n<\/tr>\n
57<\/td>\n6.4.2 Comment on the selection of the sine-wave frequency and waveform epoch <\/td>\n<\/tr>\n
58<\/td>\n6.4.3 Comments on sine-wave histogram testing
6.4.4 Comment on the amount of sine-wave overdrive and the number of waveforms epochs required
6.4.4.1 Input overdrive and required number of waveforms <\/td>\n<\/tr>\n
60<\/td>\n6.5 Determining the static transfer curve
6.5.1 Alternate method for determining the static transfer curve <\/td>\n<\/tr>\n
61<\/td>\n7. Analog input
7.1 Input characteristics
7.1.1 Static input resistance
7.2 Static input impedance versus input signal level
7.2.1 Test method for static input impedance
7.3 Static input current
7.4 Static gain and offset
7.4.1 Static gain and offset (independently based) <\/td>\n<\/tr>\n
62<\/td>\n7.4.1.1 Alternate method for determining gain and offset
7.4.2 Static gain and offset (terminal based) <\/td>\n<\/tr>\n
63<\/td>\n8. Linearity
8.1 General comments on linearity
8.2 Integral nonlinearity
8.2.1 Integral nonlinearity test method <\/td>\n<\/tr>\n
64<\/td>\n8.2.2 Alternate test method for determining INL
8.3 Absolute accuracy error
8.3.1 Test method for absolute accuracy error
8.4 Differential nonlinearity and missing codes <\/td>\n<\/tr>\n
65<\/td>\n8.4.1 Differential nonlinearity and missing codes test method
8.5 Example INL and DNL data <\/td>\n<\/tr>\n
67<\/td>\n8.6 Monotonicity
8.6.1 Test method for monotonicity
8.7 Hysteresis
8.7.1 Hysteresis test method <\/td>\n<\/tr>\n
68<\/td>\n8.7.2 Alternate hysteresis test method
8.7.3 Comment on hysteresis and alternation <\/td>\n<\/tr>\n
69<\/td>\n8.8 Harmonic and spurious distortion
8.8.1 Total harmonic distortion <\/td>\n<\/tr>\n
70<\/td>\n8.8.1.1 Coherent sampling THD test method
8.8.1.2 Noncoherent sampling test method 1 (windowed DFT) <\/td>\n<\/tr>\n
71<\/td>\n8.8.1.3 Noncoherent sampling test method 2 (sine fitting) <\/td>\n<\/tr>\n
72<\/td>\n8.8.1.4 Comments on waveform lengths, sample rate, and input frequency for noncoherent sampling using curve fitting <\/td>\n<\/tr>\n
73<\/td>\n8.8.2 Spurious free dynamic range
8.8.2.1 Coherent sampling SFDR test method <\/td>\n<\/tr>\n
74<\/td>\n8.8.2.2 Noncoherent SFDR sampling test method
8.9 Intermodulation distortion
8.9.1 Intermodulation distortion test method using two tones <\/td>\n<\/tr>\n
75<\/td>\n8.9.1.1 Comments on test procedure
8.9.1.2 Additional comments <\/td>\n<\/tr>\n
76<\/td>\n8.9.2 Intermodulation distortion test methods using more than two tones
8.9.2.1 Multi-tone power ratio <\/td>\n<\/tr>\n
77<\/td>\n8.9.2.2 MTPR test method <\/td>\n<\/tr>\n
78<\/td>\n8.9.2.3 Comments on MTPR
8.10 Noise power ratio
8.10.1 Test method for noise power ratio <\/td>\n<\/tr>\n
80<\/td>\n8.10.2 NPR testing issues
8.10.2.1 Input signal filtering
8.10.2.2 Notch filter width
8.10.2.3 Windowing
8.10.2.4 Measured and theoretical NPR <\/td>\n<\/tr>\n
81<\/td>\n8.10.2.5 Comments on NPR <\/td>\n<\/tr>\n
83<\/td>\n9. Noise (total)
9.1 General comments concerning noise
9.2 Signal-to-noise-and-distortion ratio (SINAD)
9.2.1 SINAD test method <\/td>\n<\/tr>\n
84<\/td>\n9.2.2 Coherent sampling test method for SINAD in the frequency domain
9.2.3 Comments on SINAD and SNR
9.3 Signal-to-noise ratio (SNR)
9.3.1 Coherent sampling test method for SNR <\/td>\n<\/tr>\n
85<\/td>\n9.3.2 Noncoherent sampling test method 1 (windowed DFT)
9.3.3 Noncoherent sampling test method 2 (sine fitting)
9.4 Effective number of bits (ENOB)
9.4.1 Comment on ideal quantization error
9.4.2 Comment on the relationship of SINAD and ENOB <\/td>\n<\/tr>\n
86<\/td>\n9.4.3 Comment on significance of number of samples, M
9.4.4 Comment on effects of jitter or phase noise on sine-wave tests <\/td>\n<\/tr>\n
87<\/td>\n9.5 Random noise
9.5.1 Test method for random noise <\/td>\n<\/tr>\n
88<\/td>\n9.5.2 Alternative test method for low noise ADCs
9.5.2.1 Note on amplitude of triangle wave used for test
9.5.2.2 Note on desired accuracy <\/td>\n<\/tr>\n
89<\/td>\n9.5.3 Alternative random noise and hysteresis test method based on a feedback loop
10. Step response parameters
10.1 Step response definition <\/td>\n<\/tr>\n
90<\/td>\n10.2 Test method for acquiring an estimate of the step response
10.2.1 Comment on test results
10.3 Slew rate limit
10.3.1 Test method <\/td>\n<\/tr>\n
91<\/td>\n10.4 Settling time parameters
10.4.1 Settling time
10.4.2 Short-term settling time
10.4.3 Long-term settling error
10.4.4 Test method for settling time and short-term settling time <\/td>\n<\/tr>\n
92<\/td>\n10.4.5 Comment on settling time
10.5 Transition duration of step response
10.5.1 Test method for transition duration
10.6 Overshoot and precursors
10.6.1 Test method for overshoot and precursors
11. Frequency response parameters
11.1 Bandwidth <\/td>\n<\/tr>\n
93<\/td>\n11.1.1 Bandwidth test method <\/td>\n<\/tr>\n
94<\/td>\n11.1.2 Alternative bandwidth test method using time domain techniques
11.1.3 Useful power bandwidth test method <\/td>\n<\/tr>\n
95<\/td>\n11.2 Gain error (gain flatness)
11.3 Frequency response and gain from step response
11.3.1 Frequency response and dynamic gain test method <\/td>\n<\/tr>\n
96<\/td>\n11.3.2 Aliasing and first differencing error bounds <\/td>\n<\/tr>\n
97<\/td>\n11.3.3 Comment on frequency response tests
12. Differential gain and phase
12.1 Introductory information on differential gain and phase <\/td>\n<\/tr>\n
98<\/td>\n12.2 Method for testing a general-purpose ADC <\/td>\n<\/tr>\n
100<\/td>\n12.2.1 Method for neglecting phase adjustment factor <\/td>\n<\/tr>\n
101<\/td>\n12.3 Comments on differential phase and differential gain testing
13. Sampling aperture effects
13.1 Introductory information on sampling aperture effects
13.2 Aperture duration <\/td>\n<\/tr>\n
106<\/td>\n13.2.1 Test method for aperture duration
13.2.2 Comment on selecting the value of p
13.3 Aperture delay <\/td>\n<\/tr>\n
107<\/td>\n13.3.1 Test method for aperture delay
13.3.2 Comment on aperture delay
13.4 Aperture uncertainty
13.4.1 Test method for aperture uncertainty <\/td>\n<\/tr>\n
109<\/td>\n14. Additional tests and specification
14.1 Digital logic signals <\/td>\n<\/tr>\n
110<\/td>\n14.2 Pipeline delay
14.3 Out-of-range recovery interval
14.3.1 Test method for absolute out-of-range recovery
14.3.2 Test method for relative out-of-range recovery <\/td>\n<\/tr>\n
111<\/td>\n14.3.3 Comments on test methods
14.4 Differential input specifications
14.4.1 Input impedance to ground (for differential input ADCs)
14.4.1.1 Test method
14.4.2 Common-mode rejection ratio (CMRR) and maximum common-mode signal level <\/td>\n<\/tr>\n
112<\/td>\n14.4.2.1 Test method for CMRR
14.4.3 Maximum operating common-mode signal
14.4.3.1 Test method for maximum operating common-mode signal <\/td>\n<\/tr>\n
113<\/td>\n14.4.4 Common-mode out-of-range recovery interval
14.4.4.1 Test method for common-mode out-of-range recovery time
14.5 Comments on reference signals
14.6 Power supply parameters
14.6.1 Power consumption <\/td>\n<\/tr>\n
114<\/td>\n14.6.1.1 Power consumption test method
14.6.1.2 Power supply voltage effects
14.6.1.3 Power supply voltage effects test method <\/td>\n<\/tr>\n
115<\/td>\n14.6.1.4 Comments on power supply rejection ratio (PSRR) <\/td>\n<\/tr>\n
116<\/td>\nAnnex A (informative) ADC architectures
A.1 Integrating ADCs
A.2 Flash ADCs <\/td>\n<\/tr>\n
117<\/td>\nA.3 Pipelined and subranging ADCs <\/td>\n<\/tr>\n
119<\/td>\nA.4 SAR ADCs <\/td>\n<\/tr>\n
120<\/td>\nA.5 \u03a3-\u2206 ADCs
A.6 Time-interleaved ADCs <\/td>\n<\/tr>\n
121<\/td>\nA.7 Folding and interpolating ADCs <\/td>\n<\/tr>\n
123<\/td>\nAnnex B (informative) Sine-wave fitting algorithms
B.1 Algorithm for three-parameter (known frequency) least-squares fit to sine-wave data <\/td>\n<\/tr>\n
124<\/td>\nB.2 Algorithm for four-parameter least-squares fit to sine-wave data <\/td>\n<\/tr>\n
126<\/td>\nAnnex C (normative) Discrete Fourier transforms and windowing <\/td>\n<\/tr>\n
128<\/td>\nC.1 Windowed DFT and spectral leakage
C.1.1 Spectral leakage <\/td>\n<\/tr>\n
129<\/td>\nC.1.2 Coherent sampling and sine-fitting methods of reducing spectral leakage <\/td>\n<\/tr>\n
130<\/td>\nC.2 Some useful windows and their characteristics <\/td>\n<\/tr>\n
131<\/td>\nC.3 Window selection <\/td>\n<\/tr>\n
132<\/td>\nAnnex D (informative) Presentation of sine-wave data
D.1 ENOB presentation <\/td>\n<\/tr>\n
133<\/td>\nD.2 Presentation of residuals <\/td>\n<\/tr>\n
135<\/td>\nD.3 Other examples of presentations of sine-wave test results <\/td>\n<\/tr>\n
139<\/td>\nAnnex E (informative) Bibliography <\/td>\n<\/tr>\n
143<\/td>\nBack Cover <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters (Approved Draft)<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
IEEE<\/b><\/a><\/td>\n2023<\/td>\n143<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":444808,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2644],"product_tag":[],"class_list":{"0":"post-444800","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-ieee","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/444800","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/444808"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=444800"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=444800"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=444800"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}