{"id":45708,"date":"2024-10-17T07:15:11","date_gmt":"2024-10-17T07:15:11","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/astm-e995-2011\/"},"modified":"2024-10-24T16:02:32","modified_gmt":"2024-10-24T16:02:32","slug":"astm-e995-2011","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/astm\/astm-e995-2011\/","title":{"rendered":"ASTM-E995 2011"},"content":{"rendered":"<\/p>\n<p id=\"s00002\">1.1 The purpose of this guide is to familiarize the analyst with the principal background subtraction techniques presently in use together with the nature of their application to data acquisition and manipulation.<\/p>\n<p id=\"s00003\">1.2 This guide is intended to apply to background subtraction in electron, X-ray, and ion-excited Auger electron spectroscopy (AES), and X-ray photoelectron spectroscopy (XPS).<\/p>\n<p id=\"s10003\">1.3 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.<\/p>\n<p id=\"s00004\">1.4 <span class=\"italic\">This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.<\/span><\/p>\n<p><h4>PDF Catalog<\/h4>\n<table border=\"1px\" class=\"des-table\">\n<tr>\n<th>PDF Pages<\/th>\n<th>PDF Title<\/th>\n<\/tr>\n<tr>\n<td><b>1<b><\/td>\n<td>Scope <br \/> Referenced Documents <br \/> Terminology <br \/> Summary of Guide <br \/> Significance and Use  <\/td>\n<\/tr>\n<tr>\n<td><b>2<b><\/td>\n<td>Apparatus <br \/> Common Procedures  <\/td>\n<\/tr>\n<tr>\n<td><b>3<b><\/td>\n<td>Less Common Procedures <br \/> Rarely Used Procedures <br \/> Keywords <br \/> X1. COMPARISONS AVAILABLE IN THE LITERATURE <br \/> X1.1   <\/td>\n<\/tr>\n<tr>\n<td><b>4<b><\/td>\n<td>REFERENCES  <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"<p><b>E995-11 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy<\/b><\/p>\n<table class=\"shortdes-table\" style=\"width: 100%\" border=\"0\" cellspacing=\"0\" cellpadding=\"0\">\n<tbody>\n<tr>\n<td>Published By<\/td>\n<td>Publication Date<\/td>\n<td>Number of Pages<\/td>\n<\/tr>\n<tr>\n<td><a href=\"https:\/\/pdfstandards.shop\/product-category\/publishers\/astm\/\"><b>ASTM<\/b><\/a><\/td>\n<td>2011<\/td>\n<td>5<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":45709,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[276,2637],"product_tag":[],"class_list":{"0":"post-45708","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-17-180-30","7":"product_cat-astm","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/45708","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/45709"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=45708"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=45708"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=45708"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}