{"id":79492,"date":"2024-10-17T18:35:00","date_gmt":"2024-10-17T18:35:00","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-993-1990\/"},"modified":"2024-10-24T19:40:18","modified_gmt":"2024-10-24T19:40:18","slug":"ieee-993-1990","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-993-1990\/","title":{"rendered":"IEEE 993 1990"},"content":{"rendered":"
New IEEE Standard – Inactive – Withdrawn. Withdrawn Standard. Withdrawn Date: Oct 25, 1996. No longer endorsed by the IEEE. A language useful for describing Automatic Test Equipment (ATE) instrumentation and configurations, as well as Interface Test Adapters (ITA), is defined. Principally intended for testing environments using the ATLAS test language, TEDL can also be used to describe instrumentation in non-ATLAS environments.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
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31<\/td>\n | 8 The P981 Resource Description 8.1 Overview <\/td>\n<\/tr>\n | ||||||
32<\/td>\n | Appendix A: Complete Formal Syntax of TEDL A1 TEDL Formal Syntax <\/td>\n<\/tr>\n | ||||||
44<\/td>\n | A2 TEDL Syntax Diagrams TEDL Syntax Diagrams <\/td>\n<\/tr>\n | ||||||
62<\/td>\n | A3 TEDL Reserved Words <\/td>\n<\/tr>\n | ||||||
64<\/td>\n | Appendix B Glossary <\/td>\n<\/tr>\n | ||||||
65<\/td>\n | B2 Related Document Description <\/td>\n<\/tr>\n | ||||||
66<\/td>\n | TEDL Modeling <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" IEEE Trial-Use Standard for Test Equipment Description Language (TEDL)<\/b><\/p>\n |