{"id":80239,"date":"2024-10-17T18:42:22","date_gmt":"2024-10-17T18:42:22","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-1546-2001\/"},"modified":"2024-10-24T19:42:52","modified_gmt":"2024-10-24T19:42:52","slug":"ieee-1546-2001","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-1546-2001\/","title":{"rendered":"IEEE 1546 2001"},"content":{"rendered":"
New IEEE Standard – Active. An aid in the understanding and use of digital test interchange format (DTIF) files isprovided in this guide. This information will be an aid to users in developing tools such aspreprocessors and postprocessors of DTIF data and other utilities.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
1<\/td>\n | Title Page <\/td>\n<\/tr>\n | ||||||
3<\/td>\n | Introduction Participants <\/td>\n<\/tr>\n | ||||||
5<\/td>\n | CONTENTS <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | 1. Overview 1.1 Scope 1.2 Purpose 2. References <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | 3. Definitions of terms and acronyms 3.1 Terms 3.2 Acronyms 4. DTIF functional groups <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 4.1 UUT Model group <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 4.2 Stimulus and Response group <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | 4.3 Fault Dictionary group <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | 4.4 Probe group <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | 5. DTIF application example <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | 5.1 Application example \u2013 UUT Model group <\/td>\n<\/tr>\n | ||||||
28<\/td>\n | 5.2 Application example\u2014Stimulus and Response group <\/td>\n<\/tr>\n | ||||||
32<\/td>\n | 5.3 Application example\u2014Fault Dictionary group <\/td>\n<\/tr>\n | ||||||
35<\/td>\n | 5.4 Application example\u2014Probe group <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" IEEE Guide for Digital Test Interchange Format (DTIF) Application<\/b><\/p>\n |