{"id":80611,"date":"2024-10-17T18:46:06","date_gmt":"2024-10-17T18:46:06","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-c57-12-60-1993\/"},"modified":"2024-10-24T19:44:06","modified_gmt":"2024-10-24T19:44:06","slug":"ieee-c57-12-60-1993","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-c57-12-60-1993\/","title":{"rendered":"IEEE C57.12.60 1993"},"content":{"rendered":"
New IEEE Standard – Inactive – Superseded. A uniform method is established for determining the temperature classification of solidcast and resin-encapsulated power and distribution transformer insulation systems by testing rather than by chemical composition. These insulation systems are intended for use in transformers covered by IEEE Std C57.12.01-1989 and IEEE Std C57.12.91-1995 as they apply to solidcast and resin-encapsulated transformers whose highest voltages exceed nominal 600 V.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
2<\/td>\n | Overview Scope Test procedures <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | Purpose I 3 References <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | Basic considerations General Intent of test methods <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | 2.3 Aging factors 2.4 Data treatment General <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | Test models <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | Screening Test cycles Temperature aging <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | Cold shock <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | Humidity conditionins Dielectric tests <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 5 Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" IEEE Trial-Use Standard Test Procedures for Thermal Evaluation of Insulation Systems for Solid-Cast and Resin-Encapsulated Power and Distribution Transformers<\/b><\/p>\n |