{"id":82739,"date":"2024-10-18T03:08:21","date_gmt":"2024-10-18T03:08:21","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-746-1984\/"},"modified":"2024-10-24T19:51:14","modified_gmt":"2024-10-24T19:51:14","slug":"ieee-746-1984","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-746-1984\/","title":{"rendered":"IEEE 746 1984"},"content":{"rendered":"

New IEEE Standard – Inactive – Withdrawn. This standard describes methods for measuring ther performance of uniformly coded alnalog-to-digital (A\/D) coverters and digital-to-analog (D\/A) converters for pulse code modulation (PSM) television video signals. Excluded are A\/D and D\/A converters that employ nonlinear processes for bit reduction television circuits, as for example, sub-Nyquist encoding, differential PCM, transform coders, etc. This standard is intended primarily for CCIR System M, 525-line\/60-field television circuits. The performance to be measured should be relevant to the subjective quality of the television picture. Measurements not related to the quality of the video signal are excluded from this standard. Where possible, television type test signals are used to accomodate clamping circuits in the converters.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
9<\/td>\n1 Scope and References
1.1 Scope
1.2 References
Definition and Discussions
2.1 General <\/td>\n<\/tr>\n
10<\/td>\n2.2 Television Applications of A\/D and D\/A Converters
Signal Processes Required for Analog to Digital Conversion <\/td>\n<\/tr>\n
11<\/td>\nDigital to Analog Conversion Showing the Resultant Frequency Spectrum
Encoding Rates <\/td>\n<\/tr>\n
12<\/td>\n2.3 Manufacturers’ Definitions
3 Measuring Configurations
3.1 A\/D
3.2 D\/A
3.3 Codec
3.4 Analog Test Signal Generators
3.5 Digital Test Signal Generators
Measuring the Performance of an A\/D Converter
Measuring the Performance of a D\/A Converter <\/td>\n<\/tr>\n
13<\/td>\n3.6 Analog Measuring Devices
3.7 Digital Measuring Devices
4 Low Frequency Linearity Errors
4.1 General
4.2 Definitions
Measuring the Performance of an A\/D – D\/A Codec
Measuring the Performance of a D\/A – A\/D Codec <\/td>\n<\/tr>\n
14<\/td>\nFig 8 A\/D Converter Transfer Function <\/td>\n<\/tr>\n
15<\/td>\n4.3 The Method of Measurement
Fig 9 Terminal Based Integral Linearity Error
Zero Based Integral Linearity Error <\/td>\n<\/tr>\n
16<\/td>\nIndependent Integral Linearity Error
General Linearity Test Configuration <\/td>\n<\/tr>\n
17<\/td>\nLinearity Test Configuration for Method A <\/td>\n<\/tr>\n
18<\/td>\nLinearity Test Configuration for Method B
Linearity Test Configuration for Method C <\/td>\n<\/tr>\n
19<\/td>\n4.4 Interpretation of Error Waveform
Composite Linearity Test Waveform for Method C
Linearity Test Configuration for Method D <\/td>\n<\/tr>\n
20<\/td>\n4.5 Expression of Linearity Error Measurements
Linearity Error Waveform for Ideal A\/D and D\/A
Differential Linearity and Code Size Error
Missing Codes in A\/D Converter <\/td>\n<\/tr>\n
21<\/td>\n5 FrequencyResponse
5.1 General
5.2 Measuring Configuration
5.3 Measuring Frequency Response
Nonmonotonicity in A\/D Converter <\/td>\n<\/tr>\n
22<\/td>\nGeneral Frequency Response Test Configuration
Output from Sync Inserter Method A
Frequency Response Test Configuration for Method A <\/td>\n<\/tr>\n
23<\/td>\nFrequency Response Test Configuration for Method B
Frequency Response Test Configuration For Method C <\/td>\n<\/tr>\n
24<\/td>\n5.4 Reporting Sinc Function
Differential Gain and Differential Phase
6.1 General
6.2 Definitions
6.3 Measuring Configuration
6.4 Effect of Quantizing Error on Measurements
6.5 Test Signal
6.6 Measuring Instrument <\/td>\n<\/tr>\n
25<\/td>\n6.7 Methods of Measurement
Composite dp and dg Test Waveform <\/td>\n<\/tr>\n
26<\/td>\n7 Signal-to-Noise Ratio
7.1 General
7.2 Signal-to-Noise Ratio
Test Configuration for Measuring dg and dp <\/td>\n<\/tr>\n
27<\/td>\n7.3 Signal-to-Quantizing Error Ratio
7.4 Requirement for Measurement
Oscilloscope Display of dg and dp when Measured through a PCM Codec <\/td>\n<\/tr>\n
28<\/td>\n7.5 The Measurement of Signal-to-Noise Ratio
7.6 Reporting Test Results
Linear Waveform Distortion
8.1 General
Signal-to-Noise Ratio Test Configuration <\/td>\n<\/tr>\n
29<\/td>\n8.2 The Requirements for Measurements
8.3 The Measurements of Linear Waveform Distortions
Test Configuration for Linear Waveform Distortion Measurements <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

IEEE Standard for Performance Measurements of A\/D and D\/A Converters for PCM Television Video Circuits<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
IEEE<\/b><\/a><\/td>\n1984<\/td>\n30<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":82740,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2644],"product_tag":[],"class_list":{"0":"post-82739","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-ieee","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/82739","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/82740"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=82739"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=82739"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=82739"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}