{"id":410127,"date":"2024-10-20T05:38:56","date_gmt":"2024-10-20T05:38:56","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iec-63068-42022\/"},"modified":"2024-10-26T10:23:12","modified_gmt":"2024-10-26T10:23:12","slug":"bs-iec-63068-42022","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iec-63068-42022\/","title":{"rendered":"BS IEC 63068-4:2022"},"content":{"rendered":"

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
2<\/td>\nundefined <\/td>\n<\/tr>\n
4<\/td>\nCONTENTS <\/td>\n<\/tr>\n
6<\/td>\nFOREWORD <\/td>\n<\/tr>\n
8<\/td>\nINTRODUCTION <\/td>\n<\/tr>\n
9<\/td>\n1 Scope
2 Normative references
3 Terms and definitions
4 Principle <\/td>\n<\/tr>\n
10<\/td>\n5 Requirements
5.1 General
Table 1 \u2013 Combination table for identifying defects <\/td>\n<\/tr>\n
11<\/td>\n5.2 Parameter settings
5.2.1 General <\/td>\n<\/tr>\n
12<\/td>\n5.2.2 Parameter setting process
5.3 Procedure
5.4 Image evaluation
5.4.1 General
5.4.2 Mean width of planar and volume defects <\/td>\n<\/tr>\n
13<\/td>\n5.4.3 Evaluation process
5.5 Precision
5.6 Test report
5.6.1 Mandatory elements <\/td>\n<\/tr>\n
14<\/td>\n5.6.2 Optional elements <\/td>\n<\/tr>\n
15<\/td>\nAnnex A (informative)Optical inspection and photoluminescence images of defects
A.1 General
A.2 Micropipe <\/td>\n<\/tr>\n
16<\/td>\nA.3 TSD
Figures
Figure A.1 \u2013 Micropipe <\/td>\n<\/tr>\n
17<\/td>\nA.4 TED
Figure A.2 \u2013 TSD <\/td>\n<\/tr>\n
18<\/td>\nA.5 BPD
Figure A.3 \u2013 TED <\/td>\n<\/tr>\n
19<\/td>\nA.6 Scratch trace
Figure A.4 \u2013 BPD <\/td>\n<\/tr>\n
20<\/td>\nA.7 Stacking fault
Figure A.5 \u2013 Scratch trace <\/td>\n<\/tr>\n
21<\/td>\nA.8 Propagated stacking fault
Figure A.6 \u2013 Stacking fault <\/td>\n<\/tr>\n
22<\/td>\nA.9 Stacking fault complex
Figure A.7 \u2013 Propagated stacking fault <\/td>\n<\/tr>\n
23<\/td>\nA.10 Polytype inclusion
Figure A.8 \u2013 Stacking fault complex <\/td>\n<\/tr>\n
24<\/td>\nA.11 Particle inclusion
Figure A.9 \u2013 Polytype inclusion <\/td>\n<\/tr>\n
25<\/td>\nA.12 Bunched-step segment
Figure A.10 \u2013 Particle inclusion <\/td>\n<\/tr>\n
26<\/td>\nFigure A.11 \u2013 Bunched-step segment <\/td>\n<\/tr>\n
27<\/td>\nA.13 Surface particle
Figure A.12 \u2013 Surface particle <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices – Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2022<\/td>\n28<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":410133,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[577,2641],"product_tag":[],"class_list":{"0":"post-410127","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-31-080-99","7":"product_cat-bsi","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/410127","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/410133"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=410127"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=410127"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=410127"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}