{"id":290989,"date":"2024-10-19T19:45:11","date_gmt":"2024-10-19T19:45:11","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iso-224932014\/"},"modified":"2024-10-25T16:46:19","modified_gmt":"2024-10-25T16:46:19","slug":"bs-iso-224932014","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iso-224932014\/","title":{"rendered":"BS ISO 22493:2014"},"content":{"rendered":"

This International Standard defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts, classified according to their hierarchy in a systematic order, with those terms that have already been defined in ISO 23833 also included, where appropriate.<\/p>\n

This International Standard is applicable to all standardization documents relevant to the practice of SEM. In addition, some clauses of this International Standard are applicable to documents relevant to related fields (e.g. EPMA, AEM, EDS) for the definition of terms which are relevant to such fields.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
6<\/td>\nForeword <\/td>\n<\/tr>\n
7<\/td>\nIntroduction <\/td>\n<\/tr>\n
9<\/td>\nSection sec_1
Section sec_2
Section sec_3
Section sec_3.1
Section sec_3.1.1
Section sec_3.1.1.1
1\tScope
2\tAbbreviated terms
3\tTerms and definitions used in the physical basis of SEM <\/td>\n<\/tr>\n
10<\/td>\nSection sec_3.1.1.2
Section sec_3.1.2
Section sec_3.1.2.1
Section sec_3.1.2.1.1
Section sec_3.1.2.1.2
Section sec_3.1.2.2
Section sec_3.1.3
Section sec_3.1.3.1
Section sec_3.1.3.2
Section sec_3.1.4
Section sec_3.1.5
Section sec_3.2
Section sec_3.2.1 <\/td>\n<\/tr>\n
11<\/td>\nSection sec_3.2.1.1
Section sec_3.2.2
Section sec_3.2.3
Section sec_3.2.4
Section sec_3.2.5
Section sec_3.3
Section sec_3.3.1
Section sec_3.3.2
Section sec_3.3.3
Section sec_3.3.4 <\/td>\n<\/tr>\n
12<\/td>\nSection sec_3.3.5
Section sec_3.3.6
Section sec_3.3.7
Section sec_3.3.8
Section sec_3.4
Section sec_3.4.1
Section sec_3.4.2
Section sec_3.4.3
Section sec_3.4.4
Section sec_3.4.5
Section sec_3.4.6
Section sec_3.4.7
Section sec_3.4.8 <\/td>\n<\/tr>\n
13<\/td>\nSection sec_3.4.9
Section sec_3.5
Section sec_3.5.1
Section sec_3.5.2
Section sec_3.5.3
Section sec_3.5.4
Section sec_3.5.5
Section sec_3.6
Section sec_3.7
Section sec_3.7.1
Section sec_4
Section sec_4.1
Section sec_4.1.1
4\tTerms and definitions used in SEM instrumentation <\/td>\n<\/tr>\n
14<\/td>\nSection sec_4.1.1.1
Section sec_4.1.1.1.1
Section sec_4.1.1.1.2
Section sec_4.1.1.2
Section sec_4.1.2
Section sec_4.1.2.1
Section sec_4.1.2.2
Section sec_4.1.2.3
Section sec_4.1.2.4
Section sec_4.1.2.5
Section sec_4.1.3 <\/td>\n<\/tr>\n
15<\/td>\nSection sec_4.1.4
Section sec_4.1.5
Section sec_4.1.6
Section sec_4.2
Section sec_4.2.1
Section sec_4.2.1.1
Section sec_4.2.1.2
Section sec_4.2.2
Section sec_4.2.2.1
Section sec_4.2.2.2
Section sec_4.2.2.3 <\/td>\n<\/tr>\n
16<\/td>\nSection sec_4.2.2.4
Section sec_4.2.3
Section sec_4.2.3.1
Section sec_4.2.4
Section sec_4.2.5
Section sec_4.2.5.1
Section sec_4.2.5.2
Section sec_4.2.5.3
Section sec_4.3
Section sec_4.3.1
Section sec_4.3.2 <\/td>\n<\/tr>\n
17<\/td>\nSection sec_4.3.3
Section sec_4.3.4
Section sec_4.4
Section sec_4.4.1
Section sec_4.4.2
Section sec_4.4.3
Section sec_4.4.4
Section sec_4.4.5
Section sec_4.5
Section sec_4.5.1 <\/td>\n<\/tr>\n
18<\/td>\nSection sec_4.5.2
Section sec_4.5.3
Section sec_4.5.4
Section sec_4.5.5
Section sec_4.6
Section sec_4.6.1
Section sec_4.6.2
Section sec_4.6.2.1
Section sec_4.6.2.2
Section sec_4.6.2.3
Section sec_4.6.2.4
Section sec_4.6.2.5 <\/td>\n<\/tr>\n
19<\/td>\nSection sec_4.6.2.6
Section sec_4.6.2.7
Section sec_4.6.2.8
Section sec_4.6.2.9
Section sec_4.6.2.10
Section sec_4.6.3
Section sec_4.7
Section sec_4.7.1
Section sec_4.7.2
Section sec_4.7.3 <\/td>\n<\/tr>\n
20<\/td>\nSection sec_5
Section sec_5.1
Section sec_5.1.1
Section sec_5.1.2
Section sec_5.1.2.1
Section sec_5.1.3
Section sec_5.1.3.1
Section sec_5.2
Section sec_5.2.1
Section sec_5.2.2
Section sec_5.2.2.1
Section sec_5.2.2.2
5\tTerms and definitions used in SEM image formation and processing <\/td>\n<\/tr>\n
21<\/td>\nSection sec_5.2.2.2.1
Section sec_5.2.3
Section sec_5.2.4
Section sec_5.2.5
Section sec_5.3
Section sec_5.3.1
Section sec_5.3.2
Section sec_5.3.3 <\/td>\n<\/tr>\n
22<\/td>\nSection sec_5.3.3.1
Section sec_5.3.3.2
Section sec_5.3.3.3
Section sec_5.3.4
Section sec_5.3.5
Section sec_5.3.5.1
Section sec_5.3.5.2
Section sec_5.3.6
Section sec_5.3.7
Section sec_5.3.8
Section sec_5.3.9 <\/td>\n<\/tr>\n
23<\/td>\nSection sec_5.3.9.1
Section sec_5.3.10
Section sec_5.3.11
Section sec_5.4
Section sec_5.4.1
Section sec_5.4.1.1
Section sec_5.4.1.2
Section sec_5.5
Section sec_5.6
Section sec_5.6.1
Section sec_5.6.2
Section sec_5.6.3 <\/td>\n<\/tr>\n
24<\/td>\nSection sec_5.6.4
Section sec_6
Section sec_6.1
Section sec_6.2
Section sec_6.2.1
Section sec_6.2.2
Section sec_6.2.3
Section sec_6.2.4
Section sec_6.3
6\tTerms and definitions used in SEM image interpretation and analysis <\/td>\n<\/tr>\n
25<\/td>\nSection sec_6.4
Section sec_6.5
Section sec_6.5.1
Section sec_6.6
Section sec_6.6.1
Section sec_6.6.2
Section sec_6.6.3
Section sec_6.6.4
Section sec_6.6.5
Section sec_6.6.6
Section sec_6.6.7
Section sec_6.6.8
Section sec_6.6.9 <\/td>\n<\/tr>\n
26<\/td>\nSection sec_6.6.10
Section sec_7
Section sec_7.1
Section sec_7.1.1
Section sec_7.1.2
Section sec_7.1.3
Section sec_7.1.4
Section sec_7.2
Section sec_7.2.1
Section sec_7.2.2
Section sec_7.2.3
Section sec_7.2.4
7\tTerms and definitions used in the measurement and calibration of SEM image magnification and resolution <\/td>\n<\/tr>\n
27<\/td>\nSection sec_7.3
Section sec_7.3.1
Section sec_7.3.2
Section sec_7.4 <\/td>\n<\/tr>\n
28<\/td>\nReference ref_1
Reference ref_2
Reference ref_3
Reference ref_4
Reference ref_5
Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Microbeam analysis. Scanning electron microscopy. Vocabulary<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2014<\/td>\n32<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":290995,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[1001,2641],"product_tag":[],"class_list":{"0":"post-290989","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-71-040-50","7":"product_cat-bsi","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/290989","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/290995"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=290989"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=290989"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=290989"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}